METHOD FOR THE 3-DIMENSIONAL MEASUREMENT OF A SAMPLE WITH A MEASURING SYSTEM COMPRISING A LASER SCANNING MICROSCOPE AND SUCH MEASURING SYSTEM
    42.
    发明申请
    METHOD FOR THE 3-DIMENSIONAL MEASUREMENT OF A SAMPLE WITH A MEASURING SYSTEM COMPRISING A LASER SCANNING MICROSCOPE AND SUCH MEASURING SYSTEM 审中-公开
    用于包含激光扫描显微镜和这种测量系统的测量系统的样品的三维测量方法

    公开(公告)号:WO2013098567A1

    公开(公告)日:2013-07-04

    申请号:PCT/HU2012/000002

    申请日:2012-01-05

    CPC classification number: G01B11/24 G01B9/04 G06F3/01 G06F3/011 G06F3/0346

    Abstract: The invention relates to a method for the 3-dimensional measurement of a sample with a measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by - providing the measuring system with a 3-dimensional virtual reality device, - creating the 3-dimensional virtual space of the measuring space using the 3-dimensional virtual reality device, - allowing for selecting an operation in the virtual space, - providing real-time unidirectional or bidirectional connection between the measuring space and the virtual space such that an operation selected in the virtual space is performed in the measuring space and data measured in the measuring space is displayed in the virtual space. The invention further relates to a measuring system for the 3-dimensional measurement of a sample, the measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by further comprising a 3-dimensional virtual reality device for displaying a 3- dimensional virtual space of the measuring space, and a real-time unidirectional or bidirectional connection is provided between the laser scanning microscope and the 3-dimensional virtual reality device.

    Abstract translation: 本发明涉及一种用具有三维测量空间的测量系统对样品进行三维测量的方法,该方法包括一个激光扫描显微镜,其特征在于 - 向该测量系统提供三维虚拟现实装置, 使用三维虚拟现实设备创建测量空间的三维虚拟空间, - 允许选择虚拟空间中的操作, - 在测量空间和虚拟空间之间提供实时单向或双向连接,使得 在测量空间中执行在虚拟空间中选择的操作,并且在虚拟空间中显示在测量空间中测量的数据。 本发明还涉及一种用于样品的三维测量的测量系统,所述测量系统具有三维测量空间并且包括激光扫描显微镜,其特征在于还包括一个三维虚拟现实设备,用于显示3 - 在激光扫描显微镜和三维虚拟现实设备之间提供测量空间的三维虚拟空间以及实时单向或双向连接。

    LASER SCANNING MICROSCOPE FOR SCANNING ALONG A 3D TRAJECTORY
    43.
    发明申请
    LASER SCANNING MICROSCOPE FOR SCANNING ALONG A 3D TRAJECTORY 审中-公开
    用于扫描三维轨迹的激光扫描显微镜

    公开(公告)号:WO2010007452A2

    公开(公告)日:2010-01-21

    申请号:PCT/HU2009000057

    申请日:2009-07-14

    CPC classification number: G02B21/0048 G02B21/006 G02B21/0084

    Abstract: The invention relates to a laser scanning microscope (10) having: focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13); drive means (18) for displacing the at least one optical element of the focusing means (15) for changing the position of the focal plane (29), and deflecting means (14) for deflecting the laser beam (13). The microscope comprises a control system (32) configured to carry out the steps of: providing a periodical drive signal for the drive means (18); obtaining time dependant displacement data of the at least one optical element of the focusing means (15) in response to the periodical drive signal of the drive means (18); providing a response function (z(t)) using the time dependant displacement data, calculating a drive signal for the deflecting means (14) using the response function (z(t)) to move the focal volume (30) of the laser beam (13) along a given 3D trajectory (48) within a sample to be examined. The invention further relates to a method for carrying out such a scanning operation along a 3D trajectory (48). ?

