Abstract:
A spectrometer (100) for characterizing a radiation beam, the spectrometer (100) comprising an optical radiation guiding system comprising a collimator (110) for collimating the radiation beam into a collimated radiation beam, and a beam shaper (120) for distributing the power of the collimated radiation beam over a discrete number of line shaped fields, and a spectrometer chip (130) wherein the spectrometer chip (130) is adapted for processing the radiation in a discrete number of line shaped fields coming from the beam shaper (120).
Abstract:
Portable spectrophotometer and method for characterizing solar collector tubes for simultaneously and on-field characterizing reflection and transmission coefficients. This device includes all the components needed to take this measurement, such as a module that takes the measurement of the reflection coefficient (R) of the inner tube (1'), a module that takes the measurement of transmission coefficient (T) of the outer tube (1"), an electronic data acquisition and processing system (12), an external computer (13) for controlling the device and sending the measured data (17) and a communication system (15) between device and the computer (13).
Abstract:
MIR spectroscopy systems comprising hierarchical spectral dispersion that enables fine spectral resolution and high sensitivity spectroscopy are disclosed. Hierarchical spectral dispersion is derived by employing at least two diffractive lens arrays, located on either side of a test sample, each receiving input radiation having an input spectral range and distributing the input radiation into a plurality of output signals, each having a fraction of the spectral range of the input radiation. As a result, the signal multiplication factor of the two arrays is multiplied in a manner that mitigates the propagation of wavelength harmonics through the system. In some embodiments, an emitter array comprising a plurality of spectrally selective emitters provides the input MIR radiation to a spectroscopy system. In some embodiments, spectrally selective detectors are used to detect narrow spectral components in the radiation after they have passed through the test sample.
Abstract:
A spectrophotometer optics system is provided. The spectrophotometer optics system includes an optical sensing array and an optical waveguide including an input side and an output side. The input side of the optical waveguide receives input light and the optical sensing array is located at the output side of optical waveguide. The optical waveguide is configured to carry light to be analyzed by total internal reflection to the output side of the optical waveguide and to direct the light to be analyzed toward the optical sensing array. The spectrophotometer optics system includes an optical dispersive element configured to separate the light to be analyzed into separate wavelength components, and the optical dispersive element is supported by the optical waveguide.
Abstract:
A spectrometer 1A includes spectroscopic units 2A, 2B, and 2C. A light passing part 21A, a reflection part 11A, a common reflection part 12, a dispersive part 40A, and a light detection part 22A included in the spectroscopic unit 2A are arranged along a reference line RL1 when viewed in a Z-axis direction. A light passing part 21B, a reflection part 11B, the common reflection part 12, a dispersive part 40B, and a light detection part 22B included in the spectroscopic unit 2B are arranged along a reference line RL2 when viewed in the Z-axis direction. A light passing part 21C, a reflection part 11C, the common reflection part 12, a dispersive part 40C, and a light detection part 22C included in the spectroscopic unit 2C are arranged along a reference line RL3 when viewed in the Z-axis direction. The reference line RL1, the reference line RL2, and the reference line RL3 intersect with one another.
Abstract:
A spectrometer 1A includes a light detection element 20 provided with a light passing part 21, a first light detection part 22, and a second light detection part 26, a support 30 fixed to the light detection element 20 such that a space S is formed, a first reflection part 11 provided in the support 30 and configured to reflect light L1 passing through the light passing part 21 in the space S, a second reflection part 12A provided in the light detection element 20 and configured to reflect the light L1 reflected by the first reflection part 11 in the space S, and a dispersive part 40A provided in the support 30 and configured to disperse and reflect the light L1 reflected by the second reflection part 12A to the first light detection part 22 in the space S. A plurality of second light detection parts 26 is disposed in a region surrounding the second reflection part 12A.
Abstract:
In a spectroscopic module 1, a flange 7 is formed integrally with a diffraction layer 6 along a periphery thereof so as to become thicker than the diffraction layer 6. As a consequence, at the time of releasing a master mold used for forming the diffraction layer 6 and flange 7, the diffraction layer 6 formed along a convex curved surface 3a of a main unit 3 can be prevented from peeling off from the curved surface 3 a together with the master mold. A diffraction grating pattern 9 is formed so as to be eccentric with respect to the center of the diffraction layer 6 toward a predetermined side. Therefore, releasing the mold earlier from the opposite side of the diffraction layer 6 than the predetermined side thereof can prevent the diffraction layer 6 from peeling off and the diffraction grating pattern 9 from being damaged.