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    51.
    发明专利
    未知

    公开(公告)号：DE1929429A1

    公开(公告)日：1969-12-18

    申请号：DE1929429

    申请日：1969-06-10

    Applicant: APPLIED RES LAB INC

    Inventor： L DAHLQUIST RALPH ,  L JONES JAMES

    IPC: G01N21/67 ,  G01N21/73 ,  H05H1/48 ,  G01J3/30

    Abstract: A wall-stabilized electric arc within a capillary tube, supported by a gas flowing lengthwise through the tube is used to excite a material for spectroscopic analysis. A material to be analyzed, in gaseous or finely comminuted form, is fed into the arc near one end and carried through it by the working gas. Emission or absorption of radiation is observed endwise of the tube.

    Ion beam microanalyser
    52.
    发明专利
    Ion beam microanalyser 未知

    公开(公告)号：GB1145107A

    公开(公告)日：1969-03-12

    申请号：GB4418366

    申请日：1966-10-04

    Applicant: APPLIED RES LAB INC

    IPC: G01Q10/00 ,  G01Q30/06 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/02 ,  H01J49/14 ,  H01J49/20 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32

    Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.

    Method of and apparatus for preparing samples for x-ray analysis
    56.
    发明专利
    Method of and apparatus for preparing samples for x-ray analysis 未知

    公开(公告)号：GB1090440A

    公开(公告)日：1967-11-08

    申请号：GB2815967

    申请日：1965-11-01

    Applicant: APPLIED RES LAB INC

    IPC: G01N1/28 ,  G01N23/22 ,  G01T7/02

    Abstract: 1,090,440. Rotary table compression moulding machine. APPLIED RESEARCH LABORATORIES Inc. Nov. 1, 1965 [Nov. 19, 1964], No. 28159/67. Divided out of 1,090,439. Heading B5A. A rotary table compression moulding machine, particularly for making briquettes for subsequent X-ray analysis, comprises an intermittently rotating hub 40 carrying radial arms 44-49 each of which is provided with a through bore 50. Each arm carries upper and lower pressing pistons, 52 and 54 which are pivoted to the outer ends of levers 56 and 58, the levers themselves being centrally pivoted about rollers 98 mounted upon the arm. The levers are moved along the arm, to bring the pistons into a position overlying the bore, by cam actuated rods 61 and 62 connected to rollers 98, and are pivoted, to insert the pistons into the bore, by means of second, cam actuated rods 62 and 64 connected to the inner ends of the levers. In operation, starting from a position in which the upper piston is radially retracted and the lower piston is located in the bore, each arm is first indexed to a station B, where the bore is filled by a hopper 76, and then to a station D, during which time the upper piston is forwarded and pivoted into the bore to effect a preliminary compression. At station D, the pistons are engaged between upper and lower press jaws to fully compress the material, after which the lower piston is lowered and radially retracted, the upper piston is lowered to push the formed briquette from the bore, and the arm is indexed to a last station F. At station F the lower piston is forwarded to knock the briquette off the lower end of the upper piston on to a take-off device such as conveyer 74.

    57.
    发明专利
    未知

    公开(公告)号：FR1453769A

    公开(公告)日：1966-06-03

    申请号：FR38575

    申请日：1965-11-16

    Applicant: APPLIED RES LAB INC

    IPC: G01N23/22

    X-ray diffraction apparatus
    58.
    发明专利
    X-ray diffraction apparatus 未知

    公开(公告)号：GB948673A

    公开(公告)日：1964-02-05

    申请号：GB3533661

    申请日：1961-09-29

    Applicant: APPLIED RES LAB INC

    IPC: G01N23/201

    Abstract: 948,673. X-ray diffraction apparatus. APPLIED RESEARCH LABORATORIES Inc. Sept. 29, 1961 [Dec. 8, 1960], No. 35336/61. Heading H5R. [Also in Division F2] An X-ray diffraction apparatus incorporates a mechanical linkage having an apex point equispaced from its opposite ends and means for locating the ends of the linkage for travel along a pair of straight ways inclined to each other at an angle which is half the angle subtended at the apex by the ends of the ways; the diffraction element is secured at one end of the linkage, and the detector slit at the end of a radius arm connected to the apex; as the focal circle in effect rolls about the point corresponding to the specimen under examination, the diffracting element and the slit remain on the circle, and the apex itself moves in a circular path about the specimen. Fig. 2 shows diagrammatically how the linkage arrangement is set out in relation to an X-ray monochromator. The X-rays from the specimen 32 are diffracted by the curved crystal 10 and pass through an exit slit 20 to a detector 22. The isosceles triangle linkage 30 has its apex 44 at the centre of the focal circle 18 and the ends of its base 28 also lying on the circle. At one end of the base is mounted the crystal 10. The ends of the base are constrained to move along straight ways 36, 38 respectively, which, extended, meet at the specimen 32 and form an angle # thereat. The apex angle 44 of the triangle is thus 2#. As the base ends of the triangle move along the ways, the apex 44 describes a circular path about centre 32. The detector 22 is slidably mounted on an arm 50 pivoted at the farther base end of the triangle, and a constant length cable arrangement maintains the distance from crystal 10 to exit slit 20 the same as the distance from crystal 10 to specimen 32. A rigid arm 52 links slit 20 to the apex point 44, so that as the triangle moves, the slit 20 follows the lemniscate path 26. Fig. 4 shows a practical embodiment. The isosceles triangle 30 of Fig. 2 here takes the form of a T-bar 64, the cross-piece 66 forming the base of the triangle, and the tip 68 the apex (44 on Fig. 2). The assembly is mounted on a base-plate 60. A slot 62 in the plate forms one guiding way (36, 40 in Fig. 2) and a track 72 fixed to the plate forms the other guiding way (38, 42 in Fig. 2). The two guide ways are in this case inclined at 45 degrees, so that the T-bar defines a right-angled isosceles triangle. One end of the T-bar carries a roller 70 which runs in track 72, held there by a spring 74. The other end carries a pivot 76 projecting through slot 62. This is rotatable in a slide 78, which can be guided smoothly along slot 62 by means of a drive screw 81, power-driven via a gear train 82. The crystal 10 is fixed at the end of pivot 76. The slit 20 and detector 22 are mounted on a slide bar 90 (equivalent of 50 in Fig. 2) which turns on pivot 76 at the crystal position, and is urged away from the crystal 10 by a tension spring 92. Its travel is controlled by the constant length cable 54, both ends of which are anchored on a pin 100, and which has two flights trained round pulleys pivoted at 76 and a bight portion passing round an idler pulley fixed to the assembly 20, 22 (Fig. 8, not shown). This maintains the distances exit slit to crystal to specimen constant, as described above. The equivalent of the link arm 52 in Fig. 2 is provided by bar 98.

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