Abstract:
Systems and methods are disclosed for reducing the influence of plasma generated debris on internal components of an EUV light source. In one aspect, an EUV metrology monitor is provided which may have a heater to heat an internal multi-layer filtering mirror to a temperature sufficient to remove deposited debris from the mirror. In another aspect, a device is disclosed for removing plasma generated debris from an EUV light source collector mirror having a different debris deposition rate at different zones on the collector mirror. In a particular aspect, an EUV collector mirror system may comprise a source of hydrogen to combine with Li debris to create LiH on a collector surface; and a sputtering system to sputter LiH from the collector surface. In another aspect, an apparatus for etching debris from a surface of a EUV light source collector mirror with a controlled plasma etch rate is disclosed.
Abstract:
The invention relates to a collimation device for an X‑ray beam, to an optical device for analysing a specimen (105) by the scattering of an X‑ray beam, and a collimator for an X‑ray beam. The collimation device comprises an enclosure (110) intended to be under a vacuum or a controlled atmosphere, the enclosure (110) having an inlet (120) and an outlet (121) for the beam and at least one plate (104) made of a material having a diffracting periodic structure, said plate (104) having two main faces (104a, 104b) and at least one flared aperture (104c) between said faces.
Abstract:
A conductive substrate (18) and an etching substrate (20) are bonded to each other. An etch mask (25) is formed on the etching substrate (20) using a photolithography technique. On the etching substrate (20), grooves (20a) and X-ray transmitting sections (14b) are formed by dry etching using Bosch process. The grooves (20a) are filled with Au (27) by an electroplating method using the conductive substrate (18) as an electrode. Thus, X-ray absorbing sections (14a) are formed.
Abstract:
A reflective resin sheet 13 is bonded to one face of a supporting substrate 12 transmitting a radiation ray and a resin sheet 14 of the same material as that of the reflective resin sheet 13 to the other face of the supporting substrate 12. A phosphor layer 15 converting a radiation ray into visible light is formed additionally on the reflective resin sheet 13 formed on one face of the supporting substrate 12. The phosphor layer 15 is enclosed with an additional moisture-proof layer 17 and the reflective resin sheet 13. It is possible to obtain a scintillator panel 11 higher in sensitivity characteristics, stabilized in quality and more cost-effective by placing the reflective resin sheet 13 between the supporting substrate 12 and the phosphor layer 15.
Abstract:
The device according to the first invention is intended for use in the creation of an image of an object using radiation which passes through the object, is scattered by it or generated within it. A lens is provided between the radiation source and the object positioning system, or between that system and an image-forming system which registers the intensity distribution of the radiation incident on it, or in both these spaces. This lens is designed in accordance with the second invention and converts the particle stream (focusing of divergent or quasi-parallel rays, formation of quasi-parallel rays from divergent rays, monochromatization, spatial separation of particles of different energies in an initial non-monochromatic stream, etc.). The lens comprises a set of channels for radiation transport (primarily in the form of vitreous mono- and polycapillaries) and is distinguished by an arrangement of the channels in its cross section which is in keeping with axial symmetry (reflectional, central, rotational); this results in a point of interference of the rays emerging from it. The channels can be grouped together in ordered and symmetrically configured modules (30), each of which in its turn can be formed by finer modules (31) of the same number, form and mutual configuration.
Abstract:
An exposure apparatus includes an illumination optical system for illuminating a reflection mask that forms a pattern, by using light from a light source, wherein the illumination optical system includes a field stop that defines an illuminated area on the reflection mask, and has an opening, and an imaging system for introducing the light from the opening in the field stop into the reflection mask, the imaging system being a coaxial optical system, wherein a principal ray of the imaging system at a side of the reflection mask forming an inclination angle to a common axis of the coaxial optical system, the inclination angle being approximately equal to an angle between a principal ray of the projection optical system at the side of the reflection mask and a normal to a surface of the reflection mask.