REAGENT DISTRIBUTION AND STIRRING APPARATUS

    公开(公告)号:JPH0280961A

    公开(公告)日:1990-03-22

    申请号:JP23313888

    申请日:1988-09-16

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To rapidly and simply stirr a distributed solution after the distribution of a reagent by together providing stirring function to a reagent distribution apparatus. CONSTITUTION:The up-and-down moving means 6 of a reagent distribution and stirring apparatus 1 is driven by a moving mechanism and the nozzle part a2 of a nozzle pipeline (a) falls and the corrugated deformed part (x) of the nozzle part is inserted in the reaction tube 7 at a distribution position. A predetermined amount of a reagent for starting reaction is emitted and distributed in the reaction tube 7 from the nozzle at the leading end of the pipeline (a) by driving a syringe pump 32. Thereafter, the pulse motor 55 of a stirring mechanism 5 is intermittently and repeatedly rotated forwardly and reversely, and the pipeline shaft from the elastic deformable part a1 of the pipeline (a) to the nozzle part thereof is repeatedly revolved through gears 54, 53 while supported in a twisted state at the deformable part a1 in a forward and reverse direction. With this operation, the deformed part (x) is revolved in the reaction tube 7 to stirr and mix a specimen and the reagent.

    METHOD FOR MEASURING MOLECULAR ABSORPTION COEFFICIENT

    公开(公告)号:JPS63243838A

    公开(公告)日:1988-10-11

    申请号:JP8025087

    申请日:1987-03-31

    Applicant: SHIMADZU CORP

    Inventor: TSUNASAWA YOSHIO

    Abstract: PURPOSE:To automatically obtain a molecular absorption coefft. having good accuracy with a simple operation by calculating the respective molecular absorption coeffts. from plural data on absorbancies for one wavelength and subjecting the data to weight averaging by multiplying the same by the weight determined according to a reliability function. CONSTITUTION:The data on the reliability function of the absorbancies are previously stored in a memory 9. Wavelength scanning of a spectroscope 1 is executed for every one sample soln. and the data on the absorbancy spectra of the respective sample solns. are taken into a memory 7 by CPU 6 at the time of start of analysis. The plural samples which are different in the concn. or concn. and optical path length of the materials to be measured are prepd. and the data on the measurement of the absorbancy spectra are obtd. with these samples and the molecular absorption coeffts. are respectively calculated from the plural sets of the absorbancy data for one wavelength. The resulted molecular absorption coeffts. are weight-averaged by multiplying the weight determined according to the reliability function of the original absorbancy and the result thereof is determined as the molecular absorption coefft. of that wavelength. This arithmetic operation is executed over the entire measurement wavelength, by which the molecular absorption coefft. having the good accuracy is obtd.

    METHOD FOR MEASURING CONCENTRATION BY ABSORPTION PHOTOMETER

    公开(公告)号:JPS63243837A

    公开(公告)日:1988-10-11

    申请号:JP8024987

    申请日:1987-03-31

    Applicant: SHIMADZU CORP

    Inventor: TSUNASAWA YOSHIO

    Abstract: PURPOSE:To permit automatic concn. measurement with good accuracy by determining the concn. of an original sample by the concn. of the highest reliability which is determined by the predetermined reliability function from the actually measured absorbancy values of the samples as well as the optical path length or dilution rate thereof. CONSTITUTION:The reliability function is previously determined with respect to the absorbancy value and is stored in a memory 9. A sample exchanger 3 is controlled by a CPU 6 to feed the plural samples into a measuring chamber 2 where the absorbancy is measured by using the sample having plural stages of optical path lengths or dilution rates with respect to the same sample. The absorbancy value having the max. reliability is retrieved by the reliability function stored in the memory 9 from the resulted plural absorbancy values and the concn. of the original sample is measured from the optical path length or dilution rate of the sample which gives said absorbancy. An equally good practice is to add the weight determined according to the reliability function to the resulted absorbancy value and to determine the concn. of the original sample by weight averaging.

    ABSOLUTE REFLECTION FACTOR MEASURING APPARATUS

    公开(公告)号:JPS6388430A

    公开(公告)日:1988-04-19

    申请号:JP23406286

    申请日:1986-09-30

    Applicant: SHIMADZU CORP

    Inventor: TSUNASAWA YOSHIO

    Abstract: PURPOSE:To enable the measuring of absolute reflection factor directly and without disturbance disregarding even a slight curve of a sample surface varying the angle of incidence continuously, by setting an integrating sphere at the tip of a rotary arm with the sample surface positioned at the center of a rotating section of a goniometer. CONSTITUTION:An integrating sphere K is place at the position of 180 deg. on a goniometer with the setting of no sample S so that light emitted from a spectroscope 5 is incident directly on the integrating sphere K and an output of a photoelectric multiplier tube 3 is taken into a data processor 11. Then, a sample S is set with the surface thereof positioned on the center line of rotation of a rotary base 1 so that the surface of the sample is parallel with the emission light of the spectroscope when the rotary base 1 is at an angular position of 90 deg. on the goniometer. Then, as the rotary base 1 is turned to a desired angular position theta, the rotary arm 2 takes a position of 2theta. In this manner, the emission light of the spectoscope 5 is reflected on the sample surface to be incident on the integrating sphere K, when the output of the multiplier tube 3 is taken into the processor 11. Finally, absolute spectroscopic reflection factor on the surface of the sample S can be determined by performing a specified computation with the device 11.

