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公开(公告)号：CN108340071A
公开(公告)日：2018-07-31
申请号：CN201810029001.7
申请日：2018-01-12
Applicant: 株式会社迪思科
IPC: B23K26/073
CPC classification number: G01B11/24 , G01J1/0266 , G01J1/0403 , G01J1/0411 , G01J1/0414 , G01J1/0418 , G01J1/044 , G01J1/0444 , G01J1/0448 , G01J1/0462 , G01J1/4228 , G01J1/4257 , G01J2001/4242 , B23K26/073
Abstract: 提供光斑形状检测装置，在短时间内高效地对从激光振荡器照射的激光光线的准确的光斑形状进行检测。光斑形状检测装置(1)对从激光振荡器(30)振荡出的激光光线(LB1)的光斑形状进行检测，其中，该光斑形状检测装置具有：聚光透镜(31)，其对激光振荡器所振荡的激光光线进行会聚；旋转体(镜保持器6)，其将对通过了聚光透镜的激光光线进行反射的多个镜(6a’～6q’)配设在同心圆上；驱动源(电动机7)，其使旋转体按照规定的周期进行旋转；分束器(32)，其对由旋转体的多个镜反射的激光光线的返回光(LB2)进行分支；拍摄组件(33)，其配设在返回光借助分束器而分支的方向上，对返回光的光斑形状进行拍摄；以及显示单元(m)，其使由拍摄组件拍摄的图像与多个镜相关联地进行显示。
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公开(公告)号：EP2748586A4
公开(公告)日：2015-07-08
申请号：EP12825483
申请日：2012-08-22
Applicant: LABROX OY
Inventor： YLI-KOSKI ANTERO , SALMELAINEN PAULI , VALTONEN JUKKA
CPC classification number: G01N21/6445 , G01J1/0444 , G01J1/0488 , G01J1/0492 , G01N21/6408 , G01N21/645
Abstract: An apparatus for optically measuring samples, including a radiation source configured to form an excitation beam in an excitation channel, a detector configured to detect an emission beam in an emission channel and a filter configured to be located, in an excitation position, in the excitation channel, and in an emission position, in the emission channel. The apparatus further includes a first filter storage comprising a first set of filter storage positions, a second filter storage comprising a second set of filter storage positions, and a filter transfer mechanism configured to move the filter between the excitation position, the emission position, the first set of filter storage positions and the second set of filter storage positions.
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公开(公告)号：US20170211976A1
公开(公告)日：2017-07-27
申请号：US15342937
申请日：2016-11-03
Applicant: Halliburton Energy Services, Inc.
Inventor： David L. Perkins , Christopher Michael Jones , Michael T. Pelletier , Li Gao , Robert Atkinson , William Soltmann
IPC: G01J3/02 , G01J1/02 , G01J1/04 , E21B47/00 , G01J1/46 , G01J1/28 , G01J1/42 , G02B26/04 , G01V8/10 , G01J1/22
CPC classification number: G02B26/04 , E21B47/00 , G01J1/0228 , G01J1/0295 , G01J1/0444 , G01J1/0492 , G01J1/20 , G01J1/22 , G01J1/28 , G01J1/42 , G01J1/46 , G01J3/0235 , G01J3/027 , G01J3/0297 , G01V8/10
Abstract: Various embodiments include systems and methods to provide selectable variable gain to signals in measurements using incident radiation. The selectable variable gain may be used to normalize signals modulated in measurements using incident radiation. The selectable variable gain may be attained using a number of different techniques or various combinations of these techniques. These techniques may include modulating a modulator having modulating elements in which at least one modulating element acts on incident radiation differently from another modulating element of the modulator, modulating the use of electronic components in electronic circuitry of a detector, modulating a source of radiation or combinations thereof. Additional apparatus, systems, and methods are disclosed.
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公开(公告)号：US20150192773A1
公开(公告)日：2015-07-09
申请号：US14420178
申请日：2012-08-07
Applicant: David L. Perkins , Christopher Michael Jones , Michael T. Pelletier , Li Gao , Robert Atkinson , William Soltman
Inventor： David L. Perkins , Christopher Michael Jones , Michael T. Pelletier , Li Gao , Robert Atkinson , William Soltman
CPC classification number: G02B26/04 , E21B47/00 , G01J1/0228 , G01J1/0295 , G01J1/0444 , G01J1/0492 , G01J1/20 , G01J1/22 , G01J1/28 , G01J1/42 , G01J1/46 , G01J3/0235 , G01J3/027 , G01J3/0297 , G01V8/10
Abstract: Various embodiments include systems and methods to provide selectable variable gain to signals in measurements using incident radiation. The selectable variable gain may be used to normalize signals modulated in measurements using incident radiation. The selectable variable gain may be attained using a number of different techniques or various combinations of these techniques. These techniques may include modulating a modulator having modulating elements in which at least one modulating element acts on incident radiation differently from another modulating element of the modulator, modulating the use of electronic components in electronic circuitry of a detector, modulating a source of radiation or combinations thereof. Additional apparatus, systems, and methods are disclosed.
