MEASUREMENT TIME DISTRIBUTION IN REFERENCING SCHEMES

    公开(公告)号:US20180231457A1

    公开(公告)日:2018-08-16

    申请号:US15751454

    申请日:2016-08-29

    Applicant: APPLE INC.

    Abstract: Methods and systems for measurement time distribution for referencing schemes are disclosed. The disclosed methods and systems can be capable of dynamically changing the measurement time distribution based on the sample signal, reference signal, noise levels, and SNR. The methods and systems can be configured with a plurality of measurement states, including a sample measurement state, reference measurement state, and dark measurement state. In some examples, the measurement time distribution scheme can be based on the operating wavelength, the measurement location at the sampling interface, and/or targeted SNR. Examples of the disclosure further include systems and methods for measuring the different measurement states concurrently. Moreover, the systems and methods can include a high-frequency detector to eliminate or reduce decorrelated noise fluctuations that can lower the SNR.

    Processing apparatus and particle securing method

    公开(公告)号:US09874517B2

    公开(公告)日:2018-01-23

    申请号:US14644717

    申请日:2015-03-11

    CPC classification number: G01N21/49 G01N21/55 G01N2201/06146 G01N2201/124

    Abstract: A processing apparatus includes: a light emission unit configured to emit light to a surface of a particle dispersed liquid applied to a base material, the particle dispersed liquid having particles dispersed in a solvent; a reflected light amount monitoring unit configured to detect an amount of the light reflected, and monitor a temporal variation of the detected value; and a condition adjustment unit configured to adjust a condition for a particle securing process, the particle securing process being performed to remove the solvent and secure the particles onto the base material, wherein, when the temporal variation falls within a predetermined range after the value has reached an extreme value, securing of the particles is determined to have been completed.

    ONBOARD DEVICE AND METHOD FOR ANALYZING FLUID IN A HEAT ENGINE
    64.
    发明申请
    ONBOARD DEVICE AND METHOD FOR ANALYZING FLUID IN A HEAT ENGINE 有权
    用于分析热发动机中的流体的ONBOARD装置和方法

    公开(公告)号:US20150346085A1

    公开(公告)日:2015-12-03

    申请号:US14648855

    申请日:2013-12-04

    Applicant: SP3H

    Abstract: A method for controlling a spectrometer for analyzing a product includes steps of: acquiring a measurement representative of the operation of a light source, determining, depending on the measurement, a value of supply current of the light source, and/or a value of integration time of light-sensitive cells of a sensor, disposed on a route of a light beam emitted by the light source and having interacted with a product to be analyzed, and if the integration time and/or supply current value is between threshold values, supplying the light source with a supply current corresponding to the determined supply current value, adjusting the integration time of a light-sensitive cell to the determined integration time value, and acquiring light intensity measurements supplied by the sensor, enabling a spectrum to be formed.

    Abstract translation: 一种用于控制用于分析产品的光谱仪的方法包括以下步骤:获取代表光源的操作的测量,根据测量确定光源的电源电流的值和/或积分值 传感器的感光单元的时间设置在由光源发射的光束的路径上并且与待分析的产品相互作用,并且如果积分时间和/或电源电流值在阈值之间,则提供 所述光源具有与所确定的电源电流值相对应的电源电流,将感光单元的积分时间调整到所确定的积分时间值,以及获取由所述传感器提供的光强度测量值,从而能够形成光谱。

    Method for Quantitative Optical Measurements and Laboratory Apparatus
    65.
    发明申请
    Method for Quantitative Optical Measurements and Laboratory Apparatus 审中-公开
    定量光学测量方法和实验室仪器

