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    Spectrometer having inlet slit, and manufacturing of inlet slit
    302.
    发明专利
    Spectrometer having inlet slit, and manufacturing of inlet slit 审中-公开
    具有入口切屑的光谱仪，以及进样口的制造

    公开(公告)号：JP2009080115A

    公开(公告)日：2009-04-16

    申请号：JP2008245782

    申请日：2008-09-25

    Applicant: Carl Zeiss Microimaging Gmbh ,  カール ツァイス マイクロイメージング ゲーエムベーハーCarl Zeiss MicroImaging GmbH

    Inventor： HOFMANN JENS ,  CORRENS NICO ,  FREITAG LUTZ ,  KERSTAN FELIX ,  JOCHMANN DORIS ,  ZIENER CARSTEN ,  FOERSCHLER GERHARD

    IPC: G01J3/04

    CPC classification number: G01J3/02 ,  G01J3/0202 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/18

    Abstract: PROBLEM TO BE SOLVED: To provide an easy-to-install spectrometer that can be manufactured by an inexpensive method, does not require complicated adjustment, has small spatial dimension, and has an inlet slit, and to provide a manufacturing method of the inlet slit.
    SOLUTION: The spectrometer has a housing 1, the inlet slit 4, and a diffraction grating 3 that is arranged in the housing and imaging the measured light to a photoelectron detecting element. The detecting element is arranged in the housing, and the housing and a substrate 2 are interconnected through positioning means 5a, 5b, 5c and 5d that cooperate mutually for specified mutual positioning. Holding means 6a and 6b for receiving and attaching the inlet slit, the positioning means of the substrate, and the detecting element are permanent part of the substrate, and are accurately and appropriately prepared at the specified mutual positions from the substrate by molding technique such as laser beam cutting or fluid jet cutting. At least one of holding means for the positioning means of the substrate and the detecting element is disposed as an elastic element.
    COPYRIGHT: (C)2009,JPO&INPIT

    Abstract translation: 要解决的问题：为了提供可以通过廉价的方法制造的易于安装的光谱仪，不需要复杂的调整，具有小的空间尺寸，并且具有入口狭缝，并且提供一种制造方法 入口狭缝。 解决方案：光谱仪具有壳体1，入口狭缝4和布置在壳体中的衍射光栅3，并将测量的光成像到光电子检测元件。 检测元件布置在壳体中，并且壳体和基板2通过相互配合的定位装置5a，5b，5c和5d相互连接，用于指定的相互定位。 用于接收和附接入口狭缝的保持装置6a和6b，基板的定位装置和检测元件是基板的永久部分，并且通过诸如以下的模制技术从基板通过指定的相互位置准确地和适当地制备 激光束切割或流体射流切割。 将基板的定位装置和检测元件的保持装置中的至少一个设置为弹性元件。 版权所有（C）2009，JPO＆INPIT

    System, method and apparatus for micromachined interferometer using optical splitting
    303.
    发明专利
    System, method and apparatus for micromachined interferometer using optical splitting 有权
    使用光学分割的微型干涉仪的系统，方法和装置

    公开(公告)号：JP2008102132A

    公开(公告)日：2008-05-01

    申请号：JP2007248525

    申请日：2007-09-26

    Applicant: Si-Ware Systems ,  サイ−ウエア・システムズSi−Ware Systems

    Inventor： SAADANY BASSAM AMANALLAH ,  KHALIL DIAA ABDELMAGUID ,  BOUROUINA TARIK ESSIF EDDINE

    IPC: G01B9/02 ,  G01J3/45

    CPC classification number: G01J3/02 ,  G01B9/02051 ,  G01J3/0256 ,  G01J3/4535 ,  G02B26/0841

    Abstract: PROBLEM TO BE SOLVED: To obtain a micromachined interferometer that uses a half plane beam splitter. SOLUTION: The beam splitter is optically coupled so as to receive an incident beam I and operates so as to split the incident beam into two interfering beams L1 and L2 that respectively propagates inside different media. A fixed mirror M2, embedded in one of such media, reflects the interfering beam L2 and returns this interfering beam back toward the half plane beam splitter through a medium; while a movable mirror M1, which is controlled by an actuator, reflects the interfering beam L1 and returns this interfering beam back toward the half plane beam splitter, passing through the other medium. A detection plane D1 or D2 detects the interference pattern, produced as a result of the interference between the reflected interfering beams L3 and L4. COPYRIGHT: (C)2008,JPO&INPIT

