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公开(公告)号:JP2002131649A
公开(公告)日:2002-05-09
申请号:JP2001236488
申请日:2001-08-03
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: PROBLEM TO BE SOLVED: To provide a scanning microscope which has a light source (1) preferably being a laser for generating an irradiation light beam (14) for a sample (11) and a scanner for deflecting the irradiation light beam (14) and realizes image data acquisition of a high speed and high reliability and a compact structure, more preferably a confocal scanning microscope and further to provide a scanning microscope method utilizing the light source (1) preferably being the laser for generating the irradiation light beam (14) for the sample (11) and the scanner for deflecting the irradiation light beam (14), more particularly a method for image formation in the confocal scanning microscope method. SOLUTION: The scanner is improved by constituting the same in a manner as to have at least one micromirror (16). The at least one micromirror (16) is used in the range of the scanner.
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公开(公告)号:JP2002122788A
公开(公告)日:2002-04-26
申请号:JP2001244228
申请日:2001-08-10
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , STORZ RAFAEL
Abstract: PROBLEM TO BE SOLVED: To provide a means (a vibration attenuator for microscope) of effectively lowering the natural oscillation of the microscope. SOLUTION: The vibration attenuator (1) for the microscope (7) includes a housing (3). Foam rubber (4) for regulating a cavity (5) in the housing (3) is formed to enclose a weight. The foam rubber (4) has plural interconnected bores. The housing (3) includes the vibration attenuator (1), which has a rectangular shape in one embodiment.
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公开(公告)号:JP2002107633A
公开(公告)日:2002-04-10
申请号:JP2001267466
申请日:2001-09-04
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: PROBLEM TO BE SOLVED: To provide a method and a device for optimizing or increasing the fluorescent light photon collection quantity of a fluorescent substance excited by multiple photon excitation so as to generate fluorescence in order to detect an optimum sample as to a method and a device for detecting fluorescence in a scanning microscopic method, especially a confocal scanning microscopic method. SOLUTION: The operation variable of a light source (2) generating multiple photon excitation and/or the system variable of a confocal scanning microscope is suited to the characteristics of a fluorescent material as to the optimum fluorescent photon collection quantity.
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公开(公告)号:JP2002062504A
公开(公告)日:2002-02-28
申请号:JP2001203644
申请日:2001-07-04
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN
Abstract: PROBLEM TO BE SOLVED: To provide a device for changing a light beam in two directions intersecting substantially perpendicularly to each other, for suppressing a distor tion error caused by the device to the minimum or eliminating it. SOLUTION: The optical device deflects light beams 1, 14 particularly in two directions 2, 3 intersecting substantially perpendicularly to each other. The optical device has preferably two mirrors 8, 10 turned by a rotary drive device 4, 5 around each axes intersecting perpendicularly to each other, namely, an x-axis, 6 and a y-axis 7. One of two mirrors 8, 10 is allotted to another mirror 9 at a prescribed angular position in a fixed mode about its rotation. The allotted mirrors 8, 9, namely, a first and second mirrors, rotate cooperatively around the y-axis 7. Light beams 1, 14 to be applied to a confocal scanning type microscope are then deflected by the rotation of light beams 1, 14 around the rotation axis 6 of a third mirror 10, namely, the pivot 11 of the x-axis.
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公开(公告)号:JP2001201691A
公开(公告)日:2001-07-27
申请号:JP2000380302
申请日:2000-12-14
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN
IPC: G02B21/00
Abstract: PROBLEM TO BE SOLVED: To provide a system utilized in a scanning type microscope and a method for providing a user guide. SOLUTION: The system for providing the user guide includes an irradiation source 2 for generating a light beam L and an optical device forming and leading the light beam L. A scanner 6 performs scanning with the light beam L so as to cross a sample 10. At least one detector 12 is used to detect fluorescence or reflected light from the sample 10. The position signal P of the light beam is detected on the sample 10.
