OPTICAL DEMULTIPLEXING SYSTEM
    21.
    发明公开
    OPTICAL DEMULTIPLEXING SYSTEM 审中-公开
    OPTISCHES DEMULTIPLEX-SYSTEM

    公开(公告)号:EP2588900A4

    公开(公告)日:2014-10-15

    申请号:EP11801454

    申请日:2011-06-30

    Applicant: NEWPORT CORP

    Inventor: KNAPP JAMIE

    Abstract: Demultiplexing systems and methods are discussed which may be small and accurate without moving parts. In some cases, demultiplexing embodiments may include optical filter cavities that include filter baffles and support baffles which may be configured to minimize stray light signal detection and crosstalk. Some of the demultiplexing assembly embodiments may also be configured to efficiently detect U.V. light signals and at least partially compensate for variations in detector responsivity as a function of light signal wavelength.

    Abstract translation: 讨论了解复用系统和方法,其可以在没有移动部件的情况下是小而准确的。 在一些情况下,解复用实施例可以包括滤光器空腔,其包括滤光器挡板和支撑挡板,其可被配置为使杂散光信号检测和串扰最小化。 解复用组合实施例中的一些也可以被配置为有效地检测U.V. 光信号并且至少部分地补偿作为光信号波长的函数的检测器响应度的变化。

    Gas turbine flame detection system
    22.
    发明公开
    Gas turbine flame detection system 失效
    Flammendetektoranlagefüreine Gasturbine。

    公开(公告)号:EP0448310A1

    公开(公告)日:1991-09-25

    申请号:EP91302263.8

    申请日:1991-03-15

    Abstract: A directionally-sensitive flame detection apparatus and method for determining the presence of flame in a combustion chamber zone of a gas turbine. A radiation detector (28) is coupled to the monitored combustion zone (32) by a radiation collimator (26) having mechanically-lowered (40,42) internal reflectance so as to enhance the effective collimation angle. In this manner, a narrowed detector view angle (β) is provided that is substantially independent of radiation wavelength or the material properties of the collimator tube

    Abstract translation: 用于确定燃气轮机的燃烧室区域中的火焰的存在的方向敏感的火焰检测装置和方法。 辐射检测器(28)通过具有机械降低(40,42)内部反射率的辐射准直器(26)耦合到所监视的燃烧区域(32),以便增强有效的准直角度。 以这种方式,提供了窄的检测器视角(β),其基本上独立于辐射波长或准直管的材料特性

    光量測定装置及び光量測定方法
    23.
    发明申请
    光量測定装置及び光量測定方法 审中-公开
    光量测量装置和光量测量方法

    公开(公告)号:WO2014020978A1

    公开(公告)日:2014-02-06

    申请号:PCT/JP2013/064785

    申请日:2013-05-28

    Abstract:  簡単な構成で高精度な測定を実現できる発光ダイオードの光量測定装置を提供する。 光量測定装置3は、放射状に光を発光するLED101に対向配置され、LED101から発光された光を受光し、その光量を測定する受光モジュール1と、LED101に電力を供給してLED101を発光させるためのプローブ針109と、LED101から発光された光のうち受光モジュール1に受光させる光の範囲である受光範囲を、LED101の発光中心軸LCAに対する角度θに基づいて設定する受光範囲設定手段と、を備える。LED101は、ダイシングシート103b上に複数配列されている。受光範囲設定手段は、複数配列されたLED101から発光された光を受光モジュール1が受光する際に、LED101の配列態様にかかわらず受光した光の光量の測定誤差が所定率以下となるように、受光範囲を設定する。

    Abstract translation: 提供了一种用于发光二极管(LED)的光量测量装置,所述装置能够以简单的结构实现高精度测量。 光量测量装置(3)设置有:面向发射以径向图案的光的LED(101)定位的受光模块(1),接收从LED(101)发射的光,并测量 所述光量; 用于使LED(101)通过向LED(101)供电来发光的探针(109); 以及光接收范围设定装置,其基于角度(L)设定作为由所述受光模块(1)接收的光的范围的光接收范围(从所述LED(101)发出的光) θ)相对于LED(101)的发光中心轴(LCA)。 多个LED(101)布置在切割片(103b)上。 光接收模块(1)接收从多个LED(101)发出的光时,光接收范围设定装置以接收光量的测量误差不大于 无论LED(101)的布置图案如何都是规定的速率。

    OPTO-ELECTRONIC MODULES AND METHODS OF MANUFACTURING THE SAME AND APPLIANCES AND DEVICES COMPRISING THE SAME
    24.
    发明申请
    OPTO-ELECTRONIC MODULES AND METHODS OF MANUFACTURING THE SAME AND APPLIANCES AND DEVICES COMPRISING THE SAME 审中-公开
    光电模块及其制造方法及其装置及其装置