    Abstract translation: 要解决的问题：获得使用半平面分束器的微加工干涉仪。 解决方案：光束分离器被光学耦合以便接收入射光束I并且操作以将入射光束分成分别在不同介质内传播的两个干涉光束L1和L2。 嵌入在这种介质之一中的固定镜M2反射干涉光束L2并通过介质将该干涉光束返回到半平面分束器; 而由致动器控制的可移动反射镜M1反射干涉光束L1，并将该干涉光束返回到半平面分束器，通过另一介质。 检测平面D1或D2检测作为反射干涉光束L3和L4之间的干涉而产生的干涉图案。 版权所有（C）2008，JPO＆INPIT

    Endoscope system
    304.
    发明专利
    Endoscope system 审中-公开
    内窥镜系统

    公开(公告)号：JP2008036199A

    公开(公告)日：2008-02-21

    申请号：JP2006215409

    申请日：2006-08-08

    Applicant: Olympus Corp ,  オリンパス株式会社

    Inventor： UEHARA YASUHIRO

    IPC: A61B1/00 ,  A61B1/06 ,  G01N21/64 ,  G02B23/24 ,  G02B23/26 ,  H04N7/18

    CPC classification number: A61B1/05 ,  A61B1/00096 ,  A61B1/00101 ,  A61B1/043 ,  A61B5/0071 ,  A61B5/0084 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/26 ,  G02B23/2423

    Abstract: PROBLEM TO BE SOLVED: To acquire clear observation images by highly precisely controlling spectral characteristics by a variable spectral element disposed at the distal end of a narrow and long insertion section of an endoscope.
    SOLUTION: This endoscope system having at least one portion inserted in the body cavity of a living body and acquiring images of an imaging object A in the body cavity, comprises the variable spectral element 13 disposed at the distal end of the portion to be inserted into the body cavity and varying the spectral characteristics by a change of an interval of two optical members 13a and 13b facing each other at some interval apart, an actuator 13c changing the interval between the two optical members 13a and 13b according to a driving signal to be input, a sensor 16 detecting the interval between the two optical members 13a and 13b, and an electric circuit 17 input with the output of the sensor 16, including an active element and outputting an electric signal corresponding to the output of the sensor.
    COPYRIGHT: (C)2008,JPO&INPIT

    Abstract translation: 要解决的问题：通过设置在内窥镜的狭窄和长的插入部分的远端处的可变光谱元件高度精确地控制光谱特性来获取清晰的观察图像。 解决方案：该内窥镜系统具有插入生物体的体腔中的至少一部分并且获取体腔内的成像物体A的图像，该可变光谱元件13设置在该部分的远端 插入到体腔中并且通过以相隔一定间隔彼此面对的两个光学构件13a和13b的间隔的变化来改变光谱特性，致动器13c根据驾驶改变两个光学构件13a和13b之间的间隔 信号被输入，检测两个光学构件13a和13b之间的间隔的传感器16以及与传感器16的输出一起输入的电路17，包括有源元件并输出与传感器的输出对应的电信号 。 版权所有（C）2008，JPO＆INPIT

    Compensation for target distance fluctuation in spectrophotometer
    307.
    发明专利
    Compensation for target distance fluctuation in spectrophotometer 审中-公开
    在分光光度计中的目标距离波动补偿

    公开(公告)号：JP2007057529A

    公开(公告)日：2007-03-08

    申请号：JP2006222433

    申请日：2006-08-17

    Applicant: Xerox Corp ,  ゼロックス コーポレイションXerox Corporation

    Inventor： MESTHA LALIT K ,  LOVE TONYA L ,  PAUL PETER ,  FILLION CLAUDE S

    IPC: G01J3/02 ,  G01J3/50

    CPC classification number: G01J3/50 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/0278 ,  G01J3/501 ,  G01J3/524

