MESSLICHTQUELLE UND MESSANORDNUNG ZUM ERFASSEN EINES REFLEXIONSSPEKTRUMS
    71.
    发明公开
    MESSLICHTQUELLE UND MESSANORDNUNG ZUM ERFASSEN EINES REFLEXIONSSPEKTRUMS 审中-公开
    测量光源和测量布置检测反射光谱

    公开(公告)号:EP3290904A2

    公开(公告)日:2018-03-07

    申请号:EP17185054.8

    申请日:2017-08-07

    Abstract: Die vorliegende Erfindung betrifft eine Messlichtquelle zum Erzeugen von Messlicht mit einer gleichmäßigen räumlichen Beleuchtungsstärkeverteilung. Die Messlichtquelle umfasst einen Hohlkörper (01) mit einer diffus reflektierenden Innenfläche. Im Hohlkörper (01) sind ein konkaver, hohlspiegelförmiger Beleuchtungsraum (04), ein rohrartiger Lichtformungsraum (06) und ein konkaver, hohlspiegelförmiger Lichtaustrittsraum (07) ausgebildet, die eine gemeinsame Achse (03) aufweisen. Im Beleuchtungsraum (04) ist eine Lichtquelle (08) zum Erzeugen von Licht zumindest teilweise angeordnet. Der Lichtaustrittsraum (07) weist einen Lichtaustritt (14) auf. Der Beleuchtungsraum (04) und der Lichtaustrittsraum (07) stehen sich mit ihren Hohlspiegelformen gegenüber und sind durch den rohrartigen Lichtformungsraum (06) verbunden. Erfindungsgemäß ist im Hohlkörper (01) eine diffus reflektierende Reflexionsscheibe (11) zum Reflektieren des von der im Lichtaustrittsraum (07) angeordneten Innenfläche des Hohlkörpers (01) reflektierten Lichtes durch den Lichtaustritt (14) nach außerhalb des Hohlkörpers (01) angeordnet. Im Weiteren betrifft die Erfindung eine Messanordnung zum Erfassen eines absoluten Reflexionsspektrums einer Probe und zum Durchführen einer Referenzmessung.

    Abstract translation: 本发明涉及用于产生具有均匀空间照度分布的测量光的测量光源。 测量光源包括具有漫反射内表面的空心体(01)。 在中空体(01)形成,凹,凹面镜状照明区域(04),管状光整形空间(06)和一个凹面,凹面反射镜形状的光出射空间(07),其具有一个共同的轴线(03)。 用于产生光的光源(08)至少部分地布置在照明空间(04)中。 光出射空间(07)具有光出口(14)。 所述照明腔室(04)和光出射面(07)彼此面对,它们的凹面镜形式和由管状的光成形空间(06)相连接。 漫反射反射板(11),用于通过在光出射空间反映排序(07)由光出射(14)与中空体(01)的外部反射的中空体(01)的光根据布置在所述中空体(01)本发明的内表面上。 此外,本发明涉及用于检测样品的绝对反射光谱并用于执行参考测量的测量装置。

    HETEROGENEOUS SPECTROSCOPIC TRANSCEIVING PHOTONIC INTEGRATED CIRCUIT SENSOR
    72.
    发明公开
    HETEROGENEOUS SPECTROSCOPIC TRANSCEIVING PHOTONIC INTEGRATED CIRCUIT SENSOR 审中-公开
    SPEKTROSKOPISCHER传感器麻省光电子激光器SCHALTUNG UND HETEROGENEM LASER

    公开(公告)号:EP3002568A1

    公开(公告)日:2016-04-06

    申请号:EP15002775.3

    申请日:2015-09-28

    Applicant: Aurrion, Inc.

    Abstract: Described herein are optical sensing devices for photonic integrated circuits (PICs). A PIC may comprise a plurality of waveguides formed in a silicon on insulator (SOI) substrate, and a plurality of heterogeneous lasers, each laser formed from a silicon material of the SOI substrate and to emit an output wavelength comprising an infrared wavelength. Each of these lasers may comprise a resonant cavity included in one of the plurality of waveguides, and a gain material comprising a non-silicon material and adiabatically coupled to the respective waveguide. A light directing element may direct outputs of the plurality of heterogeneous lasers from the PIC towards an object, and one or more detectors may detect light from the plurality of heterogeneous lasers reflected from or transmitted through the object.

