公开(公告)号：KR100336696B1

公开(公告)日：2002-05-13

申请号：KR1019990055885

申请日：1999-12-08

Applicant: (주)파이버프로

Inventor： 정호진 ,  이봉완

IPC: G01J4/00

CPC classification number: G01J4/04

Abstract: 본발명은빛의편광상태를측정하는장치및 그측정방법에관한것으로서, 상기장치는서로다른주파수로회전하는위상지연판과편광기를포함하여이루어진다. 본발명의방법은위상지연판과편광기를통과한광신호를검출하여여러주파수성분을분석하여편광상태를나타내는스톡스파라미터를구하는것을특징으로한다. 본발명에따르면, 위상지연판에서의위상지연량을주파수성분분석을통해편광상태와동시에분석할수 있으므로이로인한오차를줄일수 있을뿐 아니라넓은파장영역에서도사용할수 있다는장점을갖는다.

公开(公告)号：EP4394461A1

公开(公告)日：2024-07-03

申请号：EP23000001.0

申请日：2023-01-01

Applicant: POLDI microelectronics GmbH

Inventor： Grau, Günter

IPC: G02B5/30 ,  G01D5/34

CPC classification number: G01J4/04 ,  G02B5/3025

Abstract: Die Erfindung betrifft eine integrierte Schaltung zur Messung der Polarisation von Licht mit polarisationsempfindlichen Sensoren mit unterschiedlichen Ausrichtungen der Polarisationsebenen als Grundelemente in vorzugsweise vier unterschiedlichen Ausrichtungen (1,2,3,4), mit sensorischen Elementen, die je mit einem Polarisationsfilter zu einem der polarisationsempfindlichen Sensoren als bauliche Einheit zusammenwirkend angeordnet sind, wobei das polarisationsempfindliche Filter des als bauliche Einheit angeordneten polarisations-empfindlichen Sensors eine gezielte Ausdehnung und Orientierung aufweist, wobei das Polarisationsfilter mit lithographischen Methoden erzeugte Gitterstrukturen in mindestens einer Fertigungsebene aufweist, wobei die polarisationsempfindlichen Sensoren unterschiedlicher Ausrichtung aus einer Vielzahl von einzelnen Sensorelementen bestehen, die in einer Matrix angeordnet sind, wobei in der integrierten Schaltung Einrichtungen vorhanden sind, die konfiguriert sind, aus den Signalen der polarisationsempfindlichen Sensoren eine Aussage über die Polarisation des einfallenden Lichts zu treffen, wobei die Grundelemente mit unterschiedlichen Ausrichtungen (1,2,3,4) in einer 8x8-Matrix angeordnet sind, wobei die Grundelemente in der ersten Zeile der 8x8-Matrix die Anordnung [1,2,3,4,2,1,4,3], der zweiten Zeile der 8x8-Matrix die Anordnung [4,3,2,1,3,4,1,2], der dritten Zeile der 8x8-Matrix die Anordnung [3,4,1,2,4,3,2,1], der vierten Zeile der 8×8-Matrix die Anordnung [2,1,4,3,1,2,3,4], der fünften Zeile der 8x8-Matrix die Anordnung [4,3,2,1,3,4,1,2], der sechsten Zeile der 8x8-Matrix die Anordnung [1,2,3,4,2,1,4,3], der siebten Zeile der 8x8-Matrix die Anordnung [2,1,4,3,1,2,3,4] und der achten Zeile der 8x8-Matrix die Anordnung [3,4,1,2,4,3,2,1] aufweisen.

公开(公告)号：EP4392760A1

公开(公告)日：2024-07-03

申请号：EP22772428.3

申请日：2022-08-25

Applicant: Université de Strasbourg ,  Centre National de la Recherche Scientifique

Inventor： ZALLAT, Jihad ,  HEINRICH, Christian

IPC: G01N21/21

CPC classification number: G01N21/21 ,  G01N2201/022120130101 ,  G01J4/04 ,  G01J4/02

公开(公告)号：EP3410185A1

公开(公告)日：2018-12-05

申请号：EP18159036.5

申请日：2018-02-28

Applicant: Samsung Electronics Co., Ltd. ,  International Center for Quantum Optics & Quantum Technologies Limited liability company

Inventor： KOPTYAEV, Sergey Nikolaevich ,  LIHACHEV, Grigoriy Vasil'evich ,  PAVLOV, Nikolay Genad'evich ,  SHCHEKIN, Alexey Andreevich ,  BILENKO, Igor Antonovich ,  RIABKO, Maxim Vladimirovich ,  GORODETSKY, Mikhael Leonidovich ,  POLONSKY, Stanislav Vladimirovich ,  VOLOSHIN, Andrey Sergeevich ,  LANTSOV, Alexey Dmitrievich ,  MEDVEDEV, Anton Sergeevich ,  LOBANOV, Valery Evgenievich

