公开(公告)号：US20140055787A1

公开(公告)日：2014-02-27

申请号：US14114464

申请日：2012-04-05

Applicant: Yoshitaka Teraoka ,  Katsutoshi Tsurutani ,  Yuta Yamanoi

Inventor： Yoshitaka Teraoka ,  Katsutoshi Tsurutani ,  Yuta Yamanoi

IPC: G01J3/50

CPC classification number: G01J3/50 ,  G01J3/0218 ,  G01J3/0272 ,  G01J3/08 ,  G01J3/504 ,  G01N21/251 ,  G01N21/255 ,  G01N2021/4711 ,  G01N2021/4735 ,  G01N2021/575 ,  G01N2201/0221 ,  G01N2201/061 ,  G01N2201/08

Abstract: A multi-angle colorimeter employs a multi-angle mode and a symmetrical arrangement mode in an optical arrangement. Light detection on both sides of the symmetrical arrangement is performed by a single photodetector unit. The photodetector unit is used on both sides, and thus, the device becomes simpler, without any impact on individual difference in characteristics of multiple photodetector units. Conversely, elements for illumination can be used on both sides. Also in a case where multiple photodetector units are used, the size and cost of the device can be reduced with the use of a photodetector unit having a relatively low wavelength resolution as a photodetector unit to be used on one side. This enables to reduce an attitude error due to relative tilting of a measurement surface while reducing the size and cost of the device.

Abstract translation: 多角度比色计在光学装置中采用多角度模式和对称排列模式。 对称布置的两侧的光检测由单个光电检测器单元执行。 光检测器单元用于两侧，因此，器件变得更简单，而不会对多个光电检测器单元的特性的个体差异产生任何影响。 相反，用于照明的元件可以在两侧使用。 此外，在使用多个光检测器单元的情况下，可以通过使用具有相对低的波长分辨率的光电检测器单元作为一侧使用的光电检测器单元来减小器件的尺寸和成本。 这能够减少由于测量表面的相对倾斜导致的姿态误差，同时减小了装置的尺寸和成本。

公开(公告)号：US20130335735A1

公开(公告)日：2013-12-19

申请号：US13916813

申请日：2013-06-13

Applicant: The Royal Institution for the Advancement of Learning / McGill University

Inventor： Patanjali Kambhampati ,  Jonathan Saari ,  Pooja Tyagi

IPC: G01J3/10 ,  G01J3/12

CPC classification number: G01J3/10 ,  G01J3/0224 ,  G01J3/08 ,  G01J3/1256 ,  G01J3/433 ,  G01J3/453 ,  G01J9/02

Abstract: Two dimensional (2D) optical spectroscopy, wherein the spectrum has an excitation and an emission axis, reveals information formerly hidden in one-dimensional (1D) optical spectroscopy. However, current two dimensional optical spectroscopy systems are complex laboratory arrangements and accordingly limited in deployment. According to embodiments of the invention a monolithic platform providing significantly reduced complexity and increased robustness is provided allowing for “black-box” modules allowing commercial deployment of 2D optical spectroscopy instruments. Additionally, the invention supports high pulse repetition rates as well as one quantum and two quantum measurements under electronic control.

Abstract translation: 二维（2D）光谱，其中光谱具有激发和发射轴，揭示了先前隐藏在一维（1D）光谱中的信息。 然而，目前的二维光谱系统是复杂的实验室布置，因此在部署中受到限制。 根据本发明的实施例，提供了提供显着降低的复杂性和增强的鲁棒性的单片平台，允许允许商业部署2D光谱仪器的“黑箱”模块。 此外，本发明支持高脉冲重复率以及电子控制下的一个量子和两个量子测量。

公开(公告)号：US08345234B2

公开(公告)日：2013-01-01

申请号：US12094205

申请日：2006-03-10

Applicant: Michael L. Myrick ,  Robert P. Freese ,  David L. Perkins

Inventor： Michael L. Myrick ,  Robert P. Freese ,  David L. Perkins

IPC: G01J3/00

CPC classification number: G01J3/42 ,  G01J3/02 ,  G01J3/0232 ,  G01J3/08 ,  G01J2003/1217 ,  G01N21/274 ,  G01N21/31

Abstract: Disclosed is a system and methodologies for providing self-calibration in an optical analysis system. Illumination light is directed toward a material to be sampled while provisions are made to modify the characteristics of at least a portion of the illumination light falling on a reference detector. The modified characteristics may include light presence and/or spectral characteristics. Light presence may be modified by rotating or moving mirror assemblies to cause light to fall on either a sample detector or a reference detector while spectral characteristics may be modified by placing materials having known spectral characteristics in the path of the illumination light.

