Abstract:
The invention relates to a method for the 3-dimensional measurement of a sample with a measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by - providing the measuring system with a 3-dimensional virtual reality device, - creating the 3-dimensional virtual space of the measuring space using the 3-dimensional virtual reality device, - allowing for selecting an operation in the virtual space, - providing real-time unidirectional or bidirectional connection between the measuring space and the virtual space such that an operation selected in the virtual space is performed in the measuring space and data measured in the measuring space is displayed in the virtual space. The invention further relates to a measuring system for the 3-dimensional measurement of a sample, the measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by further comprising a 3-dimensional virtual reality device for displaying a 3- dimensional virtual space of the measuring space, and a real-time unidirectional or bidirectional connection is provided between the laser scanning microscope and the 3-dimensional virtual reality device.
Abstract:
The invention relates to a laser scanning microscope (10) having: focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13); drive means (18) for displacing the at least one optical element of the focusing means (15) for changing the position of the focal plane (29), and deflecting means (14) for deflecting the laser beam (13). The microscope comprises a control system (32) configured to carry out the steps of: providing a periodical drive signal for the drive means (18); obtaining time dependant displacement data of the at least one optical element of the focusing means (15) in response to the periodical drive signal of the drive means (18); providing a response function (z(t)) using the time dependant displacement data, calculating a drive signal for the deflecting means (14) using the response function (z(t)) to move the focal volume (30) of the laser beam (13) along a given 3D trajectory (48) within a sample to be examined. The invention further relates to a method for carrying out such a scanning operation along a 3D trajectory (48). ?
Abstract:
The present invention relates to novel red fluorescent sensors for detecting metal ions, preferably zinc ions, which have a chemical structure corresponding to a compound of general formula I. These sensors are very useful for determining the concentration and distribution of zinc in living cells or tissues, preferably in a laser microscopic assay.
Abstract:
The object of the invention relates to a method for scanning with an optical beam (50) using a first acousto-optic deflector (15, 15') having an optical axis along a Z-axis and at least one acousto-optic crystal layer (14), involving directing the optical beam (50) in the first acousto-optic deflector (15, 15'), and deflecting the optical beam (50) along an X-axis perpendicular to the Z-axis by means of the first acousto-optic deflector (15, 15'), during which generating a plurality of acoustic chirp signals (30) in the at least one acousto-optic crystal layer (14) of the acousto-optic deflector (15, 15') by - generating a first acoustic chirp signal (30a) having a duration of τ in the acousto-optic crystal layer (14), then - generating a second acoustic chirp signal (30b) in the acousto-optic crystal layer (14) within a τ period of time counted from the start of the generation of the first acoustic chirp signal (30a).
Abstract:
The invention relates to a method for scanning along a substantially straight line (3D line) lying at an arbitrary direction in a 3D space with a given speed using a 3D laser scanning microscope having a first pair of acousto-optic deflectors deflecting a laser beam in the x-z plane (x axis deflectors) and a second pair of acousto-optic deflectors deflecting the laser beam in the y-z plane (y axis deflectors) for focusing the laser beam in 3D. The invention further relates to a method for scanning a region of interest with a 3D laser scanning microscope having acousto-optic deflectors for focusing a laser beam within a 3D space defined by an optical axis (Z) of the microscope and X, Y axes that are perpendicular to the optical axis and to each other.
Abstract:
The subject of the invention relates to an acousto-optic deflector with a layered structure (10), the essence of which is it comprises at least two acousto-optic crystals (12), to each of which at least one electro-acoustic transducer (14) is connected, and the adjacent crystals (12) are separated by an acoustic isolator (16). The subject of the invention also relates to a method for deflecting an optical beam using an acousto-optic deflector (10), characterised by that the acousto-optic deflector (10) comprises at least two acousto-optic crystals (12', 12"), among which a first acoustic wave (15') is created in a first acousto-optic crystal (12') using a first electro-acoustic transducer (14') connected to the first acousto-optic crystal (12'), and a second acoustic wave (15") is created in a second acousto-optic crystal (12") using a second electro-acoustic transducer (14") connected to the second acousto-optic crystal (12") and arranged between the first acousto-optic crystal (12') and the second crystal (12").
Abstract:
The invention relates to an optical microscope system (10) for the simultaneous measurement of at least two spatially distinct regions of interest, characterised by comprising at least two distinct optical measuring heads (12a, 12b, 12c) that can be simultaneously focused on spatially distinct arbitrary regions of interest, each optical measuring head is optically connectable with at least one scan head (14), the optical microscope system further comprising a control system (32) connected to the at least one scan head and the optical measuring head, the control system being configured to provide for synchronised control of the operation of the at least one scan head and the at least two optical measuring head.
Abstract:
The present invention relates to a focusing system (100) for focusing an electromagnetic beam for three-dimensional random access applications, the system comprising a first pair of acousto-optic deflectors (10) for focusing an electromagnetic beam in an X-Z plane, and a second pair of acousto-optic deflectors (20) for focusing an electromagnetic beam in a Y-Z plane being substantially perpendicular to the X-Z plane, characterised in that the second pair of acousto-optic deflectors (20) are arranged between the acousto-optic deflectors (12, 12') of the first pair of acousto-optic deflectors (10), such that the first and fourth acousto-optic deflectors (12, 12") of the system belong to the first pair of acousto-optic deflectors (10) and the second and third acousto-optic deflectors (22, 22") of the system belong to the second pair of acousto-optic deflectors (20).
Abstract:
The invention relates to a method for scanning a region of interest, such as a portion of a neural process, via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflecting means for deflecting the laser beam, the method comprising: providing a primary scanning trajectory for the at least one region of interest; providing a plurality of spaced apart auxiliary scanning trajectories running along the primary scanning trajectory within the region of interest; providing a scanning sequence for scanning the scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive scanning trajectories in the scanning sequence. The invention further relates to a measuring system for implementing the method according to the invention.