公开(公告)号：JPS60185348A

公开(公告)日：1985-09-20

申请号：JP3977084

申请日：1984-03-02

Applicant: HAMAMATSU PHOTONICS KK

Inventor： KINOSHITA KATSUYUKI ,  SHINODA KAZUNORI ,  SUGIYAMA MASARU ,  OOBA KOUICHIROU ,  SUZUKI YOSHIJI

IPC: H01J29/74 ,  H01J31/50

Abstract: PURPOSE:To suppress increase of the brightness level at the background portion by arranging a metallic shielding structure between the deflection electrode and the container wall face or the electrode lead subjected to multiplactoring phenomenon and connecting it to the ground potential point. CONSTITUTION:A synchro-scan streak device is constructed by arranging a mesh electrode 3, a focus electrode 4, an anode 5 and a deflection electrode 6 in a vacuum container 1 having a photoelectric face 2 and a phosphor face 7. Then first and second flanges 31, 32 and a metallic structure where shielding boards 33, 34 of cut-disc shape are welded to said flanges 31, 32 are provided around the deflection electrodes 6a, 6b and arranged to hold the electrode lead 6c between them. Consequently, multipactoring discharge due to secondary electron emission in the vicinity of the deflection electrode 6 can be prevented to suppress increase of the background level of brightness distribution appearing on the phosphor face 7 thus to enable observation of weak streak image with good S/N ratio.

公开(公告)号：JPS59101134A

公开(公告)日：1984-06-11

申请号：JP20912782

申请日：1982-11-29

Applicant: Hamamatsu Photonics Kk ,  Masao Kaneko

Inventor： KANEKO MASAO ,  HIRUMA TERUO ,  SUZUKI YOSHIJI ,  KINOSHITA KATSUYUKI ,  SUGIYAMA MASARU

IPC: G03B42/02 ,  A61B6/00 ,  A61B6/03 ,  G01N23/04 ,  G01T1/164 ,  H01J31/50 ,  H04N5/32

CPC classification number: H01J31/503

公开(公告)号：JPH11239717A

公开(公告)日：1999-09-07

申请号：JP4349798

申请日：1998-02-25

Applicant: HAMAMATSU PHOTONICS KK

Inventor： HIRUMA TERUO ,  NATSUME YOSHIO ,  SUGIYAMA MASARU

IPC: C02F1/30 ,  B01D53/86 ,  B01J35/02 ,  C02F1/72

Abstract: PROBLEM TO BE SOLVED: To provide a method for improving the irradiation ratio of light to a photocatalyst, for elevating purification efficiency, and for purifying sewage and a large amount of industrial waste such as flue gas of an incinerator and a purification apparatus for the method. SOLUTION: A purification apparatus has an inflow surface 5 having an inflow ports 7 into which a raw material 9 is introduced, an outflow surface 6 having outflow ports 8 from which the raw material 9 is discharged, holes 3 for connecting the inflow ports 7 with the outflow ports 8, a light transmitting porous body 2 which incident light enters across the extension direction of the holes 3, and a photocatalyst which is placed on the inflow surface 5 and the outflow surface 6 in the porous body and on the inner wall surfaces of the holes 3 and activated by the incident light.

公开(公告)号：JPH04218249A

公开(公告)日：1992-08-07

申请号：JP40224690

申请日：1990-12-14

Applicant: HAMAMATSU PHOTONICS KK

Inventor： OBA AKIRA ,  SUGIYAMA MASARU ,  OSUGA SHINJI ,  YOKOYAMA TOSHIKI ,  ISHIDA NOBORU ,  NAKANO TOMOYASU

IPC: H01J35/22

Abstract: PURPOSE:To provide a plasma X ray generator capable of illuminating a microscopic area effectively in the present invention. CONSTITUTION:A high speed gas valve 23 controls injection of gas into a plasma generating chamber 2 in a vacuum vessel. An anode 21 and a cathode 22 cause the gas injected into the plasma generating chamber 2 to discharge so as to transform it into plasma. A slantingly incidence reflecting mirror 41 arranged in the vacuum vessel condenses an X ray image in a part 25 of the gas which is transformed into the plasma on a microscopic spot outside of the vacuum vessel. In an illustrated plasma X ray generator, since X ray is condensed on the microscopic spot outside of the vacuum vessel, by means of a simple X ray radiation source, a prescribed spot outside of the vacuum vessel can be illuminated locally and effectively.

