Abstract:
A photometer adapted to receive light deflected from a microscope observation axis (15) to alternatively provide image or wavelength scanning modes. The photometer comprises an entrance axis (29) for light received from the microscope, a pin hole occluder (12) positioned at one end of the entrance axis (29), a detector axis (27) having a detector (18) at one end thereof, and first and second scanning axes (16, 28) selectively connecting the entrance axis (29). The first scanning axis (16) is provided with a first imaging means (14) positioned thereon for imaging the pin hole occluder (12 near said detector (18). The second scanning axis (28) is provided with monochromator means (32) to reflect a single wavelength of light and a second imaging means for imaging the pin hold occluder (12) near the detector (18). The photometer also includes selector means (26) for connecting a chosen scanning axis (16, 28) to said entrance and detector axes (29, 27). By means of this arrangement image scanning' can be performed when said first scanning axis (16) connects said entrance and detector axes (29, 27), and wavelength scanning can be performed when said second scanning axis (28) connects said entrance and detector axes (29, 27).
Abstract:
A spectrophotometer includes means for ensuring that the active area of a detector is always filled regardless of the resolution aperture setting of the instrument.
Abstract:
A concentration correction system includes an infrared detector and components that produce an aggregate emission of infrared radiation. A mirror assembly includes a mirror and is changeable between a correcting configuration and a measuring configuration. In the correcting configuration, the mirror producesa mirror signal incident on the detector. The mirror assembly also obstructs external body infrared radiation from reaching the detector. In the measuring configuration, the mirror assembly allows the external body infrared radiation onto the detector. A concentration correction method includes receiving external body infrared radiation and simultaneously receiving a first portion of the aggregate emission. A measurement value indicative of concentration is recorded from the detector. A second portion of the aggregate emission reflected with the mirror and produces a mirror signal incident on the detector. A correction value corresponding to the mirror signal is recorded from the detector and used to correct the measurement value.
Abstract:
Die Erfindung betrifft ein verbessertes Spektrometer für die optische Emissionsspektrometrie mit einer Strahlung aussendenden Quelle (11), einem Eintrittsspalt (2), einem Gitter (1), einem Langpassfilter (10), und Detektoren (3, 4, 5, 6), wobei im Betrieb die Strahlung von dem Eintrittsspalt (2) unter einem ersten Einfallswinkel (α1) gegen die Gitternormale (N) auf das Gitter (1) fällt. Das Spektrometer ist dadurch gekennzeichnet, dass - ein erster Spiegel an einer Stelle vorgesehen ist, an der die in nullter Ordnung an dem Gitter reflektierte Strahlung auf den ersten Spiegel fällt, - ein zweiter Spiegel an einer Stelle vorgesehen ist, an der die in nullter Ordnung an dem Gitter reflektierte Strahlung von dem ersten Spiegel auf den zweiten Spiegel fällt, wobei der zweite Spiegel so ausgerichtet ist, dass die an dem zweiten Spiegel reflektierte Strahlung unter einem zweiten Einfallswinkel (α2) auf das Gitter fällt, - wenigstens eine Blende (9) vorgesehen ist, die in den optischen Pfad zwischen dem Gitter, dem ersten Spiegel, dem zweiten Spiegel und dem Gitter zur wahlweisen Unterbrechung dieses Pfades einschaltbar ist, und dass - Mitteln zum Steuern vorgesehen sind, die das Spektrometer steuern, sodass entweder die Blende oder das Filter eingeschaltet sind.
Abstract:
Technologies are described for monitoring characteristics of layers of integrated computational elements (ICEs) during fabrication using an in-situ spectrometer operated in step-scan mode in combination with lock-in or time-gated detection. As part of the step-scan mode, a wavelength selecting element of the spectrometer is discretely scanned to provide spectrally different instances of probe-light, such that each of the spectrally different instances of the probe-light is provided for a finite time interval. Additionally, an instance of the probe-light interacted during the finite time interval with the ICE layers includes a modulation that is being detected by the lock-in or time-gated detection over the finite time interval.
