MULTI-CHANNEL FLUORESCENCE DETECTING MODULE AND NUCLEIC ACID ANALYSIS SYSTEM HAVING THE SAME
    62.
    发明申请
    MULTI-CHANNEL FLUORESCENCE DETECTING MODULE AND NUCLEIC ACID ANALYSIS SYSTEM HAVING THE SAME 有权
    多通道荧光检测模块及其相应的核酸分析系统

    公开(公告)号:US20150037876A1

    公开(公告)日:2015-02-05

    申请号:US14175554

    申请日:2014-02-07

    Abstract: Provided are a multi-channel fluorescence detecting module and a nucleic acid analysis system including the multi-channel fluorescence detecting module. The nucleic acid analysis system includes: a plurality of loaders configured to accommodate a plurality of cartridges respectively, the cartridges comprising microfluidic devices; a transfer module including a linear actuator, the linear actuator including a movable unit configured to move linearly; and a fluorescence detecting module fixed to the movable unit, the fluorescence detecting module being configured to emit excitation light to the cartridges and detect fluorescence emitted from samples on the cartridges. The loaders are arranged in a row in a linearly moving direction of the movable unit.

    Abstract translation: 提供了多通道荧光检测模块和包括多通道荧光检测模块的核酸分析系统。 所述核酸分析系统包括:多个装载器,其分别容纳多个盒,所述盒包括微流体装置; 包括线性致动器的转移模块,所述线性致动器包括构造成线性运动的可移动单元; 以及荧光检测模块,其固定到所述可移动单元,所述荧光检测模块被配置为向所述盒发射激发光并检测从所述盒上的样品发出的荧光。 装载机沿可移动单元的线性移动方向排成一列。

    OPTICAL ILLUMINATION APPARATUS AND METHOD
    63.
    发明申请
    OPTICAL ILLUMINATION APPARATUS AND METHOD 有权
    光学照明装置和方法

    公开(公告)号:US20110068260A1

    公开(公告)日:2011-03-24

    申请号:US12992608

    申请日:2009-05-18

    Abstract: An optical system for detecting light from a 2D area of a sample (36) comprises a collection lens (34) for collecting light from a collection region of the sample. A light detector (44) is positionally fixed with respect to the sample, and a reflector arrangement (61) directs collected light to the detector. The reflector arrangement comprises movable components and the collection lens (34) is movable relative to the sample. The collection lens and the movable components are configurable to define different collection regions, and the movement of the components effects a direction of the light from the collection region to a substantially unchanged area of the light detector (44). This arrangement avoids the need for a bulky detector in order to detect signals from a 2D sample area formed by scanning across the sample.

    Abstract translation: 用于检测来自样品(36)的2D区域的光的光学系统包括用于收集来自样品的收集区域的光的收集透镜(34)。 光检测器(44)相对于样品位置固定,反射器装置(61)将收集的光引导到检测器。 反射器装置包括可移动部件,并且收集透镜(34)可相对于样品移动。 收集透镜和可移动部件可配置为限定不同的收集区域,并且部件的移动影响来自光收集区域的光的方向到光检测器(44)的基本上不变的区域。 这种布置避免了对庞大检测器的需要,以便检测来自通过扫描样品形成的2D样品区域的信号。

    DYNAMIC WAFER STRESS MANAGEMENT SYSTEM
    64.
    发明申请
    DYNAMIC WAFER STRESS MANAGEMENT SYSTEM 审中-公开
    动态应变管理系统

    公开(公告)号:US20070146685A1

    公开(公告)日:2007-06-28

    申请号:US11625778

    申请日:2007-01-22

    Inventor: Woo Yoo Kitaek Kang

    Abstract: Systems and techniques for characterizing samples using optical techniques are described. Light may be incident on a sample in the form of a pre-defined pattern which impinges on a wafer surface, and a reflection of the pattern is detected at a detector. Information indicative of changes in the pattern after reflection may be used to determine one or more sample characteristics and/or one or more pattern characteristics, such as stress, warpage, and curvature. The light may be coherent light of a single wavelength, or may be light of multiple wavelengths, and the pattern may be generated by transmission of the light through a diffraction grating, or hologram. The light source may be incoherent or multi-wavelength, and the pattern may be generated by imaging a pattern disposed on a mask on the sample and re-imaging the pattern at the detector.

    Abstract translation: 描述使用光学技术表征样品的系统和技术。 光可以以照射在晶片表面上的预定图案的形式入射到样品上,并且在检测器处检测图案的反射。 指示反射后图案变化的信息可用于确定一个或多个样品特性和/或一个或多个图案特征,例如应力,翘曲和曲率。 光可以是单个波长的相干光,或者可以是多个波长的光,并且可以通过衍射光栅或全息图的透射来产生图案。 光源可以是不相干的或多波长的,并且可以通过对设置在样品上的掩模上的图案进行成像并在检测器处重新成像图案来生成图案。

    Mapping-measurement apparatus
    65.
    发明申请
    Mapping-measurement apparatus 有权
    测绘仪

