Abstract:
PROBLEM TO BE SOLVED: To identify and quantitatively determine an atom of a solid element contained in sludge, waste fluid, and soil. SOLUTION: The atomic analyzing apparatus comprises a plasma generating device 10 for generating non-equilibrium atmospheric pressure plasma by making discharge gas between a pair of micro-electrodes, a plasma induction electrode 21 that has an irradiation object 22 for radiating the non-equilibrium atmospheric pressure plasma and guides the non-equilibrium atmospheric pressure plasma generated by a plasma generating device to the irradiation object, a bias voltage applying device for applying bias voltage between the electrode of the plasma generating device and the plasma induction electrode and irradiating the irradiation object with the non-equilibrium atmospheric pressure plasma, and a spectrometer for atomizing material constituting the irradiation object by irradiation of the non-equilibrium atmospheric pressure plasma and analyzing the atom by light absorption. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
A spectroscopic measurement apparatus 1A comprises an integrating sphere 20 in which a sample S is located, a spectroscopic analyzer 30 dispersing the light to be measured from the sample S and obtaining a wavelength spectrum, and a data analyzer 50. The analyzer 50 includes an object range setting section which sets a first object range corresponding to excitation light and a second object range corresponding to light emission from the sample S in a wavelength spectrum, and a sample information analyzing section which determines a luminescence quantum yield of the sample S, determines a measurement value ¦ 0 of the luminescence quantum yield from results of a reference measurement and a sample measurement, and determines, by using factors ², ³ regarding stray light in the reference measurement, an analysis value ¦ of the luminescence quantum yield with the effect of stray light reduced by ¦ = ²¦ 0 +³. This realizes a spectroscopic measurement apparatus, a measurement method, and a measurement program which can reduce the effect of stray light generated in a spectrometer.
Abstract:
An electrolysis device (1) comprising a cell (10) containing a solution (60), a pair of electrodes installed in the cell (10), and a voltage application device (50) connected to the pair of electrodes. One electrode of the pair of electrodes is a smaller electrode (20), and another electrode of the pair of electroeds is a larger electrode (30). An area of a liquid-contacting portion (21) of the smaller electrode (20) with the solution (60) is smaller than an area of a liquid-contacting portion of the larger electrode (30) with the solution (60). In a state in which the solution (60) is contained in the cell (10), only the solution (60) is present between the liquid-contacting portion (21) of the smaller electrode (20) and a liquid surface (61) of the solution (60) vertically above the liquid-contacting portion (21) of the smaller electrode (20).
Abstract:
1.- A system (1) for analysing the chemical composition of a target material (100) comprising: [a] a laser system (2) [b] at least one scanner assembly for directing said laser beam (4) onto said target material (100) to produce luminous plasma on said target material (100) and to collect the light emitted thereafter, and [c] a spectral analyser (10). The scanner assembly further comprises at least [d] first light redirecting means (12) being configured such as to let the light pass therethrough when the light falls on one first side (14) of said first light redirecting means (12) and to redirect at least part of the light when the light falls on a second opposite side (16) opposite. Said first light redirecting means (12) are arranged in the system (1) to gather said light emitted by said plasma, collinearly with the laser beam directed onto said target material (100) and to redirect said light emitted by said plasma onto said first focusing means (6).
Abstract:
The wide-angle emission filter includes a base matrix, a photoresist, and a colorant. The base matrix has a flat shape and including a transparent material. The base matrix does not generate fluorescent light or phosphorescent light by an excitation light. The photoresist is disposed in the base matrix. The photoresist is fixed in a solid state through at least one method selected from the group consisting of thermal hardening, photo hardening, and drying. The colorant is disposed in the base matrix and includes light having a predetermined wavelength range. The wide-angle emission filter filters the excitation light regardless of an incident angle of the excitation light.
Abstract:
The quantitative analysis method for analyzing the composition of materials of the invention is based on a functional relationship (curve Cσ) between line intensity and the concentration of the element in the material. The method comprises: obtaining characteristic parameters, selecting the spectral lines of neutral atoms and ions of the elements of interest, obtaining their atomic data; calculating, for the selected lines, a line crosssection; measuring line intensities; determining the concentrations of the elements of interest by means of fitting two graphs Cσ, one for neutral atoms and another for ions with a unit charge, the fitting being performed by means of an iterative algorithm which compares the experimental graphs with the curves Cσ calculated with a plasma model; calculating, for the data of the graphs Cσ, the product of line optical depth by Lorentzian width; evaluating, for the data of the graphs Cσ, a condition on the validity limit of the model, the datum for which the mentioned product is greater being eliminated if the condition is not complied with; repeating the three preceding steps until all data comply with the mentioned condition. The invention has the advantage of not requiring prior calibrations.