公开(公告)号：JPH04162327A

公开(公告)日：1992-06-05

申请号：JP28645190

申请日：1990-10-24

Applicant: HAMAMATSU PHOTONICS KK

Inventor： YOKOYAMA TOSHIKI ,  SUGIYAMA MASARU ,  OBA AKIRA

IPC: C23C14/06 ,  H01J9/12 ,  H01J9/233

Abstract: PURPOSE:To obtain a thin film easily peeled from a substrate and causing no deterioration on a photoelectric face by forming a support film made of an organic material and generating the adhesive strength to the thin film larger than the adhesive strength between the substrate and the thin film on the thin film made of a material with the preset light characteristic. CONSTITUTION:A thin film 2 made of a material with the preset light characteristic (e.g., photoelectric transfer characteristic) is formed on the smooth face of a substrate 1, and a support film 3 made of an organic material and generating the adhesive strength to the thin film 2 larger than the adhesive strength between the substrate 1 and the thin film 2 is formed on the thin film 2. The adhesive strength between the support film 3 and the thin film 2 is made larger than the adhesive strength between the thin film 2 and the substrate 1, thus the support film 3 can be easily peeled from the substrate 1 together with the thin film 2, the thin film 2 is pinched by the support film 3 and the substrate 1 before it is peeled, and no deterioration occurs during storage.

公开(公告)号：JPH0221550A

公开(公告)日：1990-01-24

申请号：JP17224888

申请日：1988-07-11

Applicant: HAMAMATSU PHOTONICS KK

Inventor： OSUGA SHINJI ,  SUGIYAMA MASARU ,  OBA AKIRA ,  KINOSHITA KATSUYUKI

IPC: H01J37/22 ,  G21K7/00 ,  H01J31/50

Abstract: PURPOSE:To enable an hourly change of a substance to be observed to be continuously observed while being able to observe an image having large magnification utilizing X-rays by thinning a supporting film to the extent not to interface with transmission of X-rays while forming a throughhole on a supporting member. CONSTITUTION:Photoelectric conversion film 42 is fixed to a supporting film 43 thin to the extent not to interfare with transmission of X-rays for being arranged inside a vacuum container 31 to perform photoelectric conversion without attenuating an expanded X-ray image in order to observe the converted image as a visible image. Thereby, observation of the enlarged image of a substance to be observed is made possible while making it possible to observe even a continuous hourly change. Further, since a throughhole 40 is formed on a supporting member 44, which supports the supporting film 43, a vacuum degree can be made equal between the side of X-ray imaging and the side of electron imaging while being able to make the supporting film 43 extremely thin.

公开(公告)号：JPH01117252A

公开(公告)日：1989-05-10

申请号：JP27486387

申请日：1987-10-30

Applicant: HAMAMATSU PHOTONICS KK

Inventor： OSUGA SHINJI ,  SUGIYAMA MASARU ,  HAYAKAWA TAKESHI ,  KINOSHITA KATSUYUKI

IPC: H01J31/50

Abstract: PURPOSE:To enable observing the enlarge image of an object without any need of film development and enlargement by fixing a photoelectric conversion film to a support film so thinned as not to hinder the permeation of an X-ray and observing a converted enlarged image as a visible image. CONSTITUTION:An X-ray from an X-ray tube permeates a specimen 13 and is imaged on the conversion film of a photoelectric conversion part 4 via enlarged reflection with an incidence reflecting mirror 2. The converted electron is enlarged and accelerated by electromagnetic coils 5 and 5a at the outside of a vacuum vessel 13c and doubled with a micro channel plate MCP 6, thereby forming a visible image on a fluorescent screen 7. This enlarged image generates a visible image on a monitor 11 via a TV camera 9. Also, the conversion film of the conversion part 4 is a thin Au film and fixed to a support film so thinned as not to hinder the permeation of the X-ray. According to the observation of an enlarged image as a visible image as aforementioned, it is unnecessary to process a film for development and enlargement. And the enlarged image of an object can be observed and the change thereof with the passage of time can also be observed.

