SHARED OPTICAL PERFORMANCE MONITORING
    71.
    发明申请
    SHARED OPTICAL PERFORMANCE MONITORING 审中-公开
    共享光学性能监控

    公开(公告)号:WO2006005192B1

    公开(公告)日:2006-05-18

    申请号:PCT/CA2005001100

    申请日:2005-07-15

    Abstract: An apparatus for shared optical performance monitoring (OPM) is provided. A wavelength sensitive device receives light at an input port and routes it wavelength selectively to a set of output ports. To perform optical performance monitoring on the output ports, a monitoring component of each output signal is extracted, and these monitoring components are then combined. A single OPM function is then performed on the combined signal. However, with knowledge of the wavelengths that were included in each output signal, a virtual OPM function can be realized for each output port. The per port functionality can include total power per port, power per wavelength per port, variable optical attentuation, dynamic gain equalization, the latter two examples requiring feedback.

    Abstract translation: 提供了一种用于共享光学性能监视(OPM)的设备。 波长敏感设备在输入端口接收光并将其波长选择性地路由到一组输出端口。 为了对输出端口进行光学性能监视,提取每个输出信号的监视组件,然后组合这些监视组件。 然后对组合信号执行单个OPM功能。 然而,通过了解每个输出信号中包含的波长,可以为每个输出端口实现虚拟OPM功能。 每端口功能可以包括每端口的总功率,每端口的每波长功率,可变光学注意度,动态增益均衡,后两个需要反馈的示例。

    MULTIPLEXING ROTARY SPECTROMETER
    72.
    发明申请
    MULTIPLEXING ROTARY SPECTROMETER 审中-公开
    多重旋转光谱仪

    公开(公告)号:WO2005066597A1

    公开(公告)日:2005-07-21

    申请号:PCT/US2004/037826

    申请日:2004-11-12

    Abstract: A rotary spectrometer including a plurality of input ports. Each input port may be arranged to receive an optical waveguide carrying electromagnetic radiation. The spectrometer also includes a plurality of optical bandpass filters, which are housed on a first body that rotates under the control of a motor so that each optical bandpass filter may be brought into alignment with each input port. Further, the spectrometer includes a plurality of detector circuits disposed on a second body that rotates with the first body. Each detector circuit is optoelectrically coupled to one of the plurality of optical bandpass filters, thereby resulting in each detector circuit being dedicated to responding to a range of wavelengths determined by the bandpass filter to which it is optoelectrically coupled.

    Abstract translation: 一种包括多个输入端口的旋转光谱仪。 每个输入端口可被布置成接收携带电磁辐射的光波导。 光谱仪还包括多个光学带通滤光器,它们容纳在电动机的控制下旋转的第一主体上,使得每个光学带通滤波器可以与每个输入端口对齐。 此外,光谱仪包括设置在与第一主体一起旋转的第二主体上的多个检测器电路。 每个检测器电路被光电耦合到多个光带通滤波器中的一个,从而导致每个检测器电路专用于响应由光电耦合到其的带通滤波器确定的波长范围。

    METHOD AND ASSEMBLY FOR DETECTING THE WAVELENGTH-DEPENDENT BEHAVIOR OF AN ILLUMINATED SPECIMEN
    74.
    发明申请
    METHOD AND ASSEMBLY FOR DETECTING THE WAVELENGTH-DEPENDENT BEHAVIOR OF AN ILLUMINATED SPECIMEN 审中-公开
    方法和设备测量探头LIT的波长依赖行为

    公开(公告)号:WO02012863A1

    公开(公告)日:2002-02-14

    申请号:PCT/EP2001/009048

    申请日:2001-08-04

    Abstract: The invention relates to a method and to an assembly for operating an optical imaging system for detecting the characteristic values of the wavelength-dependent behavior of an illuminated specimen, especially of the emission and/or absorption behavior, preferably of the fluorescence and/or luminescence and/or phosphorescence and/or enzyme-activated light emission and/or enzyme-activated fluorescence, preferably for the purpose of operating a laser scanning microscope. According to the inventive method, the image spot information of the specimen is broken down into its spectral components in a spatially resolved and wavelength-independent manner on the detector end, and for different spectral components at least one summation is made.

    Abstract translation: 用于操作的成像光学系统,用于检测被照明的样品的波长相关的行为的特征变量的,特别是发射和/或吸收特性,优选的荧光和/或发光和/或磷光和/或方法和装置酶激活的发光和/或酶激活 荧光,优选用于操作激光扫描显微镜,与检测侧空间分辨的样品成频谱成分的像素信息依赖于波长的分解,其中,至少一个求和是为不同光谱分量进行。

    PHOTODIODE ARRAY FOR SPECTROSCOPIC MEASUREMENT, AND SPECTROSCOPIC MEASUREMENT APPARATUS
    79.
    发明公开
    PHOTODIODE ARRAY FOR SPECTROSCOPIC MEASUREMENT, AND SPECTROSCOPIC MEASUREMENT APPARATUS 审中-公开
    光二极管阵列,用于光谱测量光谱测量和设备

    公开(公告)号:EP2833106A4

    公开(公告)日:2015-04-22

    申请号:EP13767497

    申请日:2013-03-26

    Abstract: A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure (the material and/or thickness of the coating) of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO 2 coating layer (104) on the silicon substrate (102) and an Al 2 O 3 coating layer (105) are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance (the rate at which incident light reaches a photoelectric conversion region) can be improved while making the best efforts to avoid a complex manufacturing process. As a result, high levels of sensitivity can be achieved without omission even within the ultraviolet wavelength region in a spectrometric measurement system using a photodiode array detector.

    PHOTODIODE ARRAY FOR SPECTROSCOPIC MEASUREMENT, AND SPECTROSCOPIC MEASUREMENT APPARATUS
    80.
    发明公开
    PHOTODIODE ARRAY FOR SPECTROSCOPIC MEASUREMENT, AND SPECTROSCOPIC MEASUREMENT APPARATUS 审中-公开
    用于光谱测量的光电二极管阵列和光谱测量装置

    公开(公告)号:EP2833106A1

    公开(公告)日:2015-02-04

    申请号:EP13767497.4

    申请日:2013-03-26

    Abstract: A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure (the material and/or thickness of the coating) of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO 2 coating layer (104) on the silicon substrate (102) and an Al 2 O 3 coating layer (105) are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance (the rate at which incident light reaches a photoelectric conversion region) can be improved while making the best efforts to avoid a complex manufacturing process. As a result, high levels of sensitivity can be achieved without omission even within the ultraviolet wavelength region in a spectrometric measurement system using a photodiode array detector.

    Abstract translation: 以一维形式排列的多个光电二极管被分成多个组。 对于每个组改变抗反射涂层的结构(涂层的材料和/或厚度),使得属于每个组的光电二极管的所有表面都覆盖有抗反射涂层,该抗反射涂层具有在 这些光电二极管接收的光波长范围。 特别地,硅衬底(102)上的SiO 2涂层(104)和Al 2 O 3涂层(105)对于所有光电二极管是共同的,而上层的结构相对于波长进行修改。 在紫外线波长区域内,涂层结构相对于波长更细微地改变。 通过这样的设计,可以在尽可能避免复杂的制造工艺的同时提高透射率(入射光到达光电转换区域的速率)。 结果,即使在使用光电二极管阵列检测器的光谱测量系统中的紫外线波长区域内也可以实现高水平的灵敏度。

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