公开(公告)号：US20010043327A1

公开(公告)日：2001-11-22

申请号：US09827455

申请日：2001-04-06

Inventor： Bryan Barney ,  Leonard Kamlet ,  Alson Spores

IPC: G01J003/28

CPC classification number: G01J3/10 ,  G01J3/28 ,  G01N21/31 ,  G01N21/9501 ,  G01N2021/3568

Abstract: A method and apparatus for spectral identification of a material based on a spectral signature. The method is ideally suited for thin film substrate characterization, as found in semiconductor wafer and optical thin film processing.

Abstract translation: 一种用于基于光谱特征的材料的光谱识别的方法和装置。 该方法非常适用于半导体晶片和光学薄膜处理中发现的薄膜基板表征。

公开(公告)号：US20010038451A1

公开(公告)日：2001-11-08

申请号：US09877847

申请日：2001-06-08

Inventor： Wayne D. Jung ,  Russell W. Jung ,  Alan R. Loudermilk

IPC: G01J003/18 ,  G01J003/28

CPC classification number: G01J3/51 ,  G01J1/0242 ,  G01J1/04 ,  G01J1/06 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0229 ,  G01J3/0254 ,  G01J3/0259 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0278 ,  G01J3/0283 ,  G01J3/0291 ,  G01J3/2803 ,  G01J3/508 ,  G01J3/513

Abstract: Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of teeth are disclosed. Perimeter receiver fiber optics preferably are spaced apart from a source fiber optic and receive light from the surface of the object/tooth being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object/tooth being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing dental prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a patient data base. Such methods and implements may be desirably utilized for purposes of detecting and preventing counterfeiting or the like. Preferably, a two stage spectral separation is utilized, preferably utilizing a diffraction grating and interference filters.

Abstract translation: 公开了用于确定牙齿的颜色或其他光学特性的光学特性测量系统和方法。 周边接收机光纤优选地与源光纤间隔开，并且从被测量的物体/齿的表面接收光。 来自周边光纤的光通过各种滤光片。 该系统利用周边接收器光纤来确定关于探头相对于被测量物体/齿的高度和角度的信息。 在处理器控制下，可以以预定的高度和角度进行光学特性测量。 公开了各种颜色光谱光度计布置。 还可以获得半透明度，荧光，光泽度和/或表面纹理数据。 可以提供音频反馈以指导操作者使用该系统。 探头可能具有可移除或屏蔽的尖端，以防止污染。 还公开了一种基于测量数据生产牙科假体的方法。 测量的数据也可以存储和/或组织为患者数据库的一部分。 为了检测和防止伪造等目的，可以期望地使用这些方法和装置。 优选地，利用两级光谱分离，优选利用衍射光栅和干涉滤光器。

公开(公告)号：US20010030746A1

公开(公告)日：2001-10-18

申请号：US09832687

申请日：2001-04-11

Inventor： Thomas Hamm ,  Beno Mueller

IPC: G01J003/28

CPC classification number: G01J3/20 ,  G01J3/28 ,  G01J3/2803 ,  H01L25/167 ,  H01L31/02325 ,  H01L2924/0002 ,  H01L2924/09701 ,  H01L2924/00

Abstract: An optical device includes an imaging device for imaging an incident beam onto a focal surface, and a support element which includes at least one side having a shape corresponding to the focal surface, where the side is located on the focal surface. The invention also includes a sensor array in close contact with the side of the support element having the shape of the focal surface.