    公开(公告)号:US20050088656A1

    公开(公告)日:2005-04-28

    申请号:US10970518

    申请日:2004-10-21

    Abstract: A mapping-measurement apparatus for applying mapping measurement to a predetermined area on a surface of a sample, comprising: a light illumination unit for illuminating the sample with light; a photodetector for detecting, through an aperture, reflection light or transmission light coming from the sample; and a detection-side scanning mirror provided in the optical path from the sample to the aperture. The aperture restricts light to be detected by the photodetector only to light coming from a given measurement portion only on the surface of the sample. The detection-side scanning mirror is structured such that the direction of a reflection plane thereof can be changed. The direction of the reflection plane of the detection-side scanning mirror is changed with respect to the incident direction of the reflection light or the transmission light coming from the sample to change the measurement portion on the surface of the sample where measurement is performed by the photodetector.

    Abstract translation: 一种用于将样本测量应用于样品表面上的预定区域的测绘装置,包括:用光照射样品的光照射单元; 光检测器,用于通过孔径检测来自样品的反射光或透射光; 以及设置在从样品到孔的光路中的检测侧扫描反射镜。 孔径仅将光检测器的光限制在仅在样品表面上的来自给定测量部分的光。 检测侧扫描镜的结构使得其反射面的方向可以改变。 检测侧扫描反射镜的反射面的方向相对于来自样品的反射光或透射光的入射方向发生变化,从而将被测定的样品的表面上的测定部变更为 光电探测器

    Three dimensional scanning system
    66.
    发明授权
    Three dimensional scanning system 失效
    三维扫描系统

    公开(公告)号:US5173796A

    公开(公告)日:1992-12-22

    申请号:US703285

    申请日:1991-05-20

    Abstract: A part scanning and part calibration apparatus and mechanism for the inspection of printed circuit boards and integrated circuits include a camera and two rotating mirrors to scan an image of a pattern mask retical upon which a precise pattern has been deposited. Small parts are placed upon the retical to be inspected. The third overhead mirror is provided to view the part under inspection from another perspective. The scene of the part is triangulated and the dimensions of the system can thus be calibrated. A precise retical mask is provided with dot patterns which provide an additional set of information needed for calibration. By scanning more then one dot pattern the missing state values can be resolved using an iterative trigonomic solution.

    Abstract translation: 用于检查印刷电路板和集成电路的部件扫描和部件校准装置和机构包括相机和两个旋转镜,用于扫描已经沉积精确图案的图案掩模图案的图像。 小部件放置在被检查的retical上。 提供第三顶置反射镜以从另一个角度来观察被检查的部件。 该部件的场景是三角形的,因此可以校准系统的尺寸。 提供了精确的掩模掩模,其具有提供校准所需的另外一组信息的点图案。 通过扫描更多的一个点图案,可以使用迭代的三角解决方案来解决缺失的状态值。

    Photothermal test process, apparatus for performing the process and heat
microscope
    67.
    发明授权
    Photothermal test process, apparatus for performing the process and heat microscope 失效
    光热测试过程,用于执行过程和热显微镜的设备

    公开(公告)号:US5118945A

    公开(公告)日:1992-06-02

    申请号:US513902

    申请日:1990-04-24

    Abstract: A process, apparatus and heat microscope for testing the properties of materials by the photothermal effect includes generating a laser beam with a laser light source integrated into a portable measuring head, emitting the laser beam toward a region of a surface of a material sample to be tested, and focussing the laser beam to a desired measurement point diameter at a target light spot with optics at an end toward the laser beam, for absorbing a proportion of the amount of light energy with irradiated volume elements of the material sample and emitting infrared light signals from the surface of the volume elements and volume elements adjacent thereto. The emitted IR light signals are conducted to an optical decoupling element for conducting the emited IR light signals further and largely suppressing components of the laser beam reflected at the surface of the sample. Decoupled IR light signals are further conducted and focused onto receiving surface of at least one IR light detector inside the portable measuring head for converting received IR light signals into corresponding electrical signals for further signal processing. The laser beam is conducted from the laser light source to the optical element at the end of the laser beam with a first resulting degree of transmission and reflection of at least 60%, and the IR light signals emitted by the material sample are conducted to the at least one IR light detector with a second resulting degree of transmission and reflection of at least 60%.

    Abstract translation: 用于通过光热效应测试材料性质的工艺,设备和热显微镜包括:将激光光源集成到便携式测量头中产生激光束,将激光束朝向材料样品表面的区域发射为 测试并且将激光束聚焦到目标光点处的期望的测量点直径,其中光学器件在朝向激光束的一端,用于吸收一定量的光能与照射的材料样品的体积元素并发射红外光 来自与其相邻的体积元件和体积元件的表面的信号。 发射的IR光信号被传导到光去耦元件,用于进一步传导发射的IR光信号并且在很大程度上抑制在样品表面反射的激光束的分量。 去耦合的IR光信号被进一步传导并聚焦到便携式测量头内的至少一个IR光检测器的接收表面上,用于将接收的IR光信号转换成相应的电信号以进一步的信号处理。 激光束在激光束的端部从激光源传导到光学元件,具有至少60%的第一个所得到的透射和反射度,并且由材料样品发射的IR光信号被传导到 至少一个IR光检测器,其具有至少60%的第二导致的透射和反射度。

