公开(公告)号：EP2324435A4

公开(公告)日：2014-02-26

申请号：EP09798823

申请日：2009-07-17

Applicant: LUMINEX CORP

Inventor： ROTH WAYNE D

IPC: G06F17/00 ,  G01N35/00

CPC classification number: G06K9/00147

Abstract: Methods and systems are provided which include configurations for the reassigning unit locations of a classification matrix at which two or more classification regions overlap as non-classification regions. In addition, methods and systems are provided which include configurations for mathematically creating classification regions which may be characterized by values which more accurately correspond to measured values of particles. Other embodiments of methods and systems include configurations for acquiring data corresponding to measurable parameters of a particle and identifying a location within a classification matrix to which at least some of the data corresponds. Such methods and systems further include configurations for translating either the data corresponding to the identified unit location or a target space located at known locations within the classification matrix a preset number of predetermined coordinate paths until a conclusion that the particle may be classified to particular particle category or a reject class is attained.

Abstract translation: 提供的方法和系统包括用于在其中分类矩阵的重新分配单元位置的两个或多个区域重叠分类为非分类区域的配置。 此外，提供这样的方法和系统，包括用于数学创建其可以通过其对应更精确地设置为颗粒的测量值的值来表征的分类区域的配置。 的方法和系统的其它实施例包括用于向至少一些所述数据的对应哪一个分类矩阵内获取数据对应于粒子的可测量参数和识别的位置的配置。 搜索的方法和系统还包括用于平移要么数据对应于所识别的单元位置或位于分类矩阵中已知位置处的目标空间坐标路径预定的预设数量，直到一个结论做了粒子可被分类到特定的颗粒类别配置 或拒绝类实现。

公开(公告)号：CA2979457C

公开(公告)日：2020-04-28

申请号：CA2979457

申请日：2009-07-17

Applicant: LUMINEX CORP

Inventor： ROTH WAYNE D

IPC: G01N15/00

Abstract: Methods and systems are provided which include configurations for the reassigning unit locations of a classification matrix at which two or more classification regions overlap as non-classification regions. In addition, methods and systems are provided which include configurations for mathematically creating classification regions which may be characterized by values which more accurately correspond to measured values of particles. Other embodiments of methods and systems include configurations for acquiring data corresponding to measurable parameters of a particle and identifying a location within a classification matrix to which at least some of the data corresponds. Such methods and systems further include configurations for translating either the data corresponding to the identified unit location or a target space located at known locations within the classification matrix a preset number of predetermined coordinate paths until a conclusion that the particle may be classified to particular particle category or a reject class is attained.

公开(公告)号：AU2009270759B2

公开(公告)日：2015-10-01

申请号：AU2009270759

申请日：2009-07-17

Applicant: LUMINEX CORP

Inventor： ROTH WAYNE D

IPC: G01N35/00 ,  G06F17/00

Abstract: Methods and systems are provided which include configurations for the reassigning unit locations of a classification matrix at which two or more classification regions overlap as non-classification regions. In addition, methods and systems are provided which include configurations for mathematically creating classification regions which may be characterized by values which more accurately correspond to measured values of particles. Other embodiments of methods and systems include configurations for acquiring data corresponding to measurable parameters of a particle and identifying a location within a classification matrix to which at least some of the data corresponds. Such methods and systems further include configurations for translating either the data corresponding to the identified unit location or a target space located at known locations within the classification matrix a preset number of predetermined coordinate paths until a conclusion that the particle may be classified to particular particle category or a reject class is attained.

公开(公告)号：AU2014250695A1

公开(公告)日：2014-11-06

申请号：AU2014250695

申请日：2014-10-17

Applicant: LUMINEX CORP

Inventor： ROTH WAYNE D ,  CALVIN EDWARD A ,  COLLINS CHARLES J ,  DEICHER WILLIAM R ,  KRAGER JARDEN E ,  SCHILFFARTH ADAM R ,  JOHNSON ROSS G ,  BOZARTH COLIN D ,  SELVARAJ VICTOR ,  SMITH ERIC D ,  ARAB NICOLAS F ,  BERNARD BRUCE J C ,  CONNER DONALD A ,  ROACH ROBERT S ,  SMITH DAVID L

IPC: G01N15/00 ,  G01N21/64

Abstract: Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image 10 the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. m N m j0 C-C) I!' a_ Lij ED)L

公开(公告)号：CA2653761C

公开(公告)日：2014-07-29

申请号：CA2653761

申请日：2007-06-04

Applicant: LUMINEX CORP

Inventor： ROTH WAYNE D ,  COLLINS CHARLES J ,  DUONG DUNG

IPC: G01N33/543

Abstract: Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.

