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    HOLDER FOR SAMPLE CARRIER
    1.
    发明专利
    HOLDER FOR SAMPLE CARRIER 失效

    公开(公告)号：JP2000241713A

    公开(公告)日：2000-09-08

    申请号：JP2000036804

    申请日：2000-02-15

    Applicant: LEICA MICROSYSTEMS WETZLER GMB

    Inventor： WEIS ALBRECHT ,  GANSER MICHAEL ,  STENZEL RUEDIGER

    IPC: G01N1/28 ,  G02B21/26

    Abstract: PROBLEM TO BE SOLVED: To constitute a holder so as to extremely decrease danger that a sample carrier made of glass is damaged, improve operability in terms of human engineering, extend its applicable range to the sample carriers of various sizes and guarantee the sure positioning of the sample carrier without shake in directions (x), (y) and (z). SOLUTION: This holder is equipped with a movable pressing part 1 and a stationary contact part 2, and the contact part 2 is constituted to have at least one precise contact point (6a, 6b; 7) for the side 4a in the direction (x) or the side 5a in the direction (y) of the sample carrier 3. In such a case, the pressing part 1 (H1) comes in contact with the sample carrier 3 at two pressing points 8 and 9 at an actuation position. Either pressing point 9 comes in contact with the side 4a in the direction (x) of the sample carrier 3 and the other pressing point 8 comes in contact with the side 5a in the direction (y) of the sample carrier 3.

    Microscope system and image forming method
    2.
    发明专利
    Microscope system and image forming method 审中-公开
    微观系统和图像形成方法

    公开(公告)号：JP2006338001A

    公开(公告)日：2006-12-14

    申请号：JP2006138921

    申请日：2006-05-18

    Applicant: Leica Microsystems Cms Gmbh ,  ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー

    Inventor： GANSER MICHAEL

    IPC: G02B21/00

    CPC classification number: G02B21/36 ,  G02B21/365

    Abstract: PROBLEM TO BE SOLVED: To provide a microscope system and an image forming method.
    SOLUTION: The microscope system and the image forming method use a microscope (2) having one or more setting elements (6) for correcting at least one microscope setting and a camera (1) for photographing a microscopic pictures, the microscope system and the image forming method being characterized in that the camera is operable in a specified image mode. At least one of the setting elements (6) of the microscope (2) is effectively connected to the camera (1) and the specified picture mode of the camera (1) can be set in accordance with correction of microscope settings. Alternatively or in addition, the microscope settings can be corrected according to picture modes of an existent camera (1). Consequently, optimum picture modes of the camera (1) can be selected according to kinds of microscopic inspection.
    COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题：提供显微镜系统和图像形成方法。 解决方案：显微镜系统和图像形成方法使用具有用于校正至少一个显微镜设置的一个或多个设置元件（6）的显微镜（2）和用于拍摄微观图像的照相机（1），显微镜系统 并且所述图像形成方法的特征在于，所述照相机可以以指定的图像模式操作。 显微镜（2）的设置元件（6）中的至少一个有效地连接到相机（1），并且可以根据显微镜设置的校正来设置照相机（1）的指定图像模式。 或者或另外，可以根据现有照相机（1）的图像模式来校正显微镜设置。 因此，可以根据显微镜检查的种类来选择照相机（1）的最佳图像模式。 版权所有（C）2007，JPO＆INPIT

    Objective and microscope
    4.
    发明专利
    Objective and microscope 有权
    目标与显微镜

    公开(公告)号：JP2006243723A

    公开(公告)日：2006-09-14

    申请号：JP2006043796

    申请日：2006-02-21

    Applicant: Leica Microsystems Cms Gmbh ,  ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー

    Inventor： WEIS ALBRECHT ,  GANSER MICHAEL

    IPC: G02B21/02 ,  G02B21/06

    CPC classification number: G01N21/6458 ,  G02B21/02 ,  G02B21/06 ,  G02B21/084 ,  G02B21/16

    Abstract: PROBLEM TO BE SOLVED: To provide a simply constituted objective for total internal reflection microscopy to be used for the conventional beam paths of illumination light and detection light, and to provide a microscope.
    SOLUTION: Regarding the objective (1) for the total internal reflection microscopy, illumination light (3) as well as detection light (14) travel through the objective (1), whereby the illumination light (3) has a focus in the plane of the objective pupil. The objective (1) is characterized in that a diaphragm (13) is provided in the vicinity or in the plane of the objective pupil and in that the diaphragm (13) has a middle area (15) which is impermeable to the illumination light (3) and permeable to the detection light (14) as well as an edge area (16) which permeable to the illumination light (3).
    COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题：为了提供用于照明光和检测光的常规光束路径的全内反射显微镜的简单构成的目的，并提供显微镜。 解决方案：关于全内反射显微镜的目的（1），照明光（3）以及检测光（14）行进通过物镜（1），由此照明光（3）具有焦点 客观学生的飞机。 目的（1）的特征在于，在目标瞳孔的附近或平面内设置有隔膜（13），并且隔膜（13）具有不能透过照明光的中间区域（15） 3）并且可透过检测光（14）以及可透过照明光（3）的边缘区域（16）。 版权所有（C）2006，JPO＆NCIPI

