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    MEASUREMENT CONTROL APPARATUS
    1.
    发明公开
    MEASUREMENT CONTROL APPARATUS 审中-公开
    测定控制装置

    公开(公告)号：EP1420258A4

    公开(公告)日：2005-01-12

    申请号：EP02760692

    申请日：2002-08-22

    Applicant: ADVANTEST CORP

    Inventor： SAKURAI RYUICHI ,  KASAHARA TOSHIHARU ,  SAITOH CHIEZOH

    IPC: G01R31/28 ,  G01R31/319

    CPC classification number: G01R31/31919 ,  G01R31/28

    Abstract: Noise in measurement data received/transmitted from/to a measurement module is reduced. A measurement control unit 10 controls circuits 50a, b to be measured and acquires measurement data from the circuits 50a, b to be measured. Moreover, a CPU 20 controls the measurement control unit 10 via a bus 40. Since the CPU 20 does not directly control the circuits 50a, b to be controlled, no data is passed between the CPU 20 and the measurement control unit 10. Accordingly, a control signal and the like transmitted by the bus 40 is not mixed in the measurement data and the control signal and the like transmitted from the CPU 20 does not become a noise, thereby reducing the noise in the measurement data.

    2.
    发明专利
    未知

    公开(公告)号：DE3482678D1

    公开(公告)日：1990-08-16

    申请号：DE3482678

    申请日：1984-09-05

    Applicant: ADVANTEST CORP

    Inventor： KASAHARA TOSHIHARU ,  OGAMI TAKAYUKI ,  KITAYOSHI HITOSHI

    IPC: G06F1/03 ,  G06F1/02

    Abstract: @ A set value of a frequency setting register (11) is accumulated upon each occurrence of a clock signal, and a waveform memory (14) is read out by using the accumulated value as an address. In the waveform memory, amplitude data of one cycle of the waveform of a burst signal to be generated are stored at fixed phase intervals. The output read out of the waveform memory is converted into an analog signal. A wave-number counter (21) counts the number of times the amplitude data of one cycle is read out of the waveform memory and, when having counted by preset number of waves, yields a wave-number counting end signal. After the occurrence of the wave-number counting end signal a phase counter (31) counts clock signals, and when the count value of the phase counter reaches a value corresponding to a preset end phase, the generation of the burst signal is stopped.

    Measurement controlling device, method, program and recording medium recording program
    7.
    发明专利
    Measurement controlling device, method, program and recording medium recording program 审中-公开
    测量控制设备，方法，程序和记录中介记录程序

    公开(公告)号：JP2003066099A

    公开(公告)日：2003-03-05

    申请号：JP2001253183

    申请日：2001-08-23

    Applicant: Advantest Corp ,  株式会社アドバンテスト

    Inventor： SAKURAI RYUICHI ,  KASAHARA TOSHIHARU ,  SAITOU CHIEZOU

    IPC: G01R31/28 ,  G01R31/319

    CPC classification number: G01R31/31919 ,  G01R31/28

    Abstract: PROBLEM TO BE SOLVED: To reduce noise of measurement data exchanged by a measurement module.
    SOLUTION: A measurement control part 10 controls circuits 50a and b to be measured, and it acquires measurement data from the circuits 50a and b to be measured. A CPU 20 controls the measurement control part 10 via a bus 40. Since the CPU 20 does not directly control circuits 50a and b to be measured, no measurement data is exchanged between the CPU 20 and the measurement control part 10. Consequently, since a control signal or the like transmitted via the bus 40 is not mixed in the measurement data and the control signal or the like sent from the CPU 20 does not become noise, the noise of the measurement data is reduced.
    COPYRIGHT: (C)2003,JPO

    Abstract translation: 要解决的问题：减少由测量模块交换的测量数据的噪声。 解决方案：测量控制部件10控制要测量的电路50a和b，并且从测量的电路50a和b获取测量数据。 CPU20经由总线40控制测量控制部分10.由于CPU 20不直接控制电路50a和b被测量，所以在CPU 20和测量控制部分10之间没有交换测量数据。因此，由于 经由总线40发送的控制信号等不在测量数据中混合，并且从CPU 20发送的控制信号等不会变得噪声，所以测量数据的噪声降低。