IPC: G02F1/35 ,  H01S3/00

CPC classification number: H01S3/108 ,  G01J3/453 ,  G01J4/04 ,  G01N21/21 ,  G02F1/35 ,  G02F2203/15 ,  G02F2203/56 ,  H01S3/005 ,  H01S3/083 ,  H01S3/105

Abstract: Provided is an optical source apparatus that may generate two different optical frequency combs. The optical source apparatus includes an optical resonator and a continuous wave laser emitting laser light having a spectrum component corresponding to a resonance frequency of the optical resonator, and the optical resonator is configured to generate a first frequency comb and a second frequency comb having different modes by interacting with the laser light emitted by the continuous wave laser.

公开(公告)号：EP3191817A4

公开(公告)日：2018-07-25

申请号：EP15840079

申请日：2015-09-11

Applicant: ROSEMOUNT ANALYTICAL INC

Inventor： BUTCHER BRADLEY A ,  NGUYEN HOANG MINH ,  FENG CHANG-DONG

IPC: G01N33/18 ,  G01N21/27 ,  G01N21/78 ,  G01N31/22

CPC classification number: G01N33/18 ,  G01J4/04 ,  G01N1/4077 ,  G01N21/01 ,  G01N21/11 ,  G01N21/21 ,  G01N21/3103 ,  G01N21/78 ,  G01N31/02 ,  G01N31/22 ,  G01N2201/0612 ,  G01N2201/062 ,  G01N2201/127

Abstract: A wet chemistry analyzer is provided. The wet chemistry analyzer comprises a reaction chamber configured to receive a reactant solution from a sample inlet and facilitate a process reaction. The wet chemistry analyzer also includes a detection chamber configured to receive a portion of a reaction mixture from the reaction chamber and measure a concentration of a chemical within the reaction mixture. The reaction chamber and the detection chamber are fluidically coupleable such that a portion of the reaction mixture can be directed to flow into the detection chamber to pre-condition a surface inside the detection chamber.

公开(公告)号：EP3152536A4

公开(公告)日：2018-05-23

申请号：EP15803319

申请日：2015-01-20

Applicant: J A WOOLLAM CO INC

Inventor： LIPHARDT MARTIN M ,  HALE JEFFREY S ,  HE PING ,  PFEIFFER GALEN L

IPC: G01J4/00

CPC classification number: G02B17/0621 ,  G01J1/0411 ,  G01J1/0414 ,  G01J4/00 ,  G01J4/04 ,  G01N21/21 ,  G02B19/0023 ,  G02B19/0076 ,  G02B27/0012 ,  G02B27/286

Abstract: A reflective optics system that preferably requires the presence of both convex and a concave mirrors that have beam reflecting surfaces, the application of which achieves focusing of a beam of electromagnetic radiation onto a sample, (which can be along a locus differing from that of an input beam), with minimized effects on a polarization state of an input beam state of polarization based on adjusted angles of incidence and reflections from the various mirrors involved.

公开(公告)号：EP3243054A2

公开(公告)日：2017-11-15

申请号：EP16704953.5

申请日：2016-01-08

Applicant: Apple Inc.

Inventor： KANGAS, Miikka M. ,  BISHOP, Michael J. ,  CHEN, Robert ,  SIMON, David I. ,  SONTAG III, Harold L. ,  SKIDMORE, George Dee

IPC: G01J5/08 ,  G01J5/02 ,  G01J5/20

CPC classification number: G01J5/0825 ,  G01J4/04 ,  G01J5/0225 ,  G01J5/0846 ,  G01J5/0853 ,  G01J5/20 ,  G01J2005/202

Abstract: This relates to sensor systems, detectors, imagers, and readout integrated circuits (ROICs) configured to selectively detect one or more frequencies or polarizations of light, capable of operating with a wide dynamic range, or any combination thereof. In some examples, the detector can include one or more light absorbers; the patterns and/or properties of a light absorber can be configured based on the desired measurement wavelength range and/or polarization direction. In some examples, the detector can comprise a plurality of at least partially overlapping light absorbers for enhanced dynamic range detection. In some examples, the detector can be capable of electrostatic tuning for one or more flux levels by varying the response time or sensitivity to account for various flux levels. In some examples, the ROIC can be capable of dynamically adjusting at least one of the frame rate integrating capacitance, and power of the illumination source.

