公开(公告)号：US09410880B2

公开(公告)日：2016-08-09

申请号：US14366266

申请日：2013-08-08

Applicant: BEIJING INSTITUTE OF TECHNOLOGY

Inventor： Weiqian Zhao ,  Han Cui ,  Lirong Qiu ,  Yun Wang

IPC: G01N21/00 ,  G01N21/47 ,  G01N21/65

CPC classification number: G01N21/47 ,  G01N21/65 ,  G01N21/658 ,  G01N2201/063

Abstract: The present invention belongs to a technical field of optical microscopic imaging and spectral measurement, and discloses a laser differential confocal mapping-spectrum microscopic imaging method and device. The core concept of the present invention is to combine the differential confocal detection and the spectrum detection techniques and use a dichroic beam splitting system (13) to separate the Rayleigh light for geometric position detection from the Raman scattering light for spectrum detection, by mean of the property that the zero-cross point of the differential confocal curve (43) accurately corresponds to the focus of the objective, the spectral information at focus of the excitation spot being accurately captured by the zero trigger to accomplish the spectrum detection with high spatial resolution. Therefore, the present invention provides a method and device that may be able to accomplish the spectrum detection with high spatial resolution to a micro-area of a sample.

Abstract translation: 本发明属于光学显微成像和光谱测量的技术领域，并且公开了一种激光微分共焦映射光谱显微成像方法和装置。 本发明的核心概念是组合差分共聚焦检测和光谱检测技术，并使用二向色分束系统（13）将用于几何位置检测的瑞利光与用于光谱检测的拉曼散射光分离，通过 差分共聚焦点曲线（43）的零交叉点准确地对应于物镜的焦点，激发点焦点处的光谱信息被零点触发精确地捕获，完成高空间分辨率的光谱检测 。 因此，本发明提供了一种能够以高空间分辨率对样品的微区进行光谱检测的方法和装置。

公开(公告)号：US20160209333A1

公开(公告)日：2016-07-21

申请号：US15000715

申请日：2016-01-19

Applicant: NuFlare Technology, Inc.

Inventor： Masatoshi HIRONO ,  Riki OGAWA ,  Takeshi FUJIWARA

IPC: G01N21/88 ,  G01N21/95

CPC classification number: G01N21/9501 ,  G01N21/956 ,  G01N2021/95676 ,  G01N2201/063 ,  G03F1/84

Abstract: According to one embodiment, a defect inspection device includes a first beam splitter configured to branch light into a first optical path and a second optical path, a first optical system on the first optical path, a second optical system on the second optical path, a first aperture configured to form an illumination field of an inspection sample by light from the first optical system, a second aperture configured to form an illumination field of the inspection sample by light from the second optical system, and a third optical system configured to illuminate, with a first illumination, an image of the first aperture on a first area of the inspection sample, and to illuminate, with a second illumination, an image of the second aperture on a second area of the inspection sample.

Abstract translation: 根据一个实施例，缺陷检查装置包括第一分束器，其被配置为将光分支到第一光路和第二光路中，第一光学系统上的第一光学系统，第二光学路径上的第二光学系统， 第一孔，被配置为通过来自第一光学系统的光形成检查样本的照明场;第二孔，被配置为通过来自第二光学系统的光形成检查样本的照明场;以及第三光学系统， 利用第一照明，在检查样品的第一区域上的第一孔的图像，并且用第二照明照亮检查样品的第二区域上的第二孔的图像。

公开(公告)号：US20160139053A1

公开(公告)日：2016-05-19

申请号：US14983933

申请日：2015-12-30

Applicant: SciAps, Inc.

