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公开(公告)号:DE2617398A1
公开(公告)日:1976-11-04
申请号:DE2617398
申请日:1976-04-21
Applicant: SONY CORP
Inventor: AOKI TERUAKI , MATSUSHITA TAKESHI , MIFUNE TADAYOSHI , ABE MOTOAKI
IPC: H01L29/73 , H01L21/00 , H01L21/265 , H01L21/329 , H01L21/331 , H01L21/76 , H01L23/29 , H01L29/78 , H01L21/302
Abstract: Silicon ions are implanted in a silicon dioxide layer on a silicon substrate so that the dioxide layer is converted into a semi-insulating layer having an improved passivation property.
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公开(公告)号:CA982701A
公开(公告)日:1976-01-27
申请号:CA169179
申请日:1973-04-19
Applicant: SONY CORP
Inventor: MATSUSHITA TAKESHI
IPC: H01L29/73 , H01L21/331 , H01L29/08 , H01L29/74 , H01L29/744
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公开(公告)号:DE2320579A1
公开(公告)日:1973-11-08
申请号:DE2320579
申请日:1973-04-21
Applicant: SONY CORP
Inventor: MATSUSHITA TAKESHI , HAYASHI HISAO
IPC: H01L29/73 , H01L21/331 , H01L29/00 , H01L29/06 , H01L29/861 , H01L9/00
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公开(公告)号:DE2320563A1
公开(公告)日:1973-10-25
申请号:DE2320563
申请日:1973-04-21
Applicant: SONY CORP
Inventor: MATSUSHITA TAKESHI
IPC: H01L29/73 , H01L21/331 , H01L29/08 , H01L29/74 , H01L29/744 , H01L11/10
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公开(公告)号:CA927479A
公开(公告)日:1973-05-29
申请号:CA66602
申请日:1969-11-04
Applicant: SONY CORP
Inventor: MATSUSHITA TAKESHI
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公开(公告)号:CA918242A
公开(公告)日:1973-01-02
申请号:CA66603
申请日:1969-11-04
Applicant: SONY CORP
Inventor: MATSUSHITA TAKESHI
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公开(公告)号:CA909967A
公开(公告)日:1972-09-12
申请号:CA909967D
Applicant: SONY CORP
Inventor: MATSUSHITA TAKESHI , YAGI HAJIME
IPC: H01L29/00 , H01L31/111
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公开(公告)号:CA907217A
公开(公告)日:1972-08-08
申请号:CA907217D
Applicant: SONY CORP
Inventor: MATSUSHITA TAKESHI
IPC: H01L29/00 , H01L31/111
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公开(公告)号:GB2360391A
公开(公告)日:2001-09-19
申请号:GB0024398
申请日:2000-10-05
Applicant: SONY CORP
Inventor: MATSUSHITA TAKESHI , MIZUNO SHINICHI
IPC: H01L21/3205 , H01L21/20 , H01L21/28 , H01L31/0224 , H01L31/04 , H01L21/268
Abstract: A method of manufacturing a solar cell comprises forming a porous Si layer 2, p-type Si layers 3, 4 and an n-type Si layer 5 on an Si substrate 1. The n-type layer 5 is etched by laser abrasion to form an electrode pattern. The porous Si layer 2 may be weakened by application of ultrasound to allow the device layers to be separated from the substrate along the line 6.
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