公开(公告)号：JP2001228082A

公开(公告)日：2001-08-24

申请号：JP2000035724

申请日：2000-02-14

Applicant: SHIMADZU CORP

Inventor： SATO TATSUMI

IPC: G01N21/27 ,  G01J3/08

Abstract: PROBLEM TO BE SOLVED: To measure a large-sized sample in a horizontally placed state. SOLUTION: Luminous flux S on a sample side is incident on the undersurface of a sample 21, in an almost vertical direction and the light transmitted through the sample upwardly is refracted by a reflecting mirror M1 to be sent to an integrating sphere 24 equipped with a detector. A luminous flux R on the reference side incident, in parallel with the luminous flux S on the sample side, is refracted by reflecting mirrors M2-M4 so as to bypass the sample 21 to be introduced into the integrating sphere 24. Accordingly, it is unnecessary to prepare a holder matched with the sample 21 in size or shape, and a measuring position can be freely changed by shifting the position of the sample. When a conventional standard sample chamber 11 is utilized, movable reflecting mirrors 22, 23 are inserted in a optical path and luminous flux advancing on a horizontal surface in parallel by reflectingt mirrors M5-M7 may be used.

公开(公告)号：JPH09264655A

公开(公告)日：1997-10-07

申请号：JP7357796

申请日：1996-03-28

Applicant: SHIMADZU CORP

Inventor： SATO TATSUMI ,  KITA JUNICHI ,  NAKANO HIROSHI

IPC: G01N25/56 ,  F25D21/02 ,  G01W1/00

Abstract: PROBLEM TO BE SOLVED: To facilitate a mounting work, to occupy no wide space, and besides to detect in such a manner that adhesion of frost is distinguished from that of ice. SOLUTION: A base sheet 4 having a heat generating resistor 2 and a thermistor 3 is arranged in the vicinity of a heat-exchanger. When temperature detected by the thermistor 3 is lower than a freezing temperature, the heat generating resistor 2 is caused to generate heat in a specified time ratio until temperature measured by the thermistor 3 is increased by a given value. When an increase time required for the increase of the temperature is higher than a given ice boundary value, it is decided that a freezing state is produced. When the increase time is lower than the ice boundary value and higher than a given frost boundary value, it is decided that a frosting state is produced. When the increase time is lower than the frost boundary value, it is decided that neither frost nor ice is adhered.

公开(公告)号：JPH0678942B2

公开(公告)日：1994-10-05

申请号：JP31326086

申请日：1986-12-29

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO ,  GOTO SEIJI ,  SATO TATSUMI

IPC: G01J3/18

公开(公告)号：JPH05302853A

公开(公告)日：1993-11-16

申请号：JP6513091

申请日：1991-03-29

Applicant: SHIMADZU CORP

Inventor： SATO TATSUMI ,  YAMAUCHI HIRONORI

IPC: G01J1/02 ,  G01J3/02 ,  G01N21/47

Abstract: PURPOSE:To reduce the opening area of an incident window, to reduce the opening ratio of an integrating sphere and to make it possible to measure the diffused reflection only based on the diffused reflection component by providing the constitution wherein luminous fluxes are cast into two reflection measuring windows at an incident angle 0 and a specified incident angle. CONSTITUTION:A main body 1 of an integrating sphere has two reflection measuring windows, wherein a sample 2 whose reflection is measured or a standard sample 2 is arranged. Incident windows A and B, through which measuring luminous flux or reference luminous flux is cast, are provided in correspondence with the reflection measuring windows. The window A is set so that the incident luminous flux 3 is cast on the sample at the specified incident angle and the reflected luminous flux 4 does not return to the incident window again. The incident window at the side A has the opening area of the size, which can sufficiently pass only the incident luminous flux, because the luminous flux 3 has the specified incident angle and the entire reflected luminous flux from the corresponding sample is supplemented with the inner wall of the integrating sphere. Namely aXb (a

