Abstract:
PROBLEM TO BE SOLVED: To provide an element transfer method and a display device that can easily exfoliate a substrate after an element is transferred from the substrate, where elements are arranged, to another substrate, is capable of reducing the possibility of damage on the substrate, and can transfer an additional element onto the same substrate again once the transfer of element is done. SOLUTION: A plurality of elements arranged on a temporary holding substrate is held by being embedded to an adhesive layer formed on a transfer substrate and the elements are peeled off from a temporary holding substrate. The elements can be arranged on the large area transfer substrate by additionally embedding the other elements to the adhesive layer before the adhesive layer is cured. Embedding of the elements having different characteristics from the elements embedded previously to the adhesive layer can easily provide a multi-color display device and a display device having a drive circuit. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a light emitting mounting board which can be intended to maximize an extraction efficiency of a light. SOLUTION: An end 14 inclining to a lower face of an n-type GaN layer 11 is formed in the n-type GaN layer 11, an active layer 12, and a p-type GaN layer 13 which form a GaN based light emitting diode 1. A p-side electrode 15 is formed on the p-type GaN layer 13. A transparent resin 16 is formed so as to cover an upper face of the p-type GaN layer 13 in a portion around the end 14 and the p-side electrode 15, and a reflective film 17 is formed so as to coat the entire of the transparent resin 16 and the p-side electrode 15. An n side electrode 18 is formed on the lower face of the n-type GaN layer 11. The side of the n-type GaN layer 11 of this GaN based light emitting diode 1 is mounted on a transparent substrate 2 through a transparent medium layer of a low refractive index 3 such as an air gap or the like. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor light-emitting element for achieving face light emission with higher light extraction efficiency and light density from a light extraction surface. SOLUTION: The semiconductor light-emitting element has a laminated semiconductor structure section 4, comprising at least a first-conductivity-type first cladding layer 1, an active layer 2, and a second-conductivity-type second cladding layer 3. In this case, the outer-periphery surface 4s of the laminated semiconductor structure section 4 is formed in a curved surface shape convexly curved or bent toward outside for the lamination direction. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To improve mechanical and electrical connection reliability to establish effective wiring connection with higher accuracy at a lower cost even in a fine semiconductor chip for a large number of connection objects. SOLUTION: A semiconductor chip 1 including a first and a second electrodes 11, 12 for external connections is arranged at an area near connecting portions 23, 24 of a first and a second wires 21, 22 as the respective connection objects and the semiconductor chip 1 is temporarily fixed via a bonding layer 3. Next, a metal body 4 is grown by a non-electrolytic plating method at the connecting portions 23, 24 of the first and second electrodes 11, 12 for external connections. The semiconductor chip 1 is connected with the first and second wires 21, 22 by combining and integrating the grown metal precipitated structure. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide element connection wiring with which only the defective element can be easily cut from the wiring, an image display device, and a method for cutting the wiring, in the image display device in which light emitting elements, such as minute light emitting diodes are arranged on a substrate. SOLUTION: A cutting section 7 B is formed in a juncture 6 B for electrically connecting the light emitting element 5 B and the wiring 4 B and the removal of the cutting section 7 B is performed by irradiating the cutting section 7 B with a laser beam, thereby cutting the electrical connection of the wiring 4 B and the light emitting element 5 B constituting a circuit on the substrate. By forming the cutting section 7 B at a point where the section does not overlap the elements, such as the light emitting element 5 B, the lower layer wiring 2, and a transparent electrode 3 B, the accidental exertion of damage to the wiring etc., other than the juncture 6 B can be prevented when the wiring is irradiated with the laser beam. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To form an electrode on a small light emitting element without fail and to prevent light extraction efficiency from degrading. SOLUTION: A transparent electrode 4 is connected directly to a light extraction surface 5 so as to cover the entire surface of the light extraction surface 5. The transparent electrode 4 is formed so as to be larger in size than the light extraction surface 5 and connected electrically to an n-type semiconductor layer 6 including the light extraction surface 5 without fail. In other words, even when a light emitting diode 1 is small in size, the n-type semiconductor layer 6 and the transparent electrode 4 are connected without fail. Therefore, compared to the case that it is difficult to precisely form the transparent electrode which is smaller in size than the light extraction surface 5 in the light extraction surface, the transparent electrode is formed more reliably on the light emitting diode 1 without fail and it becomes possible to extract light generated in the light emitting diode 1 to the outside of the element without blocking the electrode. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an element transfer method which can exfoliate a substrate easily after the element is transferred from a substrate where elements are arranged to another substrate, is capable of reducing the substrate damages, and imprinting to add an element on the same substrate again after printing the element, and to provide a substrate for element transfer and a display device. SOLUTION: A plurality of elements arranged on a temporary holding substrate are buried in an adhesive layer formed on a transfer substrate and held. The elements are exfoliated from the substrate. The adhesive layer is selectively hardened, a cured wall is formed and the adhesive layer is divided into micro cells, thereby preventing the adhesive layer from moving by pressure. A transfer substrate side of the adhesive layer is hardened and a cured layer is formed, and the elements are fixed by the cured layer, thereby preventing the displacement of the elements in the adhesive layer. The adhesive layer is softened after the elements are buried in the adhesive layer, thereby reducing the step-difference in a boundary of the elements and the adhesive layer. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor element and the semiconductor element whereby an adhesive material layer remaining around a growth substrate and a semiconductor layer can be efficiently removed with ease and the element can be formed with low production cost and high yield when the semiconductor layer is transferred, by ablation using irradiation with a laser beam, to the substrate having the adhesive material layer formed thereon. SOLUTION: The adhesive material layer remaining around the growth substrate and the semiconductor layer can be positively removed with ease in an efficient manner by emitting the laser beam onto the surplus adhesive material layer remaining around the growth substrate and the semiconductor layer, performing plasma ashing thereon, or combining the laser beam irradiation and ashing. The semiconductor layer can be entirely used as an element without removing the surplus adhesive material layer along the surrounding part of the semiconductor layer. Thus, it is possible to form the semiconductor element with high yield without damaging the crystals of the semiconductor layers. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device by which favorable electrodes can be formed by completely removing the gallium precipitated on the rear face of the grown semiconductor layer after separating the grown semiconductor layer by laser ablation and the semiconductor layer can be completely separated for each device, and to provide a semiconductor device. SOLUTION: After a grown semiconductor layer has transferred to a substrate for temporary retention by laser ablation by exposing the rear face of a substrate to the laser beam, isotropic etching is applied to the rear face of the grown semiconductor layer by using a mixture of solution (royal water) of hydrochloric acid and nitric acid. In this way, the gallium precipitated on the rear face of the grown semiconductor layer and layers exhibiting low conductivity formed by anisotropic etching by RIE can be completely removed. Accordingly, a surface most suitable for forming electrodes can be properly exposed from the rear face of the semiconductor device and proper electrodes of low-resistance can be formed on the rear face of the device. Furthermore, the grown semiconductor layer can be completely separated for each device with uniform etched profile. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a method of manufacturing elements which can deal with the formation of microelements as well, and can easily connect the elements to the wiring disposed on the surface of a resin embedded with the elements and to provide a method of manufacturing an image display device using the same. SOLUTION: Resin layers are formed by packing a resin to the circumferences of the elements arranged on the front surface of a release material layer and the elements and the peeling surfaces of the resin layers are formed flush with each other by peeling the resin layers from the release material layer, by which electrode pads and wiring are easily formed while the defect of connection is suppressed. COPYRIGHT: (C)2003,JPO