Abstract:
A defect inspecting apparatus of the invention solves a problem that in a defect inspecting apparatus, because of improving detection sensitivity of a microscopic defect by reducing a detection pixel size, a focal depth becomes shallow, a height of imaging is varied due to environmental change and the detection sensitivity of a defect becomes unstable. This apparatus comprises an XY stage, which carries a substrate to be inspected and scans in a predetermined direction, and a mechanism having a system of irradiating a defect on the inspected substrate at a slant and detecting the defect by a detection optical system disposed on the upper side, which corrects a height of imaging in real time for change in temperature and barometric pressure in order to keep the imaging in a best condition.
Abstract:
A system includes a light source, a detector, at least one pressure sensor, and a control unit. The light source emits light at a wavelength substantially corresponding to an absorption line of a target gas. The detector is positioned to detect the intensity of light emitted from the light source that has passed through the target gas. The pressure sensor detects the pressure of the target gas. The control circuit is coupled to the detector and the light source to adjust the modulation amplitude of the light source based on the pressure detected by the at least one pressure sensor. Related systems, apparatus, methods, and/or articles are also described.
Abstract:
A method and apparatus for detecting minority gaseous species in a mixture by light-emission spectroscopy by means of an optical spectrometer (8), in which the radiation emitted by a plasma (4) present in the gas mixture for analysis is used and, in the spectrum of the radiation, lines are identified of a majority gaseous species that present amplitudes that are sensitive to the presence of a minority species, and information about the concentration of a minority gaseous species is deduced from the amplitude(s) of the sensitive line(s). This makes it possible to monitor minority gaseous species in real time.
Abstract:
An apparatus and method for detecting at least one component gas in a sample includes a radiation source for providing radiation along an optical path in a pre-selected spectral band having at least one absorption line of the component gas to be detected and an optical detector for detecting radiation at the optical path. A sample chamber is positioned in the optical path between the source and the optical detector to contain a quantity of a sample gas. At least one gas cell enclosing an amount of the gas to be detected is fixedly positioned in the optical path in series with the gas chamber. A mathematical relationship is determined between the detected radiation and the concentration of a sample gas filling the sample chamber.
Abstract:
Optical systems are provided. One such optical system includes an optical source that propagates a source beam of light. A diffracting component is optically coupled to the optical source and is operative to receive the source beam and produce a diffracted beam. A target is located to receive the diffracted beam. Additionally, a compensating system repositions at least one of the optical source, the diffracting component, and the target in response to a detected change in refractive index of a medium through which the diffracted beam propagates so that the diffracted beam continues to be received by the target. Methods and other systems also are provided.
Abstract:
A computerized emissions tester determines concentrations of HC, CO, and CO2 in exhaust emissions. An IR test bench assembly develops an analog voltage representative of the concentration of a particular gas in a sample gas of known concentration. Data related to calibration pressure, voltage offset and voltage gain are stored in non-volatile memory EEPROM. Algorithms relating voltage and concentration of the particular gases are included in software. The pressure of an exhaust emission is compared with the calibration pressure data in memory and a correction is applied to the tester output. The data relating to the voltage offset and gain factor are also used to compensate the tester output.
Abstract:
Validation verification data quantifying an intensity of light reaching a detector of a spectrometer from a light source of the spectrometer after the light passes through a validation gas across a known path length can be collected or received. The validation gas can include an amount of an analyte compound and an undisturbed background composition that is representative of a sample gas background composition of a sample gas to be analyzed using a spectrometer. The sample gas background composition can include one or more background components. The validation verification data can be compared with stored calibration data for the spectrometer to calculate a concentration adjustment factor, and sample measurement data collected with the spectrometer can be modified using this adjustment factor to compensate for collisional broadening of a spectral peak of the analyte compound by the background components. Related methods, articles of manufacture, systems, and the like are described.
Abstract:
Non-dispersive infrared (NDIR) sensing systems employ a NDIR sensor coupled to a microprocessor to determine gas concentrations by employing slope-based methodologies that compensate for pressure variations, temperature variations, or both, which may compare NDIR signals with calibrated data. NDIR sensor systems may employ means for limiting the system peak current demand, providing for the portability and scalability of the system. In NDIR sensor systems calculating gas concentrations using calibration data, the phase of the change in the NDIR output signal in response to a change in the infrared source emitter level may be measured as part of the calibration process.
Abstract:
Disclosed embodiments of the present invention provide means to obtain correct gas density and flux measurements using (i) gas analyzer (open-path, or closed-path gas analyzers with short intake tube, for example 1 m long, or any combination of the two); (ii) fast temperature or sensible heat flux measurement device (such as, fine-wire thermocouple, sonic anemometer, or any other device providing fast accurate gas temperature measurements); (iii) fast air water content or latent heat flux measurement device (such as, hygrometer, NDIR analyzer, any other device providing fast accurate gas water content measurements); (iv) vertical wind or sampling device (such as sonic anemometer, scintillometer, or fast solenoid valve, etc.) and (v) algorithms in accordance with the present invention to compute the corrected gas flux, compensated for T-P effects. In case when water factor in T-P effects is negligible, the fast air water content or latent heat flux measurement device (item iii in last paragraph) can be excluded.
Abstract:
A gas analysis cell having a pressure control system eliminates pressure variations in the gas cell regardless of changes in restriction, gas viscosity and barometric pressure. Since optical alignement through the gas cell is sensitive to gas pressure, maintaining a constant pressure in the gas cell makes the system more stable.