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公开(公告)号：JP2000241713A
公开(公告)日：2000-09-08
申请号：JP2000036804
申请日：2000-02-15
Applicant: LEICA MICROSYSTEMS WETZLER GMB
Inventor： WEIS ALBRECHT , GANSER MICHAEL , STENZEL RUEDIGER
Abstract: PROBLEM TO BE SOLVED: To constitute a holder so as to extremely decrease danger that a sample carrier made of glass is damaged, improve operability in terms of human engineering, extend its applicable range to the sample carriers of various sizes and guarantee the sure positioning of the sample carrier without shake in directions (x), (y) and (z). SOLUTION: This holder is equipped with a movable pressing part 1 and a stationary contact part 2, and the contact part 2 is constituted to have at least one precise contact point (6a, 6b; 7) for the side 4a in the direction (x) or the side 5a in the direction (y) of the sample carrier 3. In such a case, the pressing part 1 (H1) comes in contact with the sample carrier 3 at two pressing points 8 and 9 at an actuation position. Either pressing point 9 comes in contact with the side 4a in the direction (x) of the sample carrier 3 and the other pressing point 8 comes in contact with the side 5a in the direction (y) of the sample carrier 3.
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公开(公告)号：JP2006243723A
公开(公告)日：2006-09-14
申请号：JP2006043796
申请日：2006-02-21
Inventor： WEIS ALBRECHT , GANSER MICHAEL
CPC classification number: G01N21/6458 , G02B21/02 , G02B21/06 , G02B21/084 , G02B21/16
Abstract: PROBLEM TO BE SOLVED: To provide a simply constituted objective for total internal reflection microscopy to be used for the conventional beam paths of illumination light and detection light, and to provide a microscope.
SOLUTION: Regarding the objective (1) for the total internal reflection microscopy, illumination light (3) as well as detection light (14) travel through the objective (1), whereby the illumination light (3) has a focus in the plane of the objective pupil. The objective (1) is characterized in that a diaphragm (13) is provided in the vicinity or in the plane of the objective pupil and in that the diaphragm (13) has a middle area (15) which is impermeable to the illumination light (3) and permeable to the detection light (14) as well as an edge area (16) which permeable to the illumination light (3).
COPYRIGHT: (C)2006,JPO&NCIPIAbstract translation: 要解决的问题：为了提供用于照明光和检测光的常规光束路径的全内反射显微镜的简单构成的目的，并提供显微镜。 解决方案：关于全内反射显微镜的目的（1），照明光（3）以及检测光（14）行进通过物镜（1），由此照明光（3）具有焦点 客观学生的飞机。 目的（1）的特征在于，在目标瞳孔的附近或平面内设置有隔膜（13），并且隔膜（13）具有不能透过照明光的中间区域（15） 3）并且可透过检测光（14）以及可透过照明光（3）的边缘区域（16）。 版权所有（C）2006，JPO＆NCIPI
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3.发明专利
公开(公告)号：JP2003090962A
公开(公告)日：2003-03-28
申请号：JP2002195868
申请日：2002-07-04
Applicant: LEICA MICROSYSTEMS
Inventor： WEIS ALBRECHT
Abstract: PROBLEM TO BE SOLVED: To provide an apparatus which can regulate the brightness of the illumination beam path of a microscope while providing low heat generation without varying color temperature. SOLUTION: In the apparatus for regulating the brightness of a light source (2), configured as an incandescent lamp, in the illumination beam path of the microscope, the brightness of the light source (2) being modifiable by increasing or reducing the electrical power delivered to the light source (2), a red shift, associated with the reduction in the delivered electrical power, of the spectrum of the light emitted by the light source (2) in the illumination beam path is compensated for by way of a variable optical fiber that brings about a blue shift of the spectrum. A color-neutral regulation of the brightness of the illuminating light is thereby achieved.
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公开(公告)号：JP2004163949A
公开(公告)日：2004-06-10
申请号：JP2003381413
申请日：2003-11-11
Inventor： WEIS ALBRECHT
CPC classification number: G02B26/007 , G02B21/06
Abstract: PROBLEM TO BE SOLVED: To provide a microscope which keeps the brightness and the perceived color of a sample image constant in the case of changing the numerical aperture of an optical system for illumination.