    FILM THICKNESS MEASURING METHOD AND DEVICE OF TRANSPARENT FILM
    5.
    发明专利
    FILM THICKNESS MEASURING METHOD AND DEVICE OF TRANSPARENT FILM 失效

    公开(公告)号：JP2001147107A

    公开(公告)日：2001-05-29

    申请号：JP2000339229

    申请日：2000-11-07

    Applicant: LEICA MICROSYSTEMS

    Inventor： GANSER MICHAEL ,  WEISS ALBRECHT

    IPC: G01B11/06

    Abstract: PROBLEM TO BE SOLVED: To provide a method and a device for measuring the film thickness of a transparent film. SOLUTION: An irradiated beam 4 is passed through an objective lens 5 and guided to an object 1 having the transparent film 2. A structured focusing auxiliary member 9 is arranged in the irradiated beam 4, and a camera 13 is arranged in an image beam 12, and each of them is arranged on a conjugate position relative to a focusing surface 8 of the objective lens 5. The focusing surface 8 of the objective lens 5 is moved gradually through the object 1. Camera images are recorded at respective positions, and focus scores thereof are determined, and the image of the focusing auxiliary member 9 is used as a sharpness display device. The position having a maximal focus score is assigned to the position of an interface. The thickness of the transparent film 2 is calculated from the difference between each position of the interfaces.

    METHOD AND DEVICE FOR LASER MICROSCOPIC CUTTING
    6.
    发明专利
    METHOD AND DEVICE FOR LASER MICROSCOPIC CUTTING 审中-公开

    公开(公告)号：JP2002174778A

    公开(公告)日：2002-06-21

    申请号：JP2001266008

    申请日：2001-09-03

    Applicant: LEICA MICROSYSTEMS

    Inventor： GANSER MICHAEL ,  WEIS ALBRECHT ,  WESNER JOACHIM ,  JOHANNSEN GERHARD

    IPC: B23K26/03 ,  B23K26/073 ,  B23K26/402 ,  G01N1/04 ,  G01N1/28 ,  G02B21/32 ,  B23K26/00 ,  B23K26/02

    Abstract: PROBLEM TO BE SOLVED: To provide a method for laser microscopic cutting which has reliability and cuts off a sample visual field (segment) from samples with a convenient style. SOLUTION: The method and device for laser microscopic cutting of a region of interest (23) of a sample (4) are formed with a cutting line (25), not closed, to enclose a sample region (23) of interest by a laser beam (7) in a first step. A web (26) for coupling the sample region (23) of interest remains at a place, not closed, of the cutting line (25). The web (26) is cut by using a single laser pulse directed thereto, by which the cutting line is completed in a second step. The sample region (23) of interest is thus separated from the sample (4) and is dropped into a collecting container (19) by the effect of gravity.

    LASER MICRODISECTION METHOD AND DEVICE
    7.
    发明专利
    LASER MICRODISECTION METHOD AND DEVICE 审中-公开

    公开(公告)号：JP2002156316A

    公开(公告)日：2002-05-31

    申请号：JP2001265864

    申请日：2001-09-03

    Applicant: LEICA MICROSYSTEMS WETZLER GMB

    Inventor： GANSER MICHAEL

    IPC: G01N33/48 ,  G01N1/04 ,  G01N1/28

    Abstract: PROBLEM TO BE SOLVED: To provide a laser microdisection method and a device, capable of cutting off a sample observation/inspection region from a sample in matching with the purpose, and preventing fold backs of the sample observation/inspection region. SOLUTION: This method includes (a) a step for forming perforation including webs 26, 27, 28 by a laser beam 7 along a cutting plane line 25, enclosing the sample observation/inspection region 23 and interrupted by the webs 26, 27, 28, in which the perforation has two or more webs 26, 27, 28 interrupting the cutting plane line 25 and the webs 26, 27, 28 connect the sample observation/ inspection region 23 to the sample 4 surrounding the sample observation/ inspection region, and (b) a step for cutting off the webs 26, 27, 28 of the perforation by a single laser pulse, which is directed toward the sample observation/ inspection region 23 and defocused, and cutting off the sample observation/ inspection region 23 from the sample 4.

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