公开(公告)号：US4298797A

公开(公告)日：1981-11-03

申请号：US10820

申请日：1979-02-09

Applicant: Claude R. Bernard ,  Bernard Daigne ,  Francois Girard

Inventor： Claude R. Bernard ,  Bernard Daigne ,  Francois Girard

IPC: G01J3/18 ,  G01J3/20 ,  G01J3/36 ,  G01J1/42 ,  G01J3/28

CPC classification number: G01J3/20 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/36

Abstract: A spectrograph usable more particularly in the far ultraviolet range. It comprises along the Rowland circle measuring blocks including photo-detectors. Said measuring blocks are movably mounted along a guiding rail materializing the Rowland circle. Motion means are provided for the displacement of the various measuring blocks along the guiding rail. Transmission means between the motion means and a measuring block constantly direct the latter towards the diffraction grating.

Abstract translation: 更特别可用于远紫外线范围的光谱仪。 它包括罗兰圆测量块，包括光电探测器。 所述测量块沿着实现罗兰圆的导轨可移动地安装。 提供运动装置用于沿着导轨移动各种测量块。 运动装置和测量块之间的传输装置不断地将其指向衍射光栅。

公开(公告)号：US3495909A

公开(公告)日：1970-02-17

申请号：US3495909D

申请日：1965-12-17

Applicant: NORMAN N AXELROD

Inventor： AXELROD NORMAN N

IPC: G01J3/06 ,  G01J3/20

CPC classification number: G01J3/06 ,  G01J3/20

公开(公告)号：JP4816258B2

公开(公告)日：2011-11-16

申请号：JP2006152705

申请日：2006-05-31

Applicant: コニカミノルタホールディングス株式会社

Inventor： 滋人 大森

IPC: G02B5/18 ,  G01J3/20 ,  G01J3/36 ,  G02B6/293 ,  G02B6/42

公开(公告)号：JP2010286829A

公开(公告)日：2010-12-24

申请号：JP2010107105

申请日：2010-05-07

Applicant: Canon Inc ,  キヤノン株式会社

Inventor： ISHIBE YOSHIHIRO

IPC: G02B5/18 ,  G01J3/20 ,  G01N21/27 ,  G01N21/47

CPC classification number: B23C3/00 ,  B23C2226/31 ,  G01J3/18 ,  G01J3/20 ,  G01J3/50 ,  G02B5/1842 ,  G02B5/1861 ,  G02B27/0944

Abstract: PROBLEM TO BE SOLVED: To obtain a highly accurate diffraction element that prevents an intensity decrease of a light beam entering a light receiving unit without a decrease in diffraction efficiency and without a problem of flare or the like, a method of manufacturing the diffraction element, and a spectrometer using the same. SOLUTION: In the diffraction element 2 having a diffraction grating formed on a substrate having a curved surface, the curved surface 3 has an anamorphic shape formed by turning a curved line (I) in a plane about a straight line (II) in the same plane serving as a rotating axis, and gratings 10a of the diffraction grating 10 exist in cross sections orthogonal to the rotation axis. COPYRIGHT: (C)2011,JPO&INPIT

Abstract translation: 要解决的问题为了获得高度精确的衍射元件，其不会降低衍射效率并且没有发生耀斑等的问题，可以防止进入光接收单元的光束的强度降低， 衍射元件和使用其的光谱仪。 解决方案：在具有形成在具有曲面的基板上的衍射光栅的衍射元件2中，弯曲表面3具有通过在直线（II）的平面内转动曲线（I）而形成的变形形状， 在作为旋转轴的同一平面中，衍射光栅10的光栅10a存在于与旋转轴正交的横截面中。 版权所有（C）2011，JPO＆INPIT