SOLUTION: The microscope is equipped with a light source (1) having a control device, the optical systems for illumination (2, 3 and 4) and an aperture part (6) in an optical path for illumination. The numerical aperture of the optical systems (2, 3 and 4) is changed by the aperture part (6), and the intensity of light radiated by the light source (1) is changed by the control device of the light source (1). In the case of changing the numerical aperture by the aperture part (6), the light source (1) is controlled simultaneously by the control device of the light source (1) so that light flux passing through the optical systems (2, 3 and 4) remains substantially unchanged. Therefore, a spectral compensating device (8) is arranged on the optical path of illumination or the optical path of an image, and the change of the spectral intensity distribution of the light radiated by the light source (1) occurring because of the control by the control device of the light source (1) is at least corrected so that it remains substantially unchanged.
COPYRIGHT: (C)2004,JPO-
公开(公告)号：JP2001108909A
公开(公告)日：2001-04-20
申请号：JP2000237006
申请日：2000-08-04
Applicant: LEICA MICROSYSTEMS
Inventor： WEIS ALBRECHT
IPC: G02B7/00 , B23Q1/26 , B25B1/24 , F16B2/20 , F16B5/10 , F16C29/12 , G01B5/00 , G02B7/16 , G02B21/00 , G02B21/06 , G02B21/16 , G02B21/24 , G12B9/08
Abstract: PROBLEM TO BE SOLVED: To provide a holder capable of reliably fixing an element having a dovetail slit arranged outside to an abutting surface without inclination, without using a tool and requiring only a very small space. SOLUTION: To the holder for fixing an element provided with a dovetail slit outside to an abutting surface 3, a pin-like bolt 4 is fixed in front of an abutting surface 3 and a compressing spring 6 to be curved in the direction of separating from the bolt under tension is fixed beside it. Their cross sections and the lengths and an interval between them are fitted to the inner profile of the dovetail slit 2. Advantageously, the spring 6 can be additionally biased to the surface 3. In order to fix the element 1, the slit 2 is pressurized against the surface 3 to a stopper through the bolt 4 and the spring 6 and locked.
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Patent Agency Ranking6.发明专利Microscope having at least one beam splitter and scattered light reducing means 审中-公开具有至少一个光束分离器和散射光减少装置的显微镜
公开(公告)号：JP2005004221A
公开(公告)日：2005-01-06
申请号：JP2004175602
申请日：2004-06-14
Inventor： WEIS ALBRECHT
CPC classification number: G02B21/06 , G02B5/003 , G02B21/16 , G02B27/0018 , G02B2207/113
Abstract: PROBLEM TO BE SOLVED: To provide a microscope having a scattered light reducing means that has a particularly compact configuration and at the same time a good scattered light reducing effect, and to provide a beam splitter unit.
SOLUTION: In the microscope having at least one beam splitter and the scattered light reducing means in the beam path of the microscope, the scattered light reducing means is constituted as a black glass plate (6) that has a (mirror surface) polished surface coated with antireflection film (7).
COPYRIGHT: (C)2005,JPO&NCIPIAbstract translation: 要解决的问题：提供一种具有散射光减少装置的显微镜，其具有特别紧凑的结构，同时具有良好的散射光减少效果，并提供分束器单元。 解决方案：在具有显微镜的光束路径中的至少一个分束器和散射减光装置的显微镜中，散射光减少装置构成为具有（镜面）的黑色玻璃板（6） 抛光表面涂有防反射膜（7）。 版权所有（C）2005，JPO＆NCIPI
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公开(公告)号：JP2002174778A
公开(公告)日：2002-06-21
申请号：JP2001266008
申请日：2001-09-03
Applicant: LEICA MICROSYSTEMS
Inventor： GANSER MICHAEL , WEIS ALBRECHT , WESNER JOACHIM , JOHANNSEN GERHARD
IPC: B23K26/03 , B23K26/073 , B23K26/402 , G01N1/04 , G01N1/28 , G02B21/32 , B23K26/00 , B23K26/02
Abstract: PROBLEM TO BE SOLVED: To provide a method for laser microscopic cutting which has reliability and cuts off a sample visual field (segment) from samples with a convenient style. SOLUTION: The method and device for laser microscopic cutting of a region of interest (23) of a sample (4) are formed with a cutting line (25), not closed, to enclose a sample region (23) of interest by a laser beam (7) in a first step. A web (26) for coupling the sample region (23) of interest remains at a place, not closed, of the cutting line (25). The web (26) is cut by using a single laser pulse directed thereto, by which the cutting line is completed in a second step. The sample region (23) of interest is thus separated from the sample (4) and is dropped into a collecting container (19) by the effect of gravity.
