Abstract:
A sample analyzer with an optical detection device and a sample analysis method of the sample analyzer are disclosed. The optical detection device includes a fluid chamber, a light source and a light detector. The fluid chamber includes an illumination zone. An analyte flows through the illumination zone so as to form a sample stream. The light source illuminates the illumination zone to excite cell articles, reacted with a reagent, of the sample stream to emit a light signal. The light detector detects the fluorescent lights and transforms it into an electric signal. The light detector can include a silicon photomultiplier.
Abstract:
Methods and systems for measurement time distribution for referencing schemes are disclosed. The disclosed methods and systems can be capable of dynamically changing the measurement time distribution based on the sample signal, reference signal, noise levels, and SNR. The methods and systems can be configured with a plurality of measurement states, including a sample measurement state, reference measurement state, and dark measurement state. In some examples, the measurement time distribution scheme can be based on the operating wavelength, the measurement location at the sampling interface, and/or targeted SNR. Examples of the disclosure further include systems and methods for measuring the different measurement states concurrently. Moreover, the systems and methods can include a high-frequency detector to eliminate or reduce decorrelated noise fluctuations that can lower the SNR.
Abstract:
A processing apparatus includes: a light emission unit configured to emit light to a surface of a particle dispersed liquid applied to a base material, the particle dispersed liquid having particles dispersed in a solvent; a reflected light amount monitoring unit configured to detect an amount of the light reflected, and monitor a temporal variation of the detected value; and a condition adjustment unit configured to adjust a condition for a particle securing process, the particle securing process being performed to remove the solvent and secure the particles onto the base material, wherein, when the temporal variation falls within a predetermined range after the value has reached an extreme value, securing of the particles is determined to have been completed.
Abstract:
A method for controlling a spectrometer for analyzing a product includes steps of: acquiring a measurement representative of the operation of a light source, determining, depending on the measurement, a value of supply current of the light source, and/or a value of integration time of light-sensitive cells of a sensor, disposed on a route of a light beam emitted by the light source and having interacted with a product to be analyzed, and if the integration time and/or supply current value is between threshold values, supplying the light source with a supply current corresponding to the determined supply current value, adjusting the integration time of a light-sensitive cell to the determined integration time value, and acquiring light intensity measurements supplied by the sensor, enabling a spectrum to be formed.
Abstract:
The invention is related to a method for the quantitative optical measurement of a characteristic property of at least one analyte in at least one laboratory sample, in particular for the fluorescence measurement of at least one biochemical or biological sample, has the method using a laboratory apparatus, which h at least one light source and at least one detector device, the apparatus utilizing at least sensitivity parameter S, which controls the capability of the laboratory apparatus to detect a signal by means of the at least one detector device, the method using source light for causing the at least one sample to emit a sample light, and the at least one detector device for detecting sample light and utilizing the at least one sensitivity parameter S to detect the corresponding at least one intensity I of the sample light, the method comprising the steps: —determining at least one reference point (S_ref; I ref); —using at least one first sensitivity parameter S_m1, which is not the same as S_ref, for measuring at least one first intensity I_m1 of sample light as-signed to a first analyte; —determining a quantity Q1, which is a measure for the slope of a line, which is determined by utilizing the at least one reference point (S_ref; 1_ref) and the at least one measurement point (S_m1; I_m1); using the quantity Q1 for calculating a first analyte value C_m1, which is dependent on Q1 and which is characteristic for a property of the first analyte, in particular for a concentration of the first analyte in the at least one sample, in particular according to the formula Q1=(I_m1−1_ref)/(S_m1−S_ref). The method, further, is related to a laboratory apparatus, which is configured to apply the method according to the invention.
Abstract:
According to one embodiment, an automatic analyzer comprises a light source, a spectroscope, a photo detection unit, a storage unit, a selection unit, and a calculation unit. The storage unit stores photo detector identifiers related to photo detectors and wavelength band identifiers in association with each other. The selection unit selects a specific photo detector from photo detectors. The specific photo detector corresponds to a specific photo detector identifier associated with a wavelength band identifier of a wavelength band according to a measurement item of a sample. The calculation unit calculates an absorbance related to the measurement item based on a signal from the selected specific photo detector.
Abstract:
The invention relates to a method and a microelectronic sensor device for making optical examinations in an investigation region (3). An input light beam (L1) is emitted by a light source (20) into said investigation region (3), and an output light beam (L2) coming from the investigation region (3) is detected by a light detector (30) providing a measurement signal (X). An evaluation unit (40) provides a result signal (R) based on a characteristic parameter (e.g. the intensity) of the input light beam (L1) and the output light beam (L2). Preferably, the input light beam (L1) is modulated with a given frequency (ω) and monitored with a sensor unit (22) that provides a monitoring signal (M). The monitoring signal (M) and the measurement signal (X) can then be demodulated with respect to the monitoring signal, and their ratio can be determined. This allows to obtain a result signal (R) that is largely independent of environmental influences and variations in the light source.
Abstract:
A sensor board for use with an endpoint controller which monitors light intensity is provided. The sensor board can provide a dynamic range of up to five million because a constant current driver and phase sensitive detector help eliminate noise from the detected signal. The sensor board can also subtract a DC voltage offset from the detected signal and amplify the difference to provide increased resolution of small changes in the detected signal.
Abstract:
An apparatus for inspecting a coating formed on a workpiece, comprising a light emitter and a light receiver positioned on respective sides of the workpiece; an amplifier for amplifying a detection signal from the light receiver and for generating an amplified output signal; a comparator for comparing the amplified output signal with a predetermined level thereby to generate a control signal indicative of a difference between the amplified output signal and the predetermined level; a zero adjustment for adjusting the amplified output signal to a zero value; and a tuning circuit for tuning the amplified output signal, which is generated from the amplifier when the workpiece to be inspected has not yet been formed with the coating, to a predetermined tuned value. The tuning circuit is operable to vary the amplification factor of the amplifier and also to the intensity of light emitted by the light emitter. In place of the tuning circuit, an amplification factor setting citcuit may be used for sampling the light transmissivity of the workpiece and for selecting one of amplification factors according to the result of sampling. After the formation of the coating on the workpiece, the amplified output signal may decrease with a decrease of the light transmissivity of the workpiece, and the coating condition is determined depending on whether or not the amplified output signal is lower than the predetermined level.
Abstract:
This invention relates to an automatic range control method for a compact and portable optical density/dot percentage measuring device which can use a conventional light table as its light source, and which can digitally display a result of measurement. In the method, information obtained from an A/D converter, which converts a measured analog signal to a digital signal, is positively employed for reducing overall measuring time. An A/D conversion is first made at x1 range by a 10 bit A/D converter. The A/D conversion value is compared with predetermined values to determine a gain to be selected and perform further A/D conversion.