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    SHAPED ABRASIVE PARTICLES WITH CONCAVE VOID WITHIN ONE OF THE PLURALITY OF EDGES
    31.
    发明申请
    SHAPED ABRASIVE PARTICLES WITH CONCAVE VOID WITHIN ONE OF THE PLURALITY OF EDGES 审中-公开

    公开(公告)号：WO2021079331A1

    公开(公告)日：2021-04-29

    申请号：PCT/IB2020/059971

    申请日：2020-10-23

    Applicant: 3M INNOVATIVE PROPERTIES COMPANY

    Inventor： ECKEL, Joseph B. ,  SALMON, Fay T. ,  NIENABER, Aaron K. ,  NELSON, Thomas J. ,  ARTHUR, Cory M. ,  GHADERI, Alireza ,  JESME, Ronald D. ,  BUCKLEY, David T.

    IPC: B24D11/00 ,  C09K3/14

    Abstract: A shaped abrasive particle is presented. The shaped abrasive particle has a first and second surface. The first and second surfaces are substantially parallel to each other and separated by a thickness. Each of the first and second surfaces have a surface profile, which includes a plurality of corners and a plurality of edges connecting the plurality of corners. The shaped abrasive particle also includes a recess included wholly within one of the plurality of edges, wherein the recess is a concave void extending into the surface profile. The shaped abrasive particle also includes a magnetically responsive coating. The magnetically responsive coating causes the shaped abrasive particle to be responsive to a magnetic field. The shaped abrasive particle, when exposed to the magnetic field, experiences a net torque that causes the shaped abrasive particle to orient with respect to the magnetic field such that each of the first and second surfaces are substantially perpendicular to a backing.

    DEVICE WITH LIGHT CONTROL STRUCTURE HAVING MAGNETIZABLE PARTICLES
    35.
    发明申请
    DEVICE WITH LIGHT CONTROL STRUCTURE HAVING MAGNETIZABLE PARTICLES 审中-公开

    公开(公告)号：WO2020018794A1

    公开(公告)日：2020-01-23

    申请号：PCT/US2019/042411

    申请日：2019-07-18

    Applicant: 3M INNOVATIVE PROPERTIES COMPANY

    Inventor： O'NEILL, Mark B. ,  GAIDES, Gary E. ,  ECKEL, Joseph B. ,  NIENABER, Aaron K. ,  JESME, Ronald D. ,  WEIGEL, Mark D.

    IPC: H01L31/054 ,  G02B5/02

    Abstract: According to one embodiment, a solar device, comprises one or more photovoltaic cells disposed in an encapsulant and a light control structure including a louver film having a series of louver structures, wherein each louver structure includes one or more groupings of a plurality magnetizable particles aligned at least in a first orientation dispersed in a binding matrix. The light control structure substantially transmits light incident at a first angle and substantially limits transmission of light incident at a second angle. Each louver structure is spaced apart from an adjacent louver structure, wherein each louver structure is substantially aligned in a plane substantially parallel to an adjacent louver structure.

    VERIFYING STRUCTURAL INTEGRITY OF MATERIALS
    37.
    发明申请
    VERIFYING STRUCTURAL INTEGRITY OF MATERIALS 审中-公开

    公开(公告)号：WO2018140148A3

    公开(公告)日：2018-08-02

    申请号：PCT/US2017/066596

    申请日：2017-12-15

    Applicant: 3M INNOVATIVE PROPERTIES COMPANY

    Inventor： YUNGERS, Christopher R. ,  FALKNOR, Subhlakshmi M. ,  REDINGER, David H. ,  JESME, Ronald D. ,  CHINNOCK, Eric M.

    IPC: G01N27/20

    Abstract: A method may include coupling a first electrical connector of an article to a second electrical connector of a measurement device. The article may include a tested material, the first electrical connector, and a plurality of electrical contacts electrically connected to the first electrical connector. The measurement device may include a power source and a user interface. The method also may include causing, by a controller, an electrical signal to be applied to a pair of drive electrical contacts from the plurality of electrical contacts. The method further may include receiving, by the controller, from an analog-to-digital converter, a measured voltage measured using a measurement electrical contact from the plurality of electrical contacts. The method also may include determining, by the controller, whether the tested material includes a crack or other defect based on the measured voltage.

    ELECTRONIC SENSOR HAVING ELECTRICAL CONTACTS FOR DIRECT MONITORING OF FILTER MEDIA WITHIN A FILTRATION SYSTEM
    40.
    发明申请
    ELECTRONIC SENSOR HAVING ELECTRICAL CONTACTS FOR DIRECT MONITORING OF FILTER MEDIA WITHIN A FILTRATION SYSTEM 审中-公开
    具有电子接触器的电子传感器，用于过滤系统中过滤介质的直接监控

    公开(公告)号：WO2017030812A1

    公开(公告)日：2017-02-23

    申请号：PCT/US2016/045844

    申请日：2016-08-05

    Applicant: 3M INNOVATIVE PROPERTIES COMPANY

    Inventor： MAKI, Jeffrey M. ,  AMELL, Nicholas G. ,  HABLE, Brock A. ,  ASTLE, Robert E. ,  BONIFAS, Andrew P. ,  JESME, Ronald D.

    IPC: B01D35/143

    CPC classification number: B01D35/143

    Abstract: In general, techniques are described for filter media monitoring within a filtration system. The filter media monitoring techniques described herein include, for example, direct contact with the filter media, e.g., a sensor may be located inside a boundary defined by a surface of the filter media, or indirect contact with the filter media, e.g., a sensor may be located outside the boundary defined by the surface of the filter media such that the sensor does not make direct physical contact with the filter media being monitored.

    Abstract translation: 一般来说，描述了用于在过滤系统内进行过滤介质监测的技术。 本文所述的过滤介质监测技术包括例如与过滤介质的直接接触，例如，传感器可位于由过滤介质的表面限定的边界内，或与过滤介质的间接接触，例如传感器 可以位于由过滤介质的表面限定的边界之外，使得传感器不与被监测的过滤介质直接物理接触。

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