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公开(公告)号：JP2006235624A
公开(公告)日：2006-09-07
申请号：JP2006035077
申请日：2006-02-13
Inventor： WEIS ALBRECHT
CPC classification number: G01N1/286 , G01N2001/2886 , G02B21/16
Abstract: PROBLEM TO BE SOLVED: To show a laser microdissection unit capable of realizing the unification of a microscope having a fluorescent axis and motorized and integrated.
SOLUTION: The laser microdissection unit for cutting a microscopic sample (3) using a laser beam of a laser (19) includes a microscope (1) including an illumination beam path directed onto the sample (3) and an imaging beam path configured to image the sample (3), and the microscope includes a fluorescence device (14) including an excitation filter (15), a dichroic beam splitter (16) and a blocking filter (17). The dichroic beam splitter (16) and the blocking filter (17) are spectrally transparent to the laser beam, and the laser beam is directable through the blocking filter (17) and the dichroic beam splitter (16) onto the sample (3).
COPYRIGHT: (C)2006,JPO&NCIPIAbstract translation: 要解决的问题：显示能够实现具有荧光轴的显微镜的统一并机动和集成的激光显微解剖单元。 解决方案：使用激光激光束（19）切割微观样品（3）的激光显微切割单元包括显微镜（1），其包括指向样品（3）的照射光束路径和成像光束路径 被配置为对样品（3）成像，并且显微镜包括包括激发滤光器（15），二向色分束器（16）和阻挡滤光器（17）的荧光装置（14）。 二向色光束分离器（16）和阻挡滤光器（17）对于激光束是光谱透明的，并且激光束可以通过阻挡滤光器（17）和二向色分束器（16）被引导到样品（3）上。 版权所有（C）2006，JPO＆NCIPI
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公开(公告)号：JP2004334222A
公开(公告)日：2004-11-25
申请号：JP2004140031
申请日：2004-05-10
Inventor： WEIS ALBRECHT , GANSER MICHAEL
Abstract: PROBLEM TO BE SOLVED: To prevent unrequested deviations from being caused between individual (constitutional) images of overlay images, with respect to a microscope.
SOLUTION: In the microscope having a interference contrast transmitted-light device provided with an analyzing element (1) allowed to be arranged in an imaging optical path, two glass wedge plates (2, 3) are arranged immediately after the analyzing element (1) in the imaging direction and constituted/oriented so that the sum of respective beam deviations of the two glass wedge plates (2, 3) compensates a beam deviation caused by the analyzing element (1) to zero.
COPYRIGHT: (C)2005,JPO&NCIPI-
公开(公告)号：JP2004264857A
公开(公告)日：2004-09-24
申请号：JP2004058812
申请日：2004-03-03
Inventor： BAMBERGER STEFAN , WEIS ALBRECHT
Abstract: PROBLEM TO BE SOLVED: To provide an iris diaphragm device at a proper price which can perform the shielding perfectly, which also includes a single diaphragm surface defined for use in the microscope observation, and which requires only a slight volume of structure.
SOLUTION: The iris diaphragm device for use in the microscope includes an iris diaphragm having a frame ring at a fixed position, a rotatable adjustment ring, and a plurality of blades. The device is constituted so that a diaphragm aperture opened/closed by the plurality of blades can be continuously adjusted between the maximum aperture and the minimum aperture by the rotation of the adjustment ring. A link driving device (6) having at least two link levers (7 and 8) and operated by an operational element (9) is provided to the adjustment ring (3). Further, a screen element (11) is pivotably moved in front of the diaphragm aperture (5), is constituted so as to screen the diaphragm aperture (5), when the operational element (9) is further operated after the diaphragm aperture (5) is adjusted to a prescribed size, and is provided to one of the at least two link levers (7 and 8).
COPYRIGHT: (C)2004,JPO&NCIPI
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