Abstract:
A semiconductor arrangement and method of formation are provided. The semiconductor arrangement includes an electro-wetting-on-dielectric (EWOD) device. The EWOD device includes a top portion over a bottom portion and a channel gap between the top portion and the bottom portion. The bottom portion includes a driving dielectric layer over a first electrode, a second electrode and a first separating portion of an ILD layer between the first electrode and a second electrode. The driving dielectric layer has a first thickness less than about 1,000 Å. An EWOD device with a driving dielectric layer having a first thickness less 1000 Å requires a lower applied voltage to alter a shape of a droplet within the device and has a longer operating life than an EWOD device that requires a higher applied voltage to alter the shape of the droplet.
Abstract:
Micro-Electro-Mechanical System (MEMS) structures, methods of manufacture and design structures are disclosed. The method includes forming a Micro-Electro-Mechanical System (MEMS) beam structure by venting both tungsten material and silicon material above and below the MEMS beam to form an upper cavity above the MEMS beam and a lower cavity structure below the MEMS beam.
Abstract:
The present invention relates to MEM switches. More specifically, the present invention relates to a system and method for making MEM switches having a common ground plane. One method for making MEM switches includes: patterning a common ground plane layer on a substrate; forming a dielectric layer on the common ground plane layer; depositing a DC electrode region through the dielectric layer to contact the common ground plane layer; and depositing a conducting layer on the DC electrode region so that regions of the conducting layer contact the DC electrode region, so that the common ground plane layer provides a common ground for the regions of the conducting layer
Abstract:
A method for depositing material on a channel plate such that the material is registered to one or more channels formed in the channel plate includes filling at least one of the channels with a resist that is not wetted by the material; depositing the material on at least a region of the channel plate that includes at least part of the resist, the material registering with at least one channel edge as a result of the material's abutment to the resist; and then removing the resist. The method may be used, in one embodiment, to apply an adhesive or gasket material that is used in assembling a switch.
Abstract:
A method for producing co-planar surface areas is disclosed. At first a first layer with at least one recess is provided. Onto the first layer a second layer is deposited over the entire area of the first layer wherein the second layer has a thickness greater than the depth of the recess. The second layer is composed of material different to the material of the first layer. The next step removes the second layer completely beyond the area of at least one recess. The remaining portion of the second layer is removed until the second layer is coplanar with the first layer.
Abstract:
The present disclosure is related to a method for producing one or more structural elements (3,4) on top of at least two components of a Micro-Electromechanical System (MEMS) device, wherein a gap (10) is present between two of said components, the method comprising: ● filling said gap with a planarizing material, ● producing said elements on top of said two components (1,2),
wherein filling said gap (10) consists of performing subsequently: ● a first step, being a sputtering step or a combined sputtering/deposition step, thereby widening the entrance to said gap, and, ● a second step, being a conformal deposition step, thereby filling said gap with a planarizing material and producing a substantially flat layer (17) of said material on top of said components (1,2).
Abstract:
A method of disposing a plurality of isolated particles of a first material onto a substrate comprising the steps of:
(a) depositing a first species onto the substrate; (b) anodizing the first species to produce a second species; (c) altering the surface of the second species so that at least one first region of the second species is of greater thickness than at least one second region of the second species; (d) depositing the first material onto the second species; and (e) levelling the surface of the first material and the second species.
Abstract:
A method for producing co-planar surface areas is disclosed. At first a first layer with at least one recess is provided. Onto the first layer a second layer is deposited over the entire area of the first layer wherein the second layer has a thickness greater than the depth of the recess. The second layer is composed of material different to the material of the first layer. The next step removes the second layer completely beyond the area of at least one recess. The remaining portion of the second layer is removed until the second layer is coplanar with the first layer.
Abstract:
반도체 디바이스들의 제조 방법으로서 화학 기계 연마 조성물 (Q1) 의 존재하에서 적어도 하나의 III-V 재료를 함유하는 기판 또는 층을 화학 기계 연마하는 단계를 포함하고, 상기 화학 기계 연마 조성물 (Q1) 은 (A) 무기 입자들, 유기 입자들 또는 이들의 혼합물 또는 복합물, (B) 적어도 하나의 양친매성 (amphiphilic) 비이온 계면활성제로서 (b1) 적어도 하나의 소수성 기; 및 (b2) 폴리옥시알킬렌 기들로 이루어지는 군으로부터 선택된 적어도 하나의 친수성 기를 갖고 상기 폴리옥시알킬렌 기들은 (b22) 옥시에틸렌 모노머 단위들 외의 옥시알킬렌 모노머 단위들을 포함하는, 상기 적어도 하나의 양친매성 비이온 계면활성제; 및 (M) 수성 매질 을 포함하는, 반도체 디바이스들의 제조 방법.