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公开(公告)号：DE10120626B4
公开(公告)日：2010-02-11
申请号：DE10120626
申请日：2001-04-26
Applicant: LEICA MICROSYSTEMS
Inventor： HOFFMANN JUERGEN
Abstract: Microscope (1) for investigating a sample having a light source (7), which emits illumination light (19) of at least one illumination wavelength for illumination the sample (15) and at least one control element (61 to 71). The microscope is characterized in that the control element (61 to 71) is visible in darkness.
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公开(公告)号：DE10150542B4
公开(公告)日：2007-03-29
申请号：DE10150542
申请日：2001-10-12
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: The invention discloses a fluorescence microscope comprising a light source that emits excitation light for illumination of a specimen, means for defining a two-dimensional search region for the excitation and detection wavelengths, means for selecting a subregion from the search region, at least one detector that detects detected light proceeding from the specimen, and a display for displaying an image of at least a portion of the specimen. Furthermore the invention discloses a method for fluorescence microscopy.
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公开(公告)号：DE10321829A1
公开(公告)日：2004-12-16
申请号：DE10321829
申请日：2003-05-14
Applicant: LEICA MICROSYSTEMS
Inventor： MOELLMANN KYRA , HOFFMANN JUERGEN
Abstract: The beam deflector has two tilting mirrors (3,4) each carried on a shaft (1,2). The axes of rotation of the mirrors are essentially parallel to each other. The shafts (1,2) are mechanically coupled for rotation of the mirrors such that the mirrors rotate a different angles to each other in a predetermined angular relationship. Preferably the two shafts have a common drive such that one driven shaft drives the other.
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公开(公告)号：GB2369953B
公开(公告)日：2003-04-30
申请号：GB0123899
申请日：2001-10-04
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: A light source for illumination in scanning microscopy, and a scanning microscope contain an electromagnetic energy source that emits light of one wavelength, and a beam splitter for spatially dividing the light into at least two partial light beams. An intermediate element for wavelength modification is provided in at least one partial light beam.
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公开(公告)号：GB2366115B
公开(公告)日：2003-04-02
申请号：GB0117156
申请日：2001-07-13
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HOFFMANN JUERGEN
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Patent Agency Ranking
公开(公告)号：DE10120626A1
公开(公告)日：2002-11-07
申请号：DE10120626
申请日：2001-04-26
Applicant: LEICA MICROSYSTEMS
Inventor： HOFFMANN JUERGEN
Abstract: Microscope (1) for investigating a sample having a light source (7), which emits illumination light (19) of at least one illumination wavelength for illumination the sample (15) and at least one control element (61 to 71). The microscope is characterized in that the control element (61 to 71) is visible in darkness.
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公开(公告)号：DE10105391A1
公开(公告)日：2002-08-29
申请号：DE10105391
申请日：2001-02-06
Applicant: LEICA MICROSYSTEMS
Inventor： HOFFMANN JUERGEN
Abstract: The invention discloses a scanning microscope for optical measurement with high spatial resolution of a specimen point of a specimen, having a light source for emitting an exciting light beam suitable for exciting an energy state of the specimen; a detector for detection of the emitted light; and a stimulating light beam, coming from the light source, for generating stimulated emission of the specimen excited by the exciting light beam at the specimen point, the exciting light beam and the stimulating light beam being arranged in such a way that their intensity distributions in the focal region partially overlap, wherein optical elements which shape the stimulating light beam are combined into at least one module that is positionable in the beam path of the scanning microscope.
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公开(公告)号：DE10063276A1
公开(公告)日：2002-07-04
申请号：DE10063276
申请日：2000-12-19
Applicant: LEICA MICROSYSTEMS
Inventor： HOFFMANN JUERGEN
Abstract: The device has an illumination beam path (41), a microscope lens (37) and at least one light source (17,21) that produce a stimulation beam (19) and an emission beam (23) of different wavelengths. The stimulation beam is focused on a first region in a first plane and stimulates the specimen (39). The emission beam is focused on a second region in a second plane in a specimen and produces stimulated emission. The focus regions at least partly overlap. The optical properties of the components in the illumination beam path are patched together so that optical aberrations are corrected so focus regions remain relatively fixed independently of the scanning motion.
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公开(公告)号：GB2369192A
公开(公告)日：2002-05-22
申请号：GB0113359
申请日：2001-06-01
Applicant: LEICA MICROSYSTEMS
Inventor： HOFFMANN JUERGEN
Abstract: A scanning microscope (100) possesses at least one illumination source (4), an objective (10), and at least one detector (12). An optical circulator (14) is arranged between the at least one illumination source (4), the objective (10), and the at least one detector (12). In a further embodiment, the scanning microscope (100) is configured as a confocal microscope.
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公开(公告)号：GB2367702A
公开(公告)日：2002-04-10
申请号：GB0118351
申请日：2001-07-27
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: A scanning microscope, in particular a confocal scanning microscope, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is, with a view to fast and reliable image-data acquisition and a compact structure, configured and refined in such a way that the scanning device has at least one micromirror (16). An optical arrangement with a light source (1), preferably a laser, for generating a light beam and at least one micromirror (16) for deflecting the light beam is furthermore provided, in which an adaptive lens (22) is provided for correcting for mirror defects or deformation of the mirror surface. Lastly, a method for imaging in scanning microscopy, in particular in confocal scanning microscopy, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is provided, in which at least one micromirror (16) is used in the scope of the scanning device.
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