    Abstract translation: 本发明涉及一种激光扫描显微镜(10),其具有:聚焦装置(15),其具有焦平面(29)并且包括用于聚焦激光束(13)的至少一个光学元件; 用于移动聚焦装置(15)的至少一个光学元件以改变焦平面(29)的位置的驱动装置(18)和用于偏转激光束(13)的偏转装置(14)。 该显微镜包括控制系统(32),该控制系统(32)被配置为执行以下步骤:为驱动装置(18)提供周期性驱动信号; 响应驱动装置(18)的周期性驱动信号获得聚焦装置(15)的至少一个光学元件的时间相关位移数据; 使用所述时间相关位移数据提供响应函数(z(t)),使用所述响应函数(z(t))计算用于所述偏转装置(14)的驱动信号以移动所述激光束的所述焦点容积(30) (13)沿着要检查的样本内的给定3D轨迹(48)。 本发明还涉及用于沿着3D轨迹(48)执行这种扫描操作的方法。 ?

    ACOUSTO-OPTIC DEFLECTOR WITH LAYERED STRUCTURE AND METHOD FOR DEFLECTING AN OPTICAL BEAM WITH SUCH DEFLECTOR
    47.
    发明申请
    ACOUSTO-OPTIC DEFLECTOR WITH LAYERED STRUCTURE AND METHOD FOR DEFLECTING AN OPTICAL BEAM WITH SUCH DEFLECTOR 审中-公开
    具有层状结构的光学偏振器和用于用这种偏转器偏转光束的方法

    公开(公告)号:WO2016193770A1

    公开(公告)日:2016-12-08

    申请号:PCT/HU2016/050020

    申请日:2016-05-31

    Applicant: FEMTONICS KFT

    Abstract: The subject of the invention relates to an acousto-optic deflector with a layered structure (10), the essence of which is it comprises at least two acousto-optic crystals (12), to each of which at least one electro-acoustic transducer (14) is connected, and the adjacent crystals (12) are separated by an acoustic isolator (16). The subject of the invention also relates to a method for deflecting an optical beam using an acousto-optic deflector (10), characterised by that the acousto-optic deflector (10) comprises at least two acousto-optic crystals (12', 12"), among which a first acoustic wave (15') is created in a first acousto-optic crystal (12') using a first electro-acoustic transducer (14') connected to the first acousto-optic crystal (12'), and a second acoustic wave (15") is created in a second acousto-optic crystal (12") using a second electro-acoustic transducer (14") connected to the second acousto-optic crystal (12") and arranged between the first acousto-optic crystal (12') and the second crystal (12").

    Abstract translation: 本发明的主题涉及一种具有层状结构(10)的声光偏转器,其主要原理是包括至少两个声光晶体(12),其中至少一个电声换能器 14)连接,相邻的晶体(12)被声隔离器(16)分开。 本发明的主题还涉及一种使用声光偏转器(10)偏转光束的方法,其特征在于声光偏转器(10)包括至少两个声光晶体(12',12“ ),其中使用连接到第一声光晶体(12')的第一电声换能器(14')在第一声光晶体(12')中产生第一声波(15'),以及 使用连接到第二声光晶体(12“)的第二电声换能器(14”)在第二声光晶体(12“)中产生第二声波(15”),并布置在第一声光 - 光学晶体(12')和第二晶体(12“)。

    OPTICAL MICROSCOPE SYSTEM FOR SIMULTANEOUS OBSERVATION OF SPATIALLY DISTINCT REGIONS OF INTEREST
    48.
    发明申请
    OPTICAL MICROSCOPE SYSTEM FOR SIMULTANEOUS OBSERVATION OF SPATIALLY DISTINCT REGIONS OF INTEREST 审中-公开
    光学显微镜系统,用于同时观察空间不同区域的利益

    公开(公告)号:WO2015079268A1

    公开(公告)日:2015-06-04

    申请号:PCT/HU2013/000114

    申请日:2013-11-28

    Applicant: FEMTONICS KFT.

    Abstract: The invention relates to an optical microscope system (10) for the simultaneous measurement of at least two spatially distinct regions of interest, characterised by comprising at least two distinct optical measuring heads (12a, 12b, 12c) that can be simultaneously focused on spatially distinct arbitrary regions of interest, each optical measuring head is optically connectable with at least one scan head (14), the optical microscope system further comprising a control system (32) connected to the at least one scan head and the optical measuring head, the control system being configured to provide for synchronised control of the operation of the at least one scan head and the at least two optical measuring head.