Abstract translation: 各种实施例包括为使用入射辐射的测量中的信号提供可选择的可变增益的系统和方法。 可选择的可变增益可用于使用入射辐射对在测量中调制的信号进行归一化。 可选择的可变增益可以使用许多不同的技术或这些技术的各种组合来实现。 这些技术可以包括调制具有调制元件的调制元件，其中至少一个调制元件作用于与调制器的另一个调制元件不同的入射辐射，调制在检测器的电子电路中使用电子元件，调制辐射源或组合 其中。 公开了附加装置，系统和方法。
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公开(公告)号：US20130043390A1
公开(公告)日：2013-02-21
申请号：US13212875
申请日：2011-08-18
Applicant: Howard M. DE RUYTER
Inventor： Howard M. DE RUYTER
IPC: G01J5/00
CPC classification number: G01J5/522 , G01J1/0295 , G01J1/0411 , G01J1/0444 , G01J3/0202 , G01J3/021 , G01J3/0235 , G01J3/28 , G01J5/0809 , G01J5/084
Abstract: A calibration system for a detector includes a base member, a plurality of radiation sources fixedly attached to the base member, and a positioning mechanism attached to the base member. Each radiation source is maintained at a different temperature and is configured to emit electromagnetic radiation. The positioning mechanism includes a movable member having a single degree of freedom with respect to the base member, and a plurality of optical elements arranged on the movable member. Each optical element corresponds to one of the radiation sources and each optical element is configured to at least be movable between a calibration position and a non-calibration position. When the optical element is in the calibration position, the optical element is configured to receive the electromagnetic radiation from its corresponding radiation source and to reflect the electromagnetic radiation to a detector.
Abstract translation: 一种用于检测器的校准系统，包括基座部件，固定在基部部件上的多个辐射源，以及安装在基座部件上的定位机构。 每个辐射源被保持在不同的温度并被配置成发射电磁辐射。 定位机构包括相对于基底部件具有单一自由度的可动部件和布置在可动部件上的多个光学元件。 每个光学元件对应于一个辐射源，并且每个光学元件被配置为至少可以在校准位置和非校准位置之间移动。 当光学元件处于校准位置时，光学元件被配置为从其相应的辐射源接收电磁辐射并将电磁辐射反射到检测器。
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Patent Agency Ranking6.发明授权
公开(公告)号：EP2559980B1
公开(公告)日：2015-12-30
申请号：EP12172168.2
申请日：2012-06-15
Applicant: Raytheon Company
Inventor： Deruyter, Howard M.
CPC classification number: G01J5/522 , G01J1/0295 , G01J1/0411 , G01J1/0444 , G01J3/0202 , G01J3/021 , G01J3/0235 , G01J3/28 , G01J5/0809 , G01J5/084
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公开(公告)号：EP2395331A2
公开(公告)日：2011-12-14
申请号：EP11167767.0
申请日：2011-05-26
Applicant: ENC Technology Co., Ltd.
Inventor： Lee, Seong Weon , Chin, Sang Young , Moon, Gyung Su
CPC classification number: G01J1/02 , G01J1/0266 , G01J1/04 , G01J1/0411 , G01J1/0422 , G01J1/0437 , G01J1/0444 , G01J1/0448
Abstract: Disclosed herein is a high-speed optical measurement apparatus. The high-speed optical measurement apparatus includes an objective lens unit, an optical path unit, a control circuit unit, a measurement sensor, an eyepiece unit, and a measurement sensor connection. The objective lens unit adjusts the magnitude of the overall light of the individual locations of the object or the set of multiple objects, and allows the light to make its entrance. The optical path unit changes the path of the incident light. The control circuit unit outputs a control signal which is used to change a direction of the light by controlling the optical path unit. The measurement sensor measures the incident light. The eyepiece unit conforms the light to the size and location of the measurement sensor. The measurement sensor connection fastens the measurement sensor so that the light incoming through the eyepiece unit is aligned with the measurement sensor.
