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公开(公告)号：KR1020020078214A
公开(公告)日：2002-10-18
申请号：KR1020010018253
申请日：2001-04-06
Applicant: (주) 인텍플러스
IPC: G01B11/00
CPC classification number: G01B11/2509 , G01B2210/50
Abstract: PURPOSE: A three-dimensional surface shape measurement method and apparatus is provided to measure the three-dimensional shape of an object in a real time basis at a high speed, while obtaining an optimized measurement result by arranging the detection unit at the position optimum for the shape of the object. CONSTITUTION: A three-dimensional surface shape measurement method, comprises the steps of arranging an illumination device(30) over an object(45); arranging an image sensor(43) as a detection unit over the object; scanning multi-wavelength to the object through the illumination device; and calculating a height information for the object corresponding to a Hue-value, by detecting, through the detection unit, the bandpass distributed in accordance with the height of the object, and converting the detected wavelength into the Hue-value. The height information for the object is determined by the function of only the Hue-value.
Abstract translation: 目的：提供三维表面形状测量方法和装置，以高速度实时地测量物体的三维形状，同时通过将检测单元布置在最佳的位置 物体的形状。 构成：三维表面形状测量方法，包括在物体（45）上方布置照明装置（30）的步骤。 将图像传感器（43）作为检测单元布置在物体上; 通过照明装置向物体扫描多波长; 以及通过检测单元检测根据物体的高度分布的带通，并将所检测的波长转换为色相值，计算与色调值对应的物体的高度信息。 物体的高度信息仅由色相值的函数决定。
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公开(公告)号：KR1020140062356A
公开(公告)日：2014-05-23
申请号：KR1020120129025
申请日：2012-11-14
Applicant: (주) 인텍플러스
Abstract: The present invention relates to an auto-focusing device capable of identifying the optimum focal distance to a test target using a tunable liquid lens, accurately adjusting the focal point, and accordingly enabling a test device to clearly recognize defects of the test target. The auto-focusing device includes: a light source which is installed in a test device for auto-focusing of a test camera and emits light to a test target; a first camera which takes an image of the test target reflected by the light; a tunable liquid lens which is placed between the first camera and the test target; a control unit which controls the amount of current applied to the tunable liquid lens to adjust the focal distance of the tunable liquid lens; an analysis unit which analyzes the image of the test target according to the variable focal distance of the tunable liquid lens and calculates the optimum focal distance; and a distance adjustment unit which adjusts the distance between the test camera and the test target corresponding to the calculation result by the analysis unit.
Abstract translation: 本发明涉及一种自动对焦装置，其能够使用可调式液体透镜识别到测试对象的最佳焦距，精确地调整焦点，并且因此使得测试装置能够清楚地识别测试对象的缺陷。 该自动聚焦装置包括：光源，其安装在用于测试相机的自动聚焦的测试装置中并将光发射到测试对象; 拍摄由光反射的测试对象的图像的第一相机; 放置在第一照相机和测试对象之间的可调式液体透镜; 控制单元，其控制施加到可调液晶透镜的电流量以调节可调液晶透镜的焦距; 分析单元，其根据可调液晶透镜的可变焦距分析测试对象的图像，并计算最佳焦距; 以及距离调整单元，其通过分析单元调整与计算结果相对应的测试摄像机与测试对象之间的距离。
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公开(公告)号：KR1020140012342A
公开(公告)日：2014-02-03
申请号：KR1020120078934
申请日：2012-07-19
Applicant: (주) 인텍플러스
IPC: G01N21/88 , G01M11/02 , G01R31/265
Abstract: The present invention relates to an LED module inspection device that enables users to inspect the condition of the LED module by using the images of the LED module taken at different angles, which are acquired by a light from external sources that is applied to the LED module and a power autonomously supplied by the LED module. The LED module inspection device comprises: a main camera in the vertical upper side of the LED module to obtain an image of the LED module; a lighting unit for emitting light to the LED module; a power source unit for supplying power to the LED module; and a determination unit for determining the malfunction of the LED module using the image of the LED module obtained by the main camera.
Abstract translation: LED模块检查装置技术领域本发明涉及一种LED模块检查装置，其使得用户能够通过使用以不同角度拍摄的LED模块的图像来检查LED模块的状况，所述图像是通过施加到LED模块的外部源的光获取的 以及由LED模块自主提供的功率。 所述LED模块检查装置包括：在所述LED模块的垂直上侧的主摄像机，以获得所述LED模块的图像; 用于向LED模块发射光的照明单元; 用于向LED模块供电的电源单元; 以及确定单元，用于使用由主摄像机获得的LED模块的图像来确定LED模块的故障。
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公开(公告)号：KR1020140012341A
公开(公告)日：2014-02-03
申请号：KR1020120078932
申请日：2012-07-19
Applicant: (주) 인텍플러스
CPC classification number: G01N21/8806 , G01B11/30 , G01N21/8901 , G01N21/958 , G01N2021/9513
Abstract: The present invention discloses an automatic optical inspection device having improved testing power and securing inspection capabilities by emitting different lights to overlapping image frames during an inspection. The automatic optical inspection device according to the present invention comprises: a stage on which an inspection target is mounted; a photographing unit for photographing the inspection target on the stage; a lighting unit for emitting lights to the inspection target; and a moving unit for linearly moving the stage or the photographing unit to change the relative position of the inspection target to the photographing unit. The moving speed of the moving unit is determined to partially overlap an n^th image and an (n+1)^th image photographed in the photographing unit.