Abstract:
Ein Laserspektrometer weist eine wellenlängendurchstimmbare Laserdiode (4) und eine Kollimatorlinse (12) auf, die das divergente Licht (3) der Laserdiode (4) zu einem parallelen Lichtbündel (13) formt, um damit ein Messgas zu durchstrahlen, anschließend die Lichtintensität zu detektieren und die Konzentration einer interessierenden Gaskomponente des Messgases anhand der Minderung der Lichtintensität durch die Absorption des Lichts (3) an der Stelle einer ausgewählten Absorptionslinie der Gaskomponente zu bestimmen. Um eine Unterdrückung von Interferenzmustern mit konstruktiv einfachen und präzise arbeitenden Mitteln zu erreichen, ist ein MEMS- (Micro Electro Mechanical System-) Spiegel (17) vorhanden, der das Licht (3) der Laserdiode (4) auf die Kollimatorlinse (12) lenkt und von einer Steuereinrichtung (18) zu oszillierenden Kippbewegungen (19) angeregt wird, so dass das von dem MEMS-Spiegel (12) reflektierte Licht (3) auf unterschiedliche Bereiche der Kollimatorlinse (12) trifft.
Abstract:
The present invention generally pertains to a system, method and kit for the detection and measurement of spectroscopic properties of light from a sample, or the scalable detection and measurement of spectroscopic properties of light from each sample present among multiple samples, simultaneously, wherein the system comprises: an optical train comprising a dispersing element; and an image sensor. The light detected and measured may comprise light scattered from a sample, emitted as chemiluminescence by a chemical process within a sample, selectively absorbed by a sample, or emitted as fluorescence from a sample following excitation.
Abstract:
A method and an apparatus for carrying out a chemical-physical analysis, such as a spectroscopic analysis, an absorption analysis, a scattering analysis, etc. on one or more regions of a sample (11 ), provides prearranging a source (1 ) of a first electromagnetic radiation comprising a plurality of components with respective wavelength, prearranging a plurality of sites (9) distributed on a determined surface to emit the first radiation, arranging such surface facing a corresponding region of a sample (11 ) such that the whole surface thereof is attained by the first radiation, emitting the first radiation on the sample (11) thus causing the emission of a second radiation by the sample (11 ), which is analysed to associate an intensity of the second radiation to each region and wavelength. For each of the wavelength of the first radiation, a wavelength code is selected by which respective components of the first radiation are coded; the coded components are joined together to form the first electromagnetic radiation which is distributed in a plurality of radiation beams. Such beams are conveyed to respective emission sites (9), for each of which an emission site (9) code is selected, a radiation beam being codified by said code. A decoding of the of the second radiation produces a plurality of fractions, each fraction associated to a wavelength of the first radiation such that for each emission site (9) it is possible to instantaneously compare each fraction associated to a respective wavelength with a component of the first radiation having the same wavelength, the components of the first electromagnetic radiation being emitted simultaneously. The steps of wavelength coding and of site coding, and possibly also other coding steps may be earned out subsequently with respect to one another, or at the same time. The method and the apparatus allow reducing the time required to carry out said analysis.
Abstract:
A method and an apparatus for carrying out a chemical-physical analysis, such as a spectroscopic analysis, an absorption analysis, a scattering analysis, etc. on one or more regions of a sample (11 ), provides prearranging a source (1 ) of a first electromagnetic radiation comprising a plurality of components with respective wavelength, prearranging a plurality of sites (9) distributed on a determined surface to emit the first radiation, arranging such surface facing a corresponding region of a sample (11 ) such that the whole surface thereof is attained by the first radiation, emitting the first radiation on the sample (11) thus causing the emission of a second radiation by the sample (11 ), which is analysed to associate an intensity of the second radiation to each region and wavelength. For each of the wavelength of the first radiation, a wavelength code is selected by which respective components of the first radiation are coded; the coded components are joined together to form the first electromagnetic radiation which is distributed in a plurality of radiation beams. Such beams are conveyed to respective emission sites (9), for each of which an emission site (9) code is selected, a radiation beam being codified by said code. A decoding of the of the second radiation produces a plurality of fractions, each fraction associated to a wavelength of the first radiation such that for each emission site (9) it is possible to instantaneously compare each fraction associated to a respective wavelength with a component of the first radiation having the same wavelength, the components of the first electromagnetic radiation being emitted simultaneously. The steps of wavelength coding and of site coding, and possibly also other coding steps may be earned out subsequently with respect to one another, or at the same time. The method and the apparatus allow reducing the time required to carry out said analysis.