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    OPTICAL ANALYZER
    42.
    发明申请
    OPTICAL ANALYZER 有权
    光学分析仪

    公开(公告)号：US20160234904A1

    公开(公告)日：2016-08-11

    申请号：US15015810

    申请日：2016-02-04

    Applicant: SHIMADZU CORPORATION

    Inventor： Yusuke NAGAI ,  Keisuke OGAWA ,  Masato WATANABE ,  Kumiko JINGU ,  Masanori FUJIWARA ,  Tomoyuki YAMAZAKI

    IPC: H05B33/08 ,  G01N21/33

    CPC classification number: H05B33/0851 ,  G01N21/33 ,  G01N2201/0621 ,  G01N2201/0638 ,  G01N2201/0692 ,  G01N2201/0695

    Abstract: Provided is an optical analyzer for performing a feedback control on the amount of light emitted from an LED as a light source, in which the configuration of an optical system is made simple and the degree of freedom in optical system arrangement is secured. An optical member 2 for focusing most of light while discharging part of the light as unfocused light is provided on an optical path from a light casting unit 1 to a sample cell 3. The optical member 2 can be achieved with a simple configuration, for example, two ball lenses spaced apart by a predetermined distance from each other. The light focused by the optical member 2 is cast as measurement light into the sample cell 3. Meanwhile, a second photodetector 5 is arranged at a position where the unfocused light reaches. The second photodetector 5 generates a detection signal in accordance with the amount of light that has entered the second photodetector 5 as monitored light, and a drive current to be supplied to an LED is controlled through a drive current controlling unit 6 and a current source 7 such that the amount of light is maintained at a fixed level.

    Abstract translation: 提供了一种用于对从光源发出的光量进行反馈控制的光学分析器，其中光学系统的结构简单且光学系统布置的自由度得到确保。 在从光铸造单元1到样品池3的光路上设置有用于聚焦大部分光的光学构件2，同时以未聚焦的光排出部分光。光学构件2可以以简单的构造实现，例如 ，彼此隔开预定距离的两个球透镜。 将由光学构件2聚焦的光作为测量光铸造到样品池3中。同时，第二光电检测器5布置在未聚焦的光到达的位置。 第二光电检测器5根据作为监视光进入第二光电检测器5的光量产生检测信号，通过驱动电流控制单元6和电流源7控制提供给LED的驱动电流 使得光量保持在固定的水平。

    DYNAMIC MEASUREMENT OF MATERIAL PROPERTIES USING TERAHERTZ RADIATION WITH REAL-TIME THICKNESS MEASUREMENT FOR PROCESS CONTROL
    44.
    发明申请
    DYNAMIC MEASUREMENT OF MATERIAL PROPERTIES USING TERAHERTZ RADIATION WITH REAL-TIME THICKNESS MEASUREMENT FOR PROCESS CONTROL 审中-公开
    使用TERAHERTZ辐射与实时厚度测量进行过程控制的材料特性的动态测量

    公开(公告)号：US20150323452A1

    公开(公告)日：2015-11-12

    申请号：US14334529

    申请日：2014-07-17

    Applicant: Advantest Corporation

    Inventor： Edward King ,  David Heaps ,  Mark Sullivan ,  Richard McKay ,  Eiji Kato

    IPC: G01N21/3586 ,  G01N21/3563 ,  G01B11/06 ,  G01N33/15

    CPC classification number: G01N21/3586 ,  G01B11/06 ,  G01N21/3563 ,  G01N33/15 ,  G01N2201/061 ,  G01N2201/0692

    Abstract: A method of determining material properties for an object under test is disclosed. The method comprises determining a thickness at a point on the object under test in a non-invasive manner. It also comprises obtaining a terahertz measurement by passing terahertz radiation through the object under test using a terahertz emitter and detecting the terahertz radiation using a terahertz detector. Finally, it comprises determining an optical property at the point on the object under test using a measurement value from the terahertz emitter and the terahertz detector and a measured value for the thickness at the point.

    Abstract translation: 公开了一种确定待测物体的材料特性的方法。 该方法包括以非侵入性方式确定被测物体上的某一点的厚度。 它还包括通过使用太赫兹发射器将太赫兹辐射通过待测物体，并使用太赫兹检测器检测太赫兹辐射来获得太赫兹测量。 最后，它包括使用来自太赫兹发射器和太赫兹检测器的测量值以及该点处的厚度的测量值来确定被测物体上的点处的光学特性。

    Sample analyzer including a high frequency control component and sample analyzing method
    45.
    发明授权
    Sample analyzer including a high frequency control component and sample analyzing method 有权
    样品分析仪，包括高频控制组件和样品分析方法

    公开(公告)号：US08269952B2

    公开(公告)日：2012-09-18

    申请号：US12229783

    申请日：2008-08-27

    Applicant: Kunio Ueno

    Inventor： Kunio Ueno

    IPC: G01N33/48

    CPC classification number: G01N15/1459 ,  G01N15/1434 ,  G01N2015/0073 ,  G01N2015/008 ,  G01N2015/0084 ,  G01N2201/0612 ,  G01N2201/0692 ,  G01N2201/0697 ,  H01S5/0427 ,  H01S5/0622 ,  H01S5/0652 ,  H01S5/0653 ,  H01S5/06832

