Abstract:
An active matrix display (1) wherein each pixel (7) has a thin-film light-emitting element (40) provided with a pixel electrode (41), an organic semiconductor film (43) formed on the pixel electrode (41) and an opposing electrode (op) formed on the organic semiconductor film (43). A protective film (60) is formed on the opposing electrode (op) to cover nearly the whole surface of the substrate. The protective film (60) prevents the entrance of moisture or oxygen, thus preventing the thin-film light-emitting element (40) from being deteriorated.
Abstract:
A display, such as an EL device having little variation in film thickness between pixels, and a color filter are disclosed. Arranged on a substrate are pixels formed by an ink-jet method in regions to be coated and partitioned by banks so formed as to satisfy the formulae a⊃d/4, d/2∫b∫5d, c⊃t0, c⊃(1/2)x(d/b) where a is the width of the banks, c is the height of the banks, b is the width of the regions to be coated, d is the diameter of droplets of a liquid material for forming a thin film, and t0 is the thickness of the thin film. A method of modifying the surface is a method comprising forming banks of an organic martial on an inorganic bank forming surface, and performing a plasma processing under an excessive fluorine condition, or a method comprising performing oxygen gas plasma processing of a substrate having banks formed of an organic material, and then performing fluorine-based gas plasma processing.
Abstract:
Liquid is applied and subjected to a heat treatment to form one thin film among an insulating thin film, a silicon thin film and a conductive thin film constituting a TFT. A substrate is spin-coated with the liquid which contains a thin film component and is supplied from the coating liquid storing part (105) of a spin-coater (102). The substrate to which the coating liquid is applied is subjected to a heat treatment by a heat treatment unit (103) to form a coating film on the substrate. If, further, the coating film is subjected to laser annealing, etc., one of the film qualities, crystallinity, denseness and adhesion is improved. If the coating liquid or resist is applied by an ink-jet method, the utilization efficiency of coating liquid can be improved and, further, a patterned coating film can be formed. A thin film device which is low in cost and has a high throughput can be obtained. By manufacturing TFTs with a manufacturing apparatus having the high utilization efficiency of the coating liquid, the initial investment and the cost of a liquid crystal display are significantly reduced.
Abstract:
A solution containing a cyclic silane compound, which does not contain carbon, and/or a silane compound modified by boron or phosphorus is applied onto a substrate and a silicon precursor film is formed, and the film is then transformed into semiconductor silicon by heat and/or light treatment. Thereby, it is possible to easily produce a silicon film having satisfactory characteristics as an electronic material at low costs, differing from the vacuum process, such as in CVD methods.
Abstract:
An active matrix light emitting device (1) has an insulating film (80) for step cut of which the upper part overhangs as an eaves part (81) is formed between a pixel electrode (41) and a light emitting element (43) in a boundary region (71) between pixels. Therefore, even if the light emitting element (43) is astride pixels (7), a step cut (43c) is formed at the eaves part (81), and the pixels are isolated from each other. Thus, crosstalk between pixels is prevented and the display quality is improved.
Abstract:
An active matrix display (1) in which a thick insulating film is formed surrounding an organic semiconductor film to suppress a parasitic capacitance and prevent the occurrence of breakage in the opposing electrodes formed on the upper layer of the insulating film, and which is provided with bank layers (bank) made of resist films and formed along a data line (sig) and a scanning line (gate), and an electrode (op) opposed to a thin-film light-emitting element (40) and laminated on the upper layer of a bank layer (bank), thereby to suppress the capacitance parasitic on the data line (sig). An interrupted portion (off) is formed in a bank layer (bank), and is a flat portion without having a large step caused by the bank layer (bank) and, hence, the opposing electrode (op) is not broken in this portion. When an organic semiconductor film (43) is to be formed by the ink-jet method, the liquid material jetted from the ink-jet head is blocked by the bank layer (bank).
Abstract:
A method for forming a silicon film which comprises discharging an ink composition (11) selectively onto a predetermined region of a substrate using an ink jet head (12) to form a pattern of a silicon precursor, and then subjecting the pattern to a treatment by heat and/or light to convert the silicon precursor to an amorphous silicon film or a poly-crystal silicon film. The method can be used for providing a silicon film pattern on a large area portion of a substrate with saving energy with a low cost.
Abstract:
An active matrix display in which a thick insulating film is preferably formed to surround an organic semiconductor film of a thin-film light-emitting element without damaging the thin-film light-emitting element, and which is provided with thick bank layers (bank) formed along the data line (sig) and the scanning line (gate) to suppress the capacitance parasitic on the data line (sig) and surround a region where the organic semiconductor film (43) of the thin-film light-emitting element (40) is formed by the ink-jet method. Here, the bank layer (bank) is constituted of a lower insulating film (61) formed of a thick inorganic material and an upper insulating film (62) formed of an organic material and laminated with a narrow width on the lower insulating film (61), so as to avoid the contact between the organic semiconductor film (41) and the upper insulating film (62).
Abstract:
A method for forming a thin film comprises repeating the step of forming an affinity bank layer (111-11n) of a material (inorganic material such as SiO2) exhibiting an affinity with a thin film material liquid (130) and the step of forming a nonaffinity bank layer (121-12n) of a material (organic material such as resist) exhibiting a nonaffinity with the thin film material liquid (130) so as to form a bank (110) of alternate affinity bank layers and nonaffinity bank layers, filling the space between the banks with the thin film material liquid (130) by an ink-jet method, and performing heat treatment so as to form thin film layers (131-13n) in order. By performing the steps, the cost necessary for affinity control is reduced, and a multilayer thin film with a uniform thickness is formed.
Abstract:
All or part of thin film, such as silicon film, insulating film and a conducting film, which composes a thin-film transistor are formed using liquid materials. Coating of liquid material on a substrate is heat-treated to form desired thin film. This method allows use of low-cost equipment, thus reducing the manufacturing costs of thin-film transistors.