Abstract:
The invention relates to a device for measuring fluorescent radiation emitted by biological substances, comprising a light source, a capturing unit, an evaluation unit, at least one emission fiber, and at least one detection fiber. Said emission fiber guides excitation radiation to the biological substrate and the detection fiber receives fluorescent radiation and guides it to the evaluation unit. The capturing unit comprises a semiconductor sensor arrangement that detects fluorescent radiation emitted by the biological substance in wave length areas that are separate from each other, are arranged. Data sets of at least two different reference measurements on at least two different biological substances are stored and compared to the measured measurement values to the stored data sets and issues a result relating to the pathological attacks of the examined biological substances and/or relating to the type of examined, biological substances.
Abstract:
An apparatus consisting of stacked slab waveguides whose outputs are vertically staggered is disclosed. At the input to the stacked waveguides, the entrances to each slab lie in approximately the same vertical plane. A spot which is imaged onto the input will be transformed approximately to a set of staggered rectangles at the output, without substantial loss in brightness, which staggered rectangles can serve as a convenient input to a spectroscopic apparatus. A slit mask can be added to spatially filter the outputs so as to present the desired transverse width in the plane of the spectroscopic apparatus parallel to its dispersion.
Abstract:
A minute particle analyzing device includes: a light source; a first condenser lens for condensing light from the light source to a first end of a multimode optical fiber; a second condenser lens for condensing the light emerging from a second end of the multimode optical fiber to a minute particle; and a detector for detecting light generated from the minute particle by the application of the light from the light source.
Abstract:
An optical device is provided that includes a converging lens device, a transmitting optical fiber, a sample holder, and a receiving optical fiber. The converging lens device focuses light onto the transmitting optical fiber, which receives the focused light through an entrance face and transmits the light from an exit face, through a sample, and onto the receiving optical fiber. The sample holder holds the sample for analysis. The receiving optical fiber receives the light through an entrance face of the receiving optical fiber after transmission through the sample. The converging lens device is positioned to focus the light onto the entrance face of the transmitting optical fiber such that a half-angle of the angular distribution of the focused light that reaches the entrance face of the transmitting optical fiber is selected to underfill an entrance aperture of the entrance face of the receiving optical fiber in both a spatial dimension and an angular dimension.
Abstract:
A spectral imaging apparatus includes: a spectral transmittance variable element having a spectral transmittance characteristics such that a transmittance periodically varies with wavelength and being capable of changing the variation period, for converting light from an object under observation into light having a plurality of peak wavelengths; a light extracting device for extracting, from the light having a plurality of peak wavelengths, light for imaging that contains a peak wavelength proximate to a predetermined command wavelength designated by a user and light for calibration that contains a peak wavelength other than the peak wavelength proximate to the command wavelength; an image sensor for capturing an image of the object under observation formed of the light for imaging; a detector for detecting, from the light for calibration, the peak wavelength other than the peak wavelength proximate to the command wavelength; and a control unit including, an operation processing section that calculates the peak wavelength that is proximate to the command wavelength and is contained in the light for imaging, from the peak wavelength that is other than the peak wavelength proximate to the command wavelength, is contained in the light for calibration and is detected by the detector, calculates an amount of shift between the peak wavelength proximate to the command wavelength as calculated and the command wavelength, and determines an amount of adjustment of the variation period on a basis of the amount of shift, and a drive processing section that drives the spectral transmittance variable element for changing the variation period.
Abstract:
A hyperspectral imaging system and a method are described herein for using an array of optical homogenizing elements to reduce spectral noise in an image of a real-world scene. In one embodiment, the hyperspectral imaging system and method use the array of optical homogenizing elements for homogenizing a spatial, an angular, and a polarization distribution of light from different elements within the real-world scene before it is measured by a spectrometer.
Abstract:
We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the source being configured to direct radiation towards the prism and the detector being configured to detect radiation from the source reflected from the exposed surface of the prism; and (d) an electronic processor contained within the enclosure, the electronic processor being in communication with the detector. The apparatus can be configured so that, during operation, the electronic processor determines information about a sample placed in contact with the exposed surface of the prism based on radiation reflected from the exposed prism surface while it is in contact with the sample.
Abstract:
Fiber optic probe scatterometers for spectroscopy measurements are disclosed. An example device includes an optically transparent illumination tube, an opaque tube, an inner surface of the opaque tube being adjacent an outer surface of the illumination tube and the illumination tube being disposed within the opaque tube, and an optical fiber disposed within and spaced a first distance from the illumination tube, wherein the opaque tube is to be coupled to a spectrometer and an illumination source to provide a light signal along the illumination tube and to collect a scattered light signal via the optical fiber for the spectrometer.
Abstract:
An apparatus for receiving Raman scattering signals, includes an optic light-collection system for collecting Raman scattering lights having scattered from an object when excitation laser beams are irradiated thereto, a spectroscope including a diffraction grating, for separating the Raman scattering lights into its spectral components, and an optical path converter including at least one optical waveguide for converting lights having been collected by the optic light-collection system into slit-shaped lights in compliance with an orientation of the diffraction grating.
Abstract:
We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the source being configured to direct radiation towards the prism and the detector being configured to detect radiation from the source reflected from the exposed surface of the prism; and (d) an electronic processor contained within the enclosure, the electronic processor being in communication with the detector. The apparatus can be configured so that, during operation, the electronic processor determines information about a sample placed in contact with the exposed surface of the prism based on radiation reflected from the exposed prism surface while it is in contact with the sample.