    公开(公告)号:US20140370509A1

    公开(公告)日:2014-12-18

    申请号:US14352031

    申请日:2012-10-16

    Applicant: Eppendorf AG

    Abstract: The invention is related to a method for the quantitative optical measurement of a characteristic property of at least one analyte in at least one laboratory sample, in particular for the fluorescence measurement of at least one biochemical or biological sample, has the method using a laboratory apparatus, which h at least one light source and at least one detector device, the apparatus utilizing at least sensitivity parameter S, which controls the capability of the laboratory apparatus to detect a signal by means of the at least one detector device, the method using source light for causing the at least one sample to emit a sample light, and the at least one detector device for detecting sample light and utilizing the at least one sensitivity parameter S to detect the corresponding at least one intensity I of the sample light, the method comprising the steps: —determining at least one reference point (S_ref; I ref); —using at least one first sensitivity parameter S_m1, which is not the same as S_ref, for measuring at least one first intensity I_m1 of sample light as-signed to a first analyte; —determining a quantity Q1, which is a measure for the slope of a line, which is determined by utilizing the at least one reference point (S_ref; 1_ref) and the at least one measurement point (S_m1; I_m1); using the quantity Q1 for calculating a first analyte value C_m1, which is dependent on Q1 and which is characteristic for a property of the first analyte, in particular for a concentration of the first analyte in the at least one sample, in particular according to the formula Q1=(I_m1−1_ref)/(S_m1−S_ref). The method, further, is related to a laboratory apparatus, which is configured to apply the method according to the invention.

    Abstract translation: 本发明涉及一种用于定量光学测量至少一个实验室样品中至少一种分析物的特征性质的方法,特别是用于至少一种生化或生物样品的荧光测量的方法,具有使用实验室装置的方法 ,其至少一个光源和至少一个检测器装置,所述装置至少使用灵敏度参数S,其控制实验室装置通过至少一个检测器装置检测信号的能力,所述方法使用源 用于使所述至少一个样品发射样品光的光,以及所述至少一个检测器装置,用于检测样品光并利用所述至少一个灵敏度参数S来检测所述样品光的相应的至少一个强度I,所述方法 包括以下步骤: - 确定至少一个参考点(S_ref; I ref); - 使用与S_ref不同的至少一个第一灵敏度参数S_m1来测量与第一分析物相符合的样本光的至少一个第一强度I_m1; - 确定通过利用所述至少一个参考点(S_ref; 1_ref)和所述至少一个测量点(S_m1; I_m1)确定的线的斜率的度量的量Q1; 使用数量Q1来计算取决于Q1的第一分析物值C_m1,其特征在于至少一个样品中的第一分析物的浓度,特别是对于至少一个样品中的第一分析物的浓度,其特征在于第一分析物的性质, 公式Q1 =(I_m1-1_ref)/(S_m1-S_ref)。 该方法还涉及实验室设备,其被配置为应用根据本发明的方法。

    AUTOMATIC ANALYZER
    66.
    发明申请
    AUTOMATIC ANALYZER 有权
    自动分析仪

    公开(公告)号:US20120148450A1

    公开(公告)日:2012-06-14

    申请号:US13401047

    申请日:2012-02-21

    Abstract: According to one embodiment, an automatic analyzer comprises a light source, a spectroscope, a photo detection unit, a storage unit, a selection unit, and a calculation unit. The storage unit stores photo detector identifiers related to photo detectors and wavelength band identifiers in association with each other. The selection unit selects a specific photo detector from photo detectors. The specific photo detector corresponds to a specific photo detector identifier associated with a wavelength band identifier of a wavelength band according to a measurement item of a sample. The calculation unit calculates an absorbance related to the measurement item based on a signal from the selected specific photo detector.

    Abstract translation: 根据一个实施例,自动分析仪包括光源,分光镜,光检测单元,存储单元,选择单元和计算单元。 存储单元相关联地存储与光检测器和波长带标识符相关的光检测器标识符。 选择单元从光电检测器中选择特定的光电检测器。 特定的光检测器对应于根据样品的测量项目与波长带的波长带标识符相关联的特定光检测器标识符。 计算单元基于来自所选择的特定光检测器的信号计算与测量项目相关的吸光度。

    MICROELECTRONIC SENSOR DEVICE WITH LIGHT SOURCE AND LIGHT DETECTOR
    67.
    发明申请
    MICROELECTRONIC SENSOR DEVICE WITH LIGHT SOURCE AND LIGHT DETECTOR 审中-公开
    具有光源和光探测器的微电子传感器装置