Abstract translation: 光学装置包括用于将入射光束成像到焦点表面上的成像装置，以及支撑元件，其包括至少一个具有与焦点表面对应的形状的侧面，该侧面位于焦点表面上。 本发明还包括与具有焦平面形状的支撑元件的侧面紧密接触的传感器阵列。

公开(公告)号：US20010024275A1

公开(公告)日：2001-09-27

申请号：US09801001

申请日：2001-03-08

Inventor： Toru Suzuki ,  Osamu Wakabayashi

IPC: G01J003/28

CPC classification number: G01J3/1809 ,  G01J3/1838 ,  G01J3/22

Abstract: A spectrometer measures a spectrum of a light beam supplied from a light source so as to obtain fine information and coarse information of the spectrum easily. This spectrometer has a holographic grating, an Echelle grating, a rotation stage and a line sensor. In the case where a single pass beam is to be detected, a control processing unit controls the rotation stage so as to rotate the Echelle grating from the Littrow arrangement by a predetermined angle null1. On the other hand, in the case where a double pass beam is to be detected, the control processing unit controls the rotation stage so as to rotate the Echelle grating from the Littrow arrangement by a predetermined angle null2.

Abstract translation: 光谱仪测量从光源提供的光束的光谱，以便容易地获得光谱的精细信息和粗略信息。 该光谱仪具有全息光栅，Echelle光栅，旋转台和线传感器。 在要检测单程光束的情况下，控制处理单元控制旋转阶段，以使Echelle光栅从Littrow布置旋转预定角度δ1。 另一方面，在要检测双通光束的情况下，控制处理单元控制旋转台，以便将梯形光栅从Littrow布置旋转预定角度δ2。

公开(公告)号：US20010019408A1

公开(公告)日：2001-09-06

申请号：US09846583

申请日：2001-05-01

Inventor： Thomas W. Hagler

IPC: G01J003/28 ,  G01J003/04

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0213 ,  G01J3/0229 ,  G01J3/0289 ,  G01J3/12 ,  G01J3/18 ,  G01J3/32 ,  G01J3/433 ,  G01J2001/4242 ,  G01J2003/2866

Abstract: A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin2(mnullnullpnull/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by correspond filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.

公开(公告)号：US20040239929A1

公开(公告)日：2004-12-02

申请号：US10854987

申请日：2004-05-27

Applicant: Leica Microsystems Heidelberg GmbH

Inventor： Ingo Boehm ,  Frank Schreiber

IPC: G01J003/28

CPC classification number: G01J3/14 ,  G01J3/0224 ,  G01J4/00 ,  G02B21/0024

Abstract: An apparatus for ascertaining properties of a light beam, comprises a means for splitting a measured beam out from the light beam and comprises at least one detector that at least partially receives the measured beam. A polarization-influencing means is arranged in the beam path of the measured beam in order to enhance reliability and reproducibility.

Abstract translation: 用于确定光束性质的装置包括用于将测量的光束从光束分离出的装置，并且包括至少部分地接收所测量的光束的至少一个检测器。 在测量光束的光束路径中布置偏振影响装置，以便提高可靠性和再现性。

公开(公告)号：US20040239928A1

公开(公告)日：2004-12-02

申请号：US10882398

申请日：2004-07-02

Inventor： Yutaka Masuda

IPC: G01J003/28 ,  G01J003/42 ,  G01J003/46

CPC classification number: G01J3/46 ,  G01J3/463 ,  G01J3/504 ,  Y02T10/82

Abstract: To provide a modified-color generation and display method using computer graphic, including measuring the spectral reflectance of an original color by using a spectrophotometer, obtaining the modified spectral reflectance of a modified color by changing the measured spectral reflectance, and displaying the computer graphic of the modified color on a monitor.

Abstract translation: 为了提供使用计算机图形的修改颜色生成和显示方法，包括通过使用分光光度计测量原始颜色的光谱反射率，通过改变测量的光谱反射率来获得修改的颜色的修改的光谱反射率，并且显示计算机图形 监视器上的修改颜色。

公开(公告)号：US20040233429A1

公开(公告)日：2004-11-25

申请号：US10789942

申请日：2004-02-27

Inventor： Lawrence D. Taylor ,  David Slocum

IPC: G01J003/28

CPC classification number: G01J3/02 ,  G01J3/0264 ,  G01J3/46 ,  G01J3/462 ,  G01J3/524

Abstract: A system for calibrating a spectrophotometer includes a spectrophotometer, including a network communication interface, operating in a plurality of modes and producing and implementing diagnostic information. A network communicates with the spectrophotometer via the network communication interface. A remote processor is enabled to communicate with the spectrophotometer directly via the network communication interface. Alternatively, a spectrophotometer having a thin client is disclosed that can operate independently of a local PC.

