受光装置および受光装置の製造方法
    53.
    发明申请
    受光装置および受光装置の製造方法 审中-公开
    光电设备,以及用于制造光电设备的方法

    公开(公告)号:WO2013065729A1

    公开(公告)日:2013-05-10

    申请号:PCT/JP2012/078151

    申请日:2012-10-31

    Inventor: 戎井 崇裕

    Abstract:  受光装置は、基板と、上面に受光部を有し、下面が前記基板上に搭載された受光素子と、平坦な上面および前記受光素子の前記受光部を露出する開口を有し、前記基板上に、前記受光素子の厚さよりも厚く形成され、前記受光素子を取り囲む前記受光素子の側面に密着している絶縁樹脂と、を含む。前記絶縁樹脂は、前記平坦な上面と前記受光部の前記上面との間の高さに設けられた段部を有し、前記段部は、前記開口の周囲において、前記受光素子の相対向する少なくとも一対の側面に対して平行に延びる。

    Abstract translation: 光接收器件包括:衬底; 在上表面具有感光体部分的感光体元件和安装在基板上的下表面; 具有平坦的上表面和感光体元件的感光体部分露出的开口的绝缘树脂形成在衬底上比感光体元件更大的厚度,并围绕感光体元件以密封感光体元件的侧面 。 该绝缘树脂具有台阶部分,该台阶部分具有在平坦的上表面和感光体部分的上表面之间的高度,台阶部分平行于感光体元件的至少一对相互相对的侧壁延伸,在周边 的开幕。

    SUN DETECTION SENSOR
    54.
    发明申请
    SUN DETECTION SENSOR 审中-公开
    太阳检测传感器

    公开(公告)号:WO2010080078A1

    公开(公告)日:2010-07-15

    申请号:PCT/US2009/000069

    申请日:2009-01-06

    Abstract: A sun detection sensor assembly for attachment to a thermal imaging device, comprising an elongated tubular body having two ends and a sensor, characterized as Sun TECT sensor, attached to one end, the Sun TECT sensor having a tubular body, an IR window positioned at one end of the tubular body, and a photo a infrared photo transistor positioned within the tubular body, opposite the IR window, the infrared photo transistor having a photo sensitive surface for detecting the exposure from sun when the sun is within a field of view of the Sun TECT Sensor, and an automatic ON/OFF mechanism which is activated by the infrared photo transistor and protecting the thermal imaging device from undesired and harmful infrared radiation.

    Abstract translation: 一种用于附接到热成像装置的太阳检测传感器组件,包括具有两端的细长管状体和附接到一端的Sun TECT传感器的传感器,所述Sun TECT传感器具有管状体,IR窗口位于 管状体的一端和与IR窗口相对的位于管状体内的红外光电晶体管的照片,红外光电晶体管具有光敏表面,用于当太阳处于 太阳TECT传感器,以及由红外光电晶体管激活的自动ON / OFF机构,并保护热成像设备免受不良和有害的红外辐射。

    METHOD AND SYSTEM OF ARRAY IMAGING
    55.
    发明申请
    METHOD AND SYSTEM OF ARRAY IMAGING 审中-公开
    阵列成像的方法与系统

    公开(公告)号:WO2008051189A3

    公开(公告)日:2008-10-02

    申请号:PCT/US2006032608

    申请日:2006-08-21

    Inventor: WALT DAVID R

    Abstract: The present invention relates to a method and system of array imaging that extends or maximizes the longevity of the sensor array b minimizing the effects of photobleaching. The imaging system has a light source (12), a variable exposure aperture (14), and a varia filter system (16). The system extends the longevity of sensors (28) by 1) using the variable exposure aperture to selectively expose sections of the sensor array containing representative numbers of each type of sensor, and/or 2) using the variable filter system to control the intensity of the excitation light, providing only the intensity required to induce the appropriate excitation and increasing intensity over time as necessary to counteract the effects of photobleaching.