Abstract translation: 这里公开了一种高速光学测量装置。 高速光学测量装置包括物镜单元，光路单元，控制电路单元，测量传感器，目镜单元和测量传感器连接。 物镜单元调整物体或多个物体的各个位置的整体光的大小，并允许光进入。 光路单元改变入射光的路径。 控制电路单元通过控制光路单元输出用于改变光的方向的控制信号。 测量传感器测量入射光。 目镜单元将光线与测量传感器的尺寸和位置相符。 测量传感器连接固定测量传感器，使通过目镜单元进入的光线与测量传感器对齐。
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公开(公告)号：EP2748586A1
公开(公告)日：2014-07-02
申请号：EP12825483.6
申请日：2012-08-22
Applicant: Labrox Oy
Inventor： YLI-KOSKI, Antero , SALMELAINEN, Pauli , VALTONEN, Jukka
CPC classification number: G01N21/6445 , G01J1/0444 , G01J1/0488 , G01J1/0492 , G01N21/6408 , G01N21/645
Abstract: An apparatus for optically measuring samples, including a radiation source configured to form an excitation beam in an excitation channel, a detector configured to detect an emission beam in an emission channel and a filter configured to be located, in an excitation position, in the excitation channel, and in an emission position, in the emission channel. The apparatus further includes a first filter storage comprising a first setof filter storage positions, a second filter storage comprising a second set of filter storage positions,and a filter transfer mechanism configured to move the filter between the excitation position, the emission position, the first set of filter storage positions and the second set of filter storage positions.
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9.发明公开Calibration system for detector comprising a plurality of radiation sources 有权Kalibriereinrichtungfüreinen Detektor mit mehreren Strahlungsquellen
公开(公告)号：EP2559980A1
公开(公告)日：2013-02-20
申请号：EP12172168.2
申请日：2012-06-15
Applicant: Raytheon Company
Inventor： Deruyter, Howard M.
CPC classification number: G01J5/522 , G01J1/0295 , G01J1/0411 , G01J1/0444 , G01J3/0202 , G01J3/021 , G01J3/0235 , G01J3/28 , G01J5/0809 , G01J5/084
Abstract: A calibration system (300) for a detector (328) includes a base member (302), a plurality of radiation sources (304)fixedly attached to the base member, and a positioning mechanism (306) attached to the base member. Each radiation source (394) is maintained at a different temperature and is configured to emit electromagnetic radiation. The positioning mechanism includes a movable member (308) having a single degree of freedom with respect to the base member (302), and a plurality of optical elements arranged (310) on the movable member. Each optical element corresponds (310) to one of the radiation sources (304) and each optical element is configured to at least be movable between a calibration position and a non-calibration position. When the optical element is in the calibration position, the optical element is configured to receive the electromagnetic radiation from its corresponding radiation source and to reflect the electromagnetic radiation to a detector.
Abstract translation: 用于检测器（328）的校准系统（300）包括基座构件（302），固定地连接到基座构件的多个辐射源（304）和附接到基座构件的定位机构（306）。 每个辐射源（394）保持在不同的温度并被配置为发射电磁辐射。 所述定位机构包括：相对于所述基座部件（302）具有单一自由度的可动部件（308），以及在所述可动部件上配置的多个光学部件（310）。 每个光学元件对应于（310）到辐射源（304）中的一个，并且每个光学元件被配置为至少可以在校准位置和非校准位置之间移动。 当光学元件处于校准位置时，光学元件被配置为从其相应的辐射源接收电磁辐射并将电磁辐射反射到检测器。
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公开(公告)号：US09519133B2
公开(公告)日：2016-12-13
申请号：US14420178
申请日：2012-08-07
Applicant: David L. Perkins , Christopher Michael Jones , Michael T. Pelletier , Li Gao , Robert Atkinson , William Soltmann
Inventor： David L. Perkins , Christopher Michael Jones , Michael T. Pelletier , Li Gao , Robert Atkinson , William Soltmann
IPC: G02B26/04 , G01J1/02 , G01J1/04 , G01J1/22 , G01J1/20 , G01J1/28 , G01J1/42 , G01J1/46 , G01J3/02 , E21B47/00 , G01V8/10
CPC classification number: G02B26/04 , E21B47/00 , G01J1/0228 , G01J1/0295 , G01J1/0444 , G01J1/0492 , G01J1/20 , G01J1/22 , G01J1/28 , G01J1/42 , G01J1/46 , G01J3/0235 , G01J3/027 , G01J3/0297 , G01V8/10
Abstract: Various embodiments include systems and methods to provide selectable variable gain to signals in measurements using incident radiation. The selectable variable gain may be used to normalize signals modulated in measurements using incident radiation. The selectable variable gain may be attained using a number of different techniques or various combinations of these techniques. These techniques may include modulating a modulator having modulating elements in which at least one modulating element acts on incident radiation differently from another modulating element of the modulator, modulating the use of electronic components in electronic circuitry of a detector, modulating a source of radiation or combinations thereof. Additional apparatus, systems, and methods are disclosed.
Abstract translation: 各种实施例包括为使用入射辐射的测量中的信号提供可选择的可变增益的系统和方法。 可选择的可变增益可用于使用入射辐射对在测量中调制的信号进行归一化。 可选择的可变增益可以使用许多不同的技术或这些技术的各种组合来实现。 这些技术可以包括调制具有调制元件的调制元件，其中至少一个调制元件作用于与调制器的另一个调制元件不同的入射辐射，调制在检测器的电子电路中使用电子元件，调制辐射源或组合 其中。 公开了附加装置，系统和方法。
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