Abstract:
PROBLEM TO BE SOLVED: To improve the positioning accuracy and/or settling time of a substrate supported by a movable support or an exchangeable object such as a patterning device. SOLUTION: The movable support is configured to hold the exchangeable object. The support includes a movable structure configured to be movable relative to a reference object, an object holder configured to be movable relative to the movable structure and hold the exchangeable object, an actuator configured to move the movable structure relative to the reference object, and a minimum stroke actuator configured to move the object holder relative to the movable structure. The stiffness of the minimum stroke actuator is substantially larger than at least a degree of stiffness of the actuator. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a measurement system easy to manufacture a grating or a pattern. SOLUTION: The measurement system includes a sensor arranged to cooperate with a first pattern arranged on a structure of the measurement system to determine a first positional quantity of the sensor relative to the structure, and arranged to cooperate with a second pattern arranged on the structure to determine a second position quantity of the sensor relative to the structure, wherein the first and the second patterns are arranged on different surfaces of the structure. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an improved lithographic apparatus, where vibration in a projection system or another module of the equipment caused by displacement is reduced. SOLUTION: The lithographic apparatus includes: an illumination system for attaching conditions to radial beams; a support for supporting a patterning device capable of giving a pattern to a section of the radial beams to form the patterning radial beams; a substrate table for holding a substrate; and the projection system for projecting the patterning radial beams onto a target portion of the substrate. The apparatus also includes: a sensor arranged to detect the vibration of the projection system in use; an actuator arranged to exert a force to the projection system in use; and the projection system for converting an output signal of the sensor to an actuator input signal in use so that vibration of the projection system is reduced by controlling the actuator by an input signal arranged to exert the force to the projection system during operation. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a combination of a structure and two or more active damping systems capable of improving overall damping performance of a combination of the plurality of active damping systems. SOLUTION: This combination of a structure and two or more damping system is an active damping system assembly damping vibration of at least a part of the structure, and includes a sensor measuring a positional amount of interface mass attached to the structure, and a plurality of active dampers each including an actuator applying force to the interface mass depending on a signal supplied by the sensor. Each of the plurality of active damping systems is connected to the interface mass. This structure can be formed into a projection system of a lithography device. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a stage device arranged to reduce an influence of an electromagnetic motor on an electromagnetic actuator without employing a ferromagnetic shield. SOLUTION: In a stage device and a lithographic device provided with such a stage device, the stage device includes an electromagnetic motor arranged to move an object table, an electromagnetic actuator configured to position the object table, and a device constructed to supply an electric current to the stage device so that in use, the electric current will at least partially compensate the electromagnetic actuator for an influence of a stray magnetic field generated by the electromagnetic motor. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a positioning device that virtually determines the position of first and second movable objects in a common operating zone. SOLUTION: A positioning device comprises a first coil assembly arranged next to the operating zone, a second coil assembly arranged on the opposite side of the operating zone, one or more first magnets arranged on the first movable object that work together with the first coil assembly, and one or more second magnets arranged on the second movable object that work together with the second coil assembly. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus for exposing the patterns of first and second pattering devices carried by one patterning device support on a substrate by single continuous scan operations. SOLUTION: The lithographic apparatus includes: an illumination system configured to condition a radiation beam; a support constructed to support first and second patterning devices, each patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; and a projection system configured to project the patterned radiation beam onto a target portion of the substrate, wherein the illumination system includes a radiation beam path adaptation device, and the adaptation device is configured to adapt a radiation beam path to allow the subsequent projections of the pattern of the first patterning device and the pattern of the second patterning device during the single scanning movement of the patterning device support. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To perform a high-speed measurement without increasing an entrance length although a measuring sensor is meandered on a substrate to perform equi-spaced measurements in the uniform motion component, and a high-speed movement is required to shorten measuring time which inevitably requires a long entrance length and a broad space in measuring the height level of the substrate in a lithographic projection device to make a map. SOLUTION: The high-speed measurement is achieved by selecting a measured orbit in which relative movement of a measuring system MS and the substrate 4 is performed along predetermined measuring points, selecting accelerations and speeds of the correlated measuring system MS and substrate 4 as the functions of time, determining the timings of measured samples so as to take these measured samples at these predetermined points, and taking at least one measurement sample at a point at which the substrate 4 and measuring system MS are accelerated in a correlated manner, thereby enabling the high-speed measurement without increasing the entrance length. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an improved type drive device for at least partially compensating for the relative displacement between an object to be driven and an actuator for driving it. SOLUTION: The positioning device for positioning an object comprises a first actuator and a connector, arranged in between the first actuator and the object. The connector includes an elastic member and a second actuator connected to the elastic member, in series. The first actuator is configured and arranged, such that a force applies onto the connector in a first direction and the second actuator is controlled, such that the distance in the first direction between the first object and the object is kept substantially constant. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a system and method for controlling lithographic projection system, by which focal points over the whole exposure area can be further improved. SOLUTION: In the lithographic projection system, a focal surface is adjusted by using a manipulator which can be used by a projection lens system, so that the shape of the surface matches that of the surface of a wafer in the exposure area, as much as possible. The form control of the focal surface can be integrated with leveling control which decides the height and inclination of the surface of the wafer.