Inventor： David Day

IPC: G01N21/71

CPC classification number: G01N21/718 ,  G01J3/0272 ,  G01J3/2823 ,  G01J3/443 ,  G01N21/65 ,  G01N2201/0221 ,  G01N2201/06113 ,  G01N2201/063

Abstract: An analysis system includes a moveable focusing lens, a laser (typically an eye safe laser) having an output directed at the focusing lens, and a spectrometer outputting intensity data from a sample. A controller system is responsive to the spectrometer and is configured to energize the laser, process the output of the spectrometer, and adjust the position of the focusing lens relative to the sample until the spectrometer output indicates a maximum or near maximum intensity resulting from a laser output focused to a spot on the sample.

Abstract translation: 分析系统包括可移动聚焦透镜，具有指向聚焦透镜的输出的激光器（通常是眼睛安全激光器）以及从样本输出强度数据的光谱仪。 控制器系统响应于光谱仪并且被配置为激励激光器，处理光谱仪的输出，并且调整聚焦透镜相对于样品的位置，直到光谱仪输出指示由激光产生的最大或接近最大强度 输出集中在样品上的一个点。

公开(公告)号：US20160069816A1

公开(公告)日：2016-03-10

申请号：US14942124

申请日：2015-11-16

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Yuko Otani ,  Takehiro Tachizaki ,  Masahiro Watanabe ,  Shunichi Matsumoto

IPC: G01N21/88 ,  G01N21/95 ,  G01N21/94

CPC classification number: G01N21/8806 ,  G01N21/21 ,  G01N21/47 ,  G01N21/94 ,  G01N21/9501 ,  G01N21/95607 ,  G01N21/95623 ,  G01N2021/8822 ,  G01N2021/8848 ,  G01N2201/06113 ,  G01N2201/063

Abstract: The disclosed device, which, using an electron microscope or the like, minutely observes defects detected by an optical appearance-inspecting device or an optical defect-inspecting device, can reliably insert a defect to be observed into the field of an electron microscope or the like, and can be a device of smaller scale. The electron microscope, which observes defects detected by an optical appearance-inspecting device or an optical defect-inspecting device, has a configuration incorporating an optimal microscope that re-detects defects, and a spatial filter and a distribution polarization element are inserted at the pupil plane when making dark-field observations using this optical microscope. The electron microscope, which observes defects detected by an optical appearance-inspecting device or an optical defect-inspecting device, has a configuration incorporating an optimal microscope that re-detects defects, and a distribution filter is inserted at the pupil plane when making dark-field observations using this optical microscope.

Abstract translation: 所公开的使用电子显微镜等精细观察由光学外观检查装置或光学缺陷检查装置检测到的缺陷的装置可以将观察到的缺陷可靠地插入电子显微镜领域或 喜欢，可以是一个规模较小的设备。 观察由光学外观检查装置或光学缺陷检查装置检测到的缺陷的电子显微镜具有结合重新检测缺陷的最佳显微镜的结构，并且将空间滤光器和分布偏振元件插入瞳孔 当使用该光学显微镜进行暗视场观察时。 观察由光学外观检查装置或光学缺陷检查装置检测到的缺陷的电子显微镜具有包含重新检测缺陷的最佳显微镜的结构，并且当制作暗色检测装置时，将分布滤光片插入瞳孔平面， 使用该光学显微镜进行现场观察。

公开(公告)号：US20150323446A1

公开(公告)日：2015-11-12

申请号：US14648577

申请日：2013-11-19

Applicant: KONICA MINOLTA, INC.

Inventor： Yoshiyuki NAGASHIMA ,  Katsutoshi TSURUTANI

IPC: G01N21/21 ,  G01N21/25

CPC classification number: G01N21/21 ,  G01N21/251 ,  G01N33/32 ,  G01N2201/063

Abstract: A reflection property measuring device comprising illumination light and reflected light polarizing plates held by a holder in a mutually superposed state in a thickness direction thereof, wherein the holder has a fittingly-holding portion for setting a held posture, and each of the polarizing plates has a fitting portion fittable to the fittingly-holding portion. The fitting portions of the polarizing plates are provided at positions allowing the polarizing plates to be held by the holder in respective postures where polarizing directions thereof intersect orthogonally. A manufacturing method is disclosed for polarizing plates used in the device, wherein the illumination light and reflected light polarizing plates are manufactured in such a manner as to be punched out from the same polarizing plate material.