    MONOCHROMATOR
    35.
    发明专利

    公开(公告)号:JPS6352019A

    公开(公告)日:1988-03-05

    申请号:JP19776486

    申请日:1986-08-22

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To simplify a wavelength driving mechanism by performing wavelength driving with one feed screw as to a monochromator equipped with >=2 diffraction gratings. CONSTITUTION:The diffraction gratings G1 and G2 are rotated by levers 2 and 4. The lever 2 (or 4) has length l1 (or l2), the feed screw 6 is supported rotatably, and a nut 8 is fitted movably in its axial direction. The nut is moved by the rotation 10 of the screw 6 and the tip spheres of the levers 2 and 4 which abut on the nut 8 through an abutting plate move along with the nut 8. Incident light 14 is incident through an incident slit S1 and diffracted spectrally by the grating G1, and the light is reflected by a mirror 16 after passing through a slit S2, incident on and diffracted spectrally by the grating G, and projected from a projection slit S3. Consequently, the gratings G1 and G2 can be rotated accurately in synchronism with the screw 6. Thus, the >=2 gratings G1 and G2 are rotated at the same time with the single screw 6, so the structure is simplified.

    SPECTROPHOTOMETER
    37.
    发明专利

    公开(公告)号:JPS62113046A

    公开(公告)日:1987-05-23

    申请号:JP25357385

    申请日:1985-11-12

    Applicant: SHIMADZU CORP

    Inventor: TSUNASAWA YOSHIO

    Abstract: PURPOSE:To enable the measurement both for a liquid tank and a flat sample, by arranging a sample unit adapted to be irradiated with a horizontal luminous flux and a sample unit adapted to be irradiated with a vertical luminous flux in a single sample chamber. CONSTITUTION:When without a flat sample 32, a bend mirror 24 acts merely as focusing mirror. Regarding this action, the bend mirror 24 works the same as a lens 36 inserted into the side of a control luminous flux 14. Therefore, the use of a solution cell holder 26 at a horizontal luminous flux 12a of a sample side luminous flux 12 enables the same measurement as in the past. On the other hand, when measuring a planar sample 32 such as gel developed by electrophoresis, all to do is to remove the solution cell holder 26. For measurement of a gel, normally, the holder 30 for the planar sample is used to make a scan in the direction of development of the gel employing a parallel moving mechanism. This enables the realization of a position scanning mechanism of a planar sample and a cell positioner of the solution cell holder in the same moving mechanism by differentiating a program.

    MULTIPLE LUMINOUS FLUX SPECTROPHOTOMETER

    公开(公告)号:JPS56138225A

    公开(公告)日:1981-10-28

    申请号:JP4252780

    申请日:1980-03-31

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To elevate durability of a spectrophotometer and make it inexpensive, by constituting two equivalent light passages after emission of a reference cell and a sample cell of a symmetrical multiple luminous flux spectrophotometer for which one rotary sector mirror has been used, by use of two concave mirrors and one plane mirror. CONSTITUTION:A light beam of the light source L, which has been separated by the monochromator M is reflected by the concave mirror m1, is made to branch to two beams by the rotary sector mirror S1, which pass through the equivalent concave mirrors m3, m4, the reference cell Cr and the sample cell Cs, and are converged at the same spot on the photoelectric surface of the photodetector D through the concave mirrors m5, m6 whose curvature is different, and the plane mirror m7. The angles theta made by the incident beam and the emitting beam in the concave mirrors m5, m6 are equal, but the positions are different by DELTAl. The plane mirror m7 is placed at a prescribed position where the light passages of two beams which have been emitted from the concave mirror m5 and m6 are made equivalent. Since the rotary sector mirror has been decreased by one piece, it is possible to elevate durability of a spectrophotometer and also make it inexpensive.

    Apparatus for inspecting substrate
    40.
    发明专利
    Apparatus for inspecting substrate 审中-公开
    检测基板的装置

    公开(公告)号:JP2014169878A

    公开(公告)日:2014-09-18

    申请号:JP2013040520

    申请日:2013-03-01

    CPC classification number: Y02E10/50

    Abstract: PROBLEM TO BE SOLVED: To provide an apparatus for inspecting a substrate capable of efficiently inspecting micro-cracks by utilizing a reflected image from a substrate.SOLUTION: An apparatus for inspecting a substrate includes: an integrating sphere 14 disposed above a substrate 100 for a solar battery cell conveyed by a conveyance mechanism 1; light source units 2 for emitting light to inside of the integrating sphere 14; and a CCD camera 15 provided with a CCD element for photographing an image of light irradiated from the light source unit 2 and reflected by the integrating sphere 14 and the substrate 100 for the solar battery cell, and an optical system. Each of the light source units 2 is constituted of: a first light source 21 for irradiating infrared light of a first wavelength having high transmissivity to the substrate 100 for a solar battery cell; a second light source 22 for irradiating infrared light of a second wavelength that is shorter than the first wavelength and has different transmissivity to the substrate; and a third light source 23 for irradiating visible light.

    Abstract translation: 要解决的问题:提供一种用于检查能够通过利用来自基板的反射图像有效地检查微裂纹的基板的装置。解决方案:用于检查基板的装置包括:积分球14,设置在基板100上方,用于 由输送机构1输送的太阳能电池单元; 用于将光发射到积分球14内部的光源单元2; 以及CCD摄像机15,其配备有用于拍摄从光源单元2照射并由积分球14和太阳能电池单元的基板100反射的光的图像的CCD元件,以及光学系统。 每个光源单元2由用于将太阳能电池单元的基板100照射具有高透射率的第一波长的红外光的第一光源21构成; 第二光源22,其用于照射比第一波长短的第二波长的红外光并且具有与基板不同的透射率; 以及用于照射可见光的第三光源23。

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