Abstract:
The invention relates to a UV light sensor produced in a CMOS method, comprising a substrate that has a surface, one or more sensor elements that detect radiation and are designed in said substrate, at least one passivation layer arranged over said substrate surface, and a functional layer that is arranged over said passivation layer and designed in the form of at least one filter. The problem addressed by the invention of providing a UV light sensor which is sensitive exclusively within the UV wavelength range is solved, in terms of the arrangement, by means of filters designed directly on a planar passivation layer, and stray light suppressing means around said at least one sensor element and/or around the UV light sensor. In terms of the method, the problem is solved by measuring two output signals from at least two photo diodes fitted with different filters, and by determining a mathematical relationship between the two output signals.
Abstract:
The present invention provides methods and systems for measuring optical power that require neither alterations to the optical fiber nor physical contact with the optical fiber, the system including an optical fiber configured to propagate an optical signal, wherein the optical fiber includes a core and at least a first cladding layer, wherein a portion of the optical signal scatters out of the optical fiber along a length of the optical fiber to form scattered fiber light; a detector system configured to receive the scattered fiber light along the length of the optical fiber and to output a detection signal based on the received scattered fiber light; and a processor configured to receive the detection signal and to determine a power value of the optical signal based on the received detection signal.
Abstract:
The present invention relates to a optical lighting device comprising several solid state light sources (2) and at least one optical sensor (4) arranged between the solid state light sources (2) in approximately the same plane. An optical deflection unit (5, 13) is mounted in front of the sensor (4) and designed to deflect light laterally emitted by the solid state light sources (2) to the optical sensor (4). The deflection unit (5, 13) is designed.to inhibit the transmission of ambient light to the optical sensor (4).
Abstract:
The invention relates to a radiation measuring device, especially for measuring high power radiation (10), comprising a measuring window (12) and a deflecting unit which can guide at least one part of the radiation which is to be measured (10) from the measuring window (12) to a sensor unit (14). According to the invention, the deflecting unit comprises at least one bar (16) into which the radiation (10) is injected via the measuring window (12), parallel to the longitudinal extension (18) thereof, via a side (70). The radiation is retransmitted along the longitudinal extension of the surface (18) bar to the sensor unit (14).
Abstract:
A dynamic signal to noise ratio tracking system 10 enables detection and tracking of machines 26, 170 and people 70 within the field of view of the tracking system. The tracking system 10 may include an emitter 14 configured to emit electromagnetic radiation within an area 30, a detector 16 configured to detect electromagnetic radiation reflected back from within the area, and a control unit 18 configured to evaluate signals from the detector 16 and control the machines 26, 170 or other equipment 12 as a result of this evaluation.
Abstract:
A method, apparatus, and a computer program is provided. The method comprises: determining an ambient light value from ambient light data provided by at least one ambient light sensor, in dependence upon the spectral distribution of the ambient light data provided by the at least one ambient light sensor and a manufacturer of the at least one ambient light sensor.