公开(公告)号：JP4160124B2

公开(公告)日：2008-10-01

申请号：JP52857898

申请日：1997-12-04

Applicant: パナリティカル ビー ヴィ

Inventor： エグラト，ワルテルス アルフォンスス ロウレンティウス アントニウス ファン

IPC: G21K1/06 ,  G01J3/20 ,  G01N23/20 ,  G01N23/205 ,  G01N23/207 ,  G01N23/223

CPC classification number: G01N23/20008 ,  G01J3/20 ,  G01N23/2055

公开(公告)号：JP2004309146A

公开(公告)日：2004-11-04

申请号：JP2003098804

申请日：2003-04-02

Applicant: Olympus Corp ,  オリンパス株式会社

Inventor： SHIMIZU ETSURO ,  KOMINE HITOSHI

IPC: G01J3/20 ,  G01J3/02 ,  G01J3/28 ,  G02B5/18 ,  H01L31/02

CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/0259

Abstract: PROBLEM TO BE SOLVED: To provide a highly reliable, low-cost spectrophotometer for performing a high-performance and high-stability measurement while maintaining high positional accuracy on optical components and compactness.
SOLUTION: This spectrophotometer is equipped with a light guide 2, a light inlet slit 3 for inletting inlet light into the light guide, a diffraction grating 4 for dispersing the inlet light inlet into the light guide, and a photodiode array 6 for detecting the inlet light dispersed by the diffraction grating. The spectrophotometer is structured by integrally forming the light guide, the inlet slit, and the light guide, with a light guide substrate 1, and mounting a photoelectric transducer substrate 7 with the photodiode array mounted on a mount part 5 provided on the guide substrate.
COPYRIGHT: (C)2005,JPO&NCIPI

公开(公告)号：JPH05118921A

公开(公告)日：1993-05-14

申请号：JP27975491

申请日：1991-10-25

Applicant: SHIMADZU CORP

Inventor： YOSHIOKA MASAKAZU

IPC: G01J3/04 ,  G01J3/20 ,  G01J3/443

Abstract: PURPOSE:To make it possible to easily repeat slight movement of an inlet slit at high speed and precisely maintain the angle position shifting by a slight distance by increasing and decreasing the thickness of a piezoelectric ceramic material by changing the voltage to be applied. CONSTITUTION:The side face of a slit holder is pressed 5a by rotating and moving a scanning dial 5 forward and an impulse plate 2 is moved to shift an inlet slit plate S1 and select a prescribed wavelength to be measured. Here, in the case the voltage to be applied to a piezoelectric ceramic material 12, is changed, the thickness of the material 12 is increased and decreased and corresponding to this, swinging 10 occurs. Consequently, pressing force to the side face of a holder 1 becomes strong and weak through a touching material 11 and the plate 2 moves along the tangent line direction L of Row-land circle R by a slight distance corresponding to the alteration of the thickness of the material 12. Following this, the wavelength of the light transmitted through a plate S1 is made different from the selected wavelength to be measured and the spectrum of the different wavelength comes in to an outlet slit plate S2. As a result, the intensity of the spectrum of the wavelength to be measured and the intensity of the background of the shifted wavelength before and after the wavelength are measured repeatedly.

公开(公告)号：JPH044536B2

公开(公告)日：1992-01-28

申请号：JP2900981

申请日：1981-02-28

IPC: G01J3/20 ,  G01J3/06 ,  G01J3/18

公开(公告)号：JPH0339572B2

公开(公告)日：1991-06-14

申请号：JP16883

申请日：1983-01-04

Applicant: INSTRUMENTS SA

Inventor： ARAN TEUANON

IPC: G01J3/18 ,  G01J3/20 ,  G01J3/36 ,  G01N21/72

公开(公告)号：JPH02276927A

公开(公告)日：1990-11-13

申请号：JP17021789

申请日：1989-06-30

Applicant: SHIMADZU CORP

Inventor： SASAKI SHUNICHIRO

IPC: G01J3/12 ,  G01J3/20 ,  G01N21/27

Abstract: PURPOSE:To use the integral spectroscope and spectral measuring instrument even under severe environmental conditions like the actual site of a manufacture line without difficult maintenance by uniting a light guide-in part and a spectral part whose plane shape is a Rowland circle by using a material which is high in optical spatial homogeneity. CONSTITUTION:A sample of the manufacture line flows in a measurement cell 20. The luminous flux emitted by a light source lamp 18 is transmitted through a condenser lens 8 to reach a filter 14 and an entrance slit 12. Then the luminous flux which is made incident on the spectral part 6 from the slit 12 is dispersed by a concave diffraction grating 10 to form an entrance slit image at a position corresponding to an exit slit. The incidence end surface of an optical fiber 16 is arranged at the position, so monochromatic luminous flux guided by the optical fiber 16 is transmitted through the sample flowing in the measurement cell part 20, guided by an optical fiber 26 to a detector 30, and detected.