Abstract translation: 本发明公开了一种自动光学检测装置，其具有改进的测试功率，并且通过在检查期间将不同的光发射到重叠的图像帧来确保检查能力。 根据本发明的自动光学检查装置包括：安装有检查对象的阶段; 拍摄单元，用于拍摄舞台上的检查对象; 照明单元，用于向检查目标发射光; 以及移动单元，用于线性移动舞台或拍摄单元，以将检查对象的相对位置改变为拍摄单元。 确定移动单元的移动速度部分地重叠在拍摄单元中拍摄的第n个图像和第（n + 1）个图像。
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公开(公告)号：KR1020130077498A
公开(公告)日：2013-07-09
申请号：KR1020110146232
申请日：2011-12-29
Applicant: (주) 인텍플러스
Abstract: PURPOSE: Equipment for removing foreign substance is provided to remove foreign substance not with suction force but with jet force, thereby having no need for a large amount of vacuum flow and reducing manufacturing cost. CONSTITUTION: Equipment for removing foreign substance comprises a discharging unit, a first showerhead (120) and a second showerhead (130). The discharging unit is arranged so that a free end, which is formed to be open, is adjacent to a glass substrate. The first showerhead is formed around the surface of the discharging unit. The first showerhead is formed so that fluid is ejected towards one part of the glass substrate facing the free end of the discharging unit. The first showerhead ejects foreign substance transferred along the fluid through the discharging unit. The first showerhead comprises a body unit (121), a housing unit (122) and a guide portion (123). The second showerhead is included in the first showerhead. The one end of the second showerhead is exposed to the outside and spays the fluid on the glass substrate.
Abstract translation: 目的：提供除去异物的设备，以除去吸力而是用喷射力去除异物，从而不需要大量的真空流动并降低制造成本。 构成：用于除去异物的设备包括排放单元，第一喷头（120）和第二喷头（130）。 放电单元布置成使得形成为开放的自由端与玻璃基板相邻。 第一喷头形成在排放单元的表面周围。 第一喷头形成为使得流体朝向与排放单元的自由端相对的玻璃基板的一部分喷射。 第一个喷头喷出通过排放单元沿着流体传送的异物。 第一喷淋头包括主体单元（121），壳体单元（122）和引导部分（123）。 第一个淋浴头包括在第一个淋浴喷头。 第二个喷头的一端暴露在外面，并将流体喷在玻璃基板上。
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Patent Agency Ranking
公开(公告)号：KR1020130026922A
公开(公告)日：2013-03-14
申请号：KR1020110090384
申请日：2011-09-06
Applicant: (주) 인텍플러스
Abstract: PURPOSE: An inspection apparatus for semiconductor device is provided to reliably detect a fault of semiconductor device by filtering a first wavelength light in a filter and by irradiating a third wavelength light different from the first wavelength light to a photographic unit. CONSTITUTION: An inspection apparatus(100) for semiconductor device comprises a first light source(110), a reflective member(120), a second light source(130), a filter(140), and a photographic unit(150). The first light source irradiates first wavelength light to a predetermined position. The reflective member is separated from an object in an upper direction and reflects light irradiated from the first light source to the object. The second light source is adjacent to the object and irradiates second wavelength light different from the first wavelength light to the object. The filter is separated from the reflective member in the upper direction and filters the first wavelength light between the first wavelength light and third wavelength light. The photographic unit is separated from the filter in the upper direction and is irradiated the third wavelength light passing through the filter.
