32.
    发明专利
    未知

    公开(公告)号:DE102004056529B4

    公开(公告)日:2007-07-19

    申请号:DE102004056529

    申请日:2004-11-23

    Abstract: Advanced microscope stages are shielded from dust and debris collecting on components by placing all or virtually all stage components below the stage floor. The shielded stages comprise a stage having a top side and a bottom side, an opening in the stage floor in the form of a linear slot, a carriage positioned adjacent to the slot for movement in a direction generally parallel with the slot, drive means for the carriage and stage, specimen retaining means on the top side of the stage, and means for affixing the specimen retaining means to the carriage through the opening in the stage floor. The advanced microscope stages may also have more ergonomic structural features with rounded rims and corners for greater user comfort.

    33.
    发明专利
    未知

    公开(公告)号:DE50209087D1

    公开(公告)日:2007-02-08

    申请号:DE50209087

    申请日:2002-10-31

    Inventor: GILBERT MANFRED

    Abstract: The system has several optical parts for recording images e.g. a microscope and/or a macroscope. These are connected to each other optically and mechanically via a bridge. Each image recording part has an XYZ surface which is moveable by means of a motor. A sample to be examined is laid on this surface. A control unit is provided which moves the XYZ surface in all three spatial directions synchronously.

    34.
    发明专利
    未知

    公开(公告)号:DE10246274B4

    公开(公告)日:2006-06-01

    申请号:DE10246274

    申请日:2002-10-02

    Inventor: GILBERT MANFRED

    Abstract: The microscope has a control unit (10), a memory (9) and a microprocessor (11). The memory stores a correction table which contains the drift values for the three spatial directions (X,Y and Z), as a function of temperature. Temperature sensors (30) deliver signals to the microprocessor, based on which correction values are retrieved. An Independent claim is included for a method of correcting the XYZ drift caused by temperature.

    36.
    发明专利
    未知

    公开(公告)号:DE19845603C2

    公开(公告)日:2000-08-17

    申请号:DE19845603

    申请日:1998-10-05

    Abstract: An illumination system (1) for a microscope, in which a first light source (2), a collector lens (3), an aperture diaphragm (4), and a condenser lens ((5) are arranged in the illumination beam path (6), is described. The illumination light is directed through the aperture diaphragm (4) via the condenser lens (5) into the object plane (9). Arranged in the illumination beam path (6) on the optical axis (20) is a second light source (8) that is imaged at infinity by the condenser lens (5).

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