Abstract translation: 公开了一种用于在光学分析系统中提供自校准的系统和方法。 照明光指向要采样的材料，同时进行调整以改变落在参考检测器上的照明光的至少一部分的特性。 修改的特征可以包括光存在和/或光谱特性。 可以通过旋转或移动镜组件来改变光存在，以使光落在样品检测器或参考检测器上，同时可以通过将具有已知光谱特性的材料放置在照明光的路径中来修改光谱特性。

公开(公告)号：US20110313635A1

公开(公告)日：2011-12-22

申请号：US13141505

申请日：2009-12-15

Applicant: Jeremie Blanc ,  Benjamin L'Henoret ,  Laureen Merlina-Bonnafous

Inventor： Jeremie Blanc ,  Benjamin L'Henoret ,  Laureen Merlina-Bonnafous

IPC: F02D28/00 ,  G06F19/00 ,  G01J3/42

CPC classification number: G01J1/4257 ,  F02D41/1451 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0232 ,  G01J3/0256 ,  G01J3/08 ,  G01J3/26 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/2866 ,  G01N21/031 ,  G01N21/274 ,  G01N21/31 ,  G01N21/359 ,  G01N21/85 ,  G01N2021/0314 ,  G01N2021/317 ,  G01N2021/3181 ,  G01N2021/8521 ,  G01N2201/0636 ,  G01N2201/12723

Abstract: A device for measuring a spectrum of a light beam, in a wavelength range chosen beforehand, the spectrum being generated by a sample to be analyzed, the optical measuring device including at least one light source, a measurement cell and a measurement detector placed on a measurement optical pathway, the measurement optical pathway being taken by a measurement optical beam emitted by the light source, and encountering the measurement cell, a self-calibration unit allowing any drift of the light sources, due to environmental conditions or conditions of use, to be taken into account independently of whether a sample to be analyzed is present in or absent from the measurement cell, the self-calibration unit including elements for creating a reference optical pathway, taken by a reference optical beam emitted by the light source, and not encountering the measurement cell, and a reference detector.

Abstract translation: 一种用于测量在预先选择的波长范围内的光束的光谱的装置，所述光谱由待分析的样品产生，所述光学测量装置包括至少一个光源，测量单元和放置在 测量光学路径，测量光学路径由光源发射的测量光束采取，并且遇到测量单元，允许由于环境条件或使用条件使光源发生任何漂移的自校准单元 独立于被分析样品是否存在于测量单元中或不存在的情况下，自校准单元包括用于产生由光源发射的参考光束获取的参考光学路径的元件，而不是 遇到测量单元和参考检测器。

公开(公告)号：US07990538B2

公开(公告)日：2011-08-02

申请号：US12447595

申请日：2007-11-01

Applicant: Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

Inventor： Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

IPC: G01N31/12

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01N2201/1293

Abstract: The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Abstract translation: 本主题涉及产品生产过程中产品样品的高速分析方法。 光被引导到被分析产品的一部分，从产品反射或透射到光学检测器。 将来自光学检测器的信号进行比较，以确定正在分析的产品的特性。 可以监视监视系统内的温度，以便为由光学检测器产生的信号提供补偿。 被分析的产品可以是固定的，由检查点通过输送机或其他方式移动，或者可以容纳在容器内，该容器包括产品照明光通过的窗口部分。

公开(公告)号：US07897912B2

公开(公告)日：2011-03-01

申请号：US11420399

申请日：2006-05-25

Applicant: Francis A. Dominic ,  Thomas H. Bulpitt ,  Gerald M. Heigel

Inventor： Francis A. Dominic ,  Thomas H. Bulpitt ,  Gerald M. Heigel

IPC: G01J3/02 ,  G01J3/18

CPC classification number: G01J1/04 ,  G01J1/0425 ,  G01J1/0444 ,  G01J1/4228 ,  G01J3/08

Abstract: An apparatus for measuring light properties includes a housing defining a light input port; as well as a first light detector; a second light detector; and a coupling element. The first light detector is a single channel light detector or a multiple channel light detector. The second light detector is a multiple channel light detector. The coupling element is configured and arranged to selectively couple light incident from the light input port to one of the first light detector and the second light detector. As an alternative, a beam splitting element can be used instead of the coupling element. The beam splitting element receives light from the light input port and then splits the light and delivers a portion of the light to the first light detector and a portion of the light to the second light detector.

Abstract translation: 一种用于测量光性质的装置包括限定光输入端口的壳体; 以及第一光检测器; 第二光检测器; 和耦合元件。 第一个光检测器是单通道光检测器或多通道光检测器。 第二光检测器是多通道光检测器。 耦合元件被配置和布置成将从光输入端入射的光选择性地耦合到第一光检测器和第二光检测器之一。 作为替代，可以使用分束元件代替耦合元件。 分束元件接收来自光输入端口的光，然后分解光并将一部分光传送到第一光检测器和一部分光到第二光检测器。

公开(公告)号：US07804593B2

公开(公告)日：2010-09-28

申请号：US11629143

申请日：2005-06-02

Applicant: Helmut Becker-Roβ ,  Stefan Florek ,  Günter Wesemann ,  Michael Okruss

Inventor： Helmut Becker-Roβ ,  Stefan Florek ,  Günter Wesemann ,  Michael Okruss

IPC: G01J3/28

CPC classification number: G01J3/1809 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0232 ,  G01J3/0237 ,  G01J3/0286 ,  G01J3/0294 ,  G01J3/08 ,  G01J3/12 ,  G01J3/2803

Abstract: The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40). The inventive arrangement is characterized in that another spectrometer (12) comprising at least one other dispersing element (64) and another imaging optical element (60,66) is provided in order to produce a spectrum (68) of a second wavelength range of radiation, which is different from the first wavelength range, from a radiation source on the same detector (42). The spectra can be spatially or temporally separated on the detector.