    DICHT BLEIBENDER SCHRAUBVERSCHLUSS
    68.
    发明申请
    DICHT BLEIBENDER SCHRAUBVERSCHLUSS 审中-公开
    密封螺纹瓶盖PERMANENT

    公开(公告)号:WO2013040621A1

    公开(公告)日:2013-03-28

    申请号:PCT/AT2012/050139

    申请日:2012-09-20

    Inventor: ORTNER, Johann

    Abstract: Die Erfindung betrifft eine Packung (1) mit einem Schraubverschluss (2) umfassend einen Hals (7) sowie eine Verschlusskappe (9) mit einer Seitenwand (10). Der Hals (7) weist einen ersten Abschnitt (14) mit einem ersten Durchmesser (15) und einen zweiten Abschnitt (17) mit einem zweiten Durchmesser (18) auf, wobei der erste Durchmesser (15) kleiner ist als der zweite Durchmesser (18). Der zweite Abschnitt (17) ist einem Packungsvolumen näher als der erste Abschnitt (14). Die Verschlusskappe (9) weist einen in etwa parallel zu der umlaufenden und von der Seitenwand (10) beabstandet nach innen versetzten Dichtring (23) mit einem Dichtwulst (26) auf. Der Dichtring (23) erstreckt sich bei geschlossenem Schraubverschluss (2) über den ersten Abschnitt (14) des Halses (7) hinaus in Richtung Packungsvolumen, sodass dieser zumindest teilweise in den zweiten Abschnitt (17) des Halses (7) hineinreicht. Weiters betrifft die Erfindung auch noch einen Schraubverschluss (2), eine Verschlusskappe (9) sowie ein Verfahren zur Herstellung eines derartigen Schraubverschlusses (2).

    Abstract translation: 本发明涉及一种包装件(1)具有螺帽(2),包括颈部(7)和一个封闭盖(9)的侧壁(10)。 颈部(7)具有第一直径(15)和第二部分(17)具有第二直径(18),其中所述第一直径(15)大于所述第二直径小的第一部分(14)(18 )。 所述第二部分(17)是填充体积大于所述第一部分(14)更近。 所述封闭帽(9)具有间隔开的大致平行于外周和侧壁(10)向内交错密封带密封凸缘(26),环(23)。 具有封闭螺旋盖(2)在所述颈部的所述第一部分(14)延伸的密封环(23)(7)也在包装容积的方向,以便它至少部分地进入所述第二部分(17)延伸,所述颈部(7)。 此外,本发明还涉及一螺钉(2),一个封闭帽(9)和制造这样的螺旋盖的方法(2)。

    VORRICHTUNG ZUR DETEKTION VON REFLEKTIERTEM, IN EINEM OBJEKT GESTREUTEM LICHT
    69.
    发明申请
    VORRICHTUNG ZUR DETEKTION VON REFLEKTIERTEM, IN EINEM OBJEKT GESTREUTEM LICHT 审中-公开
    DEVICE FOR DETECTION反射,在一个对象中的散射光

    公开(公告)号:WO2012159138A1

    公开(公告)日:2012-11-29

    申请号:PCT/AT2012/000139

    申请日:2012-05-21

    Abstract: Vorrichtung zur Untersuchung eines Objekts (15) mit einem Laser (10) und mit einem Linsen und/oder Spiegel aufweisenden, bildvergrößernden optischen System (11) zur Detektion von in dem Objekt (15) gestreuten Licht, als optisches Signal, wobei das optische System (11) eine Schnittstelle (19) für die Verbindung mit einem Spektrographen (16) oder einem optischen Filter (20) oder einer die Lichteinfallsdauer begrenzenden Vorrichtung (21) aufweist und/oder das optische System (11) integral mit zumindest dem Spektrographen (16) oder dem optischen Filter (20) oder der die Lichteinfallsdauer begrenzenden Vorrichtung (21) ausgebildet ist, wobei für eine variierbare Einstellung eines Winkels (α) zwischen dem Laserstrahl (L) und der Längsachse (0) des optischen Systems (11) oder für eine variierbare Einstellung eines Abstandes des Laserstrahls (L) zu der Längsachse (0) des optischen Systems (11), eine Ablenkeinrichtung (13) angeordnet ist.

    Abstract translation: 用于检查物体(15)用激光(10)中并用散在对象(15)的光检测作为光信号,其中,所述光学系统的透镜和/或反射镜具有,bildvergrößernden光学系统(11)的装置 (11)具有用于连接到光谱仪(16)或光学滤波器(20)或所述光入射持续时间限制装置(21)和/或光学系统(11)的接口(19)是一体的与至少(摄谱仪16 形成)或光学滤波器(20)或光入射持续时间的限制装置(21),用于一个角度的可变调整的(a)的激光束(L)和所述纵向轴线为(0)的光学系统(11)或间 该激光束(L)到所述光学系统(11)的纵向轴线(0)的距离的变量设置,偏转器(13)布置。

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