公开(公告)号：EP2982950A1

公开(公告)日：2016-02-10

申请号：EP14180354.4

申请日：2014-08-08

Applicant: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE -CNRS- ,  Université de Strasbourg

Inventor： Bowen, Martin ,  Halisdemir, Ufuk ,  Schleicher, Filip ,  Boukari, Samy ,  Beaurepaire, Eric

IPC: G01J4/00 ,  B82Y25/00

CPC classification number: G01J4/04

Abstract: According to an aspect of the invention, it is provided a process of detection of light comprising:
- a step of flowing an electric current through at least a first dielectric junction, said first dielectric junction comprising at least a first metallic layer extending along a first reference plane and a second metallic layer extending parallel to said first reference plane, said first and second metallic layers being separated from each other by a dielectric layer ensuring non-ohmic conduction between said first and second metallic layers;
- a step of measuring the electric resistance of the first dielectric junction;
- a step of determining the presence or the absence of light by using the measured electric resistance of the first dielectric junction.
According to another aspect of the invention, it is provided a process of characterization of the degree to which detected light is polarized along a first spatial direction and/or along a second spatial direction and/or along a third spatial direction, using a device at the nanometre scale. This enables the detection of the orientation of the incoming light.

Abstract translation: 根据本发明的一个方面，提供了一种检测光的方法，包括： - 使电流流过至少第一电介质结的步骤，所述第一介电结至少包括沿第一电介质延伸的第一金属层 参考平面和平行于所述第一参考平面延伸的第二金属层，所述第一和第二金属层通过介电层彼此分开，确保所述第一和第二金属层之间的非欧姆导电; - 测量第一电介质结的电阻的步骤; - 通过使用所测量的第一电介质结的电阻来确定存在或不存在光的步骤。 根据本发明的另一方面，提供了一种表征检测光沿着第一空间方向和/或沿着第二空间方向和/或沿着第三空间方向被偏振的程度的过程，该方法使用在 纳米级。 这使得能够检测入射光的取向。

公开(公告)号：EP2972525A1

公开(公告)日：2016-01-20

申请号：EP14765545.0

申请日：2014-03-17

Applicant: POLARIS SENSOR TECHNOLOGIES, INC.

Inventor： PEZZANITI, Joseph Larry ,  VADEN, Justin Parker ,  ROCHE, Michael Ernest

IPC: G02B5/30 ,  G01J5/58

CPC classification number: G01J5/58 ,  G01J4/04 ,  G01J5/10 ,  G01J2004/001 ,  G01J2005/0077 ,  G01J2005/586 ,  G02B5/3058 ,  H04N5/33

Abstract: A long wave infrared imaging polarimeter (LWIP) is disclosed including a pixilated polarizing array (PPA) in close proximity to a microbolometer focal plane array (MFPA), along with an alignment engine for aligning and bonding the PPA and MFPA and method for assembly.

Abstract translation: 公开了一种长波红外成像偏振计（LWIP），其包括紧邻微测热计焦平面阵列（MFPA）的像素化偏振阵列（PPA）以及用于对准和结合PPA和MFPA的对准引擎以及组装方法。

公开(公告)号：EP2877822A1

公开(公告)日：2015-06-03

申请号：EP13756601.4

申请日：2013-07-25

Applicant: Horiba Jobin Yvon S.A.S.

Inventor： ACHER, Olivier ,  RICHARD, Simon ,  NGUYEN, Thanh-Liem

IPC: G01J4/02 ,  G01J4/04

CPC classification number: G01J4/02 ,  G01J4/04

Abstract: The invention relates to an accurate and robust wavefront-division polarimetric analysis device, allowing the quasi-instantaneous measurement of the polarisation states of a luminous object. The wavefront-division polarimetric analysis device of the invention can be used to produce a plurality of light beams, all polarised according to different polarisation states, from a single upstream light beam. The polarised light beams, which do not overlap and which carry information items that are complementary in terms of polarisation, are analysed simultaneously by a plurality of detectors that measure the luminous intensity of each beam. Processing means digitally process the luminous intensity values obtained in order to determine the polarisation state of the upstream light beam. According to the invention, the operations performed by the processing means on the luminous intensity values prevent luminous intensity variations in the divided light beams during the division of the wavefront of the upstream light beam. Therefore the wavefront-division polarimetric analysis device of the invention is robust and its accuracy is not hindered by the experimental conditions. The invention further relates to a wavefront-division polarimetric analysis method for determining the polarisation state of an upstream light beam.