公开(公告)号：JPH0577972B2

公开(公告)日：1993-10-27

申请号：JP1925289

申请日：1989-01-28

Applicant: SHIMADZU CORP

Inventor： SATO TATSUMI ,  NISHIGAKI HIDEHISA

IPC: G01J3/10

公开(公告)号：JPH0287028A

公开(公告)日：1990-03-27

申请号：JP23824788

申请日：1988-09-22

Applicant: SHIMADZU CORP

Inventor： SATO TATSUMI

IPC: G01J3/18

Abstract: PURPOSE:To cover a wide wavelength region by setting different wavelengths by one diffraction grating without using a change-over mechanism by using a diffraction grating wherein the angles of inclination to the grating surfaces of the slopes of a grating groove on both sides thereof are made different from each other. CONSTITUTION:A diffraction grating G is mounted to the upper part of a shaft rotatable around a point 0 and a sign bar S is provided to the shaft so as to protrude horizontally therefrom. A feed screw T is rotated by a drive device D using a pulse motor and the quantity of rotation of the screw T is converted to a wavelength to be displayed. The nut NA with which the sphere provided to the leading end of the sign bar S is brought into contact is threaded with the feed screw T. When the sign bar S is vertical to the grating surface of the diffraction grating G and present in an ON-direction, the wavelength of diffracted light is 0 and becomes the starting position of a spectroscope. Since the sign bar S is energized in a clockwise direction by a spring Sp, said sign bar S is always elastically in contact with the nut NA and revolved in the clockwise direction as the nut is moved to the right. According to the belonging wavelength region of a measured wavelength, either one of +1st order diffracted light and -1st order diffracted light is utilized.

公开(公告)号：JPH01245124A

公开(公告)日：1989-09-29

申请号：JP7516788

申请日：1988-03-28

Applicant: SHIMADZU CORP

Inventor： SATO TATSUMI

IPC: G01J3/18

Abstract: PURPOSE:To improve the wavelength resolution by constituting the title double monochromator so that a filter for cutting a higher order diffracted light in a monochromator for fetching lower order and higher order diffracted light can be inserted and detached into and from a suitable part of an optical system of both monochromators. CONSTITUTION:In a double monochromator consisting of front stage and rear stage monochromators 1, 2, a filter 6 is placed so as to go in and out freely on an optical path in the vicinity of a slit 4, on the front stage spectroscope area side of the slit 4. In this state, in the double monochromator, within a range of 450-900nm, the filter 6 is advanced onto the optical path. In this case, the filter 6 is an LPF of sharp cut for cutting =450nm is made incident on the monochromator 2 together with a secondary diffracted light of one wavelength within a range of 190-450nm of the monochromator 1, but in the monochromator 2, a light beam of one wavelength of a range of 190-450nm is selected, and an unnecessary primary diffracted light is not emitted from an outlet slit 5.

公开(公告)号：JPS63168519A

公开(公告)日：1988-07-12

申请号：JP31326086

申请日：1986-12-29

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO ,  GOTO SEIJI ,  SATO TATSUMI

IPC: G01J3/18

Abstract: PURPOSE:To obtain a monochrometer having high refraction efficiency over a wide range of a wavelength region, by constituting the monochrometer of a main spectroscope having high resolving power and the pre-spectroscope having low resolving power connected to said main spectroscope in series and using a plane diffraction spparatus as the dispersing element of the pre-spectroscope. CONSTITUTION:A monochrometer is constituted of a main spectroscope 12 having high resolving power and a pre-spectroscope 4 having low resolving power, the light from a light source 16 is projected on a condensing mirror 26 through the inlet slit 24 of the pre-spectroscope 14 and the reflected light is allowed to be incident to a plane diffraction lattice 8 being a composite diffraction lattice having a plurality of blaze parts. This lattice 18 is supported by a support member 20 and made rotatable around shaft 22 but the shaft 22 is provided at a position shifted from the surface of the diffraction lattice. Further, each of the blaze parts is constituted of a blaze part 18a of 250nm and a blaze part 18b of 550nm and the reflected light from the lattice 18 is allowed to pass through the spectroscope 12, which has a concave mirror 32, a diffraction lattice 30 and a concave mirror 34 mounted therein, through the outlet slit 28 of the spectroscope 12 to be discharged to the outside from an outlet slit 36.