    SINE WAVE SIGNAL GENERATOR
    8.
    发明专利
    SINE WAVE SIGNAL GENERATOR 失效

    公开(公告)号：JPH02149107A

    公开(公告)日：1990-06-07

    申请号：JP30437688

    申请日：1988-11-30

    Applicant: ADVANTEST CORP

    Inventor： CHIYOMURA YUUZOU ,  KASAHARA TOSHIHARU

    IPC: H03B23/00 ,  H03B28/00

    Abstract: PURPOSE:To dispense with the write of swept sine data on a RAM by a CPU by generating a swept sine wave by hardware constitution. CONSTITUTION:A value corresponding to the start frequency of a swept sine is stored in a first latch 21, and the value corresponding to the sweep rate of the swept sine is stored in a second latch 22. The output of the second latch 22 is added on that of a third latch 23 at a first adder 24, and the output of the first latch 21 and that of the first adder 24 are switched by a switch 25, then, it is stored in the third latch 23. The output of the third latch 23 is added on that of a fourth latch 26 at a second adder 27, then, it is stored in the fourth latch 26. And a control circuit 31 is controlled by the output of a presettable counter 29, and the control circuit 31 performs the switching of the switch, storage on the third latch, and the clear of the fourth latch. In such a way, no write on the RAM at every point by the CPU is required.

    SIGNAL ELIMINATING DEVICE
    9.
    发明专利
    SIGNAL ELIMINATING DEVICE 失效

    公开(公告)号：JPS6319567A

    公开(公告)日：1988-01-27

    申请号：JP16329186

    申请日：1986-07-11

    Applicant: ADVANTEST CORP

    Inventor： YAMAGUCHI TAKAHIRO ,  OZAWA HIROMI ,  OGAWA MASAYUKI ,  KASAHARA TOSHIHARU

    IPC: G01R23/20

    Abstract: PURPOSE:To eliminate a reference wave component included in a response output signal by adding/subtracting an output signal of an eliminating signal generating means to/from an output signal of an object to be tested to cancel a required signal. CONSTITUTION:The signal eliminating device has two signal generators 100, 200 to be driven by the same clock pulse, the generator 100 supplies an oscillation signal to an object 3 to be tested and the generator 200 generates an eliminating signal for eliminating a reference wave outputted from the object 3 to be detect 3. Then, the eliminating signal is added/subtracted to/from the output signal of the object 3 to be tested by an adding/subtracting means 300 to remove the reference wave. Since the signals outputted from both the signal generators 100, 200 are synchronized with each other and the initial setting state is stably held, no residual is generated in the reference wave.

    METHOD FOR MEASURING MUTUAL MODULATION STRAIN BY SPECTRUM ANALYZER
    10.
    发明专利
    METHOD FOR MEASURING MUTUAL MODULATION STRAIN BY SPECTRUM ANALYZER 失效

    公开(公告)号：JPH0980094A

    公开(公告)日：1997-03-28

    申请号：JP23166295

    申请日：1995-09-08

    Applicant: ADVANTEST CORP

    Inventor： YAMASHITA KOICHI ,  FUKUI TAKAMASA ,  YAMAGUCHI TAKAHIRO ,  AOYAMA OSAMU ,  KOSUGE TAKASHI ,  MIYAMAE YOSHIAKI ,  KASAHARA TOSHIHARU ,  TAKAOKU HIROAKI

    IPC: G01R23/173 ,  G01R23/20

    Abstract: PROBLEM TO BE SOLVED: To properly measure three-dimensional distortion of a low level. SOLUTION: The input attenuation is made 0dB (S2 ), thereby it is made large by step 10dB and the three-dimensional distortion level L3 at this time is measured (S3 ). Next, the quantity of the input attenuation is changed to δATT=1dB, a three-dimensional distortion level L3 ' and a fundamental wave level L1 are measured and at the time a change quantity of the three- dimensional distortion level δDis =L3 -L3 ' is found. If the δDis is not within δATT±ε, it will be returned to (S3 ), furthermore the attenuation of 10dB is increased, and the similar method is performed. If the δDis is within δATT±ε, the three-dimensional distortion L3 ' at this time is made input and L1 -L3 '=ΔL represents the level difference between the fundamental wave and the three- dimensional distortion.

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