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公开(公告)号：US10473795B2
公开(公告)日：2019-11-12
申请号：US16026106
申请日：2018-07-03
Applicant: Nuctech Company Limited
Inventor： Yongqiang Wang , Qingjun Zhang , Yuanjing Li , Ziran Zhao , Lifeng Sun , Nan Bai , Xingliang Zhai
Abstract: A large-area X-ray gas detector includes a housing having an inner cavity and a ray entrance communicated with the inner cavity, a thin entrance window and a signal collection module. The inner cavity is filled with a working gas which is a non-electronegativity gas sensitive to the X-ray. The entrance window is hermetically connected to the ray entrance such that the X-ray enters into the inner cavity. The signal collection module comprises an anode wire electrode layer and a cathode electrode layer arranged parallel with each other in the inner cavity, in which the anode wire electrode layer has an anode wire for accessing to a high voltage, and the cathode electrode layer is grounded. The anode wire electrode layer collects electrons generated by the working gas under an action of the X-ray.
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公开(公告)号：US10466372B2
公开(公告)日：2019-11-05
申请号：US14981953
申请日：2015-12-29
Applicant: TSINGHUA UNIVERSITY , NUCTECH COMPANY LIMITED
Inventor： Kejun Kang , Shuwei Li , Qingjun Zhang , Yuanjing Li , Yulan Li , Ziran Zhao , Yinong Liu , Yaohong Liu , Weibin Zhu , Xiaolin Zhao , Huishao He
IPC: G01T7/00 , G01T1/20 , H04N5/57 , G01T1/16 , H01L27/30 , H05G1/36 , G21K1/02 , G01T1/17 , G01V5/00 , H04N5/369 , G06T1/00
Abstract: The present invention discloses an X-ray beam intensity monitoring device and an X-ray inspection system. The X-ray beam intensity monitoring device comprises an intensity detecting module and a data processing module, wherein the intensity detecting module is adopted to be irradiated by the X-ray beam and send a detecting signal, the data processing module is coupled with the intensity detecting module to receive the detecting signal and output an X-ray beam intensity monitoring signal, wherein the X-ray beam intensity monitoring signal includes a dose monitoring signal for the X-ray beam and a brightness correction signal for correcting signal values of the X-ray beam. The X-ray beam intensity monitoring device can simultaneously perform dose monitoring and brightness monitoring, thereby improving the service efficiency of the X-ray beam intensity monitoring device. Moreover, the monitoring result of the X-ray beam intensity can be more accurate and reliable.
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公开(公告)号：US10448904B2
公开(公告)日：2019-10-22
申请号：US16232072
申请日：2018-12-26
Applicant: TSINGHUA UNIVERSITY , NUCTECH COMPANY LIMITED
Inventor： Liang Li , Zhiqiang Chen , Kejun Kang , Ziran Zhao , Li Zhang , Yuxiang Xing , Tiao Zhao , Jianmin Li , Bicheng Liu , Qian Yi
Abstract: The present disclosure provides a decomposition method based on basis material combination. In the present disclosure, a scanned object is divided into a plurality of regions, the basis material combinations used in each of the divided regions are different each other, and the scanned object is re-divided according to the re-determined equivalent atomic number of its each point until the change on decomposition coefficient meets certain conditions. Thereby, a decomposition method based on dynamic basis material combinations is realized, which reduces a decomposition error caused by improper selection of the basis material combination and improves the accuracy of the decomposition and substance identification of the multi-energy CT.
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公开(公告)号：US10332244B2
公开(公告)日：2019-06-25
申请号：US15610930
申请日：2017-06-01
Applicant: Nuctech Company Limited
Inventor： Zhiqiang Chen , Yuanjing Li , Ziran Zhao , Yaohong Liu , Jianping Gu , Zhiming Wang
IPC: G06T7/00
Abstract: A method and an apparatus for estimating an image fuzziness are provided. The method may comprise: acquiring an image; obtaining a multi-scale representation of the image by performing a multi-scale transform on the image; calculating gradients of the image and a normalized histogram of the gradients at each scale based on the multi-scale representation; calculating error vectors between the normalized histogram of gradients at each scale and a normalized original histogram of gradients of the image; performing a weighted summing on the error vectors by using respective weights to obtain a summed result, wherein the weights are determined based on a reciprocal of the sums of squares of the gradients of the image at each scale; estimating the ambiguity of the image based on the summed result.
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公开(公告)号：US10302578B2
公开(公告)日：2019-05-28
申请号：US15494884
申请日：2017-04-24
Applicant: Tsinghua University , Nuctech Company Limited
Inventor： Liang Li , Zhiqiang Chen , Kejun Kang , Li Zhang , Ziran Zhao , Yuxiang Xing , Jianmin Li , Yulan Li , Tiao Zhao
IPC: G01N23/046 , G01N23/087
Abstract: Methods and system for decomposing a high-energy dual-energy X-ray CT material are disclosed. In the method, two types of effect such as Compton effect and electron pairing effect which dominates are reserved and the influence of the other effect such a photoelectric effect is removed so as to improve the accuracy of the material decomposition. The unique advantage of the present disclosure is to effectively remove the error of the calculated atomic number Z due to directly selecting two effects during processes of material decomposition in the conventional dual-energy CT method. This may greatly improve the accuracy of dual-energy CT identification of the material, and it is important to improve the conventional dual-use CT imaging system applications, such as clinical therapy, security inspection, industrial non-destructive testing, customs anti-smuggling and other fields.
