Abstract:
An energy beam is irradiated onto a target from an energy beam source, thereby generating an X-ray with an irradiating area to be irradiated onto an object. Then, the X-ray is introduced into a spectrometer, thereby generating an X-ray with parallelism through the selection of wavelength and wavelength range.
Abstract:
A system and method to predict a failure of an imaging system that includes a radiation source having an x-ray tube assembly is provided. The system includes a storage medium having a plurality of programmable storage instructions to instruct a processor to perform the steps of acquiring an age of the x-ray tube assembly, calculating a baseline probability of a survivability of the tube assembly for a remaining time period dependent on the age of the tube assembly, acquiring measurement of at least one operating parameter of the x-ray tube assembly, and automatically changing the baseline probability of a survivability of the imaging system for the remaining time period in response to the measurement of the at least one operating parameter of the x-ray tube assembly.
Abstract:
A RF linear electron accelerator system for generating a beam of accelerated electrons bunched in pulses having different energy spectra from pulse to pulse. The system is operable to generate a beam of high energy X-rays from such beam of accelerated electrons, using a conversion target, with pulses of the X-ray beam having energy spectra which are different from X-ray pulse to X-ray pulse. Preferably, the pulses of the electron beam have energy spectra which alternate from pulse to pulse and, correspondingly, the pulses of the X-ray beam have energy spectra which alternate from pulse to pulse. Also preferably, the current of electrons injected into the system's accelerating section and the frequency of the pulse RF power supplied to the accelerating section are changed in a synchronized manner to generate the electron beam. The system is employable in an inspection system for discriminating materials present in containers by atomic numbers.
Abstract:
A RF linear electron accelerator system for generating a beam of accelerated electrons bunched in pulses having different energy spectra from pulse to pulse. The system is operable to generate a beam of high energy X-rays from such beam of accelerated electrons, using a conversion target, with pulses of the X-ray beam having energy spectra which are different from X-ray pulse to X-ray pulse. Preferably, the pulses of the electron beam have energy spectra which alternate from pulse to pulse and, correspondingly, the pulses of the X-ray beam have energy spectra which alternate from pulse to pulse. Also preferably, the current of electrons injected into the system's accelerating section and the frequency of the pulse RF power supplied to the accelerating section are changed in a synchronized manner to generate the electron beam. The system is employable in an inspection system for discriminating materials present in containers by atomic numbers.
Abstract:
A system for sealing a large diameter tube under vacuum including: a tube having a diameter greater than about 20 mm, a disk operatively positioned inside the tube and having a smaller diameter than the tube, a vacuum operatively connected to the tube, heating means, operatively positioned on the outside of the tube, for heating the tube to a temperature sufficient to collapse the tube onto the disk, means for positioning the disk inside the tube proximate the position of the heating means on the outside of the tube and means for cooling the tube proximate the disk sufficiently to formulate a seal between the tube and the disk where the disk collapsed onto the disk is disclosed.
Abstract:
La présente invention concerne un système émetteur directif de rayons X pour exercer une action sur une cible distante, le système émetteur (100) comprenant une source (101) d'électrons d'au moins 1 MeV, ladite source étant employée pour réaliser une source (102) de rayons X orientable, un dispositif de conditionnement (103) étant placé en sortie de ladite source (102) de rayons X pour former un faisceau directif de rayons X, l'énergie des photons étant choisie, en fonction de la distance de l'émetteur à la cible, pour maximiser le couplage entre les rayons X émis et les matériaux constituant la cible. L'invention s'applique notamment à la perturbation ou la destruction d'appareils et à la détection d'explosifs à distance
Abstract:
An energy beam (30) is irradiated onto a target (11a) from an energy beam source, thereby generating an X-ray (20) with an irradiating area to be irradiated onto an object. Then, the X-ray is introduced into a spectrometer (70,41), thereby generating an X-ray with parallelism (40) through the selection of wavelength and wavelength range.
Abstract:
PROBLEM TO BE SOLVED: To obtain a radiation image, which has a contrast obtained under a desired irradiation condition, by taking into consideration not only the irradiation condition of the radiation that irradiates the subject but also the thickness of the subject.SOLUTION: A composition information acquisition unit 82 calculates a mammary gland fat ratio and a first information acquisition unit 84 acquires imaging contrast information which represents the contrast of a radiation image. A second information acquisition unit 86 sets a target irradiation condition of the X-ray and acquires target contrast information which represents the target contrast of the radiation image on the basis of the target irradiation condition. A contrast correction amount determination unit 88 determines the correction amount of the contrast on the basis of the imaging contrast information and the target contrast information. An image processing unit 92 performs image processing, which includes gradation processing on the basis of the determined contrast correction amount, on the radiation image, and a processed radiation image is obtained.
Abstract:
The invention provides an automatic system and method using x-ray inspection to image arrays of electrical interconnections on electronic devices. The electron beam of a rotating anode X-ray tube is deflected relative to the anode to cause emission of x-rays from different regions of the anode at different times. The x-ray tube is located at an inspection station for the electronic devices and disposed to irradiate a first part of the array of interconnections with x-rays emitted from a first region of the anode and to irradiate a further part of the array of interconnections with x-rays emitted from another region of the anode. X-rays emerging from the array of interconnections are detected and used to image part at least of the array in order to automatically register interconnection integrity failures and/or detect a performance trend in the formation of the connections. Typically, the arrays of electrical interconnections are established between a ball grid array on the underside of an electronics package and an array of blobs of solder paste on a printed circuit board.