Abstract:
PROBLEM TO BE SOLVED: To provide a system capable of accurately measuring a substrate table position and/or its displacement in a wide scope without an excessive increase in cost. SOLUTION: Specifically, a displacement measuring system is provided to measure a substrate table displacement within lithography equipment for a reference frame. It comprises a number of displacement sensors attached to the substrate table and a target attached to the reference frame and linked to the correspoding displacement sensor. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To make significant improvements in resolution and line edge roughness attainable from imprint lithography. SOLUTION: The lithographic device has an imprint template or a template holder configured to hold an imprint template, and a substrate table constituted to receive a substrate, the device further including walls which together with the substrate table and the imprint template or the template holder, are configured to form an enclosed space which is substantially sealed from a surrounding space. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic device having a high throughput and that can transfer patterns with relatively small structures on substrates. SOLUTION: The invention relates to a dual stage lithographic device, in which two substrate stages are constructed to cooperate with each other to perform a joint sweep movement for guiding the lithographic device from a first condition, a condition in which an immersion liquid is confined between a first substrate carried by a first stage of the stages and a final element of the projection system in the device, to a second condition, a condition in which the liquid is confined between a second substrate carried by a second stage of the two stages and the final element, such that during the joint sweep movement, the liquid is confined to be substantially within the described space with respect to the final element. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an imprint lithography method in which resolution and superposition accuracy are improved. SOLUTION: The imprint lithography method comprises: a step for subjecting an imprintable medium on a substrate to a condition that the medium is at a first temperature which may subject the medium to a flowable state, where the imprintable medium comprises an imprint material selected from a group consisting of a crystalline material and a polycrystalline material; a step for pressing a template into the medium to form an imprint in the medium; a step for cooling the medium to a second temperature which may subject the medium to a substantially non-flowable state while the medium is brought into contact with the template 46; and a step for separating the medium from the template 46 in the substantially non-flowable state. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a device and a method for improving the level of correction that can be achieved with a transmissive deformable lens element in a lithographic device. SOLUTION: The lithographic device has: a deformable lens element through which a patterned radiation beam is arranged to pass before reaching a substrate; and a deformable lens actuator configured to transmit, at a plurality of sub-regions on the deformable lens element independently, a combination of a force substantially parallel to the optical axis of the projection system and a localized torque about an axis substantially perpendicular to the optical axis. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To reduce stain particles of a surface, when the surface of a reticle or a mask is exposed to the air of the optics compartment of a lithographic apparatus. SOLUTION: The lithographic apparatus includes an optics compartment that contains the patterned surface of a patterning device and an optical element, and a substrate compartment connected to the optics compartment by a connection that is arranged to pass a patterned beam of radiation from the optical element to a substrate. The apparatus also includes a first flush gas inlet arranged to supply a first flush gas into the connection; a second flush gas inlet adjacent to the patterned surface and arranged to supply a second flush gas into the optics compartment, and to create a region adjacent to the patterned surface in which the second flush gas flows in a direction with a component normal to and away from the patterned surface, and a gas pump arranged to pump the flush gases from the optics compartment. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a system for reducing lithographic errors caused by immersion liquid. SOLUTION: A lithography apparatus comprises an illumination system so constituted as to control a radiation beam, a support so constituted as to support a pattern forming device which imparts patterns on a crosssection of the radiation beam to form a patternized radiation beam, a substrate table so constituted as to hold a substrate, a projection system so constituted as to project the patternized radiation beam on the target of the substrate, a liquid supply system so constituted as to fill at least part of a space between a final element of the projection system and the substrate with the liquid, a sealing member so disposed as to substantially enclose the liquid inside the space between the final element of the projection system and the substrate, and an element for controlling and/or compensate evaporation of the immersion liquid from the substrate. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a immersion-type lithography projection apparatus. SOLUTION: In the immersion-type lithography apparatus, an immersion liquid is confined between a final element of a projection system and a substrate. Both of hydrophobic and hydrophilic layers are used on various elements of the apparatus. The use of them helps to prevent air-bubble formation in the immersion liquid, and reduce residues remained on the elements after immersion in the immersion liquid. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus and a manufacturing method of a device. SOLUTION: There is disclosed a lithographic projection apparatus for use with an immersion liquid positioned between a final element of a projection system and a substrate W. There are disclosed a lot of methods of protecting components of the projection system, a substrate table and a liquid confinement system. These methods include a step of applying a protective coating on a final element 20 of the projection system and a step of providing sacrificial bodies at an upstream side of the components. And, a two-component final optical element of CaF 2 is also disclosed. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an effective seal for sealing liquid in a space between a definitive element of a projection system and the surface of a substrate by immersing the substrate in a liquid having a comparatively large index of refraction in a lithography projection apparatus. SOLUTION: A seal member 4 is arranged between the definitive element of a projection system PL and the surface of a substrate W, thereby a space 2 is defined. A liquid seal is formed between the seal member 4 and the surface of the substrate W, thereby the liquid is prevented from leaking from the space 2. The seal member 4 has a liquid injection port 6 and a liquid discharge port 8 on the surface thereof facing the substrate. The discharge port 8 is arranged inside the injection port 6 in the radial direction with respect to the optical axis of the projection system. The flow of the liquid from the injection port to the discharge port forms a liquid seal. COPYRIGHT: (C)2005,JPO&NCIPI