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Patent Agency Ranking
公开(公告)号：US10267678B2
公开(公告)日：2019-04-23
申请号：US14577748
申请日：2014-12-19
Applicant: NUCTECH COMPANY LIMITED
Inventor： Ziran Zhao , Jianhong Zhang , Hongqiu Wang , Weiwei Wang , Zhiming Wang , Yumin Yi
Abstract: Embodiments of the present invention provide a Raman spectroscopic inspection method, comprising the steps of: measuring a Raman spectrum of an object to be inspected successively to collect a plurality of Raman spectroscopic signals; superposing the plurality of Raman spectroscopic signals to form a superposition signal; filtering out a florescence interfering signal from the superposition signal; and identifying the object to be inspected on basis of the superposition signal from which the florescence interfering signal has been filtered out. By means of the above method, a desired Raman spectroscopic signal may be acquired by removing the interference caused by a florescence signal from a Raman spectroscopic inspection signal of the object. It may inspect correctly the characteristics of the Raman spectrum of the object so as to identify the object effectively.
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公开(公告)号：US10262410B2
公开(公告)日：2019-04-16
申请号：US15279664
申请日：2016-09-29
Applicant: NUCTECH COMPANY LIMITED
Inventor： Zhiqiang Chen , Li Zhang , Ziran Zhao , Yaohong Liu , Cun Cheng , Qiang Li , Jianping Gu , Jian Zhang , Gang Fu
IPC: G06T7/00 , G06K9/00 , G06K9/46 , G06Q30/00 , G06K9/32 , G06T7/11 , G06K9/18 , G06K9/62 , G06T7/136
Abstract: The present disclosure provides a method and a system for inspecting goods. The method includes the steps of: obtaining a transmission image and a HSCODE of inspected goods; processing the transmission image to obtain a region of interest; retrieving from a model library a model created based on the HSCODE, in accordance with the HSCODE of the inspected goods; and determining whether there are any goods not registered in a customs declaration that are contained in the region of interest based on the model. With the above solution, it is possible to inspect goods in a container efficiently, so as to find out whether there are goods not indicated in the customs declaration that are concealed in the container.
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48.发明申请公开(公告)号：US20190089344A1
公开(公告)日：2019-03-21
申请号：US16110355
申请日：2018-08-23
Applicant: Nuctech Company Limited
Inventor： Yaohong Liu , Ziran Zhao , Jinsheng Liu , Wei Jia , Wei Li , Xinshui Yan
IPC: H03K17/0812 , H03K17/567
Abstract: The disclosed technology relates to a gate protection circuit for an Insulated Gate Bipolar Transistor (IGBT), the IGBT being used as a switch device in a solid state pulse modulator based on the MARX generator principle, the gate protection circuit including: a voltage regulator configured to supply a stable voltage to an emitter of the IGBT with respect to the ground for a gate of the IGBT.
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公开(公告)号：US10217204B2
公开(公告)日：2019-02-26
申请号：US15409738
申请日：2017-01-19
Applicant: Nuctech Company Limited
Inventor： Zhiqiang Chen , Yuanjing Li , Li Zhang , Ziran Zhao , Yaohong Liu , Jianping Gu , Zhiming Wang
Abstract: A method of evaluating an image quality for an imaging system and the imaging system are provided. The method in some examples includes: acquiring an image to be evaluated which is generated by the imaging system; extracting a number of sub-images from the image; obtaining a coefficient vector indicating a degree of sparsity by applying a sparse decomposition on the sub-images based on a pre-set redundant sparse representation dictionary; and performing a linear transformation on the coefficient vector so as to obtain an evaluation value for the image quality. The sparse dictionary is learned by only using a few high quality perspective images, and then the image quality is evaluated based on the sparse degree of the image obtained by using the sparse dictionary. A convenient and rapid no-reference image quality evaluation is achieved.
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公开(公告)号：US10134123B2
公开(公告)日：2018-11-20
申请号：US15278101
申请日：2016-09-28
Applicant: Tsinghua University , NUCTECH COMPANY LIMITED
Inventor： Yuanjing Li , Ziran Zhao , Yaohong Liu , Qili Wang , Qiang Li , Jianping Gu
Abstract: The present disclosure provides a method and a system for inspecting goods. The method comprises steps of: obtaining a transmission image of inspected goods; processing the transmission image to obtain a suspicious region; extracting local texture features of the suspicious region and classifying the local texture features of the suspicious region based on a pre-created model to obtain a classification result; extracting a contour line shape feature of the suspicious region and comparing the contour line shape feature with a pre-created standard template to obtain a comparison result; and determining that the suspicious region contains a high atomic number matter based on the classification result and the comparison result.
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