Abstract translation: 一种反射特性测量装置，包括照明光和由保持器沿其厚度方向彼此重叠的状态保持的反射光偏振片，其中，所述保持器具有用于设定保持姿势的配合保持部，并且每个所述偏振片具有 可配合保持部分的装配部分。 偏振片的嵌合部设置在允许偏振片由其保持器保持的位置，其各个姿态的偏振方向正交。 公开了用于该装置中的偏振片的制造方法，其中照射光和反射光偏振片以从相同的偏振片材料冲压出来的方式制造。

公开(公告)号：US20120196271A1

公开(公告)日：2012-08-02

申请号：US13356672

申请日：2012-01-24

Applicant: Gal Ingber

Inventor： Gal Ingber

IPC: C12Q3/00 ,  C12M1/36

CPC classification number: G01N21/07 ,  G01N21/31 ,  G01N2201/063

Abstract: A system and a method for optimizing an iris setting, used in combination with a lamp, for each excitation wavelength for each carousel run in an apparatus for identifying and measuring bacteria in biological samples. The system includes a feedback control loop positioned between a filter wheel and an optical cup for measuring the intensity level of the excitation wavelength, and feeding this information to an iris having an iris setting control device such that the iris setting may be adjusted based upon the measured intensity level to control and optimize the level of light fed to the filter wheel from the lamp. The iris setting can be adjusted so that the level of light fed to the filter wheel remains constant during the lifetime of the lamp and to ensure that the level of light fed to the sample remains below the level at which photo-bleaching occurs.

Abstract translation: 用于在用于识别和测量生物样品中的细菌的装置中运行的每个转盘的每个激发波长优化与灯组合使用的虹膜设置的系统和方法。 该系统包括位于滤光轮和光学杯之间的反馈控制回路，用于测量激发波长的强度水平，并将该信息馈送到具有光圈设置控制装置的光圈，使得可以基于 测量强度水平以控制和优化从灯进入滤光轮的光的水平。 可以调节光圈设置，使得在灯的寿命期间馈送到滤光轮的光的水平保持恒定，并且确保馈送到样品的光的水平保持低于发生光漂白的水平。

公开(公告)号：US20110315894A1

公开(公告)日：2011-12-29

申请号：US13221482

申请日：2011-08-30

Applicant: Uk Kang ,  Soo Jin Bae ,  Geri V Papayan

Inventor： Uk Kang ,  Soo Jin Bae ,  Geri V Papayan

IPC: G01N21/64

CPC classification number: G01N21/6452 ,  G01N21/648 ,  G01N2201/063

Abstract: Disclosed herein is an apparatus for and method of measuring bio-chips, which can implement an illumination method of a novel type that illuminates a bio sample (which may be also referred to as a “bio specimen”) through a side face of a substrate using a diffusion plate to form an evanescent field by the illumination light over the entire surface of a substrate so as to uniformly secure brightness of the illuminated light over a wide area of a substrate, thereby more efficiently measuring fluorescence information of a bio-chip over a wide field of view.

Abstract translation: 本文公开了一种测量生物芯片的装置和方法，其可以实现通过衬底的侧面照射生物样品（其也可以称为“生物样本”）的新型照明方法 使用扩散板通过在基板的整个表面上的照明光形成消逝场，从而均匀地将照明光的亮度保持在基板的宽阔区域上，从而更有效地测量生物芯片的荧光信息 广泛的视野。

公开(公告)号：US20110211067A1

公开(公告)日：2011-09-01

申请号：US13127281

申请日：2009-11-02

Applicant: Benjamin McKay ,  Dirk François Bentschap Knook ,  Stephan Olivier van Banning ,  Anita Coetzee

