Abstract:
An output buffer that controls the slew rate of its output signal is disclosed. The buffer includes a pull-up and a pull-down bipolar transistor (Q1, Q2) coupled at a common output node in series between VDD and VSS. The buffer also includes a first set of parallel MOS devices (N5-N8) coupled between the common output node and the base of the pull-down bipolar transistor (Q2). A second set of parallel MOS devices (P1-P4) are coupled between the base of the pull-up output stage bipolar transistor (Q1) and VDD. The gates of each set of MOS devices are coupled to a digital select signal. The amount of current driving the base of each of the pull-up and pull-down transistors (when they are enabled) is determined by the number of MOS devices enabled by the digital select signal. Thus, the buffer of the present invention is able to adjust the slew rate of its output signal to accommodate different loads coupled to the common output node.
Abstract:
A current mode access BiCMOS memory cell is disclosed. The memory cell includes a CMOS storage cell for storing first and second CMOS voltage potentials, VDD and VSS, corresponding to first and second logic levels. The storage cell comprises two CMOS inverters coupled between VDD and VSS. The storage cell is coupled to a conversion circuit. The conversion circuit is coupled between third and fourth ECL working potentials. It functions to convert the first and second CMOS voltage potentials into the third and fourth working potentials. The third and fourth voltage potentials are coupled to the bases of two bipolar signal converters. The emitters of the bipolar signal converters are coupled to a selectable current source and the collectors of the bipolar signal converters are coupled to complementary bit lines. The selectable current source is responsive to a read word signal. A differential current signal representing the data stored in the memory cell is established in the complementary bit lines when the current source is selected and current is allowed to flow through one of the bipolar signal converters. The third and fourth ECL voltage potentials are chosen such that they ensure that the bipolar signal converters are not driven into saturation. In this way, read times are optimized. In addition, read times are reduced since peak-to-peak voltages of the current mode differential signal established across the complementary bit lines are reduced.
Abstract:
A large burst mode memory (10) accessing system (15) includes N discrete sub-memories (11, 12) and three main I/O ports (17, 18, 19). Data is stored in the sub-memories so that the sub-memories (11, 12) are accessed depending on their proximity to the main I/O ports (17, 18, 19). Three parallel pipelines (1, 2, 3) provide a data path to/from the main I/O ports (17, 18, 19) and the sub-memories (11, 12). The first pipeline (1) functions to couple address/control signals to the memories such that adjacent sub-memories are accessed in half cycle intervals. The second pipeline (2) functions to propagate accessed data from the sub-memories to the main I/O ports such that data is outputted from the main output port every successive clock cycle. The third pipeline (3) propagates write data to the memories such that data presented at the input of the third pipeline on successive clock cycles is written into successive sub-memories. Redundancy circuits preserve data integrity without memory access interruption.
Abstract:
A bipolar junction transistor (BJT) which exhibits a suppressed Kirk Effect comprises a lightly-doped n-type collector region (11) formed above a more heavily-doped n+ layer (12). Directly above the collector is a p-type base which has an extrinsic region (17) disposed laterally about an intrinsic region (18). An n+ emitter (20) is positioned directly above the intrinsic base region. The BJT also includes a localized n+ region (15) disposed directly beneath the intrinsic base region which significantly increases the current handling capabilities of the transistor.
Abstract translation:显示抑制Kirk效应的双极结型晶体管(BJT)包括形成在更重掺杂的n +层(12)上方的轻掺杂的n型集电极区域(11)。 集电极的正上方是p型基体,其具有围绕本征区域横向设置的非本征区域(17)。 n +发射极(20)位于本征基极区的正上方。 BJT还包括直接位于本征基极区下方的局部n +区(15),这显着增加了晶体管的电流处理能力。
Abstract:
A BiCMOS logic circuit (20) utilizes an emitter-coupled pair of bipolar transistors (21, 22) for differentially comparing an input signal (VIN) with a logic reference level (VBIAS). Each of the bipolar transistors are resistively loaded by a p-channel metal-oxide-semiconductor (PMOS) transistor (26, 27). An emitter follower (33 or 34), having its base coupled to the collector of one of the bipolar transistors and its collector connected to the first power supply potential (GND), provides the output signal. NMOS transistors (24, 36, 37) are used as current sources for biasing the emitter-coupled pair and the emitter follower. A circuit means provides a feedback signal coupled to the gates of the PMOS transistors for dynamically controlling the load resistance presented to said emitter coupled pair.
Abstract:
An optical modulator utilizing a magnetic semiconductor device, whose operation is based on the Hall effect, includes a magnetic material (33) formed on a semiconductor substrate (27). When an incoming beam of light (105) having a dominant polarization direction is directed onto the magnetic material (33) it becomes modulated. The result is an outgoing beam of light (106) which has a rotated plane of polarization when compared to the dominant polarization direction. The direction of the rotated plane of polarization is indicative of the information stored in the magnetic material (33). The modulator of the present invention further includes a means for writing the information to the magnetic material and a semiconductor sensor means (35) for electrically verifying the contents of the magnetic material (33).
Abstract:
A non-volatile, static magnetic memory device (10), whose operation is based on the Hall effect, is disclosed. The device includes a magnetic patch (33) which stores data in the form of a magnetic field, a semiconductor Hall bar (14, 15, and 17) and a pair of integrally-formed bipolar transistors (28 and 29) used for amplifying and buffering the Hall voltage produced along the Hall bar. Current is forced to flow down the length of the Hall bar causing a Hall voltage to be developed in a direction transverse to the direction of both the magnetic field and the current. The bases (18 and 19) of the bipolar transistors (28 and 29) are ohmically coupled to the Hall bar to sense the Hall voltage, the polarity of which is representative of the stored information. A system of current carrying conductors is employed for writing data to individual magnetic patches.
Abstract:
A virtual memory system including a local-to-global virtual address translator for translating local virtual addresses having associated task specific address spaces into global virtual addresses corresponding to an address space associated with multiple tasks, and a global virtual-to-physical address translator for translating global virtual addresses to physical addresses. Protection information is provided by each of the local virtual-to-global virtual address translator, the global virtual-to-physical address translator, the cache tag storage, or a protection information buffer depending on whether a cache bit or miss occurs during a given data or instruction access. The cache is configurable such that it can be configured into a buffer portion or a cache portion for faster cache accesses.
Abstract:
An improved BiCMOS logic circuit utilizes an emitter-coupled pair of bipolar transistors for differentially comparing an input signal with a logic reference level. Each of the bipolar transistors are resistively loaded by a network of p-channel metal-oxide-semiconductor (PMOS) transistors coupled in parallel. At least one of the parallel combination of transistors has its gate coupled to a control signal providing a variable load resistance. The control signal is preferably provided by a feedback network which maintains a constant voltage swing across the network over temperature.