公开(公告)号：GB1105169A

公开(公告)日：1968-03-06

申请号：GB4038765

申请日：1965-09-22

Applicant: APPLIED RES LAB INC

IPC: G01J3/06 ,  G01N23/20 ,  G01N23/207

Abstract: 1,105,169. Programmed process control. APPLIED RESEARCH LABORATORIES Inc. Sept. 22, 1965 [Sept. 22, 1964], No. 40387/65. Heading G3N. [Also in Division F2] A control system for a transmission in an X-ray spectrometer including a main brake and clutch engaged by solenoids 23, 22 and high and low speed gear trains each containing a clutch engaged by solenoid 28, 26, includes a perforated disc movable past a photo-sensor 64 feeding a signal to Schmitt trigger 70. A switch 74 has two manual and two automatic position; in the INTEGRATE position, as shown, bi-stable multivibrators energize solenoids 22, 28; when sensor 64 detects the leading edge of an aperture a signal is fed from trigger 70 to vibrator 72 to de-energize high-speed solenoid 28 and energize low-speed solenoid 26. The signal from trigger 70 is also fed to a vibrator 76 the output of which is adjustable with respect to the duration of the pulse produced; the trailing edge of this pulse causes vibrator 78 to de-energize main-clutch solenoid 22 and energize brake solenoid 23. The trailing edge of the pulse is also fed to integrator 82 which after a certain time produces a signal to return vibrator 78 to its original state and a signal from this vibrator is sent via switch arm 84 to vibrator 72 to return it to its original state. In the PROFILE position of switch 74, a diode 86 is shorted by switch arm 88 so that vibrator 72 is triggered by the leading and training edge of the pulse from trigger 70 to switch from high-speed to low-speed and then back to high-speed; the vibrator 76 is disconnected from trigger 70 so that vibrator 78 maintains solenoid 22 energized.

公开(公告)号：FR1236312A

公开(公告)日：1960-07-15

申请号：FR805629

申请日：1959-09-21

Applicant: APPLIED RES LAB INC

IPC: F16K3/06

公开(公告)号：GB1595528A

公开(公告)日：1981-08-12

申请号：GB1197178

申请日：1978-03-28

Applicant: APPLIED RES LAB

IPC: G01J3/18

Abstract: To eliminate astigmatism and coma in a spectrograph the distance between the entrance slot and a first concave mirror, as well as the relative angular positions of the entrance slot, the plane grating, the two concave mirrors and the focal plane are selected so as to satisfy the following conditions. +TR

公开(公告)号：FR2386812A1

公开(公告)日：1978-11-03

申请号：FR7809333

申请日：1978-03-30

Applicant: APPLIED RES LAB

Inventor： LINDBLOM PETER

IPC: G01J3/18 ,  G01J3/00

Abstract: To eliminate astigmatism and coma in a spectrograph the distance between the entrance slot and a first concave mirror, as well as the relative angular positions of the entrance slot, the plane grating, the two concave mirrors and the focal plane are selected so as to satisfy the following conditions. +TR

公开(公告)号：DE2340383A1

公开(公告)日：1974-02-21

申请号：DE2340383

申请日：1973-08-09

Applicant: APPLIED RES LAB INC

Inventor： WIRD SPAETER GENANNT WERDEN

IPC: G01N21/74 ,  G01N1/28 ,  G01N21/67

Abstract: An analyte material is prepared for spectrochemical analysis by depositing it in solution or electrostatically precipitating it upon a previously purged yarn of finely divided carbon fibers, dessicating it in situ, and electrically heating the yarn sufficiently to vaporize the analyte material while passing a gas stream over it in which the analyte material is condensed in particles of sufficiently small size to form an aerosol which is then conducted to any of a variety of excitation sources for spectrochemical analysis.

公开(公告)号：CA915935A

公开(公告)日：1972-12-05

申请号：CA915935D

Applicant: APPLIED RES LAB

Inventor： JONES JAMES L ,  DAHLQUIST RALPH L

IPC: G01J3/30 ,  G01N21/67 ,  G01N21/73 ,  H05H1/48

公开(公告)号：CA902806A

公开(公告)日：1972-06-13

申请号：CA902806D

Applicant: APPLIED RES LAB

Inventor： ANDERSEN CHRISTIAN A ,  RODEN HENRY J

公开(公告)号：DE2027450A1

公开(公告)日：1971-12-09

申请号：DE2027450

申请日：1970-06-04

Applicant: APPLIED RES LAB

IPC: G01J3/32 ,  G01J3/28

公开(公告)号：DE1539660A1

公开(公告)日：1970-04-09

申请号：DEA0053728

申请日：1966-10-11

Applicant: APPLIED RES LAB INC

Inventor： JAKOB LIEBL HELMUT

IPC: G01Q10/00 ,  G01Q30/06 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/02 ,  H01J49/14 ,  H01J49/20 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32 ,  H01J39/34

Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.

公开(公告)号：DE1935975A1

公开(公告)日：1970-01-22

申请号：DE1935975

申请日：1969-07-15

Applicant: APPLIED RES LAB INC

Inventor： NEUHAUS HERMANN

IPC: H01J37/141 ,  H01J37/252 ,  H01J37/14

Abstract: 1,225,579. Electron - beam apparatus. APPLIED RESEARCH LABORATORIES Inc. 17 July, 1969 [17 July, 1968], No. 36119/69. Heading HID. In order to remove contaminants from an electron microprobe of the kind having a lens positioned closely adjacent to the specimen, the lens structure is cooled to a temperature below about - 20‹ C. In the microprobe shown, an election beam impinges on a small area of the specimen 14 to cause emission of X-rays which are subjected to analysis. Contaminants are caused to condense on the surface 10 of a lens 12 which is cooled by means of a refrigerant circulated in a coil 24 surrounding the winding 16. A conventional refrigerant is used for temperatures down to- 40‹ C. and below this, liquid nitrogen is used. The coil 24 may be included in the cooling circuit of a diffusion pump for the apparatus and the temperature of the lens may be regulated by means of an adjustable valve in a by-pass circuit. The specimen 14 may be heated by means of a coil 27. Temperature sensors 26, 28 may be used in automatic regulating circuits for both cooling and heating.