Abstract translation: 用于校准分光光度计的系统包括分光光度计，包括以多种模式操作的网络通信接口，并且生成和实施诊断信息。 网络通过网络通信接口与分光光度计进行通信。 远程处理器能够通过网络通信接口直接与分光光度计进行通信。 或者，公开了具有瘦客户机的分光光度计，其可以独立于本地PC操作。

公开(公告)号：US20040227940A1

公开(公告)日：2004-11-18

申请号：US10749363

申请日：2003-12-31

Applicant: Wavefront Research, Inc.

Inventor： Thomas A. Mitchell

IPC: G01J003/28

CPC classification number: G01J3/18

Abstract: A compact spectrometer that is relatively free of spatial and spectral image distortions. The spectrometer includes one or more slit elements located at an object plane, a first optical sub-system having at least one refractive optical element, one or more dispersive elements located substantially at a center plane, a second optical sub-system having at least one refractive optical element, and one or more one detecting elements located at substantially an image plane. The first optical sub-system is capable of substantially collimating, at the center plane, electromagnetic radiation originating from the one or more slit elements. The second optical sub-system is, in one embodiment, substantially symmetric to said first optical sub-system, the center plane being the plane of symmetry. The second optical sub-system is capable of imaging the substantially collimated electromagnetic radiation from the center plane onto the image plane. Another embodiment has a reflective dispersive element, and the first optical sub-system is also the second optical sub-system, acting as a dual optical sub-system.

Abstract translation: 相对没有空间和光谱图像失真的紧凑型光谱仪。 光谱仪包括位于物平面处的一个或多个狭缝元件，具有至少一个折射光学元件的第一光学子系统，基本上位于中心平面处的一个或多个分散元件，具有至少一个的第二光学子系统 折射光学元件，以及位于基本上是图像平面的一个或多个检测元件。 第一光学子系统能够在中心平面上基本上准直来自一个或多个狭缝元件的电磁辐射。 在一个实施例中，第二光学子系统与所述第一光学子系统基本对称，中心平面是对称平面。 第二光学子系统能够将基本上准直的电磁辐射从中心平面成像到图像平面上。 另一个实施例具有反射色散元件，并且第一光学子系统也是第二光学子系统，用作双光学子系统。

公开(公告)号：US20040207844A1

公开(公告)日：2004-10-21

申请号：US10478499

申请日：2004-06-12

Inventor： Nataliya Nabatova-Gabain ,  Yoko Wasai

IPC: G01J003/447 ,  G01J003/28

CPC classification number: G01N21/211 ,  G01B11/0641 ,  G01N21/8422

Abstract: The present invention provides a thin film property measuring method using a spectroscopic ellipsometer. With the measuring method, a model including a combination of the film thickness, complex refractive index, or the like, of each layer is formed, and fitting is made for the measured spectra and the spectra calculated based upon the model, with the model and the incident angle being modified over a predetermined number of repetitions, thereby determining the structure, the wavelength dependency of the dielectric constant, and the composition ratio, of a thin film including a compound semiconductor layer on a substrate. Furthermore, new approximate calculation is employed in the present invention, thereby enabling the concentration of the atom of interest contained in polycrystalline compound semiconductor to be calculated.

Abstract translation: 本发明提供一种使用光谱椭偏仪的薄膜性质测量方法。 通过测量方法，形成包括每层的膜厚度，复合折射率等的组合的模型，并且对于测量的光谱和基于模型计算的光谱进行拟合，其模型和 在预定数量的重复中改变入射角度，由此确定在衬底上包括化合物半导体层的薄膜的结构，介电常数的波长依赖性和组成比。 此外，在本发明中采用新的近似计算，从而能够计算包含在多晶化合物半导体中的感兴趣原子的浓度。