Inventor： Benjamin McKay ,  Dirk François Bentschap Knook ,  Stephan Olivier van Banning ,  Anita Coetzee

IPC: H04N7/18

CPC classification number: G01N21/51 ,  G01N15/0227 ,  G01N21/0332 ,  G01N21/532 ,  G01N21/534 ,  G01N21/82 ,  G01N2021/651 ,  G01N2201/062 ,  G01N2201/063

Abstract: The invention relates to a sample analysis apparatus. The apparatus comprises: a radiation system to irradiate the sample in a vial and an analyser with a camera to analyse the radiation received from the sample in the vial. The apparatus is provided with a holder to releasable hold the vial and with an optical path for the radiation system to irradiate the sample and for the camera to make images of the sample. The radiation system can be used for front lighting of the sample in the vial or for back lighting of the sample in the vial. The camera may be provided with a telecentric lens.

Abstract translation: 本发明涉及一种样本分析装置。 该装置包括：用于将样品照射在小瓶中的辐射系统和具有相机的分析器，以分析从小瓶中的样品接收的辐射。 该设备设置有保持器以可释放地保持小瓶并且具有用于辐射系统的光路以照射样品并使照相机进行样品的图像。 辐射系统可用于小瓶中样品的前照明或用于样品瓶中样品的背光照明。 相机可以设置有远心透镜。

公开(公告)号：AP201609037A0

公开(公告)日：2016-02-29

申请号：AP201609037

申请日：2014-04-20

Applicant: MOBILEOCT LTD

Inventor： LEVITZ DAVID ,  BEERY ARIEL K

IPC: G01N21/956 ,  G01N21/21

CPC classification number: G01N21/21 ,  G01N21/956 ,  G01N2201/063

Abstract: A polarized light imaging apparatus is provided. In an embodiment, the apparatus comprises a light source for producing light beams; an illumination optic coupled to the light source for guiding the light beams towards the sample; a linear polarizer coupled to the illumination optic and configured to produce a linearly polarized light towards the sample respective of the light beams; a TIR birefringent polarizing prism (BPP) coupled to the sample to maximize a refraction difference between ordinary waves and extraordinary waves of light returning from the sample; and a detection optic unit coupled to the non-TIR BPP for guiding the light waves returning from the sample towards a single polarization sensitive sensor element (SE), the SE is configured to capture at least one frame of the sample respective of the light waves returning from the superficial single-scattering layer of the sample apart from the deeper diffuse layer.

公开(公告)号：US12029547B2

公开(公告)日：2024-07-09

申请号：US17238052

申请日：2021-04-22

Applicant: Hyperspectral Corp.

Inventor： David M. Palacios ,  Harry Hopper

IPC: A61B5/08 ,  A61B5/00 ,  A61B5/097 ,  A61B10/00 ,  G01J3/18 ,  G01J3/45 ,  G01N1/42 ,  G01N21/25 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/497

CPC classification number: A61B5/082 ,  A61B5/7282 ,  A61B10/00 ,  G01J3/18 ,  G01J3/45 ,  G01N1/42 ,  G01N21/255 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/497 ,  A61B5/097 ,  A61B2010/0087 ,  G01N2033/4975 ,  G01N2201/063

Abstract: A method comprising at least one light source configured to generate a light of at least one wavelength and project the light over an optical path, a sample device, the device containing a sample obtained from exhalation of a person, a vortex mask configured to receive the light after the light passes through at least a portion of the sample device, the vortex mask including a series of concentric circles etched in a substrate, the vortex mask configured to provide destructive interference of coherent light received from the at least one light source, a detector configured to detect and measure wavelength intensities from the light in the optical path, the wavelength intensities being impacted by the light passing through the sample, the detector receiving the light that remained after passing through the vortex mask, and a processor configured to provide measurement results based on the wavelength intensities.