    Abstract translation: 这里描述了用于光子集成电路(PIC)的光学感测装置。 PIC可以包括形成在绝缘体上硅(SOI)衬底中的多个波导和多个异质激光器,每个激光器由SOI衬底的硅材料形成并且发射包括红外波长的输出波长。 这些激光器中的每一个可以包括包括在多个波导之一中的谐振腔,以及包括非硅材料并且绝缘地耦合到相应波导的增益材料。 光引导元件可以将多个异质激光器的输出从PIC指向物体,并且一个或多个检测器可以检测来自从物体反射或透过物体的多个异质激光器的光。

    SPECTRAL CHARACTERISTIC MEASURING DEVICE, METHOD FOR CORRECTING SPECTRAL CHARACTERISTIC MEASURING DEVICE, AND PROGRAM
    75.
    发明公开
    SPECTRAL CHARACTERISTIC MEASURING DEVICE, METHOD FOR CORRECTING SPECTRAL CHARACTERISTIC MEASURING DEVICE, AND PROGRAM 审中-公开
    用于测量分光特性校正程序的用于测量的光谱和PROGRAM THEREFOR

    公开(公告)号:EP2677290A1

    公开(公告)日:2013-12-25

    申请号:EP12746892.4

    申请日:2012-02-03

    Inventor: IMURA Kenji

    CPC classification number: G01J3/28 G01J3/0297 G01J3/18 G01J2003/102

    Abstract: The purpose is to rapidly and easily correct a spectral characteristic measuring device regardless of the change in spectral distribution of a monochromatic light for correction. To achieve the object, a spectral characteristic measuring device includes a spectrometer and a control device. In the spectrometer, the light passed through an opening of a light shielding body is dispersed by an optical system and irradiated on a light receiving unit in which a plurality of light receiving elements are arrayed to form a dispersion image. In the control device, wavelength information indicating a correspondence relationship between the plurality of light receiving elements and wavelengths of pieces of lights is stored, where first and second intensity distributions of the light related to first and second dispersion images are acquired based on a signal outputted from each of the light receiving elements when the monochromatic light is passed through the opening and first and second dispersion images related to primary diffracted light and secondary diffracted light are formed on the light receiving unit, and an estimated intensity distribution of the light related to the second dispersion image is calculated from the first intensity distribution according to a predetermined relational expression. In the control device, a change amount related to the wavelength information is calculated based on the estimated intensity distribution and the second intensity distribution, and the wavelength information is corrected according to the change amount.

    Abstract translation: 的目的是为了快速且容易地不管单色光进行校正的光谱分布变化的校正分光特性测量装置。 为了实现上述目的,一个分光特性测量装置包括光谱仪和一个控制装置。 在光谱仪,通过对遮光体的开口后的光通过在光学系统分散并照射在光接收元件的。多个排列以形成分散体图像的光接收单元上。 在该控制装置中,波长信息指示灯的条光接收元件和波长的多元性之间的对应关系被存储,其中,与第一和第二分散体的图像的光的第一和第二强度分布基于所述输出的信号中获取 从各光接收元件当单色光通过开口和相关的主衍射光与次级衍射光的第一和第二分散体图像通过形成在光接收单元上,并在与所述光的估计强度分布的 第二分散体图像被从第一强度分布gemäß计算值到预定的关系式。 在该控制装置中,与波长有关的信息的变化量被计算基于所估计的强度分布和所述第二强度分布,和波长信息被校正到gemäß的变化量。

    INFRARED RADIATION SOURCE
    76.
    发明公开

    公开(公告)号:EP3359484A2

    公开(公告)日:2018-08-15

    申请号:EP16777674.9

    申请日:2016-10-05

    Applicant: Sintef TTO AS

    CPC classification number: G01J3/108 B82Y20/00 G01J2003/102

    Abstract: This invention relates to a source for emitting radiation in the infrared range comprising a thin membrane including a radiation element made from a semi-conductive material having a chosen dopant, the radiation element being connected to a frame, the frame comprising connector means for connecting to a power source for conducting an electrical current through the substrate, the radiation element being provided with a periodic modulation of the refractive index constituting a photonic crystal having a chosen period, thus defining an optical resonator at one or more chosen wavelengths, and wherein the membrane is mounted to the substrate through a number of conductor beams distributed along the membrane circumference so as to provide an even current distribution and thus even heating over the membrane.

    FABRY-PEROT SPECTRAL IMAGE MEASUREMENT
    78.
    发明公开
    FABRY-PEROT SPECTRAL IMAGE MEASUREMENT 审中-公开
    FABRY-PEROT光谱图像测量

    公开(公告)号:EP3215805A1

    公开(公告)日:2017-09-13

    申请号:EP15856966.5

    申请日:2015-10-23

    Abstract: A system for wide-range spectral measurement includes one or more broadband sources, an adjustable Fabry-Perot etalon, and a detector. The one or more broadband sources is to illuminate a sample, wherein the one or more broadband sources have a short broadband source coherence length. The adjustable Fabry-Perot etalon is to optically process the reflected light to extract spectral information with fine spectral resolution. The detector is to detect reflected light from the sample, wherein the reflected light is comprised of multiple narrow-band subsets of the illumination light having long coherence lengths and is optically processed using a plurality of settings for the adjustable Fabry-Perot etalon, and wherein the plurality of settings includes a separation of the Fabry-Perot etalon plates that is greater than the broadband source coherence length but that is less than the long coherence lengths.