    公开(公告)号:WO2013010284A2

    公开(公告)日:2013-01-24

    申请号:PCT/CH2012/000159

    申请日:2012-07-10

    Abstract: The method for manufacturing opto-electronic modules (1) comprises a) providing a substrate wafer (PW) on which a multitude of detecting members (D) are arranged; b) providing a spacer wafer (SW); c) providing an optics wafer (OW), said optics wafer comprising a multitude of transparent portions (t) transparent for light generally detectable by said detecting members and at least one blocking portion (b) for substantially attenuating or blocking incident light generally detectable by said detecting members; d) preparing a wafer stack (2) in which said spacer wafer (SW) is arranged between said substrate wafer (PW) and said optics wafer (OW) such that said detecting members (D) are arranged between said substrate wafer and said optics wafer. Preferably, a multitude of emission members (E) for emitting light generally detectable by said detecting members (D) is arranged on said substrate wafer (PW) such that a multitude of neighboring emission members and detecting members are present on said substrate wafer. Single modules (1) can be obtained by separating said wafer stack (2) into a multitude of separate modules (1).

    Abstract translation: 制造光电模块(1)的方法包括:a)提供布置有多个检测部件(D)的基板晶片(PW); b)提供间隔晶片(SW); c)提供光学晶片(OW),所述光学晶片包括对于通常可被所述检测构件检测的光透明的多个透明部分(t)和用于基本上衰减或阻挡入射光的至少一个阻挡部分(b),所述阻挡部分通常可被 所述检测部件; d)制备其中所述间隔晶片(SW)布置在所述衬底晶片(PW)和所述光学晶片(OW)之间的晶片堆叠(2),使得所述检测构件(D)布置在所述衬底晶片和所述光学器件 晶圆。 优选地,用于发射由所述检测构件(D)可以普遍检测的光的多个发射构件(E)布置在所述衬底晶片(PW)上,使得在所述衬底晶片上存在多个相邻的发射构件和检测构件。 可以通过将所述晶片堆叠(2)分离成多个单独的模块(1)来获得单个模块(1)。

    SYSTEMS AND METHODS FOR DETECTING LIGHT
    27.
    发明申请
    SYSTEMS AND METHODS FOR DETECTING LIGHT 有权
    用于检测光的系统和方法

    公开(公告)号:US20160266228A1

    公开(公告)日:2016-09-15

    申请号:US14643386

    申请日:2015-03-10

    Abstract: A light detection system may include a light detecting assembly including a plurality of light detectors. Each light detector may include a substrate, a mirror coupled to the substrate, and a light-receiving tube coupled to the substrate. The light-receiving tube may include a sensor positioned at a first end, a light-transmissive opening at a second end that is opposite from the first end, and a plurality of partitions that are configured to block transmission of light energy. A central light path extends through the light-receiving tube. The system may also include a control unit in communication with the light detecting assembly. The control unit is configured to determine one or more of a direction of light emitted from a light source, a position of the light source, or an intensity of light emitted from the light source based on one or more light detection signals received from the light detecting assembly.

    Abstract translation: 光检测系统可以包括包括多个光检测器的光检测组件。 每个光检测器可以包括衬底,耦合到衬底的反射镜和耦合到衬底的光接收管。 光接收管可以包括位于第一端处的传感器,在与第一端相对的第二端处的透光开口,以及被配置为阻挡光能的传输的多个隔板。 中央光路延伸穿过光接收管。 该系统还可以包括与光检测组件通信的控制单元。 控制单元被配置为基于从光接收到的一个或多个光检测信号来确定从光源发射的光的方向,光源的位置或从光源发射的光的强度中的一个或多个 检测组件。

    STANDARD LIGHT SOURCE AND MEASUREMENT METHOD
    28.
    发明申请
    STANDARD LIGHT SOURCE AND MEASUREMENT METHOD 有权
    标准光源和测量方法

    公开(公告)号:US20140224970A1

    公开(公告)日:2014-08-14

    申请号:US14161690

    申请日:2014-01-23

    Inventor: Kazuaki OHKUBO

    CPC classification number: G01J1/08 G01J1/42 G01J2001/061 G01J2001/4252

    Abstract: A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.

    Abstract translation: 具有更简化结构的新型标准光源,其适合于测量与常规标准光源不同的发光强度分布特性的光源的总光通量,以及使用该标准光源的测量方法 提供。 标准光源包括发光部分,电连接到发光部分的供电部分和设置在发光部分和供电部分之间的限制部分,用于限制从发光部分辐射的光的传播朝向 供电部。 限制部分的来自发光部分的光入射的表面被构造用于漫反射。

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