公开(公告)号：AU2010202162B2

公开(公告)日：2012-09-06

申请号：AU2010202162

申请日：2010-05-27

Applicant: LUMINEX CORP

Inventor： ROTH WAYNE D ,  MOORE DOUGLAS E

IPC: G01N15/14

Abstract: C:\NRPotbhDCC\AXL\298L426_I.DOC-27M/2010 Various methods for controlling one or more parameters of a flow cytometer type measurement system are provided. One embodiment includes monitoring parameter(s) of the measurement system during 5 measurements of sample microspheres. The method also includes altering the parameter(s) in real time based on the monitoring. Another method includes monitoring a temperature proximate to the measurement system. One such method includes altering a bias voltage of an avalanche photo diode in response to the temperature using empirically derived data. A different such method includes altering output signals of a photomultiplier tube in response to the temperature using a characteristic curve. Some methods include monitoring a 10 temperature of a fluid, in which sample microspheres are disposed, that will flow through the flow cytometer type measurement system. This method also includes determining a velocity of the sample microspheres in the measurement system from a viscosity of the fluid at the temperature. ,-26 ,/24 33 82 0 1 6 12p18 Fig. 1 4093.a 'A, I Li V~--A 1 2 3 4 6 6 7 8 0 10 11 12 13 14 15 16 17 '18 10 V 21 TomperawLre Iiodex Fig. 2

公开(公告)号：AU2010202159A1

公开(公告)日：2010-06-24

申请号：AU2010202159

申请日：2010-05-27

Applicant: LUMINEX CORP

Inventor： ROTH WAYNE D ,  MOORE DOUGLAS E

IPC: G01N15/14

Abstract: A method for controlling one or more parameters of a flow cytometer type measurement system, is disclosed. The comprises the following steps - measuring a time in which a microsphere (10) travels from a first detection window of the flow cytometer type measurement system to a second detection window of the measurement system; and - altering an applied pressure of the measurement system such that the time is substantially constant.

公开(公告)号：HK1132330A1

公开(公告)日：2010-02-19

申请号：HK09112123

申请日：2009-12-24

Applicant: LUMINEX CORP

Inventor： ROTH WAYNE D ,  COLLINS CHARLES J ,  DUONG DUNG

IPC: G01N20060101

Abstract: Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.

公开(公告)号：AU2009270759A1

公开(公告)日：2010-01-21

申请号：AU2009270759

申请日：2009-07-17

Applicant: LUMINEX CORP

Inventor： ROTH WAYNE D

IPC: G01N35/00 ,  G06F17/00

Abstract: Methods and systems are provided which include configurations for the reassigning unit locations of a classification matrix at which two or more classification regions overlap as non-classification regions. In addition, methods and systems are provided which include configurations for mathematically creating classification regions which may be characterized by values which more accurately correspond to measured values of particles. Other embodiments of methods and systems include configurations for acquiring data corresponding to measurable parameters of a particle and identifying a location within a classification matrix to which at least some of the data corresponds. Such methods and systems further include configurations for translating either the data corresponding to the identified unit location or a target space located at known locations within the classification matrix a preset number of predetermined coordinate paths until a conclusion that the particle may be classified to particular particle category or a reject class is attained.

公开(公告)号：CA2767032A1

公开(公告)日：2005-02-24

申请号：CA2767032

申请日：2004-08-13

Applicant: LUMINEX CORP

Inventor： ROTH WAYNE D ,  MOORE DOUGLAS E

IPC: G01N15/10 ,  G01N15/14

Abstract: Various methods for controlling one or more parameters of a flow cytometer type measurement system are provided. One embodiment includes monitoring parameter(s) of the measurement system during measurements of sample microspheres. The method also includes altering the parameter(s) in real time based on the monitoring. Another method includes monitoring a temperature proximate to the measurement system. One such method includes altering a bias voltage of an avalanche photo diode in response to the temperature using empirically derived data. A different such method includes altering output signals of a photomultiplier tube in response to the temperature using a characteristic curve. Some methods include monitoring a temperature of a fluid, in which sample microspheres are disposed, that will flow through the flow cytometer type measurement system. This method also includes determining a velocity of the sample microspheres in the measurement system from a viscosity of the fluid at the temperature.