Abstract translation: 目的：提供一种用于半导体器件的检查装置，通过对滤波器中的第一波长光进行滤波，并将不同于第一波长光的第三波长光照射到照相单元来可靠地检测半导体器件的故障。 构成：用于半导体器件的检查装置（100）包括第一光源（110），反射构件（120），第二光源（130），过滤器（140）和照相单元（150）。 第一光源将第一波长的光照射到预定位置。 反射构件在上方向与物体分离，并将从第一光源照射的光反射到物体。 第二光源与物体相邻，并将与第一波长光不同的第二波长光照射到物体上。 滤光器在上方向与反射构件分离，并对第一波长光和第三波长光之间的第一波长光进行滤波。 照相单元在上方向与滤光片分离，照射通过滤光器的第三波长光。
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公开(公告)号：KR101230396B1
公开(公告)日：2013-02-15
申请号：KR1020100087161
申请日：2010-09-06
Applicant: (주) 인텍플러스
Abstract: 본 발명은 카메라로 2차원 영상 및 3차원 모아레 영상을 획득하고, 사이드 카메라를 이용하여 단차를 갖는 LED칩의 들뜸, 경사짐의 유무, 커넥터의 솔더링 상태 등을 동시에 점검할 수 있도록 하는 LED어레이 검사장치에 관한 것으로, 상기와 같은 목적을 달성하기 위한 본 발명은 LED어레이가 장착되는 카세트와, 상기 카세트를 수평방향과 수직방향으로 이송시키는 카세트 구동드라이버와, 상기 LED어레이의 이상여부를 판단하기 위한 상기 LED어레이의 영상을 획득하는 영상획득모듈과, 상기 영상획득모듈을 전후좌우로 이송시키는 영상획득모듈 구동드라이버와, 상기 영상획득모듈로부터 전송되는 영상을 해석하여 LED어레이를 검사하는 영상처리수단으로 이루어진 LED어레이 검사장치에 있어서, 상기 영상획득모듈은 상기 LED어레이의 영상을 획득하도록 상기 LED어레이의 수직 상방에 배치하는 메인카메라와, 상기 LED어레이의 영상을 획득하도록 상기 LED어레이를 향해 경사지도록 배치되는 사이드 카메라와, 상기 LED어레이를 향해 빛을 조사하는 조명수단을 포함하도록 구성된다.
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公开(公告)号：KR101230397B1
公开(公告)日：2013-02-07
申请号：KR1020100094734
申请日：2010-09-29
Applicant: (주) 인텍플러스
Abstract: 본 발명은 이미지 센서에서 출력되는 영상 데이터를 전송 채널의 대역폭에 상응하는 속도로 하나 이상의 전송 채널을 통해 순차적으로 전송하는 단계와, 하나 이상의 전송 채널을 통해 수신되는 영상 데이터를 하나 이상의 전송 채널 각각의 대역폭을 합한 전체 대역폭에 해당하는 속도로 프레임 스토어에 순차적으로 기록하는 단계를 포함하는 영상 데이터 고속 송수신 방법과 이를 구현하기 위한 장치이다.
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公开(公告)号：KR1020110061335A
公开(公告)日：2011-06-09
申请号：KR1020090117952
申请日：2009-12-01
Applicant: (주) 인텍플러스
CPC classification number: G01R31/2635 , G01R31/2867 , G01R31/2887 , G01R31/2893 , G01R31/2896 , G01R31/311
Abstract: PURPOSE: An apparatus for inspecting a light emitting diode package is provided to automate an inspecting operation and a marking operation with respect to bad light emitting packages. CONSTITUTION: A loading part(110) loads the array type group of light emitting diodes into a cassette. An inspecting part(120) inspects defects in the group of the light emitting diodes through a visual inspection process. A marking part(130) implements a marking process with respect to bad light emitting diodes based on the inspection result of the inspecting part. An unloading part(140) loads a vacant cassette in order to receive the group of the light emitting diode packages.
Abstract translation: 目的：提供一种用于检查发光二极管封装的装置，用于自动执行关于不良发光封装的检查操作和标记操作。 构成：装载部件（110）将阵列型组的发光二极管装载到盒中。 检查部（120）通过目视检查处理检查发光二极管组的缺陷。 基于检查部件的检查结果，标记部件（130）针对不良发光二极管实施标记处理。 卸载部件（140）装载空盒，以便接收一组发光二极管封装。
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公开(公告)号：KR101028335B1
公开(公告)日：2011-04-11
申请号：KR1020090070904
申请日：2009-07-31
Applicant: (주) 인텍플러스
IPC: H01L21/66
CPC classification number: H01L2224/78 , H01L2224/85 , H01L2224/859 , H01L2924/10162 , H01L2924/00012
Abstract: 본 발명의 일 양상에 따른 와이어 검사 장치는 칩 패키지의 와이어 검사 장치에 있어서, 칩 패키지 수직축에 대하여 소정 입사각으로 조명광을 조사하여 와이어 그림자를 생성하는 조명부의 입사각과, 와이어 그림자를 포함하는 칩 패키지 표면 영상을 획득하는 촬상부의 수광각이 전반사 영상을 획득하도록 조명부와 촬상부를 배치하고, 획득된 영상에서 와이어와 와이어 그림자 사이의 거리 정보를 이용하여 와이어의 높이를 산출하고 와이어의 불량 여부를 판단한다.
와이어, 불량, 높이, 전반사, 그림자Abstract translation: 根据本发明的一个方面，提供了一种用于芯片封装的线检查设备，所述线检查设备包括：芯片封装封装，其包括芯片封装表面，所述芯片封装表面包括线阴影， 用于获得图像，以获得全反射图像放置一个照明单元和图像接受角成像单元，并且通过使用金属丝和金属丝的阴影之间的距离信息在导线的所获取的图像计算出的高度，并确定如果导线的失败。
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