31.
    发明专利
    未知

    公开(公告)号:DE19515712C2

    公开(公告)日:1999-04-22

    申请号:DE19515712

    申请日:1995-04-28

    Applicant: ADVANTEST CORP

    Abstract: A Doppler shift compensation apparatus for compensating Doppler frequency shifts in an incoming signal to reproduce a highly accurate signal. The Doppler shift compensation apparatus has high frequency dissolution ability and can detect a frequency, an amplitude and a phase of the incoming signal accurately. The Doppler shift compensation apparatus includes an analog to digital converter which transforms an analog input signal to digital data, a memory which stores the digital data from the analog to digital converter, a window function weighting part for multiplying a specified window function to input data from the memory, a fast Fourier transformer (FFT) for transforming the input data to frequency spectrum data, an interpolation judgment part which distinguishes line spectrum from dispersed spectrum in the frequency spectrum data from the fast Fourier transformer, a spectrum interpolator which measures the true frequency, amplitude and phase of the line spectrum based on the judgement of the interpolation judgement part, an accumulator for accumulating the frequency domain data interpolated by the spectrum interpolator, a summation part for vector-summing the frequency domain data accumulated by the accumulator to a Fourier transform output of the fast Fourier transformer, a regression computation part for performing a predetermined regression computation for the frequency data from the summation part based on the output data from the interpolation judgment part, and a subtractor for subtracting the output data of said regression computation part from the frequency data from the summation part.

    32.
    发明专利
    未知

    公开(公告)号:FR2766577A1

    公开(公告)日:1999-01-29

    申请号:FR9812085

    申请日:1998-09-28

    Applicant: ADVANTEST CORP

    Abstract: A hologram observation method capable of accurately estimating a three-dimensional wave source distribution even when a wave source is close to a hologram observation plane. The hologram observation is performed according to a two-frequency hologram observation method to reconstruct a hologram image. A three-dimensional wave source position is obtained from the reconstructed hologram image, a virtual unit wave source is disposed at the obtained wave source position and an observed wave is synthesized. A hologram image obtained from the synthesized observed wave is reconstructed, and a wave source intensity obtained from the measured hologram image is divided by a wave source intensity at the hologram image obtained from the synthesized observed wave, thereby obtaining a true complex amplitude of the wave source. An area having an intensity more than a predetermined value in the hologram image which is obtained from the synthesized observation wave is excluded from a search range, and each of the foregoing steps is executed.

    33.
    发明专利
    未知

    公开(公告)号:FR2766574A1

    公开(公告)日:1999-01-29

    申请号:FR9812084

    申请日:1998-09-28

    Applicant: ADVANTEST CORP

    Abstract: A hologram observation method capable of accurately estimating a three-dimensional wave source distribution even when a wave source is close to a hologram observation plane. The hologram observation is performed according to a two-frequency hologram observation method to reconstruct a hologram image. A three-dimensional wave source position is obtained from the reconstructed hologram image, a virtual unit wave source is disposed at the obtained wave source position and an observed wave is synthesized. A hologram image obtained from the synthesized observed wave is reconstructed, and a wave source intensity obtained from the measured hologram image is divided by a wave source intensity at the hologram image obtained from the synthesized observed wave, thereby obtaining a true complex amplitude of the wave source. An area having an intensity more than a predetermined value in the hologram image which is obtained from the synthesized observation wave is excluded from a search range, and each of the foregoing steps is executed.

    Measuring correlation function between first and second observation signals

    公开(公告)号:DE19645953A1

    公开(公告)日:1997-05-15

    申请号:DE19645953

    申请日:1996-11-07

    Applicant: ADVANTEST CORP

    Abstract: The method for measuring correlation function between first and second observation signals in a predetermined observation frequency band. The method has a number of steps: The limiting of the first observation signal to the observation frequency band, in order to carry out a frequency change of the first observation unit in a signal of a first frequency. The second observation signal is limited to the observation frequency band, in order a frequency change of the second observation signal, based on a reference frequency signal equal to that, which is used with the frequency change to the first frequency. To carryout a signal of a second frequency with a predetermined frequency difference from the first frequency and the multiplying of the signal of the first frequency and the signal of the second frequency, and to carry out a vector determination based on the reference frequency signal for a differential frequency component between the two signals. The vector determination is carried out using a synthetised Fourier integration of a reference signal corresp. to the frequency difference based on a reference frequency signal.

    37.
    发明专利
    未知

    公开(公告)号:DE3482678D1

    公开(公告)日:1990-08-16

    申请号:DE3482678

    申请日:1984-09-05

    Applicant: ADVANTEST CORP

    Abstract: @ A set value of a frequency setting register (11) is accumulated upon each occurrence of a clock signal, and a waveform memory (14) is read out by using the accumulated value as an address. In the waveform memory, amplitude data of one cycle of the waveform of a burst signal to be generated are stored at fixed phase intervals. The output read out of the waveform memory is converted into an analog signal. A wave-number counter (21) counts the number of times the amplitude data of one cycle is read out of the waveform memory and, when having counted by preset number of waves, yields a wave-number counting end signal. After the occurrence of the wave-number counting end signal a phase counter (31) counts clock signals, and when the count value of the phase counter reaches a value corresponding to a preset end phase, the generation of the burst signal is stopped.

    38.
    发明专利
    未知

    公开(公告)号:DE69528480D1

    公开(公告)日:2002-11-07

    申请号:DE69528480

    申请日:1995-01-12

    Applicant: ADVANTEST CORP

    Abstract: Non-contact type wave signal observation apparatus takes measurements of electromagnetic waves received on an observation plane and performs hologram reconstruction calculations to reconstruct characteristics of the corresponding electromagnetic wave information at points in the observed space. The invention provides apparatus for measuring transfer functions (and, if desired, waveforms) at any point on a network containing a transmission line having distributed properties and having internal signal sources - the processing takes into account fluctuations occurring in the electromagnetic radiation given off by the network. A display for displaying complex three-dimensional data such as interference data of electromagnetic waves may be used to display data produced by the apparatus according to the invention. The complex data is converted from orthogonal co-ordinates to polar co-ordinates, the phase information is converted to hue information in a hue converter and the amplitude information is used to modulate the brightness of the displayed signal; corresponding colour signals are displayed on a colour display unit.

    FIELD DISTRIBUTION MEASURING METHOD AND DEVICE

    公开(公告)号:CA2377959A1

    公开(公告)日:2001-11-08

    申请号:CA2377959

    申请日:2001-04-19

    Applicant: ADVANTEST CORP

    Abstract: A field distribution measuring method for measuring the spatial distribution of an electric field or a magnetic field by conducting a measurement at a plurality of sampling points while continuously scanning by a probe, wherein a sampling deviation amount is calculated based on a spurious vector generated due to a deviation between a probe position and a measuring timing and the distribution of an electrical field or a magnetic field is measured allowing for the deviation amount, whereby it is possible to properly remove a measuring noise generated by the deviation between a probe traveling positio n and a measuring timing.

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