公开(公告)号：JP2007024906A

公开(公告)日：2007-02-01

申请号：JP2006250356

申请日：2006-09-15

Applicant: Shimadzu Corp ,  株式会社島津製作所

Inventor： SATO TATSUMI

IPC: G01N21/27 ,  G01J3/42

Abstract: PROBLEM TO BE SOLVED: To provide a double beam spectrophotometer capable of measuring large-scale samples in a horizontally-installed situation.
SOLUTION: The sample-side light flux S is incident in a nearly vertical direction to the undersurface of sample 21, while the light transmitted upward is inflected with a reflecting mirror M to send to an integrating sphere 24 equipped with a detector. The control-side light flux R incident in parallel to the sample-side light flux S is inflected with reflecting mirrors M2 to M4 so as to bypass the sample 21 to be introduced to the integrating sphere 24. The measuring position is, therefore, freely changeable by shifting the sample position, without necessity to prepare holders fitted with magnitude and geometry of the sample 21. Moreover, when the conventional standard sample room 11 is utilized, by inserting adjustable reflecting mirrors 22 and 23 into a light path, the light flux may be obtained to propagate parallelly over horizontal plane by the use of the reflecting mirrors M5 to M7.
COPYRIGHT: (C)2007,JPO&INPIT

Abstract translation: 要解决的问题：提供能够在水平安装情况下测量大规模样品的双光束分光光度计。 解决方案：样品侧光束S沿着与样品21的下表面大致垂直的方向入射，而向上传输的光被反射镜M折射，以送到配备有检测器的积分球24。 与采样侧光束S并联入射的控制侧光束R被反射镜M2〜M4折回，以使旁路样品21被引入积分球24.测量位置因此是自由的 可以通过移动样品位置而改变，而不需要准备具有样品21的大小和几何形状的保持器。此外，当使用传统的标准样品室11时，通过将可调节反射镜22和23插入到光路中，光通量 可以通过使用反射镜M5至M7在水平面上平行地传播。 版权所有（C）2007，JPO＆INPIT

公开(公告)号：JP2003042939A

公开(公告)日：2003-02-13

申请号：JP2001235775

申请日：2001-08-03

Applicant: Shimadzu Corp ,  株式会社島津製作所

Inventor： SATO TATSUMI ,  SHINOYAMA TOMOO

IPC: G01J3/02 ,  G01N21/01 ,  G01N21/27

Abstract: PROBLEM TO BE SOLVED: To easily make a beam size changed, when light transmission and reflection for a microsample and a microfine portion are measured.
SOLUTION: A beam diaphragm part A, and a light transmission measuring part B, a dispersive reflection measuring position C and a mirror reflection measuring part D are brought into optical conjugated relation, and an image in the beam diaphragming part A is image-focused in the light transmission measuring part B, the dispersive reflection measuring position C and the mirror reflection measuring part D. That is, when the size of an opening part in a beam diaphragm 4 is reduced, the size of a measured beam is also reduced proportionally thereto, since the image in the beam diaphragm 4 is image formed in the light transmission measuring part B, the dispersive reflection measuring position C and the mirror reflection measuring part D.
COPYRIGHT: (C)2003,JPO

Abstract translation: 要解决的问题：为了容易地使光束尺寸改变，当测量微样品和微细部分的光透射和反射时。 解决方案：光束隔膜部分A，透光测量部分B，分散反射测量位置C和反射镜测量部分D成为光共轭关系，并且光束隔膜部分A中的图像被图像聚焦在 透光测量部分B，分散反射测量位置C和镜面反射测量部分D.也就是说，当光束光阑4中的开口部分的尺寸减小时，测量光束的尺寸也与其成比例地减小 由于光束光阑4中的图像是在透光测量部分B，分散反射测量位置C和镜面反射测量部分D中形成的图像。