公开(公告)号：CA979240A

公开(公告)日：1975-12-09

申请号：CA176347

申请日：1973-07-12

Applicant: APPLIED RES LAB

Inventor： DAHLQUIST RALPH L

IPC: G01N21/74 ,  G01N1/28 ,  G01N21/67

Abstract: An analyte material is prepared for spectrochemical analysis by depositing it in solution or electrostatically precipitating it upon a previously purged yarn of finely divided carbon fibers, dessicating it in situ, and electrically heating the yarn sufficiently to vaporize the analyte material while passing a gas stream over it in which the analyte material is condensed in particles of sufficiently small size to form an aerosol which is then conducted to any of a variety of excitation sources for spectrochemical analysis.

公开(公告)号：GB1385784A

公开(公告)日：1975-02-26

申请号：GB2135072

申请日：1972-05-08

Applicant: APPLIED RES LAB

IPC: G01N23/22 ,  G01N23/223 ,  B01F7/20 ,  B01F13/08

Abstract: 1385784 Mixing apparatus APPLIED RESEARCH LABORATORIES LTD 8 May 1972 [14 May 1971] 21350/72 Heading B1C [Also in Divisions G1 and G2] In a liquid cell for X-ray fluorescence analysis comprising a receptacle 27 for a liquid sample, a window opening 29 and an arrangement 45 for imparting rotary motion to the liquid, means, e.g. a baffle arrangement 83, are provided to inhibit creation of a vortex adjacent opening 29. In this way a substantially flat upper surface is presented to irradiating X-rays. The baffle 83 may comprise two connected inverted U-shaped members, Fig. 8 (not shown). As shown the rotor 45 is a bar magnet which is rotated by a motor-driven magnet arrangement 73-77 located below the receptacle base. Alternatively a rotating vane (112) may be coupled direct to the motor 47, Fig. 9 (not shown). Excess liquid drains away through passage 41. For Figure see next column

公开(公告)号：FR2094053B3

公开(公告)日：1974-03-29

申请号：FR7120352

申请日：1971-06-04

Applicant: APPLIED RES LAB

IPC: G01J3/32 ,  G01J3/00

公开(公告)号：FR2129644A5

公开(公告)日：1972-10-27

申请号：FR7208751

申请日：1972-03-14

Applicant: APPLIED RES LAB

IPC: G01N15/06 ,  G01N23/223 ,  G01N23/00 ,  F01M11/00 ,  F02B77/00

公开(公告)号：DE1798021A1

公开(公告)日：1971-08-26

申请号：DE1798021

申请日：1966-10-11

Applicant: APPLIED RES LAB INC

Inventor： JAKOB LIEBE HELMUT

IPC: G01Q10/00 ,  G01Q30/06 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/02 ,  H01J49/14 ,  H01J49/20 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32

Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.

公开(公告)号：FR2011101A1

公开(公告)日：1970-02-27

申请号：FR6920137

申请日：1969-06-17

Applicant: APPLIED RES LAB

IPC: G01N21/67 ,  G01N21/73 ,  H05H1/48 ,  H05H1/00 ,  G01N27/00

Abstract: A wall-stabilized electric arc within a capillary tube, supported by a gas flowing lengthwise through the tube is used to excite a material for spectroscopic analysis. A material to be analyzed, in gaseous or finely comminuted form, is fed into the arc near one end and carried through it by the working gas. Emission or absorption of radiation is observed endwise of the tube.

公开(公告)号：DE1939403A1

公开(公告)日：1970-02-12

申请号：DE1939403

申请日：1969-08-02

Applicant: APPLIED RES LAB LTD

Inventor： RICHARD SANGER TERENCE ,  JOHN PRINCE BRIAN

IPC: G01N30/06 ,  G01N33/20

公开(公告)号：DE1539659A1

公开(公告)日：1969-12-18

申请号：DEA0053727

申请日：1966-10-11

Applicant: APPLIED RES LAB INC

Inventor： JAKOB LIEBL HELMUT

IPC: G01Q10/00 ,  G01Q30/06 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/02 ,  H01J49/14 ,  H01J49/20 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32 ,  H01J39/34

Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.

公开(公告)号：GB1159905A

公开(公告)日：1969-07-30

申请号：GB1310668

申请日：1968-03-18

Applicant: APPLIED RES LAB INC

IPC: G01N23/225 ,  H01J35/04

Abstract: 1,159,905. X-ray apparatus. APPLIED RESEARCH LABORATORIES In(. 18 March, 1968 [20 March, 1967], No. 13106/68. Heading H5R. [Also in Division H1] Apparatus for producing characteristic X-ray radiation from a specimen to be examined comprises a rotatable specimen carrier 20 adapted to support a plurality of specimens 24 and arranged on one side of the axis of an electron beam 14, a rotatable anode carrier 26 carrying a plurality of different anode materials 28 and arranged on the other side of the axis, and magnetic deflecting means 30 so that the beam may be deflected either directly on to the specimen (as shown in Fig. 1) for the production of X-rays or on to a selected opposed anode surface 28 to produce X-rays which illuminate the specimen and produce X-ray fluorescence (Fig. 3, not shown). Preferably the specimens 24 are arranged on a bevelled edge of the carrier 20 so that X-rays enlarging normal to the specimen pass clear of the anode structure to a spectrometer 34 which may be in the same evacuated enclosure (not shown). The apparatus shown includes an electron gun 10, a focusing coil 12, and two pairs of deflecting coils 16 and 18. The anode carrier 26 and specimen carrier 20 may be water cooled.

公开(公告)号：DE1489658A1

公开(公告)日：1969-05-08

申请号：DE1489658

申请日：1965-09-18

Applicant: APPLIED RES LAB INC

Inventor： NEUHAUS HERMANN

IPC: G01N23/225 ,  H01J37/18 ,  H01J37/22 ,  H01J37/252 ,  H01J37/30 ,  H01J37/301 ,  H02G1/02