    Abstract: The present invention is to present a sample analyzer capable of automatically stabilizing the laser diode in multi-mode oscillation. A sample analyzer 1 comprises: a laser diode (LD) 501d for irradiating a sample with laser light; a photodiode (PD) 501e for detecting amount of light emitted from the LD 501d; a APC circuit 501b for outputting a direct current to be supplied to the LD 501d such that the amount of light emitted from the LD 501d is maintained at a predetermined amount, based on the amount of light detected by the PD 501e; a high frequency oscillation circuit 501f for superimposing a high frequency component on the direct current outputted from the APC circuit 501b; and a high frequency automatic adjustment circuit 501c for controlling amplitude of the high frequency component outputted from the high frequency oscillation circuit 501f according to magnitude of the direct current outputted from the APC circuit 501b such that the LD 501d oscillates in a multi-mode.

    Abstract translation: 本发明是提供能够在多模式振荡中自动稳定激光二极管的样品分析装置。 样品分析仪1包括：用激光照射样品的激光二极管（LD）501d; 用于检测从LD 501d发射的光量的光电二极管（PD）501e; APC电路501b，用于输出要提供给LD 501d的直流电流，使得从LD 501d发射的光量基于由PD 501e检测到的光量保持在预定量; 用于将高频分量叠加在从APC电路501b输出的直流上的高频振荡电路501f; 以及高频自动调整电路501c，用于根据从APC电路501b输出的直流电流的大小来控制从高频振荡电路501f输出的高频分量的振幅，使得LD 501d以多模式振荡。

    OPTICAL MEASUREMENT ARRANGEMENT
    47.
    发明申请
    OPTICAL MEASUREMENT ARRANGEMENT 有权
    光学测量装置

    公开(公告)号：US20100200728A1

    公开(公告)日：2010-08-12

    申请号：US12697618

    申请日：2010-02-01

    Applicant: Gal Ingber

    Inventor： Gal Ingber

    IPC: G01J1/32

    CPC classification number: G01J1/32 ,  G01J3/42 ,  G01J2003/2866 ,  G01N21/031 ,  G01N21/253 ,  G01N2201/0415 ,  G01N2201/0469 ,  G01N2201/0692

    Abstract: A method and device for enhancing the power correction of optical measurements in an optical measurement arrangement, the steps including: providing a light source for producing a light beam; splitting the light beam into two beams; directing a first split light beam through an interrogation area and into an optics separation device; directing the light beams from the optics separation device and a second split light beam representing the intensity of the illumination of the main light beam of the light source into cells of a detector array; measuring and assessing the information obtained in the cells; and using this information to calculate the corrected value for the cells receiving the light beams from the optics separation device in order to adjust the power for the intensity of the light beam of the light source and/or to correct the intensity of the light beams from the interrogation area.

    Abstract translation: 一种用于增强光学测量装置中的光学测量的功率校正的方法和装置，所述步骤包括：提供用于产生光束的光源; 将光束分成两束; 将第一分裂光束引导通过询问区并进入光学分离装置; 引导来自光学分离装置的光束和将光源的主光束的照明强度表示为检测器阵列的单元的第二分裂光束; 测量和评估细胞中获得的信息; 并且使用该信息来计算接收来自光学分离装置的光束的单元的校正值，以便调整光源的光束强度的功率和/或校正来自光源的光束的强度 询问区。

    Device for measuring gas concentration
    48.
    发明授权
    Device for measuring gas concentration 失效
    测量气体浓度的装置

    公开(公告)号：US06710347B1

    公开(公告)日：2004-03-23

    申请号：US10096227

    申请日：2002-03-12

    Applicant: Gideon Eden

    Inventor： Gideon Eden

    IPC: G01J502

    CPC classification number: G01N21/3504 ,  G01N21/33 ,  G01N2021/3177 ,  G01N2201/0692 ,  G01N2201/1211 ,  G01N2201/1218

    Abstract: An apparatus and method for detecting at least one component gas in a sample includes a radiation source for providing radiation along an optical path in a pre-selected spectral band having at least one absorption line of the component gas to be detected and an optical detector for detecting radiation at the optical path. A sample chamber is positioned in the optical path between the source and the optical detector to contain a quantity of a sample gas. At least one gas cell enclosing an amount of the gas to be detected is fixedly positioned in the optical path in series with the gas chamber. A mathematical relationship is determined between the detected radiation and the concentration of a sample gas filling the sample chamber.

    Abstract translation: 用于检测样品中的至少一种组分气体的装置和方法包括：辐射源，用于沿预先选择的光谱带沿着光路提供辐射，所述光谱带具有待检测的成分气体的至少一个吸收线;以及光学检测器， 检测光路上的辐射。 样品室位于源和光学检测器之间的光路中，以容纳一定量的样品气体。 包围待检测气体量的至少一个气室牢固地定位在与气室串联的光路中。 在检测到的辐射与填充样品室的样品气体的浓度之间确定数学关系。

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