Abstract translation: 本发明涉及一种分光计装置（10），其包括用于产生来自检测器（42）上的辐射源的第一波长范围的光谱仪（14）。 所述布置还包括：用于在主色散方向（46）上穿透光谱仪装置（10）的辐射的光谱分解的梯形光栅（36）; 分散元件（34），用于通过在与梯形光栅（36）的主色散方向形成角度的横向色散方向（48）上的辐射的光谱分解来分离度数，使得两个 可以用多个分离的度数（52）产生维度谱（50）; 用于在图像平面（40）中将穿过入口间隙（20）的辐射成像到成像光学装置（10）中的成像光学元件（24,38）; 以及包括所述图像平面（40）中的多个检测器元件的二维排列的表面检测器（42）。 本发明的装置的特征在于，提供包括至少一个其它分散元件（64）和另一成像光学元件（60,66）的另一个光谱仪（12），以产生第二波长范围的辐射（68） ，其与第一波长范围不同，来自相同检测器（42）上的辐射源。 光谱可以在检测器上进行空间或时间分离。

公开(公告)号：US20100231905A1

公开(公告)日：2010-09-16

申请号：US12787859

申请日：2010-05-26

Applicant: Sean M. Christian ,  Jess V. Ford ,  Mike Ponstingl ,  Anthony Johnson ,  Sven Krugor ,  Margaret C. Waid ,  Bryan Kasperski ,  Enrique Prati

Inventor： Sean M. Christian ,  Jess V. Ford ,  Mike Ponstingl ,  Anthony Johnson ,  Sven Krugor ,  Margaret C. Waid ,  Bryan Kasperski ,  Enrique Prati

IPC: G01J3/42 ,  G01J3/00

CPC classification number: G01J3/02 ,  E21B49/081 ,  E21B49/10 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0297 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1282 ,  G01J2003/1286 ,  G01N21/274

Abstract: An analysis system, tool, and method for performing downhole fluid analysis, such as within a wellbore. The analysis system, tool, and method provide for a tool including a spectroscope for use in downhole fluid analysis which utilizes an adaptive optical element such as a Micro Mirror Array (MMA) and two distinct light channels and detectors to provide real-time scaling or normalization.

Abstract translation: 用于进行井下流体分析的分析系统，工具和方法，例如在井筒内。 分析系统，工具和方法提供了一种包括用于井下流体分析的分光镜的工具，其利用诸如微镜阵列（MMA）的自适应光学元件和两个不同的光通道和检测器来提供实时缩放或 正常化。

公开(公告)号：US20100149537A1

公开(公告)日：2010-06-17

申请号：US12447595

申请日：2007-11-01

Applicant: Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

Inventor： Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

IPC: G01N21/55 ,  G01N21/59

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01N2201/1293

Abstract: The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Abstract translation: 本主题涉及产品生产过程中产品样品的高速分析方法。 光被引导到被分析产品的一部分，从产品反射或透射到光学检测器。 将来自光学检测器的信号进行比较，以确定正在分析的产品的特性。 可以监视监视系统内的温度，以便为由光学检测器产生的信号提供补偿。 被分析的产品可以是固定的，由检查点通过输送机或其他方式移动，或者可以容纳在容器内，该容器包括产品照明光通过的窗口部分。

公开(公告)号：US07705311B2

公开(公告)日：2010-04-27

申请号：US12371325

申请日：2009-02-13

Applicant: Seizi Nishizawa ,  Toshiyuki Iwamoto

Inventor： Seizi Nishizawa ,  Toshiyuki Iwamoto

IPC: G01J5/02

CPC classification number: G01J3/08 ,  G01N21/3586 ,  G01N2201/0696 ,  G01N2201/0698

Abstract: A time-domain pulsed spectroscopy apparatus which has a pulsed laser light source; a splitting unit to split pulsed laser light; a pulsed-light emitting unit; a detector; a sample holder; and a sample-unit entrance and exit optical systems; wherein the time-domain pulsed spectroscopy apparatus further comprises: at least one optical-path-length varying unit for setting a photometric range; at least one optical delay unit for the wave form signal measurement; and, at least one gate member to pass or block the pulsed light to a reflector.

Abstract translation: 一种具有脉冲激光光源的时域脉冲光谱仪; 用于分离脉冲激光的分离单元; 脉冲发光单元; 检测器 样品架 和采样单元入口和出口光学系统; 其中所述时域脉冲光谱装置还包括：用于设定光度范围的至少一个光路长度变化单元; 用于波形信号测量的至少一个光学延迟单元; 以及至少一个栅极件，以将脉冲光传递或阻挡到反射器。