Abstract:
An apparatus and method are provided. In particular, at least one first electro-magnetic radiation may be provided to a sample and at least one second electro-magnetic radiation can be provided to a non-reflective reference. A frequency of the first and/or second radiations varies over time. An interference is detected between at least one third radiation associated with the first radiation and at least one fourth radiation associated with the second radiation. Alternatively, the first electro-magnetic radiation and/or second electro-magnetic radiation have a spectrum which changes over time. The spectrum may contain multiple frequencies at a particular time. In addition, it is possible to detect the interference signal between the third radiation and the fourth radiation in a first polarization state. Further, it may be preferable to detect a further interference signal between the third and fourth radiations in a second polarization state which is different from the first polarization state. The first and/or second electro-magnetic radiations may have a spectrum whose mean frequency changes substantially continuously over time at a tuning speed that is greater than 100 Tera Hertz per millisecond.
Abstract:
Infrared radiation device and production method, capable of preventing electrode degradation by heat are provided. Infrared radiation device (1) includes substrate (11), insulation layer (12), heat generating layer (13), electrode (15), foundation portion (17) and electric conductor (16). Substrate (11) has cavity (110) exposing part of back surface of insulation layer (12). Foundation portion (17) exists on inside and outside of vertical projection area (projection direction of which is along thickness direction of insulation layer (12)) of opening edge, on surface of substrate (11), of cavity (110). Electric conductor (16) is provided on surface of foundation portion (17). End of heat generating layer (13) is provided as covering (18) covering electric conductor (16). Electrode (15) is in contact with surface of covering (18) outside vertical projection area. Conductor (16) has higher melting point than that of electrode (15) and smaller electrical resistance than those of portion (17) and layer (13).
Abstract:
A gas absorption spectroscopy system and method are provided. A sealed chamber is provided with a reference gas having a known moisture concentration. An illumination source (112) is disposed in the sealed chamber and is configured to generate an illumination beam. A measurement cell (104) is coupled to the sealed chamber and is configured for exposure to a gas sample (106) such that illumination (118) travelling through the measurement cell (104) passes through the gas sample (106). A process window (116) is disposed between the sealed chamber and the measurement cell (104). The process window (116) is configured to receive the illumination beam from the illumination source (112) and reflect a first portion (128) of illumination while allowing a second portion (118) of illumination to pass into the measurement cell (104). A reference detector (110) is disposed to receive the first portion (128) of illumination and provide a reference detector signal. A measurement detector (108) is disposed to receive the second portion (124) of illumination after the second portion of illumination has passed through the measurement cell (104) and provide a measurement detector signal. A controller (105) is coupled to the reference detector (110) and the measurement detector (108) and is configured to provide a compensated moisture output based on the reference detector signal and the measurement detector signal.
Abstract:
An apparatus and method are provided. In particular, at least one first electro-magnetic radiation may be provided to a sample and at least one second electro-magnetic radiation can be provided to a non-reflective reference. A frequency of the first and/or second radiations varies over time. An interference is detected between at least one third radiation associated with the first radiation and at least one fourth radiation associated with the second radiation. Alternatively, the first electro-magnetic radiation and/or second electro-magnetic radiation have a spectrum which changes over time. The spectrum may contain multiple frequencies at a particular time. In addition, it is possible to detect the interference signal between the third radiation and the fourth radiation in a first polarization state. Further, it may be preferable to detect a further interference signal between the third and fourth radiations in a second polarization state which is different from the first polarization state. The first and/or second electro-magnetic radiations may have a spectrum whose mean frequency changes substantially continuously over time at a tuning speed that is greater than 100 Tera Hertz per millisecond.
Abstract:
Described herein are optical sensing devices for photonic integrated circuits (PICs). A PIC may comprise a plurality of waveguides formed in a silicon on insulator (SOI) substrate, and a plurality of heterogeneous lasers, each laser formed from a silicon material of the SOI substrate and to emit an output wavelength comprising an infrared wavelength. Each of these lasers may comprise a resonant cavity included in one of the plurality of waveguides, and a gain material comprising a non-silicon material and adiabatically coupled to the respective waveguide. A light directing element may direct outputs of the plurality of heterogeneous lasers from the PIC towards an object, and one or more detectors may detect light from the plurality of heterogeneous lasers reflected from or transmitted through the object.
Abstract:
A method of optical spectroscopy and a device for use in optical spectroscopy. The device includes a substrate, and a plurality of etalon cavities affixed to or coupled to the substrate. A signal is received from a Fabry-Perot interferometer. The signal is sampled using the device according to a generalized Nyquist-Shannon sampling criterion. The signal is sampled using the device according to a phase differential criterion for wave number resolution. An input spectrum for the signal is reconstructed based on the signal sampled according to the generalized Nyquist-Shannon sampling criterion and the signal sampled according to the phase differential criterion for wave number resolution.
Abstract:
A spatial splitting-based optical Micro Electro-Mechanical Systems (MEMS) Interferometer includes a spatial splitter for spatially splitting an input beam into two interferometer beams and a spatial combiner for spatially combining the two interferometer beams. A MEMS moveable mirror is provided to produce an optical path difference between the first interferometer beam and the second interferometer beam.
Abstract:
A spectrometer (100) for characterizing a radiation beam, the spectrometer (100) comprising an optical radiation guiding system comprising a collimator (110) for collimating the radiation beam into a collimated radiation beam, and a beam shaper (120) for distributing the power of the collimated radiation beam over a discrete number of line shaped fields, and a spectrometer chip (130) wherein the spectrometer chip (130) is adapted for processing the radiation in a discrete number of line shaped fields coming from the beam shaper (120).
Abstract:
Exemplary systems and methods for filtering an electromagnetic radiation can be provided. For example, at least one first arrangement (4) can be provided which is capable of receiving at least one first electro-magnetic radiation and forwarding at least one second electro-magnetic radiation at different angles with respect to a direction of incidence of the first electro-magnetic radiation. At least one second wavelength dispersion arrangement (5) can be provided which is configured to receive the second electro-magnetic radiation, forward at least one third electro-magnetic radiation to the first arrangement (4) and further receive at least one fourth electro-magnetic radiation. The third electro-magnetic radiation can be based on the second electro-magnetic radiation, and the fourth electro-magnetic radiation can be based on the third electro-magnetic radiation. For example, the second arrangement can be configured to forward the second electro-magnetic radiation at different angles with respect to a direction of incidence of the at least one particular electro-magnetic radiation. Exemplary embodiments of methods can be provided to implement such exemplary techniques.