-
公开(公告)号：ES2179498T3
公开(公告)日：2003-01-16
申请号：ES98924676
申请日：1998-05-11
Applicant: PHOTOCURE ASA
Inventor： STEEN HARALD B
IPC: A61N5/06 , H01J20060101 , H01J3/10
Abstract: A device for irradiating a limited, defined area where uniform and intense irradiation is obtained of a sharply defined light field (7) of variable size, the light from a halogen lamp (1) or similar incoherent light source being directed by means of an elliptical mirror (2) towards one end surface (3) of a transparent rod (4) whose opposite end surface (6) is thereby uniformly irradiated and is imaged by a lens (7) in the area (9) which has to be irradiated.
-
公开(公告)号：DE69806378D1
公开(公告)日：2002-08-08
申请号：DE69806378
申请日：1998-05-11
Applicant: PHOTOCURE ASA OSLO OSLO
Inventor： STEEN B
IPC: A61N5/06 , H01J20060101 , H01J3/10
Abstract: A device for irradiating a limited, defined area where uniform and intense irradiation is obtained of a sharply defined light field (7) of variable size, the light from a halogen lamp (1) or similar incoherent light source being directed by means of an elliptical mirror (2) towards one end surface (3) of a transparent rod (4) whose opposite end surface (6) is thereby uniformly irradiated and is imaged by a lens (7) in the area (9) which has to be irradiated.
-
公开(公告)号：AT220243T
公开(公告)日：2002-07-15
申请号：AT98924676
申请日：1998-05-11
Applicant: PHOTOCURE ASA
Inventor： STEEN HARALD B
IPC: A61N5/06 , H01J20060101 , H01J3/10
Abstract: A device for irradiating a limited, defined area where uniform and intense irradiation is obtained of a sharply defined light field (7) of variable size, the light from a halogen lamp (1) or similar incoherent light source being directed by means of an elliptical mirror (2) towards one end surface (3) of a transparent rod (4) whose opposite end surface (6) is thereby uniformly irradiated and is imaged by a lens (7) in the area (9) which has to be irradiated.
-
公开(公告)号：AU7678098A
公开(公告)日：1998-12-08
申请号：AU7678098
申请日：1998-05-11
Applicant: PHOTOCURE ASA
Inventor： STEEN HARALD B
IPC: A61N5/06 , H01J20060101 , H01J3/10
Abstract: A device for irradiating a limited, defined area where uniform and intense irradiation is obtained of a sharply defined light field (7) of variable size, the light from a halogen lamp (1) or similar incoherent light source being directed by means of an elliptical mirror (2) towards one end surface (3) of a transparent rod (4) whose opposite end surface (6) is thereby uniformly irradiated and is imaged by a lens (7) in the area (9) which has to be irradiated.
-
公开(公告)号：DE19641177A1
公开(公告)日：1998-03-26
申请号：DE19641177
申请日：1996-09-24
Applicant: INST BIOPROZESS ANALYSENMESST
Inventor： HERRMANN FRANK-PETER DR SC NAT , LAUCKNER GERALD PROF DR ING , HOTTENROTT JOACHIM MARCO DIPL
Abstract: The chamber consists of a horizontal bore (2) for the gas flow intercepted by a vertical bore (5) holding the electrodes (6.1,6.2,6.3) from the exciting source (6) opposite an isolating section (7) holding an outer helical electrode (8) and an inner electrode (9) which is either helical or cylindrical in shape. These act as anode and cathode respectively. The outer electrode has gas-permeable sections and there is free space between neighbouring windings (8.1,8.2). This ensures wide dissemination of the gas mixture flowing through the bore in the detector, even if the current speed is very low, giving greater accuracy.
-
Patent Agency Ranking
公开(公告)号：DE2702444C3
公开(公告)日：1980-10-09
申请号：DE2702444
申请日：1977-01-20
Applicant: SIEMENS AG, 1000 BERLIN UND 8000 MUENCHEN
IPC: H01L21/027 , H01J37/30 , H01J37/304 , H01J3/10 , H01L21/31
Abstract: An improved charged-particle beam optical apparatus for imaging a first mask including a plurality of apertures on a specimen to be irradiated. The mask is uniformly illuminated by a beam through a plurality of condenser lenses and the apparatus includes means for adjusting the position of the mask relative to the specimen. A selected area of the specimen has an adjustment marking disposed thereon which is illuminated by a ray of charged particles from the beam passing through a test opening provided in the mask. The apparatus further includes means for detecting radiation emanating from the specimen. The improvement of the invention comprises the provision of a second mask, having at least one aperture which is alignable with the test opening in the first mask, mounted in the apparatus and movable into positions above and below the first mask for aligning the test opening and aperture in the first and second masks and covering the plurality of apertures in the first mask so as to permit charged particles from the beam to pass only through the test opening in the first mask and the aperture in the second mask.
-
公开(公告)号：DE1953712C3
公开(公告)日：1980-06-26
申请号：DE1953712
申请日：1969-10-24
Applicant: THOMSON-BRANDT, PARIS
-
公开(公告)号：DE1690626C3
公开(公告)日：1979-02-08
申请号：DEN0031068
申请日：1967-08-16
Applicant: NIHON DENSHI K.K., TOKIO
Inventor： IMURA, SHINGO , TANAKA, KAZUMITSU
IPC: H01J37/304 , H01J3/10 , H01J37/24
-
69.发明专利
公开(公告)号：CA1041228A
公开(公告)日：1978-10-24
申请号：CA228685
申请日：1975-06-06
Applicant: CGR MEV
Inventor： BOUX RENE , BOURLIER JEAN N
Abstract: A PROCESS FOR CENTRING AN IONIZING RADIATION SWEEP BEAM AND DEVICE FOR CARRYING OUT THIS PROCESS A centring process for detecting the centring errors of a sweep beam impinging on a target and correcting them, this process comprising comparing a signal VE, corresponding to the difference between electric signals received on the two halves of an electrode, with threshold voltages ? ve and comparing a signal VB, corresponding to the voltage controlling the sweep of the beam, with threshold voltages ? vb, the transmission of a signal Vp corresponding to VE > + ve and VB + vb ) indicating the direction of the centring error and its amplitude. The process permits controlling the centring of a sweep beam on secant axes making an angle .theta. therebetween.
-
公开(公告)号：CA907226A
公开(公告)日：1972-08-08
申请号：CA907226D
Applicant: ATOMIC ENERGY AUTHORITY UK
Inventor： FREEMAN JAMES H
-
-
-
-
-
-
-
-
-
Search Results
124
records
(took 0.019 seconds)