    Abstract: PROBLEM TO BE SOLVED: To provide a color spectrophotometer system for measuring accurately and stably a target spectral reflectance. SOLUTION: This color spectrophotometer system having a target surface provided with a fluctuating spacing from the color spectrophotometer system further includes: a color correction and calibration system for providing color correction and calibration information corresponding to a color measuring error in a color spectrophotometer with respect to the known fluctuating spacing of the target surface from the color spectrophotometer; and a target distance measuring system for measuring the fluctuating spacing of the target surface from the color spectrophotometer to provide a target area spacing information signal. The target area spacing information signal is automatically combined with the color correction and calibration information from the color correction and calibration system, to correct the color measuring error in the color spectrophotometer with respect to the fluctuating spacing of the target surface from the color spectrophotometer. COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题：提供一种用于准确和稳定地测量目标光谱反射率的彩色分光光度计系统。 ＆lt; P＆gt;解决方案：具有与彩色分光光度计系统间隔一定距离的目标表面的该彩色分光光度计系统还包括：颜色校正和校准系统，用于在彩色分光光度计中提供与色彩测量误差相对应的颜色校正和校准信息， 相对于来自彩色分光光度计的目标表面的已知波动间隔; 以及目标距离测量系统，用于测量目标表面与彩色分光光度计的波动间隔，以提供目标区域间隔信息信号。 目标区域间隔信息信号与来自颜色校正和校准系统的颜色校正和校准信息自动组合，以便根据彩色分光光度计相对于目标表面的波动间隔校正彩色分光光度计中的颜色测量误差。 版权所有（C）2007，JPO＆INPIT

    Mechanically adjustable full-width array type spectrophotometer
    308.
    发明专利
    Mechanically adjustable full-width array type spectrophotometer 审中-公开
    机械可调整全宽阵列式分光光度计

    公开(公告)号：JP2006177954A

    公开(公告)日：2006-07-06

    申请号：JP2005363203

    申请日：2005-12-16

    Applicant: Xerox Corp ,  ゼロックス コーポレイションXerox Corporation

    Inventor： MESTHA LALIT K ,  WANG YAO RONG ,  KUBBY JOEL A

    IPC: G01J3/26

    CPC classification number: G01N21/255 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0256 ,  G01J3/26

    Abstract: PROBLEM TO BE SOLVED: To conduct color measurements at a high speed and with high accuracy. SOLUTION: Light from an irradiation unit 14 is irradiated on a material component 12, and reflected light is provided to a spectrum photometry sensor assembly 18 via a light-focusing unit 16. The spectrum photometry sensor assembly 18 spectroscopically analyzes the reflected light from the material component 12. The wavelength in the spectroscopic analysis is set variable. COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题：以高速和高精度进行颜色测量。 解决方案：来自照射单元14的光照射在材料成分12上，并且经由光聚焦单元16将反射光提供给光谱测光传感器组件18.光谱测光传感器组件18对反射光进行光谱分析 光谱分析中的波长是可变的。 版权所有（C）2006，JPO＆NCIPI

    Photodetector and spectrometer using it
    310.
    发明专利
    Photodetector and spectrometer using it 有权

    公开(公告)号：JP2004354176A

    公开(公告)日：2004-12-16

    申请号：JP2003151415

    申请日：2003-05-28

    Applicant: Hamamatsu Photonics Kk ,  浜松ホトニクス株式会社

    Inventor： TEICHMANN HELMUT ,  HILLER DIETMAR ,  STARKER ULRICH

    IPC: G01J3/18 ,  G01J3/28

    CPC classification number: G01J3/2803 ,  G01J3/0256 ,  G01J3/0262 ,  G01J3/0291

    Abstract: PROBLEM TO BE SOLVED: To provide a photodetector capable of precisely positioning of a constitutional element when applied to a spectrometer, and to provide the spectrometer using it.
    SOLUTION: The spectrometer is constituted of a photodetector 1B which is provided with a photodiode array 11 of a plurality of photodiodes 12 disposed on the upper surface 10a of the semiconductor substrate 10, and a light incident part 13 formed as an opening keeping a prescribed positional relation to the photodiode array 11, a main part 2 composed of the tabular part 20, and supports 21 and 22 placed on the substrate 10. A lens 23 provided on the under face 20b of the tabular part 20, and a planar aberration-reduced blazed reflection diffraction grating 24 separate the light incident from the light incident part 13 and passed through the lens 23 into the spectral components. The separated light spectral components are detected by the photodiode array 11.
    COPYRIGHT: (C)2005,JPO&NCIPI

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