    Abstract translation: 用于宽范围光谱测量的系统包括一个或多个宽带源,可调法布里 - 珀罗标准具和检测器。 一个或多个宽带源将照亮样本,其中一个或多个宽带源具有短的宽带源相干长度。 可调节的法布里 - 珀罗标准具将光学处理反射光以提取精细光谱分辨率的光谱信息。 检测器检测来自样品的反射光,其中反射光由具有长相干长度的照明光的多个窄带子集组成,并且使用可调法布里珀罗标准具的多个设置进行光处理,并且其中 多个设置包括法布里 - 珀罗标准具板的分离,其大于宽带源相干长度。

    DISPOSITIF ET PROCEDE DE VARIATION DE LONGUEUR D'ONDE D'AU MOINS UNE SOURCE LUMINEUSE POUR SPECTROSCOPIE PAR DERIVEES
    79.
    发明公开
    DISPOSITIF ET PROCEDE DE VARIATION DE LONGUEUR D'ONDE D'AU MOINS UNE SOURCE LUMINEUSE POUR SPECTROSCOPIE PAR DERIVEES 审中-公开
    DISPOSITIF ET PROCEDE DE VARIATION DE LONGUEUR D'ONDE DE AU MOINS UNE SOURCE LUMINEUSE POUR SPECTROSCOPIE PAR DERIVEES

    公开(公告)号:EP3194915A1

    公开(公告)日:2017-07-26

    申请号:EP15741517.5

    申请日:2015-07-13

    CPC classification number: G01J3/447 G01J3/10 G01J3/4338 G01J2003/102

    Abstract: The present invention relates to a spectroscopy device, comprising an analysis zone (2) for receiving a sample; at least one light-emitting diode (3) arranged to emit a light beam (4)towards the analysis zone (2), having a luminous intensity spectral profile in a working wavelength interval; means (5) for varying with time the luminous intensity spectral profile emitted by said diode (3) in the working wavelength interval of said diode; a detector (6, 8, 9), arranged to receive, during a variation with time of the luminous intensity spectral profile emitted by said diode (3), the light beam (4) emitted by said diode (3) and having crossed the analysis zone (2), and supplying a detection signal (Α') of the light beam emitted by said diode (3) and received by the detector, in the form of a signal which depends on at least one characteristic representative of the luminous intensity spectral profile of said light-emitting diode. Application to derivative spectroscopy

    Abstract translation: 本发明涉及一种光谱装置,其包括用于接收样品的分析区域(2) 至少一个发光二极管(3),所述发光二极管(3)布置成朝向所述分析区域(2)发射光束(4),所述发光二极管具有在工作波长区间中的发光强度光谱分布; 用于随时间变化在所述二极管的工作波长间隔内由所述二极管(3)发射的发光强度光谱分布的装置(5) (6,8,9),其被布置成在由所述二极管(3)发射的光强度光谱分布随时间变化期间接收由所述二极管(3)发射并且与所述二极管(3)交叉的光束 分析区域(2),并且以取决于表示发光强度的至少一个特征的信号的形式提供由所述二极管(3)发射并且由所述检测器接收的光束的检测信号(A') 所述发光二极管的光谱分布。 应用于衍生光谱学

    METHOD AND MEANS FOR MULTISPECTRAL IMAGING
    80.
    发明公开
    METHOD AND MEANS FOR MULTISPECTRAL IMAGING 审中-公开
    VERFAHREN UND MITTELFÜRMULTISPEKTRALE BILDGEBUNG

    公开(公告)号:EP3152549A2

    公开(公告)日:2017-04-12

    申请号:EP15730081.5

    申请日:2015-06-03

    Abstract: The present invention relates to the multispectral imaging of samples, in particular of biological tissues. The invention further relates to a method for acquisition of fluorescence images and reflection images of an object (400) comprising the steps of alternatingly illuminating the object (400) with at least a first light and a second light, wherein the first light and the second light are spectrally shaped such that at least one light has several spectral regions of high light intensity separated by spectral region(s) of low light intensity, wherein the spectral regions of the first light and the second light with high intensity at least partially do not overlap and wherein at least one of the two lights has at least one region of low light intensity that is of longer wavelength to the neighboring region of high light intensity, and recording at least a first image of the object (400) and a second image of the object (400) while illuminating the object (400) with at least one of the lights wherein the light to be recorded as the first image is modified such, that at least one spectral region of high intensity of the second light is attenuated, and wherein the light to be recorded as the second image is modified such, that at least one spectral region of high intensity of the first light is attenuated.

    Abstract translation: 样本的多光谱成像,特别是生物组织。 一种用于获取物体的荧光和反射率图像的方法,包括用至少具有多个高强度光谱区域的第一光交替照射物体,其中第一光具有至少一个低强度区域,其具有较长波长至 具有高强度的区域和至少一个具有至少一个高强度的光谱区域的第二光,在物体照明期间用第一光照射物体并在物体照射期间记录物体的第一图像, 使用公共传感器阵列的第二光,其中由传感器阵列记录的光在其中第一光具有高强度的光谱区域中的至少一个中被衰减。

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