    Abstract translation: 本发明涉及阵列成像的方法和系统,该方法和系统使传感器阵列b的寿命延长或最大化,从而最大限度地减少光漂白的影响。 成像系统具有光源(12),可变曝光孔(14)和变种过滤系统(16)。 该系统延长传感器(28)的寿命,1)使用可变曝光孔径选择性地暴露包含每种类型传感器的代表数的传感器阵列的部分,和/或2)使用可变过滤器系统来控制传感器 激发光,仅提供诱导适当激发所需的强度和随时间增加的强度,以抵消光漂白的影响。

    STRAY CHARGED PARTICLE REMOVAL DEVICE
    56.
    发明申请
    STRAY CHARGED PARTICLE REMOVAL DEVICE 审中-公开
    带杂质颗粒去除装置

    公开(公告)号:WO2007130093A3

    公开(公告)日:2008-08-28

    申请号:PCT/US2006022783

    申请日:2006-06-12

    Abstract: In order to reduce the exposure of a detector surface 180 of a photo-multiplier 160 to stray charged particles, an off-axis structure is interposed between the resonant structure and the detector surface of the photo-multiplier. By providing the off-axis structure with at least one reflective surface, photons are reflected toward the detector surface of the photo-multiplier while at the same time absorbing stray charged particles. Stray particles may be absorbed by the reflective surface or by any other part of the off- axis structure. The off-axis structure may additionally be provided with an electrical bias and/or an absorbing coating for absorbing stray charged particles.

    Abstract translation: 为了减少光电倍增器160的检测器表面180暴露于杂散带电粒子,在谐振结构和光电倍增器的检测器表面之间插入偏轴结构。 通过向离轴结构提供至少一个反射表面,光子被朝向光电倍增管的检测器表面反射,同时吸收杂散带电粒子。 杂散颗粒可以被反射表面或离轴结构的任何其它部分吸收。 离轴结构还可以设置有用于吸收杂散带电粒子的电偏压和/或吸收涂层。

    IMAGING SYSTEM FOR VEHICLE HEADLAMP CONTROL
    58.
    发明申请
    IMAGING SYSTEM FOR VEHICLE HEADLAMP CONTROL 审中-公开
    车辆头灯控制成像系统

    公开(公告)号:WO99064267A1

    公开(公告)日:1999-12-16

    申请号:PCT/US1999/012326

    申请日:1999-06-04

    Abstract: An imaging system for use in a vehicle headlamp control system includes an aperture, an image sensor, a red lens blocking red complement light between the aperture and the image sensor, and a red complement lens blocking red light between the aperture and the image sensor. Each lens focuses light onto a different subwindow of the image sensor. The imaging system allows processing and control logic to detect the presence of headlamps on oncoming vehicles and tail lights on vehicles approached from the rear for the purpose of controlling headlamps. A light sampling lens may be used to redirect light rays from an arc spanning above the vehicle to in front of the veicle into substantially horizontal rays. The light sampling lens is imaged by the image sensor to produce an indication of light intensity at various elevations. The processing and control logic uses the light intensity to determine whether headlamps should be turned on or off. A shutter may be used to protect elements of the imaging system from excessive light exposure.

    Abstract translation: 用于车辆前照灯控制系统的成像系统包括孔径,图像传感器,阻挡孔和图像传感器之间的红色补偿光的红色透镜以及阻挡孔和图像传感器之间的红光的红色补偿透镜。 每个镜头将光线聚焦到图像传感器的不同子窗口上。 成像系统允许处理和控制逻辑来检测来自后方的车辆上的前照灯和后方车尾灯的存在,以便控制前照灯。 光采样透镜可以用于将来自车辆上方的弧的光线重新导向到叶片前方到基本上水平的射线。 光采样透镜由图像传感器成像,以产生在不同高度处的光强度的指示。 处理和控制逻辑使用光强度来确定是否应该打开或关闭头灯。 可以使用快门来保护成像系统的元件免受过度的曝光。

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