公开(公告)号：JPS61129539A

公开(公告)日：1986-06-17

申请号：JP25050784

申请日：1984-11-29

Applicant: Hamamatsu Photonics Kk ,  Nippon Kogaku Kk

Inventor： SUZUKI YOSHIJI ,  SUGIYAMA MASARU ,  NAGATA HIROSHI ,  NOGUCHI MASAYOSHI

IPC: G01J3/02 ,  G01J3/28

CPC classification number: G01J3/2803

Abstract: PURPOSE:To prevent the spectrometer from protruding from the substrate of a photoelectric detector and to standardize a unit and to reduce its size by changing the direction of the photodetection surface of the photoelectric detector without reference to the direction of light incident from an entrance slot and the wavelength dispersion direction of a dispersing element. CONSTITUTION:The entrance slit 1, diffraction grating 2, and the photoelectric detector are mounted on the substrate 4. Then, a photodetection part 5 is arranged in the detector 3 slantingly to a plane crossing its depth direction 3a at right angles and its photodetection surface is parallel (right opposite) to the wavelength dispersion direction of diffracted light from the diffraction grating 2. Namely, a microchannel plate (MCP)5 which operates as the photodetection part and a fluorescent plate 6 are arranged slanting to a housing 30 and an array sensor 8 and a circuit part 9 do not slant to the housing. A fiber plate 7 is made wedgelike so as to correct the inclination of the MCP5 and fluorescent plate 6 to the array sensor 8. Consequently, the depth direction of the detector 3 is nearly parallel to the optical axis of the incident light L1 and the whole unit is mounted without protruding from the substrate 4.

Abstract translation: 目的：为了防止光谱仪从光电检测器的基板突出，并且通过改变光电探测器的光电检测表面的方向而不参考从入口槽入射的光的方向来标准化单元并减小其尺寸，并且 分散元件的波长色散方向。 构成：将入射狭缝1，衍射光栅2和光电检测器安装在基板4上。然后，将检测器3倾斜地配置在垂直于其深度方向3a的平面上并且其光检测面 与来自衍射光栅2的衍射光的波长色散方向平行（右对置）。即，作为光电检测部分操作的微通道板（MCP）5和荧光板6被倾斜地安装到壳体30和阵列 传感器8和电路部分9不倾斜到壳体。 纤维板7被制成楔形以便将MCP5和荧光板6的倾斜度校正到阵列传感器8.因此，检测器3的深度方向几乎平行于入射光L1的光轴和整个 单元安装而不从基板4突出。

公开(公告)号：JPS59101135A

公开(公告)日：1984-06-11

申请号：JP20912882

申请日：1982-11-29

Applicant: Hamamatsu Photonics Kk ,  Masao Kaneko

Inventor： KANEKO MASAO ,  HIRUMA TERUO ,  SUZUKI YOSHIJI ,  KINOSHITA KATSUYUKI ,  SUGIYAMA MASARU

IPC: G01N23/04 ,  A61B6/00 ,  H04N5/32 ,  H05G1/64

CPC classification number: H05G1/64

公开(公告)号：JP2003075600A

公开(公告)日：2003-03-12

申请号：JP2001270761

申请日：2001-09-06

Applicant: Hamamatsu Photonics Kk ,  浜松ホトニクス株式会社

Inventor： OBA AKIRA ,  SUGIYAMA MASARU ,  ONODA SHINOBU

IPC: G01N23/04 ,  G02B5/08 ,  G02B17/00 ,  G21K1/06 ,  G21K7/00

Abstract: PROBLEM TO BE SOLVED: To provide an X-ray image expansion apparatus allowing the efficient search of the observation site of a sample and the observation of the sample to be performed at a high magnification. SOLUTION: This X-ray image expansion apparatus for expanding the X-ray image of the sample 5 by oblique incident reflector mirrors 7 and 8 to perform a detection by an X-ray detecting means 11 is characterized in that it is provided with a branch means 10 for branching the reflected X-ray by the oblique incident reflector mirror 7 from the reflected X-ray by the oblique incident reflector mirror 8. According to such a structure, the effective search of the observation site of the sample based on an image with wide visual field by the reflected X-ray from the reflector mirror 8 and the minute observation of the sample based on an image of high magnification by the reflected X-ray from the reflector mirror 7 can be simultaneously performed.

Abstract translation: 要解决的问题：提供一种X射线图像扩展装置，其能够有效地搜索样品的观察部位，并且以高倍率进行样品的观察。 解决方案：用于通过倾斜入射反射镜7和8扩展样品5的X射线图像以执行X射线检测装置11的检测的该X射线图像扩展装置的特征在于，其设有分支 用于通过倾斜入射反射镜8从反射X射线将倾斜入射反射镜7反射的X射线分支的装置10.根据这种结构，基于图像对样本的观察部位的有效搜索 通过来自反射镜8的反射X射线具有宽视野，并且可以同时执行基于来自反射镜7的反射X射线的基于高倍率的图像的样本的微小观察。