Abstract:
An apparatus for shared optical performance monitoring (OPM) is provided. A wavelength sensitive device receives light at an input port and routes it wavelength selectively to a set of output ports. To perform optical performance monitoring on the output ports, a monitoring component of each output signal is extracted, and these monitoring components are then combined. A single OPM function is then performed on the combined signal. However, with knowledge of the wavelengths that were included in each output signal, a virtual OPM function can be realized for each output port. The per port functionality can include total power per port, power per wavelength per port, variable optical attentuation, dynamic gain equalization, the latter two examples requiring feedback.
Abstract:
A rotary spectrometer including a plurality of input ports. Each input port may be arranged to receive an optical waveguide carrying electromagnetic radiation. The spectrometer also includes a plurality of optical bandpass filters, which are housed on a first body that rotates under the control of a motor so that each optical bandpass filter may be brought into alignment with each input port. Further, the spectrometer includes a plurality of detector circuits disposed on a second body that rotates with the first body. Each detector circuit is optoelectrically coupled to one of the plurality of optical bandpass filters, thereby resulting in each detector circuit being dedicated to responding to a range of wavelengths determined by the bandpass filter to which it is optoelectrically coupled.
Abstract:
A multiwavelength selector for use with a high speed performance monitor, that uses a spatial wavelength separator, a configurable spatial filter, a focusing assembly, and a photodetector to select a wavelength or wavelengths from a plurality of incoming wavelengths, for further processing by said high speed performance monitor. The invention is intended for use in fiber optic network application.
Abstract:
The invention relates to a method and to an assembly for operating an optical imaging system for detecting the characteristic values of the wavelength-dependent behavior of an illuminated specimen, especially of the emission and/or absorption behavior, preferably of the fluorescence and/or luminescence and/or phosphorescence and/or enzyme-activated light emission and/or enzyme-activated fluorescence, preferably for the purpose of operating a laser scanning microscope. According to the inventive method, the image spot information of the specimen is broken down into its spectral components in a spatially resolved and wavelength-independent manner on the detector end, and for different spectral components at least one summation is made.
Abstract:
An apparatus for obtaining an image of a tooth having at least one light source providing incident light having a first spectral range for obtaining a reflectance image (122) from the tooth and a second spectral range for exciting a fluorescence image (120) from the tooth. A polarizing beamsplitter (18) in the path of the incident light from both sources directs light having a first polarization state toward the tooth and directs light from the tooth having a second polarization state along a return path toward a sensor (68), wherein the second polarization state is orthogonal to the first polarization state. A first lens (22) in the return path directs image-bearing light from the tooth toward the sensor (68), and obtains image data from the portion of the light having the second polarization state. A long-pass filter (15) in the return path attenuates light in the second spectral range.
Abstract:
A system for measuring an optical spectral response or property and/or IV data of a device or object under test (9), comprising in optically coupled sequence: a broadband light source (1) for emitting light of a prede- fined spectrum, a slit and/or light guide (2), a wavelength dispersive device (3), a spatial light modulator (5) for re- ceiving the emitted light and controlling an intensity and spectrum of light reflected by said modulator (5), focusing optics (6, 7, 8, 12, 13, 14) for the reflected light directed towards a reference detector (15) and towards the device or object under test (9), wherein the spatial light modulator (5) is embodied as a beamsplitter and is combined with a fil- ter (4) for suppression of second and higher order frequen- cies of the primary frequencies in the reflected light.
Abstract:
A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure (the material and/or thickness of the coating) of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO 2 coating layer (104) on the silicon substrate (102) and an Al 2 O 3 coating layer (105) are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance (the rate at which incident light reaches a photoelectric conversion region) can be improved while making the best efforts to avoid a complex manufacturing process. As a result, high levels of sensitivity can be achieved without omission even within the ultraviolet wavelength region in a spectrometric measurement system using a photodiode array detector.
Abstract:
A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure (the material and/or thickness of the coating) of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO 2 coating layer (104) on the silicon substrate (102) and an Al 2 O 3 coating layer (105) are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance (the rate at which incident light reaches a photoelectric conversion region) can be improved while making the best efforts to avoid a complex manufacturing process. As a result, high levels of sensitivity can be achieved without omission even within the ultraviolet wavelength region in a spectrometric measurement system using a photodiode array detector.