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公开(公告)号:JP2002055283A
公开(公告)日:2002-02-20
申请号:JP2001183689
申请日:2001-06-18
Applicant: LEICA MICROSYSTEMS
Inventor: STORZ RAFAEL , ENGELHARDT JOHANN
IPC: G02B5/00 , G02B6/02 , G02B6/122 , G02B6/255 , G02B21/00 , G02B21/06 , G02B27/00 , H01S3/00 , H01S3/16
Abstract: PROBLEM TO BE SOLVED: To provide a scanning microscope which allows the inspection of a sample at various wavelengths and (or) in wavelength ranges and does not require the post adjustment of wavelength intrinsic component elements in an optical path at this time. SOLUTION: This scanning microscope is provided with an optical element 4 which produces at least partially spectrally diffusing illumination light within its illumination optical path 8. A beam splitter 11 which does not substantially depend upon polarized light and wavelength is positioned, fixed and arranged within the illumination optical path 8 and a detecting optical path 15.
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公开(公告)号:JP2002048980A
公开(公告)日:2002-02-15
申请号:JP2001183695
申请日:2001-06-18
Applicant: LEICA MICROSYSTEMS
Inventor: STORZ RAFAEL , ENGELHARDT JOHANN
IPC: G02B5/00 , G02B5/04 , G02B5/18 , G02B5/22 , G02B6/02 , G02B6/122 , G02B6/255 , G02B21/00 , G02B21/06 , G02B27/00 , H01S3/00 , H01S3/16
Abstract: PROBLEM TO BE SOLVED: To avoid illumination undesirable to a specimen in a scanning microscope. SOLUTION: A restricting means (16) to restrict the beam of a first wavelength is provided in a beam (15) whose wavelength is changed.
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公开(公告)号:JP2002040332A
公开(公告)日:2002-02-06
申请号:JP2001175727
申请日:2001-06-11
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN
Abstract: PROBLEM TO BE SOLVED: To form an objective lens exchanger which is capable of utilizing the sufficient space which does not damage the respective parts of additive devices in a region of a sample to be observed. SOLUTION: The device for exchanging the objective lenses includes at least one objective lens (5) which regulates a major axis (6). The exchange of the objective lens between an objective lens storage position (22) and a reference objective lens position (5a) may be realized by this device. The reference objective lens position (5a) exists within a light beam route which regulates the optical axis (3). The holding element regulates the reference objective lens position (5a) and the objective lens (5) is movable so as to be substantially coaxial with the optical axis (3) with respect to the major axis (6) near the holding element (26) in exchanging the objective lens. The objective lens is exchanged along a guide rail (17).
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公开(公告)号:JP2001324679A
公开(公告)日:2001-11-22
申请号:JP2001100297
申请日:2001-03-30
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , HOFFMANN JUERGEN , STORZ RAFAEL , ULRICH HEINRICH , BEWERSDORF JOERG , BIRK HOLGER
Abstract: PROBLEM TO BE SOLVED: To form a low output power laser beam source which can be utilized especially as a light source for a confocal scanning type microscopic method. SOLUTION: In this device for coupling beams from at least two laser beam sources 1 and 2 related to the confocal scanning type microscopic method, the beams from the laser beam sources 1 and 2 at least have nearly the same wavelength. The device is provided with at least a beam coupling device 11 coupling light beams by a system hardly having loss.
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公开(公告)号:JP2001305430A
公开(公告)日:2001-10-31
申请号:JP2000124412
申请日:2000-04-25
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , JOACHIM BURADORU
Abstract: PROBLEM TO BE SOLVED: To realize high-resolution microscopic technology in a conventional microscope, for example, in a confocal laser scanning type microscope especially even by additional equipment. SOLUTION: An objective lens 2 and a beam splitter/beam integrator 5 are formed in one module type assembly 8. The assembly 8 is provided with an interface 9 for connecting to an illumination/detection optical path 4 of the microscope.
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