    Abstract translation: 本发明涉及一种用于同时测量至少两个空间上不同的感兴趣区域的光学显微镜系统(10),其特征在于包括至少两个不同的光学测量头(12a,12b,12c),其可以同时聚焦在空间上不同 任意的感兴趣区域,每个光学测量头可与至少一个扫描头(14)光学连接,所述光学显微镜系统还包括连接到所述至少一个扫描头和所述光学测量头的控制系统(32),所述控制 系统被配置为提供对所述至少一个扫描头和所述至少两个光学测量头的操作的同步控制。

    FOCUSING SYSTEM COMPRISING ACOUSTO-OPTIC DEFLECTORS FOR FOCUSING AN ELECTROMAGNETIC BEAM
    49.
    发明申请
    FOCUSING SYSTEM COMPRISING ACOUSTO-OPTIC DEFLECTORS FOR FOCUSING AN ELECTROMAGNETIC BEAM 审中-公开
    包含用于聚焦电磁波束的光学偏振器的聚焦系统

    公开(公告)号:WO2010076579A1

    公开(公告)日:2010-07-08

    申请号:PCT/HU2009/000112

    申请日:2009-12-30

    CPC classification number: G02F1/33 G02F2201/16 G02F2203/28

    Abstract: The present invention relates to a focusing system (100) for focusing an electromagnetic beam for three-dimensional random access applications, the system comprising a first pair of acousto-optic deflectors (10) for focusing an electromagnetic beam in an X-Z plane, and a second pair of acousto-optic deflectors (20) for focusing an electromagnetic beam in a Y-Z plane being substantially perpendicular to the X-Z plane, characterised in that the second pair of acousto-optic deflectors (20) are arranged between the acousto-optic deflectors (12, 12') of the first pair of acousto-optic deflectors (10), such that the first and fourth acousto-optic deflectors (12, 12") of the system belong to the first pair of acousto-optic deflectors (10) and the second and third acousto-optic deflectors (22, 22") of the system belong to the second pair of acousto-optic deflectors (20).

    Abstract translation: 本发明涉及用于聚焦用于三维随机存取应用的电磁束的聚焦系统(100),该系统包括用于将电磁束聚焦在XZ平面中的第一对声光偏转器(10)和 第二对声光偏转器(20),用于将基本垂直于XZ平面的YZ平面中的电磁束聚焦,其特征在于,所述第二对声光偏转器(20)布置在所述声光偏转器 12,12'),使得系统的第一和第四声光偏转器(12,12“)属于第一对声光偏转器(10),该声光偏转器 并且系统的第二和第三声光偏转器(22,22“)属于第二对声光偏转器(20)。

    METHOD AND MEASURING SYSTEM FOR SCANNING A REGION OF INTEREST
    50.
    发明申请
    METHOD AND MEASURING SYSTEM FOR SCANNING A REGION OF INTEREST 审中-公开
    扫描区域的方法和测量系统

    公开(公告)号:WO2010055362A2

    公开(公告)日:2010-05-20

    申请号:PCT/HU2009/000095

    申请日:2009-11-17

    Abstract: The invention relates to a method for scanning a region of interest, such as a portion of a neural process, via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflecting means for deflecting the laser beam, the method comprising: providing a primary scanning trajectory for the at least one region of interest; providing a plurality of spaced apart auxiliary scanning trajectories running along the primary scanning trajectory within the region of interest; providing a scanning sequence for scanning the scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive scanning trajectories in the scanning sequence. The invention further relates to a measuring system for implementing the method according to the invention.

    Abstract translation: 本发明涉及一种用于通过激光扫描显微镜扫描诸如神经过程的一部分的感兴趣区域的方法,所述激光扫描显微镜具有用于聚焦激光束并具有用于偏转激光束的电机械光学偏转装置的聚焦装置, 所述方法包括:为所述至少一个感兴趣区域提供主扫描轨迹; 提供沿所述感兴趣区域内的主扫描轨迹运行的多个间隔开的辅助扫描轨迹; 提供用于扫描扫描轨迹的扫描序列; 在扫描序列中的两个连续扫描轨迹的扫描轨迹之间提供交叉轨迹。 本发明还涉及一种用于实现根据本发明的方法的测量系统。

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