OPTICAL SPECTROMETER AND LATTICE
    31.
    发明专利

    公开(公告)号:JPH08327452A

    公开(公告)日:1996-12-13

    申请号:JP13214396

    申请日:1996-05-27

    Abstract: PROBLEM TO BE SOLVED: To realize selective detection of spectrum within a specified range by providing a plurality of dispersion gratings for producing a spectrally dispersed beam. SOLUTION: A dispersion unit comprises a plurality of dispersion gratings having surface for forming a spectrally dispersed beam. Light 17 from a radiation source 11 passes through an inlet slit 16 and reflected on a collimator 18 toward a reflective dispersion grating 20 having saw-tooth grooves 21. An initial spectrum 23 is directed toward a step grating 22 having dispersion lines crossing the grating 20. The radiation is further reflected from the grating 22 to produce another dispersion beam 24 which passes through a reflector 26 and focused on a detector 34 through a mirror 28 and a lens 30. The detector 34 senses the radiation impinging thereon and produces a signal which is delivered on a line 35 toward a computer station 14. The computer processes the signal information and displays the results in the form of concentration of atomic element in the sample.

    HIGHLY SENSITIVE MULTIWAVELENGTH SPECTRAL APPARATUS

    公开(公告)号:JPH05231938A

    公开(公告)日:1993-09-07

    申请号:JP1562891

    申请日:1991-02-07

    Abstract: PURPOSE:To make an apparatus bright and small in size and to determine the spectral distribution of an extremely weak light of Raman scattering or the like simultaneously without wavelength scanning by providing an optical system limiting an incident light to be in the shape of a dot or a line and projecting it, a collimator lens, a reflection type diffraction grating, an imaging lens and a detector. CONSTITUTION:A light from a sample or an image S is passed through an incidence slit 2 and made to enter a collimator lens 3, as a dot-shaped or linear light source. The lens 3 makes the light from the sample or the image S enter a reflection type diffraction grating 4, as a parallel beam, without omission. Therefore the grating 4 displays its resolution to the full and separates an extremely weak light into its spectral components. An imaging lens 5 can form the projected image S of an optical system without curvature and can be disposed in extreme proximity to the grating 4. Therefore the entire incident light can be used for light-resolution simultaneous multiwavelength spectral separation and an apparatus is made small in size. By using lenses having as small an F number as possible and being bright for the lenses 3 and 5, the brightness of the whole of the apparatus can be enlarged. Being combined with a highly sensitive photodetector 6, therefore, the apparatus is effective for the extremely weak light.

    Method and apparatus for calibrating a spectrometer
    35.
    发明授权
    Method and apparatus for calibrating a spectrometer 失效
    用于校准光谱仪的方法和装置

    公开(公告)号:US5321970A

    公开(公告)日:1994-06-21

    申请号:US872235

    申请日:1992-04-22

    CPC classification number: G01N21/274

    Abstract: A calibration device for use in a spectrometer has a source of electromagnetic radiation, a detector for detecting electromagnetic radiation from the source, a device for recording the output of the detector, and at least one optical element in an optical path between the source and the detector to separate the electromagnetic radiation into spectral elements separately detected by the detector. The calibration device includes a variation mechanism to selectively modulate the intensity of each spectral element detected by the detector and a mechanism to adjust the variation mechanism so that the input of the detector substantially reproduces the input of electromagnetic radiation that the detector would receive in its normal operation from a sample which the spectrometer is intended to analyse.

    Abstract translation: 用于光谱仪的校准装置具有电磁辐射源,用于检测来自源的电磁辐射的检测器,用于记录检测器的输出的装置,以及源和源之间的光路中的至少一个光学元件 检测器将电磁辐射分离成由检测器单独检测的光谱元件。 校准装置包括用于选择性地调制由检测器检测到的每个光谱元件的强度的变化机构和用于调节变化机制的机构,使得检测器的输入基本上再现检测器将在其正常状态下接收的电磁辐射的输入 来自分光计旨在分析的样品的操作。

    Echelle spectroscope
    40.
    发明授权
    Echelle spectroscope 失效
    Echelle分光镜

    公开(公告)号:US5973780A

    公开(公告)日:1999-10-26

    申请号:US226707

    申请日:1999-01-07

    CPC classification number: G01J3/24 G01J3/18

    Abstract: An echelle spectroscope has one or more echelle diffraction gratings, one or more elements for separating dispersed light into portions corresponding to different orders of diffraction and one or more imaging means such as imaging mirrors but there is only one image detector. These components are so designed and arranged with respect to one another that the total range of wavelength to be analyzed is divided into a plurality of smaller ranges and the portions of the spectral light from a source corresponding to different ones of these divided wavelength ranges travel on different paths but would each form an image on the same image detector. A shutter is provided so as to selectively allow one of these portions of spectral light corresponding to one of different wavelength ranges to pass through.

    Abstract translation: 梯形分光镜具有一个或多个梯形衍射光栅,用于将分散的光分离成对应于不同衍射级的部分的一个或多个元件,以及诸如成像镜的一个或多个成像装置,但是仅存在一个图像检测器。 这些部件相对于彼此被设计和布置,使得要分析的波长的总范围被分成多个较小的范围,并且来自对应于这些分开的波长范围中的不同的光源的光谱光的部分行进 不同的路径,但是它们将在相同的图像检测器上形成图像。 提供快门,以便选择性地允许对应于不同波长范围之一的光谱光的这些部分之一通过。

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