    公开(公告)号:US20100187450A1

    公开(公告)日:2010-07-29

    申请号:US12665068

    申请日:2008-06-18

    Abstract: The invention relates to a method and a microelectronic sensor device for making optical examinations in an investigation region (3). An input light beam (L1) is emitted by a light source (20) into said investigation region (3), and an output light beam (L2) coming from the investigation region (3) is detected by a light detector (30) providing a measurement signal (X). An evaluation unit (40) provides a result signal (R) based on a characteristic parameter (e.g. the intensity) of the input light beam (L1) and the output light beam (L2). Preferably, the input light beam (L1) is modulated with a given frequency (ω) and monitored with a sensor unit (22) that provides a monitoring signal (M). The monitoring signal (M) and the measurement signal (X) can then be demodulated with respect to the monitoring signal, and their ratio can be determined. This allows to obtain a result signal (R) that is largely independent of environmental influences and variations in the light source.

    Abstract translation: 本发明涉及一种用于在调查区域(3)进行光学检查的方法和微电子传感器装置。 输入光束(L1)由光源(20)发射到所述调查区域(3)中,来自调查区域(3)的输出光束(L2)由光检测器(30)检测,提供 测量信号(X)。 评估单元(40)基于输入光束(L1)和输出光束(L2)的特征参数(例如强度)提供结果信号(R)。 优选地,以给定频率(ω)调制输入光束(L1),并用提供监视信号(M)的传感器单元(22)监视输入光束(L1)。 监测信号(M)和测量信号(X)可以相对于监视信号被解调,并且可以确定其比例。 这允许获得在很大程度上独立于光源的环境影响和变化的结果信号(R)。

    Method of and apparatus for inspecting paint coating
    69.
    发明授权
    Method of and apparatus for inspecting paint coating 失效
    检查涂料的方法和设备

    公开(公告)号:US5066132A

    公开(公告)日:1991-11-19

    申请号:US564167

    申请日:1990-08-08

    Abstract: An apparatus for inspecting a coating formed on a workpiece, comprising a light emitter and a light receiver positioned on respective sides of the workpiece; an amplifier for amplifying a detection signal from the light receiver and for generating an amplified output signal; a comparator for comparing the amplified output signal with a predetermined level thereby to generate a control signal indicative of a difference between the amplified output signal and the predetermined level; a zero adjustment for adjusting the amplified output signal to a zero value; and a tuning circuit for tuning the amplified output signal, which is generated from the amplifier when the workpiece to be inspected has not yet been formed with the coating, to a predetermined tuned value. The tuning circuit is operable to vary the amplification factor of the amplifier and also to the intensity of light emitted by the light emitter. In place of the tuning circuit, an amplification factor setting citcuit may be used for sampling the light transmissivity of the workpiece and for selecting one of amplification factors according to the result of sampling. After the formation of the coating on the workpiece, the amplified output signal may decrease with a decrease of the light transmissivity of the workpiece, and the coating condition is determined depending on whether or not the amplified output signal is lower than the predetermined level.

    Abstract translation: 一种用于检查在工件上形成的涂层的装置,包括位于工件的相应侧面上的光发射器和光接收器; 放大器,用于放大来自光接收器的检测信号并产生放大的输出信号; 比较器,用于将放大的输出信号与预定电平进行比较,从而产生指示放大的输出信号与预定电平之间的差的控制信号; 用于将放大的输出信号调整为零值的零调整; 以及调谐电路,用于当待检查的工件尚未形成涂层时,将放大器产生的放大的输出信号调谐到预定的调谐值。 调谐电路可操作以改变放大器的放大系数以及光发射器发射的光的强度。 代替调谐电路,可以使用放大因子设置电路来对工件的光透射率进行采样,并根据采样结果选择一个放大因子。 在工件上形成涂层之后,放大的输出信号可能随着工件的光透射率的降低而减小,并且根据放大的输出信号是否低于预定电平来确定涂覆条件。

Patent Agency Ranking